JPS62185860A - Material for low thermal expansion type shadow mask and its manufacture - Google Patents

Material for low thermal expansion type shadow mask and its manufacture

Info

Publication number
JPS62185860A
JPS62185860A JP2624386A JP2624386A JPS62185860A JP S62185860 A JPS62185860 A JP S62185860A JP 2624386 A JP2624386 A JP 2624386A JP 2624386 A JP2624386 A JP 2624386A JP S62185860 A JPS62185860 A JP S62185860A
Authority
JP
Japan
Prior art keywords
annealing
thermal expansion
shadow mask
low thermal
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2624386A
Other languages
Japanese (ja)
Other versions
JPH0450378B2 (en
Inventor
Kenichi Arase
荒瀬 健一
Toshio Hamaya
浜谷 利男
Fumio Mori
盛 二美男
Emiko Higashinakagaha
東中川 恵美子
Michihiko Inaba
道彦 稲葉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Toyo Kohan Co Ltd
Original Assignee
Toshiba Corp
Toyo Kohan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toyo Kohan Co Ltd filed Critical Toshiba Corp
Priority to JP2624386A priority Critical patent/JPS62185860A/en
Publication of JPS62185860A publication Critical patent/JPS62185860A/en
Publication of JPH0450378B2 publication Critical patent/JPH0450378B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C21METALLURGY OF IRON
    • C21DMODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
    • C21D8/00Modifying the physical properties by deformation combined with, or followed by, heat treatment
    • C21D8/02Modifying the physical properties by deformation combined with, or followed by, heat treatment during manufacturing of plates or strips
    • C21D8/0205Modifying the physical properties by deformation combined with, or followed by, heat treatment during manufacturing of plates or strips of ferrous alloys

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Heat Treatment Of Steel (AREA)
  • Heat Treatment Of Sheet Steel (AREA)
  • Electrodes For Cathode-Ray Tubes (AREA)

Abstract

PURPOSE:To obtain the titled material having a good press formability, by prescribing average crystal grain diameter (d) and proof stress sigma0.2 respectively, and composing of Fe-Ni alloy sheet having a specified Ni content. CONSTITUTION:The titled material is made of Fe-Ni alloy sheet contg. at least 20-45wt% Ni in which d<-0.5> is regulated to 0.5-2.5mm<-0.5> if average grain diameter is denoted as (d) and proof stress sigma0.2 is 18-22kgf/mm<2>. In manufacturing the material, Fe-Ni alloy strip having the compsn. is cold rolled by the extremely higher final cold rolling ratio (R%) 71-96% than conventional method, favorably 85-95%. Next, the obtd. Fe-Ni alloy sheet is subjected to continuous annealing of (650-900 deg.C)X(10-120sec) under atmosphere such as gaseous HNX, NX. The alloy sheet after annealing is subjected to etching perforation, further mask annealing of (650-1,250 deg.C)X(30-100min) to obtain the aimed titled material.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はシャドウマスク用素材の製造法に関し。[Detailed description of the invention] [Industrial application field] The present invention relates to a method for producing a material for a shadow mask.

より詳しくは低熱膨張率含金!用いたブレス酸形性の良
いシャドウマスク用素材の製造法に関する。
For more details, see Low thermal expansion coefficient containing metal! This invention relates to a method for producing a shadow mask material with good breath acid forming properties.

[従来技術及び問題点〕 従来、カラーテレビ用ブラウン管のシャドウマスクには
低炭素鋼板が一般に用いら扛てきたが。
[Prior Art and Problems] Conventionally, low carbon steel plates have generally not been used for shadow masks of cathode ray tubes for color televisions.

各種コンピュータ、ワードプロセ゛ソサ、計器類に用い
られるカラーCRTにおいて特に、また家庭用カラーテ
レビ受像器においても高品質の画像が求められるように
なって来たため、シャドウマスクが電子射突を受けて生
ずる熱膨張に起因する色ズレ現象の防止対策としてシャ
ドウマスクにアン/(−(Invar )が用いらn始
めている。
As high-quality images are now required, especially for color CRTs used in various computers, word processors, and instruments, and also for home color television receivers, thermal expansion caused by shadow masks being bombarded with electrons has become a problem. As a measure to prevent the color shift phenomenon caused by the shadow mask, un/(-(Invar)) has begun to be used as a shadow mask.

しかし、アンバーはプレス成形性が低炭素鋼に比して劣
1■、エツチング穿孔後のマスクのドーミング工程にお
いて、 BO工が上手くゆかない難点があった。
However, the press formability of amber was inferior to that of low carbon steel, and the BO process did not work well in the doming process of the mask after etching and perforation.

そこで、本発明者等はアンバー系材料について冷延率及
び熱処理条件を諸捗+U合せる事によ11、ブレ・ス戎
形性ン改善すべく鋭意実験及び考察を行なった結果、本
発明全完成するに至った。
Therefore, the inventors of the present invention have conducted extensive experiments and studies in order to improve the break-out shape property by adjusting the cold rolling rate and heat treatment conditions of the amber-based material.As a result, the present invention has been completed. I ended up doing it.

〔発明の目的〕[Purpose of the invention]

不発明の目的はプレス成形性の良い低熱膨強型リヤドウ
マスク用素材及びその製造法ン提供するにある。
The object of the invention is to provide a low thermal expansion type rear door mask material with good press moldability and a method for producing the same.

本発明の他の目的はσ。2耐力(wtto、2%を付与
した時の耐力)が低いアンバー系低熱膨張型シャドウマ
スク用素材及びその製造法を提供するにある。
Another object of the invention is σ. An object of the present invention is to provide an amber-based low thermal expansion shadow mask material having a low 2% yield strength (wtto, yield strength when 2% is applied) and a method for producing the same.

〔発明の構成及び作用〕[Structure and operation of the invention]

不発明によ11’ c本発明I)少なくともNiy30〜45%(重置%、
以下同じ)含むに’e−Ni系合金薄板であって、平均
結晶粒径ydとするどきd→が0.5〜2.5m”であ
I】、耐力σ が18〜22 ”/1m” である事!
z 特徴とする低熱膨張型ンヤドウマスク用素材、(本発明
U)少なくともNi930〜45%含むFe −Ni 
 系合金帯板”271〜96%の冷延率(R%)で冷間
圧延し、ついで(650〜900℃)X(10〜120
sec、)の連続焼鈍を施し、エツチング穿孔後さらに
(Bo 〜1250℃)X(30〜100m1n )の
マスク焼鈍を施すこと全特徴とする低熱膨張型シャドウ
マスク用素材の製造法、および (X弁明1)少7k<とbNiY30〜’45%、Cr
Y O,1〜2.5%含むpe−Nl 系合金帯板?、
式I ZCr”−55Or+ 71≦R≦96を満足す
る冷延率(R%)で冷間圧勉し、ついで(650〜90
0℃)X(10〜120sec、)の連続焼鈍を施し、
エツチング穿孔後さらl::(BO〜1250℃)X(
3o 〜100m1n、)のマスク焼鈍ン施すこと全特
徴とする低熱膨張型シャドウマスク用素材の製造法 が提供される。
According to the invention 11' c Invention I) At least 30 to 45% Niy (overlapping %,
The same applies hereinafter) Including 'e-Ni alloy thin plate, where the average grain size yd is 0.5 to 2.5 m'' and the yield strength σ is 18 to 22''/1 m''That's it!
z Featured material for low thermal expansion mask, (invention U) Fe-Ni containing at least 930 to 45% Ni
The alloy strip was cold rolled at a cold rolling rate (R%) of 271 to 96%, and then (650 to 900°C) x (10 to 120
A method for manufacturing a low thermal expansion shadow mask material, which is characterized in that it is subjected to continuous annealing for 200 m2, ), and then subjected to mask annealing for (Bo ~1250°C) 1) Low 7k< and bNiY30~'45%, Cr
PE-Nl alloy strip containing 1 to 2.5% Y O? ,
Formula I ZCr”-55Or+ Cold rolling was carried out at a cold rolling rate (R%) satisfying 71≦R≦96, and then (650 to 90
0℃)X (10-120sec,) continuous annealing,
After etching perforation:: (BO~1250℃)
A method for producing a low thermal expansion shadow mask material is provided, which is characterized by performing a mask annealing process of 3o to 100m1n.

以下に本発明の詳細な説明する。The present invention will be explained in detail below.

所謂アンバー材すなわち低熱膨張率のre −Ni合金
でつくったシャドウマスク用素材は前述したトオll、
エツチング後塵されるプレス加工において成形性が不足
しており、従ってシャドウマスクトシてブラウン管に組
込まれた後スプリングバックによって電子銃側に変形し
5色ズレを生ずる傾向があった。
The shadow mask material made of the so-called invar material, that is, the re-Ni alloy with a low coefficient of thermal expansion, is the aforementioned tool.
Formability is insufficient in the press work that is performed after etching, and therefore, after the shadow mask is assembled into a cathode ray tube, it tends to deform toward the electron gun due to springback, resulting in five-color misalignment.

その対策としてアンバー材の工・ソチング&i形性の向
上7図ることが急務となった。
As a countermeasure to this problem, it became urgent to improve the machining, sawing, and i-forming properties of the amber material.

そこで、本発明者等は鋭意実験、研究の結果、平均結晶
粒径idとするどきd +が0.5〜λ5u+−十で、
かつ耐力σ。、2が18〜22 KP ’/m ”の範
囲を選ぶことによって色ズレの生じないシャドウマスク
が得られる事!見出し、本発明ン完成するに至った。
Therefore, as a result of intensive experiments and research, the present inventors found that the average crystal grain size id and d+ are 0.5 to λ5u+-10,
and yield strength σ. , 2 is in the range of 18 to 22 KP'/m'', a shadow mask without color shift can be obtained!The present invention has been completed.

本発明!、ff、Iに共通して、Ni成分’Y30〜4
5%とした理由は、Niが30%よりも少ないかまた4
5%よりも多いと、いづれの場合も熱膨張率が茜くなり
、前述の本発明用途に適合しなくなるからである。
This invention! , ff, and I, the Ni component 'Y30~4
The reason for setting it to 5% is that Ni is less than 30% or 4%.
This is because if the amount exceeds 5%, the coefficient of thermal expansion becomes red in any case, making it unsuitable for the above-mentioned uses of the present invention.

また「少なくともNi、もしくはCryl・・・」とし
た連山は、その他の非有害元素及び不可避的不純物を特
に制限しないためである。
Furthermore, the range of "at least Ni or Cryl..." is because other non-hazardous elements and inevitable impurities are not particularly limited.

また不発明■においてa+1弓、5〜2.5jIJI−
子とした理由は、結晶粒径dがこの範囲!満足する事に
よって耐力σ、が望ましい範囲になるからである。
Also, in non-invention ■, a+1 bow, 5~2.5jIJI-
The reason why it is selected as a child is because the crystal grain size d is within this range! This is because, by satisfying the requirements, the yield strength σ will be within a desirable range.

すなわちa−4が2.5d→よ蚤】も大きいとdは小さ
くなって結晶粒は微細粒とな11、耐力か大きくなって
望ましくないスプリングバック!生じるようにな11、
またd→が0.5よ6)も小さいと結晶粒が粗大化して
肌荒n (Orange peel ) Y生じ、7L
/ス成形上好ましくないはか11か、エツチング孔が異
形化し、高精細度ブラウン管に適さなくなってしまうか
らである。
In other words, if a-4 is 2.5d → y] is also large, d becomes small and the crystal grains become fine11, which increases the yield strength and causes undesirable springback! As it happens11,
Also, if d→ is smaller than 0.5 (6), the crystal grains will become coarser and the skin will become rough (orange peel).
This is undesirable in terms of space molding, and the etching holes become irregularly shaped, making them unsuitable for high-definition cathode ray tubes.

そして、耐力σcLz ’!’ 18〜22 Kyf/
uz 、!:しり理由は、上記結晶粒範囲Y選ぶと耐力
がほぼ必然的にこの範囲に入るようになるからである。
And proof stress σcLz'! '18~22 Kyf/
uz,! The reason for this is that when the above crystal grain range Y is selected, the yield strength almost inevitably falls within this range.

マスク工程のハンドリング上旬10 K117w”以上
0)耐力は必要であるが、こn以上でさえあnば耐力は
低い程よいから、18KPf/1hJ12以下でもよい
訳であるけれども、前記結晶粒径の限定に従い、下限は
18KPレ−2とな11、またこれz上であっても上1
艮の22 K9fltlU12以下であれば、実用上プ
レス成形時の問題は生じない。’l 2 KpfJ+a
” Y超えると従来のアンバーと同Eiにプレス性に問
題を生ずるので、22Kpf、42思下とした。
Early handling of mask process 10 K117w" or more 0) proof stress is necessary, but if it is more than this, the lower the proof stress is, the better, so 18KPf/1hJ12 or less is fine, but according to the above crystal grain size limit. , the lower limit is 18KP ray-2, which is 11, and even if this is above z, the upper limit is 1
If it is less than 22K9fltlU12, no problem will arise during press molding in practice. 'l 2 KpfJ+a
If it exceeds Y, there will be a problem with pressability, which is the same Ei as conventional umber, so it was set to 22 Kpf and 42 Kpf.

本発明nは、本発明l!製造する方法の一つである。The present invention n is the present invention l! This is one of the manufacturing methods.

本発明者等は前述の問題点に鑑み、製造方法!模索した
が、その結果従来10〜20%程度であった最終冷延率
!71〜96%と極めて高くする事、並びにこれに適当
な熱処理7組み含せることによって本発明Iが容易に安
定して得らnる事?見出し、本発明11を完成するに至
った。
In view of the above-mentioned problems, the present inventors developed a manufacturing method! We searched for the final cold rolling rate, which used to be around 10-20%! Is it possible to easily and stably obtain the present invention I by increasing the percentage to an extremely high level of 71 to 96% and including seven appropriate heat treatments? Under the heading, present invention 11 has been completed.

従来、冷延率l高くすると顕微鏡組織が所謂繊維状組織
とな11.そのままでエツチングすると異形穿孔となる
場合があったため、冷延率は精々20%どまりであった
もの馨、敢えて71%以上もの高い冷延率を与える事に
した処に本発明の特徴がある。但し、上記異形穿孔の防
止対策として連続焼鈍(短時間歪取1)焼鈍)を施すよ
うにしている。この連続焼鈍は尚冷延率による〃ロエ硬
化歪!収1)繊維状組織全解消するから、二゛′lチン
グ時の異形穿孔乞防止するに極めて有効な手段であり、
かつ一方で通常のコイル焼鈍に比して均熱時間が短時間
であるため+f)結晶後の粒成長が抑制さ扛ろという利
益がある。従ってエツチング穿孔後のマスク焼鈍におい
で充分な粒成長がはじめて生じ、耐力の低下、すなわち
プレス成形性の向上が果される訳である。
Conventionally, when the cold rolling rate l is increased, the microscopic structure becomes a so-called fibrous structure11. Etching as it is may result in irregularly shaped perforations, so the cold rolling rate would have been no more than 20%.However, the present invention is characterized by the fact that we dared to give it a high cold rolling rate of 71% or more. However, as a measure to prevent the above-mentioned irregularly shaped holes, continuous annealing (short-time strain relief 1) annealing) is performed. This continuous annealing also causes Loe hardening distortion due to the cold rolling rate! 1) Since the fibrous tissue is completely eliminated, it is an extremely effective means to prevent irregular perforation during double-chipping.
On the other hand, since the soaking time is shorter than in normal coil annealing, there is an advantage that +f) grain growth after crystallization is suppressed and suppressed. Therefore, sufficient grain growth occurs for the first time in the mask annealing after etching and perforation, resulting in a reduction in yield strength, that is, an improvement in press formability.

ここに本発明■、iにおける冷延率の限定理由は次のと
お+1である。すなわち71%よ偽)も?rJ延率が低
いと本発す効果がなく、また96%!越えると最終的に
マスク焼鈍後結晶粒粗大化が生じて反ってプレス性が悪
化するからである。なお好ましくは85〜95%の冷延
率が採用される。
Here, the reasons for limiting the cold rolling rate in the present invention (i) and (i) are as follows: +1. In other words, 71% (false) too? If the rJ elongation is low, there is no main effect, and it is 96%! This is because if it exceeds this, grains will eventually become coarser after mask annealing, resulting in warpage and deterioration of pressability. Preferably, a cold rolling ratio of 85 to 95% is employed.

連続焼鈍の条件限定理由は次のとお11である。The reasons for limiting the conditions for continuous annealing are as follows.

均熱温度が650℃に満たないと再結晶温度に達しない
部分が多くなり、繊細状組織が充分に消失しないからで
あり、また900℃を越えると連続焼鈍炉の炉壁、八−
スロール等の寿命が短かくなり、また省エネルギーの見
地からも不経済となるため、上限’!r900℃とした
If the soaking temperature is less than 650°C, there will be many parts that do not reach the recrystallization temperature, and the fine structure will not disappear sufficiently, and if it exceeds 900°C, the furnace wall of the continuous annealing furnace,
The lifespan of the throttle etc. will be shortened and it will also be uneconomical from an energy saving perspective, so the upper limit! The temperature was r900°C.

なお特に800〜850℃の範囲が好適に採用される。In particular, a temperature range of 800 to 850°C is preferably employed.

この場合の雰囲気はHNX、NXガス等が用いらnるが
、その他の各種吸熱型、乃至発熱型の変成ガスを用いる
ことが出来、それ以外にも水素またはヘリウム、ネオン
、アルゴン等の不活性ガス、真空等も適用可能である。
In this case, the atmosphere used is HNX, NX gas, etc., but various other endothermic or exothermic gases can be used, and inert gases such as hydrogen or helium, neon, argon, etc. Gas, vacuum, etc. are also applicable.

均熱時間は] Osea、未満では再結晶不完全となI
)やすく、また1 20 sec、v超えると→イン速
度を極めて遅くするか、炉体を長大なものにしなければ
ならず不経済であるので、10〜120 secとした
If the soaking time is less than [Osea], the recrystallization is incomplete.
), and if it exceeds 120 sec, the in-in speed must be extremely slow or the furnace body must be made long, which is uneconomical, so it is set to 10 to 120 sec.

なお、連続焼鈍後調質圧延Yすることもある。Note that skin pass rolling may be performed after continuous annealing.

次にマスク焼鈍について述べる。Next, mask annealing will be described.

シャドウマスク用素材は帯板の状態でエツチング穿孔さ
f’L、Lかる後剪断もしくはプランキングによI)フ
ラ・ソトマスクとさnるのが普通である。
The material for the shadow mask is usually formed into a strip by etching holes f'L, L, and then shearing or planking to form a full-thread mask.

そしてマスク焼鈍はこのフラットマスクの状態で行なわ
れる熱処理であって、エツチング歪Yとり、その後流さ
れるプレス成形性を確保するために行なわれる工程であ
る。
Mask annealing is a heat treatment carried out in the state of this flat mask, and is a process carried out to remove the etching strain Y and to ensure press formability for subsequent flow.

焼鈍雰囲気は前述の連続焼鈍の場合に準するが、現在は
主として】O−2〜] 0 ’ Torr、程度の真空
とする場合が多い。これは工゛ソチング後のマスク表面
が清浄であって酸化されやすいので、マスク焼鈍中に表
面吸看ガス!充分に脱ガスして酸化を防止するためであ
る。
The annealing atmosphere is similar to the above-mentioned continuous annealing, but currently it is often a vacuum of about 0-2 to 0' Torr. This is because the mask surface is clean after etching and is easily oxidized, so the surface absorbs gas during mask annealing. This is to prevent oxidation by sufficiently degassing.

フラットマスクは積み重ねらnた状態で炉中に入れられ
、バッチ焼鈍されるが、均熱温度は650〜1250℃
、就中】】00〜1170℃が好適に用いられる。その
理由は650℃よ蚤)低い温度では再結晶しない部分が
生じるからであ11、一方1250℃ を超えても七n
以上粒成長効果?期待できないばかjlでなく省エネル
ギーの見地から寧ろ望ましくないからである。
The flat masks are placed in a stacked state in a furnace and batch annealed, but the soaking temperature is 650-1250℃.
, among others] 00 to 1170°C is preferably used. The reason for this is that at temperatures as low as 650°C, some parts do not recrystallize.
More grain growth effect? This is because it is not a stupid thing to have hope for, but rather it is undesirable from the standpoint of energy conservation.

均熱時間は30 m1re、に達しないと粒成長が不充
分とな11.かつ、100 m1ned上かけても最早
や粒成長は飽和してしまうし、不経済であるので。
If the soaking time does not reach 30 m1re, grain growth will be insufficient.11. Moreover, even if it is increased by 100 m1ned, the grain growth will already reach saturation, which is uneconomical.

30〜100m1n、  とした。30 to 100 m1n.

ついで焼鈍まま、もしくは必要に応じてレベラー亦工後
にプレス加工によってフラットマスクに球面状の張曝)
出しt与え、しかる後黒化処理してシャドウマスクとす
る。
Then, the flat mask is stretched into a spherical shape by press processing, either as annealed or after leveling if necessary)
After that, it is blackened and used as a shadow mask.

すtIわち本発明1.I、Iにおけるシャドウマスク用
素材とは、レベラー加工もしくはプレス加工前のフラ・
ソトマスクを云うのである。
The present invention 1. The shadow mask material in I and I refers to the flat material before leveler processing or press processing.
It is called Sotomask.

次に本発明値について説明する。Next, the values of the present invention will be explained.

特許請求の範囲弗3項に記載の本発明■は、有効成分と
してNiの他にCrを含む場合である。
The present invention (2) described in claim 3 is a case in which Cr is included in addition to Ni as an active ingredient.

第1図は冷延率RとCrとの関係!示すグラフである。Figure 1 shows the relationship between cold rolling ratio R and Cr! This is a graph showing.

なおこのグラフは実験によって得られたものである。Note that this graph was obtained through experiment.

第1図において横軸はCr1y表わし、Cr量は0、1
〜2..5%が本発明1範囲である。Cr量が0.1%
よI】少ないと効果が認められず、15%!超えると材
料の熱膨張率が上が1、本来の目的が達成できない。従
って0.1〜2.5%とした。
In Fig. 1, the horizontal axis represents Cr1y, and the amount of Cr is 0, 1
~2. .. 5% is within the scope of the present invention. Cr amount is 0.1%
[Yo I] If the amount is too low, no effect will be recognized, 15%! If it exceeds this value, the thermal expansion coefficient of the material will increase by 1, making it impossible to achieve the original purpose. Therefore, it was set at 0.1 to 2.5%.

縦軸は冷延率RY表わし1曲線R−12Cr” −55
Cr+71 よりも上でかつR≦96の八ツチング領域
に属するCr量と冷延率Rの組み合せが不発明Iの範囲
である。
The vertical axis represents the cold rolling rate RY. 1 curve R-12Cr”-55
Combinations of Cr amount and cold rolling rate R that are higher than Cr+71 and belong to the eighting region of R≦96 are within the range of non-invention I.

Rがこの式の示す曲線の下側では高耐力領域となりプレ
ス成形性がよくない。
When R is below the curve shown by this formula, it becomes a high yield strength region and press formability is poor.

またRが96%を超すと加工歪みが累積する結果マスク
焼鈍において結晶粒が粗大化し1反ってプレス成形性!
害するのでR≦96とした。
Furthermore, when R exceeds 96%, processing distortion accumulates, resulting in coarse grains during mask annealing, resulting in warpage and poor press formability.
Since this may cause damage, R≦96 was set.

〔実施例〕〔Example〕

第1表に示される如き成分組成(cr:o、041〜2
.01%)のFe−Ni 系合金帯板!供試材とし、第
2表に示したように10〜95%の最終冷延率で冷間圧
延したのち連続焼鈍およびエツチング穿孔後のマスク焼
鈍w施した。
Ingredient composition as shown in Table 1 (cr:o, 041-2
.. 01%) Fe-Ni alloy strip! The test materials were cold rolled at a final cold rolling ratio of 10 to 95% as shown in Table 2, and then subjected to continuous annealing and mask annealing after etching and perforation.

すなわち巣】表は供試材Q)化学成分の表であり、82
表は処理条件を示す表である。
In other words, nest] The table is a table of the chemical composition of the sample material Q), and 82
The table shows processing conditions.

第3表はこのようにして得られたマスク素材ノ特性!示
す表である。マスク焼鈍機0;結晶粒径が大きいほど耐
力σ、は低くなり、また耐力σ、が24 KfAaa”
 y2こえると素材のスプリングバ・ツクによりプレス
成形性が劣るようC;なる。
Table 3 shows the characteristics of the mask materials obtained in this way! This is a table showing Mask annealing machine 0: The larger the grain size, the lower the yield strength σ, and the yield strength σ is 24 KfAaa”
If it exceeds y2, the press formability will deteriorate due to the spring back of the material.

Cr量がO,1%以下の場合には、最終冷間圧延で71
〜96%の^冷延率を付与することにより。
If the Cr content is less than O.1%, the final cold rolling will result in 71
By imparting a cold rolling rate of ~96%.

耐力σ。2が低下し軟質化する。しかし、cr:0.1
%以下の範囲においてもR≧12Cr”−55Cr+7
1式ン満足するRであれば、耐力はなお低下する傾向が
ある。
Yield strength σ. 2 decreases and becomes soft. However, cr: 0.1
Even in the range of % or less, R≧12Cr”-55Cr+7
If R satisfies Equation 1, the yield strength tends to further decrease.

次に0.1%以上のOr範囲においては、式 R≧12
 Cr”−550r +71に従って、18〜22 K
P拗”の耐力σ、が得られ、Cr量の多い素材では比較
的低い冷延率でプレス成形性の優れた低熱膨張型シャド
ウマスク用素材が得られる。
Next, in the Or range of 0.1% or more, the formula R≧12
18-22 K according to Cr”-550r +71
A yield strength σ of 10% is obtained, and a low thermal expansion shadow mask material with excellent press formability can be obtained at a relatively low cold rolling rate with a material containing a large amount of Cr.

夷3表に記載の本発明実施例はすべて比較例よりも優れ
たプレス成形性!示した。
All the examples of the present invention listed in Table 3 have better press formability than the comparative examples! Indicated.

〔発明の効果〕〔Effect of the invention〕

本発明!実施することにより、前記目的のすべてが達成
される。
This invention! Through implementation, all of the above objectives are achieved.

すなわちプレス成形性の優れた低熱膨張型シャドウマス
ク用素材がもたらされる。またCry、−適量添加した
場合、あまlI冷延率を上げなくてもプレス成形性が確
保出来るという効果がある。
In other words, a low thermal expansion shadow mask material with excellent press moldability is provided. Further, when an appropriate amount of Cry is added, press formability can be ensured without increasing the cold rolling rate.

【図面の簡単な説明】[Brief explanation of drawings]

弗1図は本発明璽におけるCr量と冷廷率Rの関係ヲ示
すグラフである。 特許出和人 東洋鋼版株式会社 株式会社 東 芝 算11!I (r  (”7.1
Figure 1 is a graph showing the relationship between the Cr content and the cooling rate R in the seal of the present invention. Kazuto Patent Toyo Kohan Co., Ltd. Toshiba Calculation 11! I (r (”7.1

Claims (3)

【特許請求の範囲】[Claims] (1)少なくともNiを30〜45%(重量%、以下同
じ)含むFe−Ni系合金薄板であって、平均結晶粒径
をdとするときd^−^1^/^2が0.5から2.5
mm^−^1^/^2であり、耐力σ_0_._2が1
8〜22Kgf/mm^2である事を特徴とする低熱膨
張型シャドウマスク用素材。
(1) Fe-Ni alloy thin plate containing at least 30 to 45% (by weight, the same hereinafter) of Ni, where d^-^1^/^2 is 0.5, where d is the average crystal grain size. from 2.5
mm^-^1^/^2, and proof stress σ_0_. _2 is 1
A low thermal expansion shadow mask material characterized by 8 to 22 Kgf/mm^2.
(2)少なくともNiを30〜45%含むFe−Ni系
合金帯板を71〜96%の冷延率(R%)で冷間圧延し
、ついで(650〜900℃)×(10〜120sec
.)の連続焼鈍を施し、エッチング穿孔後さらに(65
0〜1250℃)×(30〜100min.)のマスク
焼鈍を施すことを特徴とする低熱膨張型シャドウマスク
用素材の製造法。
(2) A Fe-Ni alloy strip containing at least 30 to 45% Ni is cold rolled at a cold rolling rate (R%) of 71 to 96%, and then (650 to 900°C) x (10 to 120 sec)
.. ) was subjected to continuous annealing, and after etching and perforation, further (65
1. A method for producing a low thermal expansion shadow mask material, which comprises performing mask annealing at a temperature of 0 to 1250[deg.] C. for 30 to 100 min.
(3)少なくともNiを30〜45%、Crを0.1〜
25%含むFe−Ni系合金帯板を、 式12Cr^2−55Cr+71≦R≦96を満足する
冷延率(R%)で冷間圧延し、ついで(650〜900
℃)×(10〜120sec.)の連続焼鈍を施し、エ
ッチング穿孔後さらに(650〜1250℃)×(30
〜100min.)のマスク焼鈍を施すことを特徴とす
る低熱膨張型シャドウマスク用素材の製造法。
(3) At least 30 to 45% Ni and 0.1 to 0.1% Cr
A Fe-Ni alloy strip containing 25% of
℃) × (10 to 120 sec.), and after etching and perforation, further annealing (650 to 1250 °C) × (30
~100min. ) A method for producing a material for a low thermal expansion shadow mask, characterized by subjecting it to mask annealing.
JP2624386A 1986-02-07 1986-02-07 Material for low thermal expansion type shadow mask and its manufacture Granted JPS62185860A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2624386A JPS62185860A (en) 1986-02-07 1986-02-07 Material for low thermal expansion type shadow mask and its manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2624386A JPS62185860A (en) 1986-02-07 1986-02-07 Material for low thermal expansion type shadow mask and its manufacture

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2105789A Division JPH0610323B2 (en) 1990-04-21 1990-04-21 Material for low thermal expansion type shadow mask and its manufacturing method

Publications (2)

Publication Number Publication Date
JPS62185860A true JPS62185860A (en) 1987-08-14
JPH0450378B2 JPH0450378B2 (en) 1992-08-14

Family

ID=12187856

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2624386A Granted JPS62185860A (en) 1986-02-07 1986-02-07 Material for low thermal expansion type shadow mask and its manufacture

Country Status (1)

Country Link
JP (1) JPS62185860A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991012345A1 (en) * 1990-02-15 1991-08-22 Nkk Corporation Thin sheet of iron-nickel alloy for shadow mask and production thereof
WO2000036172A1 (en) * 1998-12-15 2000-06-22 Nippon Mining & Metals Co., Ltd. Fe-Ni ALLOY FOR TENSION MASK AND TENSION MASK USING IT AND COLOR CRT

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58157949A (en) * 1982-03-16 1983-09-20 Toshiba Corp Parts in tube
JPS60251227A (en) * 1984-05-29 1985-12-11 Nippon Steel Corp Production of low-expansion fe-ni steel sheet

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58157949A (en) * 1982-03-16 1983-09-20 Toshiba Corp Parts in tube
JPS60251227A (en) * 1984-05-29 1985-12-11 Nippon Steel Corp Production of low-expansion fe-ni steel sheet

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991012345A1 (en) * 1990-02-15 1991-08-22 Nkk Corporation Thin sheet of iron-nickel alloy for shadow mask and production thereof
US5252151A (en) * 1990-02-15 1993-10-12 Nkk Corporation Fe-Ni alloy sheet for shadow mask having a low silicon segregation and method for manufacturing same
WO2000036172A1 (en) * 1998-12-15 2000-06-22 Nippon Mining & Metals Co., Ltd. Fe-Ni ALLOY FOR TENSION MASK AND TENSION MASK USING IT AND COLOR CRT
US6572714B1 (en) 1998-12-15 2003-06-03 Nippon Mining & Metals Co., Ltd. Fe-Ni alloy for tension mask and tension mask using it and color crt

Also Published As

Publication number Publication date
JPH0450378B2 (en) 1992-08-14

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