JPH02305941A - Blank for low thermal expansion shadow mask and production thereof - Google Patents

Blank for low thermal expansion shadow mask and production thereof

Info

Publication number
JPH02305941A
JPH02305941A JP10578990A JP10578990A JPH02305941A JP H02305941 A JPH02305941 A JP H02305941A JP 10578990 A JP10578990 A JP 10578990A JP 10578990 A JP10578990 A JP 10578990A JP H02305941 A JPH02305941 A JP H02305941A
Authority
JP
Japan
Prior art keywords
thermal expansion
shadow mask
mask
low thermal
cold rolling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10578990A
Other languages
Japanese (ja)
Other versions
JPH0610323B2 (en
Inventor
Kenichi Arase
荒瀬 健一
Toshio Hamaya
浜谷 利男
Fumio Mori
盛 二美男
Emiko Higashinakagaha
東中川 恵美子
Michihiko Inaba
道彦 稲葉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Toyo Kohan Co Ltd
Original Assignee
Toshiba Corp
Toyo Kohan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toyo Kohan Co Ltd filed Critical Toshiba Corp
Priority to JP2105789A priority Critical patent/JPH0610323B2/en
Publication of JPH02305941A publication Critical patent/JPH02305941A/en
Publication of JPH0610323B2 publication Critical patent/JPH0610323B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To produce a blank for a low thermal expansion shadow mask having superior press formability by successively subjecting an Fe-Ni alloy strip contg. specified percentages of Ni and Cr to cold rolling, continuous annealing and mask annealing under specified conditions. CONSTITUTION:An Fe-Ni alloy strip consisting of 30-45wt.% Ni, 0-1-2-5wt.% Cr and the balance Fe with inevitable impurities is cold rolled at a cold rolling rate (R%) satisfying an inequality 12Cr<2>55Cr+71<=R<=96. The cold rolled strip is continuously annealed by soaking at 650-900 deg.C for 10-120sec, holes are pierced by etching and mask annealing is carried out by soaking at 650-1, 250 deg.C for 30-100min. A blank for a low thermal expansion shadow mask having superior press formability and 18-22kgf/mm<2> yield strength sigma0.2 is obtd. when the average grain size of the blank is expressed by (d), d<-1/2> is 0.5-2.5mm<-1/2>.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明はシャドウマスク用素材の製造法に関し、より詳
しくは低熱膨張率合金を用いたプレス成形性の良いシャ
ドウマスク用素材の製造法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a method for producing a material for a shadow mask, and more particularly to a method for producing a material for a shadow mask with good press formability using a low coefficient of thermal expansion alloy.

[従来技術及び問題点コ 従来、カラーテレビ用ブラウン管のシャドウマスクには
低炭素鋼板が一般に用いられてきたが、各種コンピュー
タ、ワードプロセッサ、計器類に用いられるカラーCR
Tにおいて特に、また家庭用カラーテレビ受像機におい
ても高品質の画像が求められるようになって来たため、
シャドウマスクが電子射突を受けて生ずる熱膨張に起因
する色ズレ現象の防止対策としてシャドウマスクにアン
バー(Invar)が用いられ始めている。
[Prior art and problems] Conventionally, low carbon steel sheets have been generally used for the shadow masks of cathode ray tubes for color televisions, but color CR sheets used for various computers, word processors, and instruments
As high-quality images have become required, especially in televisions, and also in home color television receivers,
Invar has begun to be used in shadow masks as a measure to prevent color shift caused by thermal expansion caused by electron bombardment of shadow masks.

しかし、アンバーはプレス成形性が低炭素鋼に比して劣
り、エツチング穿孔後のマスクのドーミング工程におい
て、加工が上手くゆかない難点があった。
However, amber has poor press formability compared to low carbon steel, and has the disadvantage that processing does not go well in the mask doming process after etching and perforation.

そこで本発明者等はアンバー系材料について冷延率及び
熱処理条件を諸種組合せる事により、プレス成形性を改
善すべく鋭意実験及び考察を行なった結果、本発明を完
成するに至った。
Therefore, the present inventors conducted extensive experiments and studies to improve press formability by combining various cold rolling rates and heat treatment conditions for amber-based materials, and as a result, they completed the present invention.

[発明の目的] 本発明の目的はプレス成形性の良い低熱膨脹型シャドウ
マスク用素材及びその製造法を提供するにある。
[Object of the Invention] An object of the present invention is to provide a low thermal expansion shadow mask material with good press moldability and a method for producing the same.

本発明の他の目的はσ。2耐力(Eio、2%を付与し
た時の耐力)が低いアンバー系低熱膨脹型シャドウマス
ク用素材及びその製造法を提供するにある。
Another object of the invention is σ. An object of the present invention is to provide an amber-based low thermal expansion type shadow mask material having a low Eio (proof stress when 2% is applied) and a method for manufacturing the same.

[発明の構成及び作用] 本発明により、 Ni:30〜45%、Cr :0.1〜2.5%を含み
、残部Fe及び不可避的不純物でなるFe−Ni系合金
薄板であって、平均結晶粒径をdとするときd−1/2
が0,5〜2,5鵬−1/2であり、耐力σ。2が18
〜22kgf 7mm2である事を特徴とする低熱膨脹
型シャドウマスク用素材(本発明1) および Ni:3Q 〜45%、Cr : 0.1〜2.5%を
含み、残部Fe及び不可避的不純物でなるFe−NL系
合金帯板を、 式12Cr’ −550r+71≦R≦96を満足する
冷延率(R%)で冷間圧延し、ついで(650〜900
℃)×(10〜120SeC9)の連続焼鈍を施し、エ
ツチング穿孔後さらに(650〜1250℃)×(30
〜100min.)のマスク焼鈍を施すことを特徴とす
る低熱膨脹型シャドウマスク用素材の製造法(本発明2
)が提供される。
[Structure and operation of the invention] According to the present invention, an Fe-Ni alloy thin plate containing Ni: 30 to 45%, Cr: 0.1 to 2.5%, and the balance being Fe and unavoidable impurities, When the crystal grain size is d, d-1/2
is 0.5 to 2.5-1/2, and the yield strength σ. 2 is 18
Low thermal expansion shadow mask material (invention 1) characterized by ~22 kgf 7 mm2 and containing ~45% Ni: 3Q, 0.1 ~ 2.5% Cr, the balance being Fe and unavoidable impurities. The Fe-NL alloy strip was cold rolled at a cold rolling rate (R%) satisfying the formula 12Cr' -550r+71≦R≦96, and then (650 to 900
℃)×(10-120SeC9), and after etching and perforation, further annealing of (650-1250℃)×(30
~100min. ) A method for producing a low thermal expansion shadow mask material (invention 2)
) is provided.

以下に本発明の詳細な説明する。The present invention will be explained in detail below.

従来、所謂アンバー材すなわち低熱膨張率のFe−Ni
合金でつくったシャドウマスク用素材は前述したとおり
、エツチング後施されるプレス加工において成形性が不
足しており、従ってシャドウマスクとしてブラウン管に
組込まれた後スプリングバックによって電子銃側に変形
し、色ズレを生ずる傾向があった。
Conventionally, so-called invar material, that is, Fe-Ni with a low coefficient of thermal expansion, was used.
As mentioned above, shadow mask materials made from alloys lack formability during the press processing performed after etching, and therefore, after being incorporated into a cathode ray tube as a shadow mask, they deform toward the electron gun side due to springback, resulting in color distortion. There was a tendency for misalignment to occur.

その対策としてアンバー材のエツチング後プレス成形性
の向上を図ることが急務となった。
As a countermeasure to this problem, it became urgent to improve the press formability of the amber material after etching.

そこで、本発明者等は鋭意実験、研究の結果、平均結晶
粒径をdとするときd−1/2が0.5〜2゜5画一1
72で、かつ耐力σ。、2が18〜22kgf/圓2の
範囲を選ぶことによって色ズレの生じないシャドウマス
クが得られる事を見出し本発明を完成するに至った。
Therefore, as a result of intensive experiments and research, the present inventors found that when the average crystal grain size is d, d-1/2 is 0.5 to 2°5 and 1
72 and yield strength σ. .

本発明1,2に共通して、Ni成分を30〜45%とし
た理由は、Niが30%よりも少ないかまた45%より
も多いと、いづれの場合も熱膨張率が高くなり、前述の
本発明用途に適合しなくなるからである。
The reason why the Ni content is set to 30 to 45% in common to Inventions 1 and 2 is that if the Ni content is less than 30% or more than 45%, the coefficient of thermal expansion will increase in either case. This is because it is not suitable for the use of the present invention.

また本発明1においてd−1/2を0. 5〜2.5m
m”2とした理由は、結晶粒径dがこの範囲を満足する
事によって耐力σ0.2が望ましい範囲になるからであ
る。
In addition, in the present invention 1, d-1/2 is 0. 5-2.5m
The reason why it is set to m''2 is that when the crystal grain size d satisfies this range, the yield strength σ0.2 falls within a desirable range.

すなわちd−1/2が2. 5mm−”’よりも大きい
とdは小さくなって結晶粒は微細粒となり、耐力が大き
くなって望ましくないスプリングバックを生じるように
なり、またd−1/2が0. 5よりも小さいと結晶粒
が粗大化して肌荒れ(Or a n g e  pee
l)を生じ、プレス成形上好ましくないばかりか、エツ
チング孔が異形化し、高精細度ブラウン管に適さなくな
ってしまうからである。
That is, d-1/2 is 2. If d is larger than 5mm-''', d becomes small and the crystal grains become fine, the yield strength increases and undesirable springback occurs, and if d-1/2 is smaller than 0.5, the crystal grains become fine. The grains become coarse and the skin becomes rough.
1), which is not only undesirable in terms of press molding, but also causes the etched holes to become irregularly shaped, making them unsuitable for high-definition cathode ray tubes.

そして、耐力σ。2を18〜22kgf/肛2とした理
由は、上記結晶粒範囲を選ぶと耐力がほぼ必然的にこの
範囲に入るようになるからである。
And proof stress σ. The reason why 2 is set to 18 to 22 kgf/hole 2 is that if the above crystal grain range is selected, the yield strength will almost inevitably fall within this range.

マスク工程のハンドリング上約10 kg f /1r
trn2以上の耐力は必要であるが、これ以上でさえあ
れば耐力は低い程よいから、18 kg f /am2
以下でもよい訳であるけれども、前記結晶粒径の限定に
従い、下限は18kg f /mm’となり、またこれ
以上であっても上限の22kgf/mm2以下であれば
、実用上プレス成形時の問題は生じない。22)cgf
/閲2を越えると従来のアンバーと同様にプレス性に問
題を生ずるので、22 kg f ’/ am 2以下
とした。
Approximately 10 kg f/1r due to handling during mask process
A yield strength of trn2 or higher is required, but as long as it is higher than this, the lower the yield strength is, the better, so 18 kg f / am2
The lower limit is 18 kgf/mm' according to the crystal grain size limitation, and even if it is larger than this, if it is below the upper limit of 22 kgf/mm2, there will be no problems during press forming in practice. Does not occur. 22)cgf
If it exceeds 22 kg f'/am 2, problems with pressability will occur as with conventional amber, so it was set to 22 kg f'/am 2 or less.

本発明2は、本発明1を製造する方法の一つである。Present invention 2 is one of the methods for manufacturing present invention 1.

本発明者等は前述の問題点に鑑み、製造方法を模索した
が、その結果従来10〜20%程度であった最終冷延率
を65.6〜96%と極めて高くする事、並びにこれに
適当な熱処理を組み合わせることによって本発明1が容
易に安定して得られる事を見出し、本発明2を完成する
に至った。
In view of the above-mentioned problems, the present inventors searched for a manufacturing method, and as a result, they were able to increase the final cold rolling rate, which was conventionally about 10 to 20%, to an extremely high 65.6 to 96%. It was discovered that the present invention 1 can be easily and stably obtained by combining appropriate heat treatments, and the present invention 2 was completed.

従来、冷延率を高くすると顕微鏡組織が所謂繊維状組織
となり、そのままでエツチングすると異形穿孔となる場
合があったため、冷延率は精々20%どまりであったも
のを敢えて65.6%以上もの高い冷延率を与える事に
した処に本発明の特徴がある。但し、上記異形穿孔の防
止対策として連続焼鈍(短時間歪取り焼鈍)を施すよう
にしている。この連続焼鈍は高冷延率による加工硬化歪
を取り繊維状組織を解消するから、エツチング時の異形
穿孔を防止するのに極めて有効な手段であり、かつ一方
で通常のコイル焼鈍に比して均熱時間が短時間であるた
め再結晶後の粒成長が抑制されるという利益がある。従
ってエツチング穿孔後のマスク焼鈍において充分な粒成
長が初めて生じ、耐力の低下、すなわちプレス成形性の
向上が果される訳である。
Conventionally, when the cold rolling rate was increased, the microscopic structure became a so-called fibrous structure, and if etched as it was, irregularly shaped perforations could occur.Therefore, the cold rolling rate was 20% at most, but it was intentionally increased to 65.6% or more. The present invention is characterized in that it provides a high cold rolling rate. However, continuous annealing (short-time strain relief annealing) is performed as a measure to prevent the above-mentioned irregularly shaped holes. This continuous annealing removes the work hardening strain caused by high cold rolling reduction and eliminates the fibrous structure, so it is an extremely effective means to prevent irregular holes during etching, and on the other hand, it is more effective than normal coil annealing. Since the soaking time is short, there is an advantage that grain growth after recrystallization is suppressed. Therefore, sufficient grain growth occurs for the first time during mask annealing after etching and perforation, resulting in a reduction in yield strength, that is, an improvement in press formability.

ここに本発明2における冷延率の限定理由は次のとおり
である。すなわち65.6%よりも冷延率が低いと本発
明効果がなく、また96%を越えると最終的にマスク焼
鈍後結晶粒粗大化が生じて反ってプレス性が悪化するか
らである。なお好ましくは75〜95%の冷延率が採用
される。
The reason for limiting the cold rolling rate in the present invention 2 is as follows. That is, if the cold rolling rate is lower than 65.6%, the effect of the present invention will not be achieved, and if it exceeds 96%, grain coarsening will eventually occur after mask annealing, resulting in warpage and deterioration of pressability. Preferably, a cold rolling ratio of 75 to 95% is employed.

連続焼鈍の条件限定理由は次のとおりである。The reasons for limiting the conditions for continuous annealing are as follows.

均熱温度が650℃に満たないと再結晶温度に達しない
部分が多くなり、繊維状組織が充分に消失しないからで
あり、また900℃を越えると連続焼鈍炉の炉壁、ハー
スロール等の寿命が短かくなり、また省エネルギーの見
地からも不経済となるため、上限を900℃とした。
If the soaking temperature is less than 650℃, there will be many parts that do not reach the recrystallization temperature, and the fibrous structure will not disappear sufficiently, and if it exceeds 900℃, the furnace walls of the continuous annealing furnace, hearth rolls, etc. The upper limit was set at 900° C. since the life would be shortened and it would also be uneconomical from the standpoint of energy conservation.

なお特に800〜850℃の範囲が好適に採用される。In particular, a temperature range of 800 to 850°C is preferably employed.

この場合の雰囲気はHNX、NXガス等が用いられるが
、その他の各種吸熱型、乃至発熱型の変成ガスを用いる
ことが出来、それ以外にも水素またはヘリウム、ネオン
、アルゴン等の不活性ガス、真空等も適用可能である。
In this case, the atmosphere used is HNX, NX gas, etc., but various other endothermic or exothermic gases can also be used. Vacuum etc. can also be applied.

均熱時間は10sec、未満では再結晶不完全となり第
すく、また120sec、を越えるとライン速度を極め
て遅くするか、炉体を長大なものにしなければならず不
経済であるので、10〜120sec、  とじた。
If the soaking time is less than 10 seconds, the recrystallization will be incomplete, and if it exceeds 120 seconds, the line speed must be extremely slow or the furnace body must be made long, which is uneconomical. , closed.

なお、連続焼鈍後調質圧延をすることもある。Note that skin pass rolling may be performed after continuous annealing.

次にマスク焼鈍について述べる。Next, mask annealing will be described.

シャドウマスク用素材は帯板の状態でエツチング穿孔さ
れ、しかる後剪断もしくはブランキングによりフラット
マスクとされるのが普通である。
The shadow mask material is usually etched and perforated in the form of a strip, and then sheared or blanked to form a flat mask.

そしてマスク焼鈍はこのフラットマスクの状態で行なわ
れる熱処理であって、エツチング歪をとり、その後節さ
れるプレス成形性を確保するために行なわれる工程であ
る。
Mask annealing is a heat treatment carried out in the state of this flat mask, and is a process carried out to remove etching distortion and ensure subsequent press formability.

焼鈍雰囲気は前述の連続焼鈍の場合に準するが、現在は
主として10−’〜10−6To r r、程度の真空
とする場合が多い。これはエツチング後のマスク表面が
清浄であって酸化されやすいのでマスク焼鈍中に表面吸
着ガスを充分に脱ガスして酸化を防止するためである。
The annealing atmosphere is similar to the above-mentioned continuous annealing, but currently it is often set to a vacuum of about 10-' to 10-6 Torr. This is because the surface of the mask after etching is clean and easily oxidized, so the gas adsorbed on the surface is sufficiently degassed during mask annealing to prevent oxidation.

フラットマスクは積み重ねられた状態で炉中に入れられ
、バッチ焼鈍されるが、均熱温度は650〜1250℃
、就中1100〜1170℃が好適に用いられる。その
理由は650℃より低い温度では再結晶しない部分が生
じるからであり、一方1250℃を超えてもそれ以上粒
成長効果を期待できないばかりでなく省エネルギーの見
地から寧ろ望ましくないからである。
The flat masks are stacked in a furnace and batch annealed at a soaking temperature of 650-1250℃.
, especially preferably 1100 to 1170°C. The reason for this is that if the temperature is lower than 650°C, some parts will not be recrystallized, whereas if the temperature exceeds 1250°C, not only no further grain growth effect can be expected, but also undesirable from the standpoint of energy saving.

均熱時間は30m i n、に達しないと粒成長が不充
分となり、かつ% 100m i n、以上かけても最
早や粒成長は飽和してしまうし、不経済であるので、3
0〜LOOmin、とじた。
If the soaking time does not reach 30 min, the grain growth will be insufficient, and even if the soaking time exceeds 100 min, the grain growth will already be saturated, which is uneconomical.
0~LOOmin, closed.

ついで焼鈍まま、もしくは必要に応じてレベラー加工後
にプレス加工によってフラットマスクに球面状の張り出
しを与え、しかる後黒化処理してシャドウマスクとする
Then, the flat mask is given a spherical protrusion by pressing, either as annealed or after leveling if necessary, and then blackened to form a shadow mask.

すなわち本発明1,2におけるシャドウマスク用素材と
は、レベラー加工もしくはプレス加工前のフラットマス
クを云うのである。
That is, the shadow mask material in the first and second inventions refers to a flat mask before leveler processing or press processing.

次に本発明2について更に詳細に説明する。Next, the second invention will be explained in more detail.

本発明2は、本発明1と共に有効成分としてNiの他に
Crを含んでいる。
The second invention, together with the first invention, contains Cr in addition to Ni as an active ingredient.

第1図は冷延率RとCrとの関係を示すグラフである。FIG. 1 is a graph showing the relationship between cold rolling ratio R and Cr.

なおこのグラフは実験によって得られたものである。Note that this graph was obtained through experiment.

第1図において横軸はCr量を表わし、Cr量は0.1
〜2.5%が本発明の範囲である。Cr量が0.1%よ
り少ないと効果が認められず、2゜5%を超えると材料
の熱膨張率が上がり、本来の目的が達成できない。従っ
て0.1〜2.5%とした。
In Fig. 1, the horizontal axis represents the amount of Cr, and the amount of Cr is 0.1
~2.5% is the range of the present invention. If the amount of Cr is less than 0.1%, no effect will be recognized, and if it exceeds 2.5%, the coefficient of thermal expansion of the material will increase, making it impossible to achieve the original purpose. Therefore, it was set at 0.1 to 2.5%.

縦軸は冷延率Rを表わし、曲線R−12Cr2−55C
r+71よりも上でかつR≦96のハツチング領域に属
するCr量と冷延率Rの組み合せが本発明2の範囲であ
る。
The vertical axis represents the cold rolling rate R, and the curve R-12Cr2-55C
The range of the second invention is a combination of Cr content and cold rolling rate R that is above r+71 and belongs to the hatched region of R≦96.

Rがこの式の示す曲線の下側では高耐力領域となりプレ
ス成形性がよくない。
When R is below the curve shown by this formula, it becomes a high yield strength region and press formability is poor.

またRが96%を超すと加工歪みが累積する結果[実施
例] 第1表に示される如き成分組成(Cr:0.041〜2
.01%)のFe−Nf系合金帯板を供試材とし、第2
表に示したように10〜95%の最終冷延率で冷間圧延
したのち連続焼鈍およびエツチング穿孔後のマスク焼鈍
を施した。
In addition, when R exceeds 96%, processing distortion accumulates. [Example] Component composition as shown in Table 1 (Cr: 0.041-2
.. 01%) was used as the test material, and the second
As shown in the table, after cold rolling at a final cold rolling ratio of 10 to 95%, continuous annealing and mask annealing after etching and perforation were performed.

すなわち第1表は供試材の化学成分の表であり、第2表
は処理条件を示す表である。
That is, Table 1 is a table showing the chemical components of the test materials, and Table 2 is a table showing processing conditions.

第3表はこのようにして得られたマスク素材の特性を示
す表である。マスク焼鈍後の結晶粒径が大きいほど耐力
σ。、2は低くなり、また耐力σ。
Table 3 is a table showing the characteristics of the mask material thus obtained. The larger the grain size after mask annealing, the higher the yield strength σ. , 2 becomes lower, and the yield strength σ.

2が24kgf/mm2をこえると素材のスプリングバ
ックによりプレス成形性が劣るようになる。
2 exceeds 24 kgf/mm2, press formability becomes poor due to springback of the material.

本発明のように、0.1%以上のCr範囲においては、 式 R≧12Cr’−55Cr+71に従って、18〜
22kgf/圓2の耐力σ。2が得られ、Cr量の多い
素材では比較的低い冷延率でプレス成形性の優れた低熱
膨脹型シャドウマスク要素材が得られる。
As in the present invention, in the Cr range of 0.1% or more, according to the formula R≧12Cr'-55Cr+71, 18 to
Proof strength σ of 22kgf/en2. 2 is obtained, and a low thermal expansion type shadow mask element material with excellent press formability can be obtained with a relatively low cold rolling rate when the material has a large amount of Cr.

第3表に記載の本発明実施例はすべて比較例よりも優れ
たプレス成形性を示した。
All of the examples of the present invention listed in Table 3 exhibited superior press formability than the comparative examples.

[発明の効果] 本発明を実施することにより、前記目的のすべてが達成
される。
[Effects of the Invention] By implementing the present invention, all of the above objects are achieved.

すなわちプレス成形性の優れた低熱膨脹型シャドウマス
ク用素材がもたらされる。また本発明ではCrを適量添
加するので、あまり冷延率を上げなくてもプレス成形性
が確保出来るという効果がある。
In other words, a low thermal expansion shadow mask material with excellent press moldability is provided. Further, in the present invention, since an appropriate amount of Cr is added, there is an effect that press formability can be ensured without increasing the cold rolling rate too much.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明2におけるCr量と冷延率Rの関係を示
すグラフである。
FIG. 1 is a graph showing the relationship between the Cr content and the cold rolling rate R in the second invention.

Claims (2)

【特許請求の範囲】[Claims] (1)Ni:30〜45%(重量%、以下同じ)、Cr
:0.1〜2.5%を含み、残部Fe及び不可避的不純
物でなるFe−Ni系合金薄板であって、平均結晶粒径
をdとするときd^−^1^/^2が0.5〜2.5m
m^−^1^/^2であり、耐力σ_0_._2が18
〜22kgf/mm^2である事を特徴とする低熱膨脹
型シャドウマスク用素材。
(1) Ni: 30-45% (weight%, same below), Cr
: Fe-Ni alloy thin plate containing 0.1 to 2.5%, the balance being Fe and unavoidable impurities, where d^-^1^/^2 is 0 when the average grain size is d. .5~2.5m
m^-^1^/^2, and proof stress σ_0_. _2 is 18
A low thermal expansion shadow mask material characterized by ~22 kgf/mm^2.
(2)Ni:30〜45%、Cr:0.1〜2.5%を
含み、残部Fe及び不可避的不純物でなるFe−Ni系
合金帯板を、 式12Cr^2−55Cr+71≦R≦96を満足する
冷延率(R%)で冷間圧延し、ついで(650〜900
℃)×(10〜120sec.)の連続焼鈍を施し、エ
ッチング穿孔後さらに(650〜1250℃)×(30
〜100min.)のマスク焼鈍を施すことを特徴とす
る低熱膨張型シャドウマスク用素材の製造法。
(2) Fe-Ni alloy strip containing Ni: 30 to 45%, Cr: 0.1 to 2.5%, and the balance being Fe and inevitable impurities, with the formula 12Cr^2-55Cr+71≦R≦96 cold rolling at a cold rolling rate (R%) that satisfies (650-900
℃) × (10 to 120 sec.), and after etching and perforation, further annealing (650 to 1250 °C) × (30
~100min. ) A method for producing a material for a low thermal expansion shadow mask, characterized by subjecting it to mask annealing.
JP2105789A 1990-04-21 1990-04-21 Material for low thermal expansion type shadow mask and its manufacturing method Expired - Lifetime JPH0610323B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2105789A JPH0610323B2 (en) 1990-04-21 1990-04-21 Material for low thermal expansion type shadow mask and its manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2105789A JPH0610323B2 (en) 1990-04-21 1990-04-21 Material for low thermal expansion type shadow mask and its manufacturing method

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2624386A Division JPS62185860A (en) 1986-02-07 1986-02-07 Material for low thermal expansion type shadow mask and its manufacture

Publications (2)

Publication Number Publication Date
JPH02305941A true JPH02305941A (en) 1990-12-19
JPH0610323B2 JPH0610323B2 (en) 1994-02-09

Family

ID=14416904

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2105789A Expired - Lifetime JPH0610323B2 (en) 1990-04-21 1990-04-21 Material for low thermal expansion type shadow mask and its manufacturing method

Country Status (1)

Country Link
JP (1) JPH0610323B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0627494A1 (en) * 1993-05-31 1994-12-07 Nkk Corporation Alloy sheet for shadow mask and method for manufacturing thereof
EP0641866A1 (en) * 1993-08-27 1995-03-08 Nkk Corporation Alloy sheet for shadow mask and method for manufacturing thereof

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61113747A (en) * 1984-11-07 1986-05-31 Nippon Mining Co Ltd Material for shadow mask
JPS61149460A (en) * 1984-12-25 1986-07-08 Nippon Mining Co Ltd Shadow mask material

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61113747A (en) * 1984-11-07 1986-05-31 Nippon Mining Co Ltd Material for shadow mask
JPS61149460A (en) * 1984-12-25 1986-07-08 Nippon Mining Co Ltd Shadow mask material

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0627494A1 (en) * 1993-05-31 1994-12-07 Nkk Corporation Alloy sheet for shadow mask and method for manufacturing thereof
EP0739992A1 (en) * 1993-05-31 1996-10-30 Nkk Corporation Alloy sheet for shadow mask and method for manufacturing thereof
EP0641866A1 (en) * 1993-08-27 1995-03-08 Nkk Corporation Alloy sheet for shadow mask and method for manufacturing thereof

Also Published As

Publication number Publication date
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