JPS62180592A - Semiconductor memory device - Google Patents
Semiconductor memory deviceInfo
- Publication number
- JPS62180592A JPS62180592A JP61024307A JP2430786A JPS62180592A JP S62180592 A JPS62180592 A JP S62180592A JP 61024307 A JP61024307 A JP 61024307A JP 2430786 A JP2430786 A JP 2430786A JP S62180592 A JPS62180592 A JP S62180592A
- Authority
- JP
- Japan
- Prior art keywords
- input circuit
- circuit
- address
- memory device
- semiconductor memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 12
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000002779 inactivation Effects 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、消費電力の低減が司能なリフレッシュ機能
を備えた半導体記憶装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor memory device equipped with a refresh function capable of reducing power consumption.
[t;F来の技術]
ダイナミックRAMには、CASビフォア、几X1リフ
レッシェ、セルフリフレッシュ等のりフレッシ:L模能
を有したものがある。なお、CASはコラムアドレスト
ロープ、R,Asはロウアドレスストローブを示すもの
である。以下、従来のダイナミックRAMの動作を説明
する。[Advanced Technology] Some dynamic RAMs have a freshness: L function such as CAS before, 几X1 refresh, and self-refresh. Note that CAS represents a column address strobe, and R and As represent a row address strobe. The operation of the conventional dynamic RAM will be explained below.
第2図は従来のダイナミックRAMの機能の概要を示す
図である。この図において、1はメモリセルアレイ、2
はロウデコーダ、3はアドレスバッファ、4はRAS償
号、CAS信号が加わるアドレスカウンタ、几gF、R
EFはリフレッシュ、非すフレッシ二の信号、AOI
At・・・・・・はアドレス信号(以下、一般的に用い
るときはA+を用いる)である。またQ。、Ql、・・
・・・・は前記アドレスカウンタ4の出力信号を示す。FIG. 2 is a diagram showing an overview of the functions of a conventional dynamic RAM. In this figure, 1 is a memory cell array, 2 is a memory cell array, and 2 is a memory cell array.
is a row decoder, 3 is an address buffer, 4 is an address counter to which RAS decoding and CAS signals are added, 几gF,R
EF is refresh, non-fresh signal, AOI
At... is an address signal (hereinafter, A+ will be used in general use). Q again. ,Ql,...
. . . indicates the output signal of the address counter 4.
また第3図(a)、 (b)は第2図に示したダイナ
ミックI’LAMのノーマルモードと、CASビフォア
、RASリフレッシェモード(以下単にリフレッシュモ
ードという)における要部の各信号波形を示すものであ
る。Furthermore, FIGS. 3(a) and 3(b) show the signal waveforms of the main parts in the normal mode, CAS before, and RAS refresh mode (hereinafter simply referred to as refresh mode) of the dynamic I'LAM shown in FIG. It is something.
次に第2図の回路の動作について第3図を参照して説明
する。Next, the operation of the circuit shown in FIG. 2 will be explained with reference to FIG.
ノーマルモード時には、REF信号が第3図(alのよ
うに′L”のため、これが印加されるFETはオフとな
る。一方、)LgF信号は同じ(用”のため、これが印
加されるFBTはオンとなり、したがって、アドレス信
号A。+ AI + 川・・・はアドレスバッファ3に
印加され、ロウデフーダ2およびコラムデコーダ(図示
せず)が動作し、メモリセルアレイ1の対応するビット
のメモリセルに対してデータの書き込み、および読み出
しが行われる。In normal mode, the REF signal is 'L' as shown in Figure 3 (al), so the FET to which it is applied is turned off.On the other hand, the LgF signal is the same ('L', as in Figure 3), so the FBT to which it is applied is Therefore, the address signal A.+ AI Data is written and read using the
次に、リフレッシュモード時には、要部の波形は第3図
(b)のようIc、RAS信号の立ち下り時点において
、几EF信号は立ち下り、REF信号は立ち上る。Next, in the refresh mode, the waveform of the main part is as shown in FIG. 3(b), at the time when the Ic and RAS signals fall, the EF signal falls and the REF signal rises.
そこで、アドレスカウンタ4の出力がロウアドレスとな
り、各ロウごとにリフレッシュが行われ、これが−巡す
ると丁ぺてのメモリセルに対し、リフレッシュ動作が行
われたことKなる。Therefore, the output of the address counter 4 becomes a row address, refresh is performed for each row, and when this cycle goes through, it is determined that the refresh operation has been performed on every memory cell.
ノーマルモード時およびリフレッシュモード時において
、ロウアドレスを外部アドレス入力または7ドレスカウ
ンタ4の出力のいずれKするかは、例えば内部信号比E
F、几EFを入力とする第4図に示すようなアドレス信
号入力回路によって決定される。In normal mode and refresh mode, whether to input the row address to the external address input or the output of the 7-address counter 4 depends, for example, on the internal signal ratio E.
It is determined by an address signal input circuit as shown in FIG. 4 which receives inputs F and EF.
第4図において、QNI〜QN4はNチャネルMO8F
IT%Qpl 、 Q□はPチャネルMO8FET。In Fig. 4, QNI to QN4 are N-channel MO8F
IT%Qpl, Q□ is a P-channel MO8FET.
EXI 、AHは外部アドレス入力を示す。EXI and AH indicate external address input.
しかし、第4図に示すアドレス信号入力回路は、リフレ
ッシュモード時にも、外部アドレス人力Ext。However, the address signal input circuit shown in FIG. 4 uses external address input Ext even in the refresh mode.
A1に従って動作する。It operates according to A1.
上記のような従来の半導体記憶装置では、リフレッシュ
モード時に、アドレス信号入力回路(つまり各MO8F
ETQ□* Qpt + Qvts * Qwtの部分
)およびこのアドレス信号入力回路に追随して動作する
回路部分等が不必要に動作するため、半導体記憶装置の
消費電力の低減が図れないという問題点があった。In the conventional semiconductor memory device as described above, in the refresh mode, the address signal input circuit (that is, each MO8F
ETQ□ * Qpt + Qvts * Qwt part) and the circuit parts that operate following this address signal input circuit operate unnecessarily, so there is a problem that it is not possible to reduce the power consumption of the semiconductor memory device. Ta.
この発明は、かかる問題点を解決するためになされたも
ので、消費電力の低減が可能な半導体記憶装置を得るこ
とを目的とする。The present invention was made to solve such problems, and an object of the present invention is to obtain a semiconductor memory device that can reduce power consumption.
この発明に係る半導体記憶装置は、リフレッシュモード
時に不要となる信号が入力される入力回路を、リフレッ
シュモード時に内部信号により不作動の固定論理レベル
になるよ51C構成したものである。The semiconductor memory device according to the present invention has a 51C configuration in which an input circuit to which signals that are unnecessary in the refresh mode are input is set to a fixed logic level of inactivation by an internal signal in the refresh mode.
この発明においては、す7レツシ工モード時に。 In this invention, in the 7 retrieval mode.
不要となる信号が入力される入力回路およびこの入力回
路に追随する回路部分が動作しない。The input circuit to which unnecessary signals are input and the circuit portion following this input circuit do not operate.
第1図はこの発明の半導体記憶装置の7ドレス信号入力
回路の一実施例を示す図である。この図1111−て、
第4図と同一符号は同一部分を示し、5はインバータ、
6はナントゲートである。FIG. 1 is a diagram showing an embodiment of a 7-dress signal input circuit of a semiconductor memory device of the present invention. This figure 1111-
The same symbols as in FIG. 4 indicate the same parts, 5 is an inverter,
6 is Nantes Gate.
第1図に示したアドレス信号入力回路は、第4図に示し
たアドレス信号入力回路とNチャネルMOS F E
T Q+nおよびPチwネルMO8FETQp*のゲー
ト入力信号が異なってい為。すなわち、リフレッシュモ
ード時(几BF=”L”)にも、循=@L″に固定する
ことができ、このアドレス信号入力回路およびこのアド
レス信号入力回路に追随する回路部分が動作しない。The address signal input circuit shown in FIG. 1 is composed of the address signal input circuit shown in FIG. 4 and an N-channel MOS F E
This is because the gate input signals of TQ+n and P channel MO8FETQp* are different. That is, even in the refresh mode (⇠BF="L"), the cycle can be fixed at @L", and this address signal input circuit and the circuit portion following this address signal input circuit do not operate.
なお、上記実施例では、アドレス信号入力回路について
説明したが、他の不要信号1例えばデータ入力、リード
/ライトコントロール入力信号等が入力される回路につ
いても同様である。In the above embodiment, the address signal input circuit has been described, but the same applies to circuits to which other unnecessary signals 1 such as data input, read/write control input signals, etc. are input.
この発明は以上説明したとおり、リフレッシュモード時
に不要となる信号が入力される入力回路を、リフレッシ
ュモード時に内部信号により不作動の固定論理レベルに
なるように構成したので、不要となる信号が入力される
入力回路およびこの入力回路に追随する回路部分が動作
せず、半導体記憶装置の消費電力を低減することかでき
るという効果がある。As explained above, the present invention is configured such that the input circuit to which unnecessary signals are input in the refresh mode is set to a fixed logic level that is inactive by an internal signal in the refresh mode, so that unnecessary signals are input to the input circuit. This has the effect that the input circuit and the circuit portion following the input circuit do not operate, thereby reducing the power consumption of the semiconductor memory device.
第1図はこの発明の半導体記憶装置のアドレス信号入力
回路の一実施例を示す回路図、第2図は従来のダイナミ
ツクルAMの構成を示す概要図。
第3図(a) 、 (b)は従来のダイナミックRA
Mにおける要部の各信号を示す図、第4図は従来の7ド
レス信号入力回路を示す図である。
図において、1はメモリセル7レイ、2はロウデコーダ
、3はアドレスバッファ、4は7ドレスカウンタ、5は
インバータ、6はナントゲート、QNI〜Q)14はN
チャネルMO8PET%QPI e Qp2はPチャネ
ルMO8PETである。
なお、各図中の同一符号は同一または相当部分を示す。
代理人 大岩増雄 (外2名)
第1図
(JIPI 、(Apt P子セネルMO5FET第2
図
ム
第3図
(a)(ノーマルモード)FIG. 1 is a circuit diagram showing an embodiment of an address signal input circuit of a semiconductor memory device according to the present invention, and FIG. 2 is a schematic diagram showing the configuration of a conventional dynamicle AM. Figure 3 (a) and (b) are conventional dynamic RA
FIG. 4 is a diagram illustrating a conventional 7-dress signal input circuit. In the figure, 1 is a 7-ray memory cell, 2 is a row decoder, 3 is an address buffer, 4 is a 7-address counter, 5 is an inverter, 6 is a Nant gate, QNI to Q) 14 is N
Channel MO8PET%QPI e Qp2 is P-channel MO8PET. Note that the same reference numerals in each figure indicate the same or corresponding parts. Agent Masuo Oiwa (2 others) Figure 1 (JIPI, (Apt P sensor MO5FET No. 2)
Figure 3 (a) (Normal mode)
Claims (1)
ックRAMにおいて、リフレッシュモード時に不要とな
る信号が入力される入力回路を、前記リフレッシュモー
ド時に内部信号により不作動の固定論理レベルになるよ
うに構成したことを特徴とする半導体記憶装置。A dynamic RAM having a refresh function using an external control signal, characterized in that an input circuit to which unnecessary signals are input in the refresh mode is configured to have a fixed logic level inactive by an internal signal in the refresh mode. A semiconductor storage device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61024307A JP2629172B2 (en) | 1986-02-04 | 1986-02-04 | Semiconductor storage device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61024307A JP2629172B2 (en) | 1986-02-04 | 1986-02-04 | Semiconductor storage device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62180592A true JPS62180592A (en) | 1987-08-07 |
JP2629172B2 JP2629172B2 (en) | 1997-07-09 |
Family
ID=12134518
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61024307A Expired - Lifetime JP2629172B2 (en) | 1986-02-04 | 1986-02-04 | Semiconductor storage device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2629172B2 (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5942396A (en) * | 1982-09-02 | 1984-03-08 | Ishihara Sangyo Kaisha Ltd | Phosphoric acid amide derivative and insecticidal, miticidal and nematocidal agent containing the same |
JPS6055593A (en) * | 1983-09-06 | 1985-03-30 | Nec Corp | Pseudo static memory |
-
1986
- 1986-02-04 JP JP61024307A patent/JP2629172B2/en not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5942396A (en) * | 1982-09-02 | 1984-03-08 | Ishihara Sangyo Kaisha Ltd | Phosphoric acid amide derivative and insecticidal, miticidal and nematocidal agent containing the same |
JPS6055593A (en) * | 1983-09-06 | 1985-03-30 | Nec Corp | Pseudo static memory |
Also Published As
Publication number | Publication date |
---|---|
JP2629172B2 (en) | 1997-07-09 |
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