JPS62176766U - - Google Patents

Info

Publication number
JPS62176766U
JPS62176766U JP6432286U JP6432286U JPS62176766U JP S62176766 U JPS62176766 U JP S62176766U JP 6432286 U JP6432286 U JP 6432286U JP 6432286 U JP6432286 U JP 6432286U JP S62176766 U JPS62176766 U JP S62176766U
Authority
JP
Japan
Prior art keywords
contact
test points
holes
large number
insulating plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6432286U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6432286U priority Critical patent/JPS62176766U/ja
Publication of JPS62176766U publication Critical patent/JPS62176766U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP6432286U 1986-04-30 1986-04-30 Pending JPS62176766U (pt)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6432286U JPS62176766U (pt) 1986-04-30 1986-04-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6432286U JPS62176766U (pt) 1986-04-30 1986-04-30

Publications (1)

Publication Number Publication Date
JPS62176766U true JPS62176766U (pt) 1987-11-10

Family

ID=30900376

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6432286U Pending JPS62176766U (pt) 1986-04-30 1986-04-30

Country Status (1)

Country Link
JP (1) JPS62176766U (pt)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007116963A1 (ja) * 2006-04-07 2007-10-18 Nidec-Read Corporation 基板検査用接触子及びその製造方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007116963A1 (ja) * 2006-04-07 2007-10-18 Nidec-Read Corporation 基板検査用接触子及びその製造方法

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