JPS6450466U - - Google Patents
Info
- Publication number
- JPS6450466U JPS6450466U JP14519187U JP14519187U JPS6450466U JP S6450466 U JPS6450466 U JP S6450466U JP 14519187 U JP14519187 U JP 14519187U JP 14519187 U JP14519187 U JP 14519187U JP S6450466 U JPS6450466 U JP S6450466U
- Authority
- JP
- Japan
- Prior art keywords
- grid
- land
- pitch
- land row
- row
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14519187U JPS6450466U (pt) | 1987-09-22 | 1987-09-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14519187U JPS6450466U (pt) | 1987-09-22 | 1987-09-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6450466U true JPS6450466U (pt) | 1989-03-29 |
Family
ID=31413566
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14519187U Pending JPS6450466U (pt) | 1987-09-22 | 1987-09-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6450466U (pt) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000156253A (ja) * | 1998-09-16 | 2000-06-06 | Jsr Corp | 積層型コネクター装置および回路基板の検査装置 |
-
1987
- 1987-09-22 JP JP14519187U patent/JPS6450466U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000156253A (ja) * | 1998-09-16 | 2000-06-06 | Jsr Corp | 積層型コネクター装置および回路基板の検査装置 |
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