JPS62174211U - - Google Patents

Info

Publication number
JPS62174211U
JPS62174211U JP6276286U JP6276286U JPS62174211U JP S62174211 U JPS62174211 U JP S62174211U JP 6276286 U JP6276286 U JP 6276286U JP 6276286 U JP6276286 U JP 6276286U JP S62174211 U JPS62174211 U JP S62174211U
Authority
JP
Japan
Prior art keywords
wavelength
light source
intensity
measured
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6276286U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6276286U priority Critical patent/JPS62174211U/ja
Publication of JPS62174211U publication Critical patent/JPS62174211U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
JP6276286U 1986-04-25 1986-04-25 Pending JPS62174211U (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6276286U JPS62174211U (de) 1986-04-25 1986-04-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6276286U JPS62174211U (de) 1986-04-25 1986-04-25

Publications (1)

Publication Number Publication Date
JPS62174211U true JPS62174211U (de) 1987-11-05

Family

ID=30897348

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6276286U Pending JPS62174211U (de) 1986-04-25 1986-04-25

Country Status (1)

Country Link
JP (1) JPS62174211U (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05231828A (ja) * 1992-02-21 1993-09-07 Hitachi Electron Eng Co Ltd 磁気ヘッドの浮上量測定方法
JPH0765331A (ja) * 1993-08-19 1995-03-10 Internatl Business Mach Corp <Ibm> 磁気ヘッドの浮上量測定方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59178304A (ja) * 1983-03-30 1984-10-09 Hitachi Ltd 微小間隙測定方法及び装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59178304A (ja) * 1983-03-30 1984-10-09 Hitachi Ltd 微小間隙測定方法及び装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05231828A (ja) * 1992-02-21 1993-09-07 Hitachi Electron Eng Co Ltd 磁気ヘッドの浮上量測定方法
JPH0765331A (ja) * 1993-08-19 1995-03-10 Internatl Business Mach Corp <Ibm> 磁気ヘッドの浮上量測定方法

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