JPS62165573U - - Google Patents

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Publication number
JPS62165573U
JPS62165573U JP5361086U JP5361086U JPS62165573U JP S62165573 U JPS62165573 U JP S62165573U JP 5361086 U JP5361086 U JP 5361086U JP 5361086 U JP5361086 U JP 5361086U JP S62165573 U JPS62165573 U JP S62165573U
Authority
JP
Japan
Prior art keywords
electrode
under test
leads
brought
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5361086U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5361086U priority Critical patent/JPS62165573U/ja
Priority to US07/033,495 priority patent/US4806857A/en
Priority to EP87303105A priority patent/EP0243045B1/en
Priority to DE8787303105T priority patent/DE3771555D1/en
Publication of JPS62165573U publication Critical patent/JPS62165573U/ja
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案の静電耐圧試験装置のブロツク
図で第２図は従来の静電耐圧試験装置のブロツク
図。 １…ＨＶ電源、２…電極、３…被試験ＩＣ、４
…放電バー、５，６…除電バー、７…リレー、８
…抵抗、９，１０…抵抗。 FIG. 1 is a block diagram of an electrostatic withstand voltage tester according to the present invention, and FIG. 2 is a block diagram of a conventional electrostatic withstand voltage tester. 1...HV power supply, 2...electrode, 3...IC under test, 4
...discharge bar, 5, 6...static elimination bar, 7...relay, 8
...Resistance, 9,10...Resistance.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被試験ＩＣが設置される電極と、該電極に直流
電圧を印加する電源と、前記被試験ＩＣのリード
に接触させ放電を行なう放電バーと、前記被試験
ＩＣのリードに接触させ除電を行なう除電バーと
を有する静電耐圧試験装置において、前記電極と
接地電位との間に抵抗及び前記電圧源の非出力時
に導通状態となるリレーを設けたことを特徴とす
る静電耐圧試験装置。 An electrode on which an IC under test is installed, a power supply that applies a DC voltage to the electrode, a discharge bar that is brought into contact with the leads of the IC under test to discharge electricity, and a static electricity remover that is brought into contact with the leads of the IC under test to eliminate static electricity. 1. An electrostatic withstand voltage testing apparatus having an electrostatic withstand voltage tester having a bar, characterized in that a resistor is provided between the electrode and a ground potential, and a relay that becomes conductive when the voltage source is not outputting.
JP5361086U 1986-04-11 1986-04-11 Pending JPS62165573U (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP5361086U JPS62165573U (en) 1986-04-11 1986-04-11
US07/033,495 US4806857A (en) 1986-04-11 1987-04-02 Apparatus for testing semiconductor devices
EP87303105A EP0243045B1 (en) 1986-04-11 1987-04-09 Apparatus for testing semiconductor devices
DE8787303105T DE3771555D1 (en) 1986-04-11 1987-04-09 APPARATUS FOR TESTING SEMICONDUCTOR ELEMENTS.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5361086U JPS62165573U (en) 1986-04-11 1986-04-11

Publications (1)

Publication Number Publication Date
JPS62165573U true JPS62165573U (en) 1987-10-21

Family

ID=30879836

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5361086U Pending JPS62165573U (en) 1986-04-11 1986-04-11

Country Status (1)

Country Link
JP (1) JPS62165573U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0262978A (en) * 1988-04-06 1990-03-02 Oki Electric Ind Co Ltd Static elimination method for electrostatic dielectric strength evaluating device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0262978A (en) * 1988-04-06 1990-03-02 Oki Electric Ind Co Ltd Static elimination method for electrostatic dielectric strength evaluating device

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