JPH0352686U - - Google Patents
Info
- Publication number
- JPH0352686U JPH0352686U JP11438789U JP11438789U JPH0352686U JP H0352686 U JPH0352686 U JP H0352686U JP 11438789 U JP11438789 U JP 11438789U JP 11438789 U JP11438789 U JP 11438789U JP H0352686 U JPH0352686 U JP H0352686U
- Authority
- JP
- Japan
- Prior art keywords
- relay
- turned
- driver
- analog switch
- control signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 2
Description
第１図はこの考案によるバーインテストシステ
ムの構成図、第２図は従来のバーインテストシス
テムの構成図である。
１……ドライバ、２……アナログスイツチ、３
……ドライバ、４……リレー、５…リレー、６…
…終端抵抗、７……バーインボード、７Ａ〜７Ｃ
……デバイス、１１……高電圧信号、１２……テ
スト信号、１３……アナログスイツチ制御信号、
１４……リレー４の制御信号、１５……リレー５
の制御信号。
FIG. 1 is a block diagram of a burn-in test system according to this invention, and FIG. 2 is a block diagram of a conventional burn-in test system. 1... Driver, 2... Analog switch, 3
...Driver, 4...Relay, 5...Relay, 6...
...Terminal resistor, 7... Bar-in board, 7A to 7C
... Device, 11 ... High voltage signal, 12 ... Test signal, 13 ... Analog switch control signal,
14...Control signal for relay 4, 15...Relay 5
control signal.
Claims (1)
と、 アナログスイツチ制御信号１３でオンオフし、
第１のドライバ１の出力を複数の測定デバイスに
供給するアナログスイツチ２と、 テスト信号１２が加えられる第２のドライバ３
と、 リレー制御信号１４で接点をオンオフし、第２
のドライバ３の出力を前記測定デバイスに供給す
る第１のリレー４と、 リレー制御信号１５で接点をオンオフし、終端
抵抗６を接地に対して接断する第２のリレー５と
を備え、 高電圧信号１１を前記測定デバイスに供給する
ときは、アナログスイツチ２をオンに、第１のリ
レー４をオフに、第２のリレー５をオフにし、 テスト信号１２を前記測定デバイスに供給する
ときは、アナログスイツチ２をオフに、第１のリ
レー４をオンに、第２のリレー５をオンにするこ
とを特徴とするバーインテストシステム。[Claims for Utility Model Registration] First driver 1 to which high voltage signal 11 is applied
and turn it on and off with the analog switch control signal 13,
an analog switch 2 that supplies the output of the first driver 1 to a plurality of measurement devices; and a second driver 3 to which a test signal 12 is applied.
Then, the relay control signal 14 turns the contact on and off, and the second
A first relay 4 that supplies the output of the driver 3 to the measurement device, and a second relay 5 that turns on and off the contacts using a relay control signal 15 and connects and disconnects the terminating resistor 6 to the ground. When supplying the voltage signal 11 to the measuring device, the analog switch 2 is turned on, the first relay 4 is turned off, and the second relay 5 is turned off, and when the test signal 12 is supplied to the measuring device: , a burn-in test system characterized in that an analog switch 2 is turned off, a first relay 4 is turned on, and a second relay 5 is turned on.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11438789U JPH0352686U (en) | 1989-09-29 | 1989-09-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11438789U JPH0352686U (en) | 1989-09-29 | 1989-09-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0352686U true JPH0352686U (en) | 1991-05-22 |
Family
ID=31662758
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11438789U Pending JPH0352686U (en) | 1989-09-29 | 1989-09-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0352686U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007018020A1 (en) * | 2005-08-09 | 2007-02-15 | Advantest Corporation | Semiconductor testing apparatus |
| JPWO2010001440A1 (en) * | 2008-07-03 | 2011-12-15 | 株式会社アドバンテスト | Test equipment and socket board |
-
1989
- 1989-09-29 JP JP11438789U patent/JPH0352686U/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007018020A1 (en) * | 2005-08-09 | 2007-02-15 | Advantest Corporation | Semiconductor testing apparatus |
| JP5038137B2 (en) * | 2005-08-09 | 2012-10-03 | 株式会社アドバンテスト | Semiconductor test equipment |
| JPWO2010001440A1 (en) * | 2008-07-03 | 2011-12-15 | 株式会社アドバンテスト | Test equipment and socket board |