JPS6216481U - - Google Patents
Info
- Publication number
- JPS6216481U JPS6216481U JP10837585U JP10837585U JPS6216481U JP S6216481 U JPS6216481 U JP S6216481U JP 10837585 U JP10837585 U JP 10837585U JP 10837585 U JP10837585 U JP 10837585U JP S6216481 U JPS6216481 U JP S6216481U
- Authority
- JP
- Japan
- Prior art keywords
- cap
- lead terminals
- covers
- lead
- individual
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 2
Description
第1図は本考案のICテストクリツプの斜視図
、第2図は本考案のICテストクリツプの使用状
態を示す図、第3図は従来のICテストクリツプ
の使用状態を示す図である。
1……リード端子、2……ケーブル、3……プ
リント配線板、4……IC、5……IC、5……
テストクリツプ。
FIG. 1 is a perspective view of an IC test clip according to the present invention, FIG. 2 is a diagram showing how the IC test clip according to the present invention is used, and FIG. 3 is a diagram showing how a conventional IC test clip is used. 1... Lead terminal, 2... Cable, 3... Printed wiring board, 4... IC, 5... IC, 5...
test clip.
Claims (1)
Cのリードフレームに板バネの力で個々に接触す
るリード端子がついており、そのリード端子の下
側はICを覆うキヤツプの内側下に固定され、リ
ード端子の上側はICを覆う形のキヤツプの上面
を通してキヤツプの上部に出ていて、キヤツプの
上部に出た個々のリード端子とフラツトケーブル
の個々の線が接続されていることを特徴とするI
Cテストクリツプ。 There is a cap that covers the IC, and the I
The lead frame of C has lead terminals that come in contact with each other using the force of leaf springs.The lower side of the lead terminals is fixed to the bottom inside of the cap that covers the IC, and the upper side of the lead terminals is attached to the inside of the cap that covers the IC. I, which is characterized in that the lead terminals extend to the top of the cap through the top surface, and the individual wires of the flat cable are connected to the individual lead terminals that project to the top of the cap.
C test clip.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10837585U JPS6216481U (en) | 1985-07-15 | 1985-07-15 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10837585U JPS6216481U (en) | 1985-07-15 | 1985-07-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6216481U true JPS6216481U (en) | 1987-01-31 |
Family
ID=30985513
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10837585U Pending JPS6216481U (en) | 1985-07-15 | 1985-07-15 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6216481U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH026764A (en) * | 1987-08-31 | 1990-01-10 | Everett Charles Contact Prod Inc | Apparatus and method for testing integrated circuit |
-
1985
- 1985-07-15 JP JP10837585U patent/JPS6216481U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH026764A (en) * | 1987-08-31 | 1990-01-10 | Everett Charles Contact Prod Inc | Apparatus and method for testing integrated circuit |
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