JPS6215762U - - Google Patents

Info

Publication number
JPS6215762U
JPS6215762U JP10658085U JP10658085U JPS6215762U JP S6215762 U JPS6215762 U JP S6215762U JP 10658085 U JP10658085 U JP 10658085U JP 10658085 U JP10658085 U JP 10658085U JP S6215762 U JPS6215762 U JP S6215762U
Authority
JP
Japan
Prior art keywords
holder
electron microscope
internal
slit
scales
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10658085U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10658085U priority Critical patent/JPS6215762U/ja
Publication of JPS6215762U publication Critical patent/JPS6215762U/ja
Pending legal-status Critical Current

Links

JP10658085U 1985-07-12 1985-07-12 Pending JPS6215762U (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10658085U JPS6215762U (zh) 1985-07-12 1985-07-12

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10658085U JPS6215762U (zh) 1985-07-12 1985-07-12

Publications (1)

Publication Number Publication Date
JPS6215762U true JPS6215762U (zh) 1987-01-30

Family

ID=30982073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10658085U Pending JPS6215762U (zh) 1985-07-12 1985-07-12

Country Status (1)

Country Link
JP (1) JPS6215762U (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01129106A (ja) * 1987-11-14 1989-05-22 Jeol Ltd 走査トンネル顕微鏡を備えた透過型電子顕微鏡
JP2007018944A (ja) * 2005-07-11 2007-01-25 Hitachi High-Technologies Corp 荷電粒子装置用試料台
JP2014146493A (ja) * 2013-01-29 2014-08-14 Sumitomo Metal Mining Co Ltd 電子顕微鏡観察用試料台、並びに試料の断面観察方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01129106A (ja) * 1987-11-14 1989-05-22 Jeol Ltd 走査トンネル顕微鏡を備えた透過型電子顕微鏡
JP2007018944A (ja) * 2005-07-11 2007-01-25 Hitachi High-Technologies Corp 荷電粒子装置用試料台
JP2014146493A (ja) * 2013-01-29 2014-08-14 Sumitomo Metal Mining Co Ltd 電子顕微鏡観察用試料台、並びに試料の断面観察方法

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