JPS6215762U - - Google Patents
Info
- Publication number
- JPS6215762U JPS6215762U JP10658085U JP10658085U JPS6215762U JP S6215762 U JPS6215762 U JP S6215762U JP 10658085 U JP10658085 U JP 10658085U JP 10658085 U JP10658085 U JP 10658085U JP S6215762 U JPS6215762 U JP S6215762U
- Authority
- JP
- Japan
- Prior art keywords
- holder
- electron microscope
- internal
- slit
- scales
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10658085U JPS6215762U (zh) | 1985-07-12 | 1985-07-12 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10658085U JPS6215762U (zh) | 1985-07-12 | 1985-07-12 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6215762U true JPS6215762U (zh) | 1987-01-30 |
Family
ID=30982073
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10658085U Pending JPS6215762U (zh) | 1985-07-12 | 1985-07-12 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6215762U (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01129106A (ja) * | 1987-11-14 | 1989-05-22 | Jeol Ltd | 走査トンネル顕微鏡を備えた透過型電子顕微鏡 |
JP2007018944A (ja) * | 2005-07-11 | 2007-01-25 | Hitachi High-Technologies Corp | 荷電粒子装置用試料台 |
JP2014146493A (ja) * | 2013-01-29 | 2014-08-14 | Sumitomo Metal Mining Co Ltd | 電子顕微鏡観察用試料台、並びに試料の断面観察方法 |
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1985
- 1985-07-12 JP JP10658085U patent/JPS6215762U/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01129106A (ja) * | 1987-11-14 | 1989-05-22 | Jeol Ltd | 走査トンネル顕微鏡を備えた透過型電子顕微鏡 |
JP2007018944A (ja) * | 2005-07-11 | 2007-01-25 | Hitachi High-Technologies Corp | 荷電粒子装置用試料台 |
JP2014146493A (ja) * | 2013-01-29 | 2014-08-14 | Sumitomo Metal Mining Co Ltd | 電子顕微鏡観察用試料台、並びに試料の断面観察方法 |