JPS6212859U - - Google Patents
Info
- Publication number
- JPS6212859U JPS6212859U JP10529885U JP10529885U JPS6212859U JP S6212859 U JPS6212859 U JP S6212859U JP 10529885 U JP10529885 U JP 10529885U JP 10529885 U JP10529885 U JP 10529885U JP S6212859 U JPS6212859 U JP S6212859U
- Authority
- JP
- Japan
- Prior art keywords
- thin
- aperture
- sample
- ray diffraction
- limited field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000002441 X-ray diffraction Methods 0.000 claims 2
- 239000000463 material Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 239000007787 solid Substances 0.000 claims 1
- 239000010409 thin film Substances 0.000 claims 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10529885U JPH0714871Y2 (ja) | 1985-07-10 | 1985-07-10 | 制限照射野絞り付きx線回折用薄片試料ホルダ−装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10529885U JPH0714871Y2 (ja) | 1985-07-10 | 1985-07-10 | 制限照射野絞り付きx線回折用薄片試料ホルダ−装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6212859U true JPS6212859U (zh) | 1987-01-26 |
JPH0714871Y2 JPH0714871Y2 (ja) | 1995-04-10 |
Family
ID=30979595
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10529885U Expired - Lifetime JPH0714871Y2 (ja) | 1985-07-10 | 1985-07-10 | 制限照射野絞り付きx線回折用薄片試料ホルダ−装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0714871Y2 (zh) |
-
1985
- 1985-07-10 JP JP10529885U patent/JPH0714871Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0714871Y2 (ja) | 1995-04-10 |