JPS62145437A - Computer - Google Patents

Computer

Info

Publication number
JPS62145437A
JPS62145437A JP60288730A JP28873085A JPS62145437A JP S62145437 A JPS62145437 A JP S62145437A JP 60288730 A JP60288730 A JP 60288730A JP 28873085 A JP28873085 A JP 28873085A JP S62145437 A JPS62145437 A JP S62145437A
Authority
JP
Japan
Prior art keywords
instruction
program
skip
signal
address
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60288730A
Other languages
Japanese (ja)
Other versions
JPH0789330B2 (en
Inventor
Hiroyuki Suzuki
鈴木 廣之
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP60288730A priority Critical patent/JPH0789330B2/en
Publication of JPS62145437A publication Critical patent/JPS62145437A/en
Publication of JPH0789330B2 publication Critical patent/JPH0789330B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To execute a program stored in a read only memory by providing a means inhibiting a skip instruction and executing an instruction stored in the read only memory at test. CONSTITUTION:A branch instruction and skip instruction inhibition signal generating circuit 8 is operated by a test state signal 9 and a program counter 7 is set to address '0' by a program counter reset signal 5. When a skip instruction is sent from a ROM 1 to an instruction decoder 3, a judging signal 12 whether or not the instruction of the next address of the skip instruction is executed is sent to the decoder 3 normally and since the circuit 8 is in operating state, a skip instruction inhibition signal 11 is generated and the signal 12 is disregarded. Thus, the instruction next to the skip instruction not executed by the program condition is executed and the sequence of the instruction by the program stored in the ROM 1 is executed sequentially from the address '0' to the final address.

Description

【発明の詳細な説明】 〔技術分野〕 顧客のプログラムを格納した読み出し専用メモリ(以下
ROMと記する)を具備し、試験時に分岐命令及びスキ
ップ命令を禁止しながら読み出し専用メモリシこ格納し
であるプログラムを実行することができるコンピュータ
に関する。
[Detailed Description of the Invention] [Technical Field] It is equipped with a read-only memory (hereinafter referred to as ROM) that stores a customer's program, and stores it in read-only memory while prohibiting branch instructions and skip instructions during testing. Relating to a computer that can run programs.

〔従来技術〕[Prior art]

例としてROM内蔵のマイクロコンビエータを用いる。 A micro combinator with a built-in ROM is used as an example.

マイクロコンビ為−夕の試験はマイクロコンピュータを
試験状態に切り換え、外部からマイクロコンビエータの
試験状態時の入力端子より命令を入力しその応答を期待
値と比較する機能試験と顧客のプログラムの格納されて
いるROMの各アドレスの情報をコンビ為−夕の端子よ
り出力し、あらかじめi客のプログラムを基にして作り
た、期待値情報と比較するROM内容確認試峨が行なわ
れる。
Microcombiator testing involves switching the microcomputer to a test state, inputting commands from the outside through the microcombiator's input terminals during the test state, and comparing the response with the expected value.The test also involves a functional test in which the customer's program is stored. A ROM contents confirmation test is performed by outputting information on each address of the ROM from the combination terminal and comparing it with expected value information created in advance based on customer i's program.

機能試験にお−て入力する命令はマイクロコンビエータ
を装造するメーカ側で作るので命令のシーケンスは限定
されてしまう。
The commands input during the functional test are created by the manufacturer that installs the micro combinator, so the sequence of commands is limited.

対して、ROMに格納される顧客のプログラムによる命
令シーケンスは無数にある。ROM内容確認試験ではR
OMに顧客の命令が正しくROMに格納されたかどうか
を確認するだけで顧客のプログラムが正確にマイクロコ
ンビ為−夕を動かすかどうかは確認できない。
In contrast, there are an infinite number of customer program instruction sequences stored in ROM. R in the ROM content confirmation test
The OM only checks whether the customer's instructions are correctly stored in the ROM, but cannot check whether the customer's program correctly operates the microcombi machine.

この為に、メーカ側で行った試験では良品となるが実装
の状態では命令の組み合わせに起因する不良のため正し
く動作しない場合があった。
For this reason, although the product was found to be good in tests conducted by the manufacturer, it sometimes did not work properly when it was installed due to defects caused by the combination of instructions.

〔発明の目的〕[Purpose of the invention]

本発明は上記欠点を見切するために、考慮されたもので
試験時にROMK格納された顧客のプログラムが正しく
、コンビエータを動作されることができるかどうか確認
する為に顧客のプログラムを格納した読み出し専用メモ
リを具備し、試験時に分岐命令及びスキップ命令を禁止
しながら読み出し専用メモリに格納しであるプログラム
を実行することができる簡易な回路を具備したコンピュ
ータを提供することにある。
The present invention has been developed in order to eliminate the above-mentioned drawbacks, and to check whether the customer's program stored in the ROMK is correct and can operate the comviator during testing, the customer's program is stored in a read-only ROMK. To provide a computer equipped with a memory and a simple circuit capable of executing a program stored in a read-only memory while prohibiting branch instructions and skip instructions during testing.

〔発明の実施例〕[Embodiments of the invention]

第1図は本発明の一実施例である。 FIG. 1 shows an embodiment of the present invention.

マイクロコンピュータ試験時のROMに内蔵されている
プログラムによる機能確認試験において試験状態信号9
によシ分岐命令及びスキップ命令禁止信号発生回路8が
動作状態になり、プログラムカウンタリヒット信号5に
よシプログラムカクンタ7はθ番地に設定される。
Test status signal 9 during a function confirmation test using a program built into the ROM during a microcomputer test
The branch instruction and skip instruction prohibition signal generation circuit 8 is activated, and the program counter counter 7 is set to address θ by the program counter rehit signal 5.

次ニグログムムカウンタはインクリメントされてθ番地
から順々にインストラクションデコーダ3に命令が送信
される。インストラクションデコーダ3がシステムの各
所に信号を送りマイクロコンビエータを動作させる。分
岐命令がROMからインストラクションデコーダ3に送
られた場合通常はプログラムカウンタ7にROM1から
の番地データをロード信号4が発生されて、プログラム
カランタフにROMからの番地データが設定されるか、
この場合分岐命令及びスキップ命令禁止信号発生回路が
動作状態にあるのでインストラクタ1ンデコーダからア
ドレスロード命令4は分岐命令禁止信号6が低レベルで
あることによりアドレスロード命令4は無視される。
The next program counter is incremented, and instructions are sequentially transmitted to the instruction decoder 3 starting from address θ. The instruction decoder 3 sends signals to various parts of the system to operate the micro combiator. When a branch instruction is sent from the ROM to the instruction decoder 3, a load signal 4 is generated to load the address data from the ROM 1 to the program counter 7, and the address data from the ROM is set in the program counter 7.
In this case, since the branch instruction and skip instruction prohibition signal generation circuit is in the operating state, the address load instruction 4 is ignored from the instructor 1 decoder because the branch instruction prohibition signal 6 is at a low level.

また、スキップ命令がROMからインストラクションデ
コーダに送られた場合通常インストラクションデコーダ
にスキップ命令の次のアドレスにある命令を実行するか
いないかの判断信号12が送信されるが分岐命令及びス
キップ命令禁止信号発生回路8が動作状態にあるので、
スキップ命令禁止信号11が発生され11は低レベルに
なシ、判断信号12は無視される。この為に、顧客のプ
ログラムでループを作っている場合でもループを無視し
、さらに、プログラムの条件によって実行されないスキ
ップ命令の次の命令も実行でき、これにより、ROMに
格納されたプログラムによる命令のシーケンスは0番地
から順々に最後のアドレスまで実行される。
Additionally, when a skip instruction is sent from the ROM to an instruction decoder, a judgment signal 12 is normally sent to the instruction decoder to determine whether or not to execute the instruction at the address next to the skip instruction, but a branch instruction and skip instruction prohibition signal is generated. Since circuit 8 is in operation,
A skip command prohibition signal 11 is generated, 11 is set to low level, and the judgment signal 12 is ignored. For this reason, even if a loop is created in the customer's program, the loop can be ignored, and the instruction following the skip instruction that is not executed depending on the program conditions can also be executed. The sequence is executed sequentially from address 0 to the last address.

この試験時のマイクロコンビエータの各端子の期待値は
顧客のプログラムを基にして作成しておく、このようを
こして、ROM内のプログラムを実行してひき期待値と
比較すnば顧客のプログラムによる命令シーケンス毎に
マイクロコンピュータの機能が確認できる。
The expected value of each terminal of the micro combinator during this test is created based on the customer's program.In this way, by running the program in the ROM and comparing it with the expected value, the customer's The functions of the microcomputer can be checked for each instruction sequence by the program.

但し、この場合分岐命令と分岐命令の行き先のアドレス
にある命令との組み合わせは確認できないかもしnない
が、前述の〔従来の技術〕に書いである機能試験におい
て、分岐命令と他の命令の組み合わせ試験において、分
岐命令と他の命令の組み合わせ試験を行えば顧客のプロ
グラムによる命令シーケンスはすべて確認できた事にな
る。
However, in this case, the combination of the branch instruction and the instruction at the destination address of the branch instruction may not be confirmed, but in the functional test described in the above-mentioned [Prior Art], the combination of the branch instruction and other instructions may not be confirmed. During testing, if a combination of branch instructions and other instructions is tested, all instruction sequences in the customer's program have been confirmed.

〔発明の効果〕〔Effect of the invention〕

以上説明したように簡単な回路をもって顧客のプログラ
ムによるROMの命令ジ−タンスの機能試験ができ、命
令の組み合わせに起因する不良が減少するという大きな
効果がある。
As explained above, it is possible to perform a functional test of the instruction resistance of a ROM according to a customer's program using a simple circuit, which has the great effect of reducing defects caused by combinations of instructions.

【図面の簡単な説明】[Brief explanation of drawings]

第1因は本発明の一実施例を示す図である。 1・・・・・・読み出し専用メモリ(ROM)、2・・
・・・・ROMからのデータバス、3・・・・・・イン
ストラクションデコーダ、4・・・・・・アドレスロー
ド信号、5・・・・・・リセット信号、6・・・・・・
分岐命令禁止信号、7・・・・・・プログラム・カウン
タ、8・・・・・・分岐命令及び、スキップ命令禁止信
号発生回路、9・・・・・・テストモード信号、10・
・・・・、ROMアドレスデコーダ、11・・・・・・
スキップ命令禁止信号、12・・・・・・判断信号。
The first factor is a diagram showing an embodiment of the present invention. 1...Read-only memory (ROM), 2...
...Data bus from ROM, 3...Instruction decoder, 4...Address load signal, 5...Reset signal, 6...
Branch instruction prohibition signal, 7...Program counter, 8...Branch instruction and skip instruction prohibition signal generation circuit, 9...Test mode signal, 10.
..., ROM address decoder, 11...
Skip command prohibition signal, 12...judgment signal.

Claims (1)

【特許請求の範囲】[Claims] 読み出し専用メモリを内蔵し、試験時に分岐命令とスキ
ップ命令を禁止し、該読み出し専用メモリに格納されて
いる命令を実行する手段を有する事を特徴とするコンピ
ュータ。
1. A computer comprising a built-in read-only memory, a means for prohibiting branch instructions and skip instructions during testing, and executing instructions stored in the read-only memory.
JP60288730A 1985-12-20 1985-12-20 Computer Expired - Fee Related JPH0789330B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60288730A JPH0789330B2 (en) 1985-12-20 1985-12-20 Computer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60288730A JPH0789330B2 (en) 1985-12-20 1985-12-20 Computer

Publications (2)

Publication Number Publication Date
JPS62145437A true JPS62145437A (en) 1987-06-29
JPH0789330B2 JPH0789330B2 (en) 1995-09-27

Family

ID=17733941

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60288730A Expired - Fee Related JPH0789330B2 (en) 1985-12-20 1985-12-20 Computer

Country Status (1)

Country Link
JP (1) JPH0789330B2 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6031652A (en) * 1983-08-01 1985-02-18 Nec Corp Microcomputer incorporating read-only memory
JPS6031653A (en) * 1983-08-01 1985-02-18 Nec Corp One-chip microcomputer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6031652A (en) * 1983-08-01 1985-02-18 Nec Corp Microcomputer incorporating read-only memory
JPS6031653A (en) * 1983-08-01 1985-02-18 Nec Corp One-chip microcomputer

Also Published As

Publication number Publication date
JPH0789330B2 (en) 1995-09-27

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