JPS62132461U - - Google Patents

Info

Publication number
JPS62132461U
JPS62132461U JP1983186U JP1983186U JPS62132461U JP S62132461 U JPS62132461 U JP S62132461U JP 1983186 U JP1983186 U JP 1983186U JP 1983186 U JP1983186 U JP 1983186U JP S62132461 U JPS62132461 U JP S62132461U
Authority
JP
Japan
Prior art keywords
probe
eddy current
tube
flaw detection
support member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1983186U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1983186U priority Critical patent/JPS62132461U/ja
Publication of JPS62132461U publication Critical patent/JPS62132461U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP1983186U 1986-02-14 1986-02-14 Pending JPS62132461U (pl)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1983186U JPS62132461U (pl) 1986-02-14 1986-02-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1983186U JPS62132461U (pl) 1986-02-14 1986-02-14

Publications (1)

Publication Number Publication Date
JPS62132461U true JPS62132461U (pl) 1987-08-21

Family

ID=30814776

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1983186U Pending JPS62132461U (pl) 1986-02-14 1986-02-14

Country Status (1)

Country Link
JP (1) JPS62132461U (pl)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS557630A (en) * 1978-06-30 1980-01-19 Sumitomo Metal Ind Ltd Inspection method of depth for peening machined layer at internal surface of tube
JPS5949955B2 (ja) * 1977-01-27 1984-12-05 セイコーエプソン株式会社 液晶表示装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5949955B2 (ja) * 1977-01-27 1984-12-05 セイコーエプソン株式会社 液晶表示装置
JPS557630A (en) * 1978-06-30 1980-01-19 Sumitomo Metal Ind Ltd Inspection method of depth for peening machined layer at internal surface of tube

Similar Documents

Publication Publication Date Title
JPS62132461U (pl)
ATE18803T1 (de) Elektrodynamischer wandlerkopf.
JPS62132462U (pl)
JPS62143258U (pl)
JPS6370077U (pl)
JPH0437583U (pl)
JPS6249178U (pl)
JPS6373608U (pl)
JPS6341763U (pl)
JPH0368054U (pl)
JPS6237768U (pl)
JPH0351369U (pl)
JPS62115192U (pl)
JPS5923660U (ja) 超音波探触子装置
JPH0383806U (pl)
JPS61144469U (pl)
JPS63148864U (pl)
JPH0237367U (pl)
JPH0443262U (pl)
JPS62132404U (pl)
JPH0159267U (pl)
JPS63177748U (pl)
JPS61205140U (pl)
JPH01153956A (ja) 配管用超音波探触子
JPH0171654U (pl)