JPS62127619A - Method for measuring plating thickness - Google Patents
Method for measuring plating thicknessInfo
- Publication number
- JPS62127619A JPS62127619A JP26885185A JP26885185A JPS62127619A JP S62127619 A JPS62127619 A JP S62127619A JP 26885185 A JP26885185 A JP 26885185A JP 26885185 A JP26885185 A JP 26885185A JP S62127619 A JPS62127619 A JP S62127619A
- Authority
- JP
- Japan
- Prior art keywords
- plating
- zinc
- thickness
- iron
- liquid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、亜鉛−鉄メツキラインに組み込まれ前記メッ
キ液の金属成分比(Zn/ Zn+Fe )を液の状態
のまま螢光X線にて測定し、前記メッキの膜厚は、亜鉛
の螢光X線を測定し、これに前記金属成分比による補正
を加えて、亜鉛−鉄のトータルのメッキ厚を求める方法
に関するものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention is incorporated into a zinc-iron plating line and measures the metal component ratio (Zn/Zn+Fe) of the plating solution in its liquid state using fluorescent X-rays. However, the plating film thickness is determined by measuring the fluorescent X-rays of zinc and correcting it based on the metal component ratio to obtain the total zinc-iron plating thickness.
本発明は鋼板上の鉄−亜鉛全台メツキのメッキ厚を螢光
X線厚み測定する場合に、重なりに問題のある鉄の螢光
X線は、測定せず、亜鉛のトータルメッキ厚を測定し、
メッキの成分比をメッキ液の分析計にて分析し、その結
果と、前述の亜鉛のトータルメッキ厚データを計算し、
厚みを測定する。In the present invention, when measuring the plating thickness of iron-zinc full plating on a steel plate using fluorescent X-rays, the fluorescent X-rays of iron, which have a problem with overlapping, are not measured, but the total plating thickness of zinc is measured. death,
Analyze the component ratio of the plating with a plating solution analyzer, calculate the results and the total zinc plating thickness data mentioned above,
Measure the thickness.
他の亜鉛−鉄合金メッキの付着量と成分量を求める方法
には、
■メッキ層を電解により溶解せしめ、この溶解液を化学
分析あるいは機器分析により定量する方法。Other methods for determining the adhesion amount and component amount of zinc-iron alloy plating include: 1. Dissolving the plating layer by electrolysis and quantifying this solution by chemical analysis or instrumental analysis.
■イオンやグロー放電により表面をスパッタリングして
放出される2次イオンや光を測定して定量する表面分析
法がある。■There is a surface analysis method that measures and quantifies secondary ions and light emitted by sputtering the surface with ions and glow discharge.
上記いずれの方法も、測定試料を製品から採取する破壊
検査であり、且つ、迅速性にも乏しい。All of the above methods are destructive tests in which a measurement sample is taken from a product, and are also poor in speed.
又、例えば、鋼板上の亜鉛−鉄合金メッキの厚みと金属
成分量を生産工程中で夫々のにαX線を測定して求める
螢光X線分析法では、下地鋼板成分のPeKαX線の直
接的な重なりの為、前記測定は困難である。For example, in the fluorescent X-ray analysis method, which determines the thickness and metal content of zinc-iron alloy plating on a steel sheet by measuring α X-rays during the production process, This measurement is difficult due to the large overlap.
本発明においては、重なりに問題のある鉄の螢光X線は
測定せず、他方の成分である亜鉛の螢光X線のみを測定
してトータルのメッキ厚みを求める。但し、金属成分比
が変動すると第1図に示すように測定する亜鉛の螢光X
線強度も変化する為厚み決定において影響を及ぼすこと
になる。In the present invention, the total plating thickness is determined by measuring only the fluorescent X-rays of the other component, zinc, without measuring the fluorescent X-rays of iron, which has a problem with overlapping. However, if the metal component ratio changes, the measured zinc fluorescence X will change as shown in Figure 1.
Since the line strength also changes, it will affect the thickness determination.
この問題を解決する為に、メッキ浴における亜鉛と鉄の
成分を求める液分押針を設け、この情報を厚み計にフィ
ード・フォワードすることによって補正を行う。To solve this problem, a liquid indenter is installed to determine the zinc and iron components in the plating bath, and correction is performed by feeding this information forward to the thickness gauge.
本発明の実施例を第2図に示した。まず、メッキ浴中の
メッキ液1をサンプリング装置(図示せず)を介して液
分押針2に連続的に送液し、これをX線で照射すること
によって励起される亜鉛と鉄の螢光X線強度を計測する
ことにより、あらかじめ既知濃度の標準液によって得ら
れた検量線によって演算することにより、メッキ液1中
の亜鉛と鉄の濃度を求め亜鉛と鉄の成分比(Zn/ Z
n+Fe )を決定する。この成分比はトータル厚みを
求める厚み計にフィード・フォワード情報として出力さ
れる。液分押針で測定するメッキ液は流体であり、その
ままメッキ浴7に戻される。その為、液組成変化に対す
る応答も早く、厚み計への組成補正情報としての信頼性
も高い。An embodiment of the invention is shown in FIG. First, the plating solution 1 in the plating bath is continuously fed to the liquid dispensing needle 2 through a sampling device (not shown), and the powder of zinc and iron is excited by irradiating it with X-rays. By measuring the optical X-ray intensity and calculating the concentration of zinc and iron in plating solution 1 using a calibration curve obtained in advance using a standard solution with a known concentration, the zinc and iron component ratio (Zn/Z
n+Fe ) is determined. This component ratio is output as feed forward information to a thickness gauge that calculates the total thickness. The plating liquid measured by the liquid indenter is a fluid and is returned to the plating bath 7 as it is. Therefore, the response to changes in liquid composition is quick, and the reliability as composition correction information for the thickness gauge is high.
次に、トータル・メッキ厚みを測定するメッキ厚み針で
は、メッキ鋼板6をX線で照射することにより励起され
る亜鉛の螢光X線強度をメッキ厚み計3にて計測し、こ
れと前記の金属成分比による補正を加え、インターフェ
ース4及びマイクロコンピュータ5にて第1図に示すよ
うな検量線にあてはめることによって、組成変化も問題
なくトータルの亜鉛−鉄合金メツキ厚みを決定すること
ができる。本発明の精度を維持する要因としては、生産
ラインにおける水素イオン濃度、浴温及びメッキ電流等
の制御が効率良く行われている必要がある。Next, using the plating thickness gauge 3 to measure the total plating thickness, the plating thickness gauge 3 measures the fluorescent X-ray intensity of zinc excited by irradiating the plated steel plate 6 with X-rays. By applying correction based on the metal component ratio and applying it to a calibration curve as shown in FIG. 1 using the interface 4 and microcomputer 5, the total zinc-iron alloy plating thickness can be determined without any problem with compositional changes. In order to maintain the accuracy of the present invention, it is necessary that hydrogen ion concentration, bath temperature, plating current, etc. in the production line be efficiently controlled.
以上述べたごとく本発明方法は亜鉛−鉄合金電気メツキ
ラインにおいて、メッキ組成は液分押針により管理でき
、更に、この情報の適用によりメッキ厚みを迅速、且つ
、非破壊的に分析できる効果を有する。As described above, the method of the present invention has the effect that the plating composition can be controlled using a liquid dispensing needle in a zinc-iron alloy electroplating line, and furthermore, the plating thickness can be analyzed quickly and non-destructively by applying this information. .
これにより、所定のメッキ品質を確保しながらメッキ付
着量を所定の範囲に制御することが可能となる。This makes it possible to control the amount of plating within a predetermined range while ensuring a predetermined plating quality.
第1図は、亜鉛−鉄合金メッキの検量線の例を示す図で
あり、第2図は本発明の実施例のブロック図を示す。
1・・・メッキ液
2・・・液分押針
3・・・メッキ厚み計
4・・・インターフェイス
5・・・マイクロコンピュータ
6・・・メッキ鋼板
7・・・メッキ浴
以上FIG. 1 is a diagram showing an example of a calibration curve for zinc-iron alloy plating, and FIG. 2 is a block diagram of an embodiment of the present invention. 1... Plating solution 2... Liquid indenter 3... Plating thickness meter 4... Interface 5... Microcomputer 6... Plating steel plate 7... Plating bath or higher
Claims (1)
前記メッキの施した直後に、前記金属成分比を入力する
ことにより金属成分比を補正して前記メッキ厚みを測定
する螢光X線メッキ厚み計とから構成した、連続、迅速
、且つ、非破壊的な前記メッキ生産工程に直結したメッ
キ厚測定方法。A liquid analyzer that measures the metal component ratio of zinc-iron plating solution,
A continuous, rapid, and non-destructive method consisting of a fluorescent X-ray plating thickness meter that measures the plating thickness by correcting the metal component ratio by inputting the metal component ratio immediately after the plating is applied. A method for measuring plating thickness that is directly connected to the plating production process.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26885185A JPS62127619A (en) | 1985-11-29 | 1985-11-29 | Method for measuring plating thickness |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26885185A JPS62127619A (en) | 1985-11-29 | 1985-11-29 | Method for measuring plating thickness |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62127619A true JPS62127619A (en) | 1987-06-09 |
Family
ID=17464145
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26885185A Pending JPS62127619A (en) | 1985-11-29 | 1985-11-29 | Method for measuring plating thickness |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62127619A (en) |
-
1985
- 1985-11-29 JP JP26885185A patent/JPS62127619A/en active Pending
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