JPS62114245A - Manufacture of substrate for hybrid integrated circuit - Google Patents

Manufacture of substrate for hybrid integrated circuit

Info

Publication number
JPS62114245A
JPS62114245A JP25370385A JP25370385A JPS62114245A JP S62114245 A JPS62114245 A JP S62114245A JP 25370385 A JP25370385 A JP 25370385A JP 25370385 A JP25370385 A JP 25370385A JP S62114245 A JPS62114245 A JP S62114245A
Authority
JP
Japan
Prior art keywords
integrated circuit
hybrid integrated
cfrp
board
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25370385A
Other languages
Japanese (ja)
Inventor
Teruo Watanabe
渡辺 照男
Hiroaki Miyagawa
宮川 宏昭
Toyokazu Inaba
稲葉 豊和
Toshiharu Furuta
俊治 古田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP25370385A priority Critical patent/JPS62114245A/en
Publication of JPS62114245A publication Critical patent/JPS62114245A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4803Insulating or insulated parts, e.g. mountings, containers, diamond heatsinks

Abstract

PURPOSE:To form a substrate for a hybrid integrated circuit having high thermal conductivity and equivalent thermal expansion coefficient to silicon by sandblasting the surface of a CFRP laminated board with alumina sand, allowing the sand to remain on the board, and forming a thin metal layer through an adhesive. CONSTITUTION:A CFRP laminated board 11 has 43kcal/m.hr. deg.C of thermal conductivity and 0.7X10<-6>/ deg.C of linear expansion coefficient. The board 11 is sandblasted with alumina sand so that the board 11 is formed to be of rough surface 12. Simultaneously with the sandblasting, the sand 12 is fed into the board 11, which is connected with a CFRP 14. This CFRP laminated board is used as a lower layer 13, epoxy prepreg is used as an adhesive 16, an electrolytic copper foil 17 is used as a surface layer, and a substrate for a hybrid integrated circuit is obtained by thermally pressing it.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、集積回路(IC)チップ搭載用の配線基板の
製造方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method of manufacturing a wiring board for mounting an integrated circuit (IC) chip.

(従来の技術) パッケージレス化したチップを印刷配線基板に直接組み
込むようにすると、高密度な実装が可能になる。そのた
めに薄い銅箔を用いた印刷配線基板が開発されてきてい
る。
(Prior Art) High-density packaging becomes possible by directly incorporating a package-less chip into a printed wiring board. For this purpose, printed wiring boards using thin copper foil have been developed.

従来、この種の混成集積回路用基板としては、例えば、
特開昭58−15290号公報に示されるものがあった
Conventionally, as this type of hybrid integrated circuit board, for example,
There was one shown in Japanese Patent Application Laid-Open No. 15290/1983.

第2図は係る従来の混成集積回路用基板の断面図である
FIG. 2 is a sectional view of such a conventional hybrid integrated circuit board.

この図に示されるように、アルミ、鉄、鉄−ニソケル合
金などの基材lヘシリカなどの放熱性の充填剤を混入し
たエポキシ、ポリイミドなどの樹脂を接着層2を介して
銅箔3と接着することにより、混成集積回路用基板とし
て構成されている。
As shown in this figure, a resin such as epoxy or polyimide mixed with a heat dissipating filler such as silica is bonded to a copper foil 3 through an adhesive layer 2 to a base material such as aluminum, iron, or iron-Nisokel alloy. By doing so, it is constructed as a substrate for a hybrid integrated circuit.

このように、基材1を熱伝導性の良い金属とし、接着層
2に高熱伝導性の充填剤を入れているため、アルミナと
同等の熱伝導率を示し、アルミナ基板の代替材として使
用されている。
In this way, since the base material 1 is made of a metal with good thermal conductivity and the adhesive layer 2 contains a highly thermally conductive filler, it exhibits the same thermal conductivity as alumina and can be used as a substitute for alumina substrates. ing.

(発明が解決しようとする問題点) しかしながら、上記構成の基板では、基材に金属を使用
するため、ICチップと線膨脹係数が合わず、外部環境
の変化などにより熱衝撃が加わると、線膨脹係数のミス
マツチから応力が生じて、ICチップが破壊されるとい
った問題があった。
(Problems to be Solved by the Invention) However, since the substrate with the above structure uses metal as the base material, the coefficient of linear expansion does not match that of the IC chip, and when thermal shock is applied due to changes in the external environment, the linear expansion There was a problem in that stress was generated due to mismatching of the expansion coefficients and the IC chip was destroyed.

本発明は、上記問題点を除去し、高熱伝導性を有し、し
かも、熱膨張係数がシリコンと同等な混成集積回路用基
板を提供することを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to eliminate the above-mentioned problems and provide a substrate for a hybrid integrated circuit that has high thermal conductivity and has a coefficient of thermal expansion equivalent to that of silicon.

(問題点を解決するための手段) 本発明は、上記問題点を解決するために、下層にCFR
P C熱伝導率43にcal/+w、hr、 ℃、線膨
脹係数0.7 Xl0−’/℃)を使用し、このCFR
Pの表面をサンドブラストで粗面とし、かつAh(h砂
をCFRP上に突き刺してCFRP基材を構成し、エポ
キシ接着剤(プリプレグ)で銅泊と前記CFRP基材を
加熱加圧することにより混成集積回路用基(反を得るよ
うにしたものである。
(Means for Solving the Problems) In order to solve the above problems, the present invention provides CFR in the lower layer.
Using cal/+w, hr, ℃, coefficient of linear expansion 0.7
The surface of P is roughened by sandblasting, and Ah (h sand is pierced onto the CFRP to form a CFRP base material, and the copper foil and the CFRP base material are heated and pressurized with epoxy adhesive (prepreg) to form a hybrid accumulation. A circuit board (made to obtain a reverse circuit board).

(作用) 本発明によれば、下層として熱伝導性が良く、かつ、線
膨脹係数の小さいCFRP C熱伝導率43Kcal/
m、hr、 ℃、線膨脹係数 0.7 x 10−’/
 ’c )を使用し、これによる熱伝導を接着層でロス
するのを防ぐため、このCFRPの表面をサンドブラス
トで粗面とし、かつ^120.砂をこのCFRP上に突
き刺し、エポキシ接着剤(プリプレグ)で銅箔と前記C
FRP基材を加熱加圧することにより、熱伝導性が良好
な、しかも、線膨脹係数がシリコンペレットに合つた混
成集積回路用基板を得ることができる。
(Function) According to the present invention, the lower layer is made of CFRP C, which has good thermal conductivity and a small coefficient of linear expansion, and has a thermal conductivity of 43 Kcal/
m, hr, °C, linear expansion coefficient 0.7 x 10-'/
'c), and in order to prevent heat conduction from being lost in the adhesive layer, the surface of this CFRP is made rough by sandblasting, and ^120. Punch sand onto this CFRP and attach it to the copper foil with epoxy adhesive (prepreg).
By heating and pressing the FRP base material, it is possible to obtain a substrate for a hybrid integrated circuit that has good thermal conductivity and has a coefficient of linear expansion matching that of silicon pellets.

(実施例) 以下、本発明の実施例について図面を参照しながら詳細
に説明する。
(Example) Hereinafter, an example of the present invention will be described in detail with reference to the drawings.

第1図は本発明に係る混成集積回路用基板の製造工程図
である。
FIG. 1 is a manufacturing process diagram of a hybrid integrated circuit board according to the present invention.

まず、第1図(a)に示される様に、CFRP積層手反
11 (例えば、パイロフィル 21〇三菱レーヨン製
)を用意する。なお、このCFRPは熱伝導率43Kc
al/m、hr、 ’C1線膨脹係数0.7 xlO−
’/’cのものである。
First, as shown in FIG. 1(a), a CFRP laminated cloth 11 (for example, Pyrofil 210 manufactured by Mitsubishi Rayon) is prepared. Furthermore, this CFRP has a thermal conductivity of 43Kc.
al/m, hr, 'C1 linear expansion coefficient 0.7 xlO-
'/'c's.

次に、第1図(b)に示されるように、このCFRP積
層板11にアルミナ砂(#120〜320)を用いたサ
ンドブラスト処理を行い、このCFRP積層板11上を
粗面12とする。
Next, as shown in FIG. 1(b), this CFRP laminate 11 is subjected to sandblasting using alumina sand (#120 to 320) to form a rough surface 12 on the CFRP laminate 11.

次に、サンドブラスト処理と同時に第1図(c)に示さ
れるように、アルミナ砂15がCF R,P積層板中に
入りこみ、CFRP14と接続される。
Next, at the same time as the sandblasting process, as shown in FIG. 1(c), alumina sand 15 penetrates into the CF R,P laminate and is connected to the CFRP 14.

このCFRP積層板を下層13として、厚さ0.05龍
のエポキシプリプレグを接着剤16として使用し、電解
銅泊17 (18μm又は35μm)を表層として、加
熱加圧することにより、混成集積回路用基板を得ること
ができる。
Using this CFRP laminate as the lower layer 13, using epoxy prepreg with a thickness of 0.05 mm as the adhesive 16, and using electrolytic copper foil 17 (18 μm or 35 μm) as the surface layer, by heating and pressurizing, a substrate for hybrid integrated circuits is formed. can be obtained.

なお、このように構成された混成集積回路用基板は熱伝
導性は従来のガラスエポキシ塞板に比較して2倍以上、
線膨脹係数は8〜4 xto−b/”cである。
Furthermore, the thermal conductivity of the hybrid integrated circuit board constructed in this way is more than twice that of the conventional glass epoxy sealing board.
The coefficient of linear expansion is 8 to 4 xto-b/''c.

このように、熱伝導性が良く線膨脹係数の小さいCFR
P積jli板を下層に用い、銅箔との密着性及び熱伝導
性を良くするためにアルミナ砂でCFRP積層板表面な
粗面とし、かつ、アルミナ砂がCFRP積層板上に残り
、更に、50μm以下のエポキシプリプレグを使用した
ので、熱伝導が良好な線膨脹係数がシリコン(′!fA
膨張係数2.6 X 10−’/℃)と非常に近い混成
集積回路用基板が得られる。
In this way, CFR has good thermal conductivity and a small coefficient of linear expansion.
A Plaminate board is used as the lower layer, and the surface of the CFRP laminate is made rough with alumina sand to improve adhesion with the copper foil and thermal conductivity, and the alumina sand remains on the CFRP laminate, and further, Since we used epoxy prepreg with a diameter of 50 μm or less, the coefficient of linear expansion with good thermal conductivity is silicon ('!fA).
A substrate for a hybrid integrated circuit having an expansion coefficient very close to that of 2.6 x 10-'/°C) can be obtained.

なお、本発明は上記実施例に限定されるものではなく、
本発明の趣旨に基づいて種々の変形が可能であり、これ
らを本発明の範囲から排除するものではない。
Note that the present invention is not limited to the above embodiments,
Various modifications are possible based on the spirit of the present invention, and these are not excluded from the scope of the present invention.

(発明の効果) 以上、詳細に説明したように、本発明によれば、熱伝導
性が良く、かつ線膨脹係数の小さいCFRP積層板を用
い、該CFRP積層)反の表面をアルミナ砂を用いサン
ドブラスト処理を行い、かつ該アルミナ砂をCFRP積
層板上に残存させ、該CFRP積N板上に接着剤を介し
て金属薄層を形成するようにしたので、熱伝導性が良好
であり、しかも線膨脹係数がシリコンに橿めて近い混成
集積回路用基板を得ることができる。
(Effects of the Invention) As described above in detail, according to the present invention, a CFRP laminate having good thermal conductivity and a small coefficient of linear expansion is used, and the surface of the CFRP laminate is made of alumina sand. Sandblasting is performed, the alumina sand is left on the CFRP laminate, and a thin metal layer is formed on the CFRP laminate with an adhesive, so it has good thermal conductivity. It is possible to obtain a substrate for a hybrid integrated circuit whose coefficient of linear expansion is much closer to that of silicon.

特に、この混成集積回路用基板はICチップとのなじみ
が良く、外部環境の変化に起因する熱衝撃などによって
もICチップが損傷を受けることがなく、IC搭載基板
として好適であり、高密度実装を行うことができる。
In particular, this hybrid integrated circuit board has good compatibility with IC chips, and the IC chips are not damaged even by thermal shock caused by changes in the external environment, making it suitable as an IC mounting board and suitable for high-density mounting. It can be performed.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る混成集積回路用基板の製造工程図
、第2図は従来の混成集積回路用基板の断面図である。 11・・・CFRP積層板、12・・・粗面、13・・
・下層、14・・・CFRP、15・・・アルミナ砂、
16・・・接着剤(エポキシプリプレグ)、17・・・
金1iLi層(を解銅泊)。
FIG. 1 is a manufacturing process diagram of a hybrid integrated circuit board according to the present invention, and FIG. 2 is a sectional view of a conventional hybrid integrated circuit board. 11...CFRP laminate, 12...Rough surface, 13...
・Lower layer, 14...CFRP, 15...Alumina sand,
16...Adhesive (epoxy prepreg), 17...
Gold 1iLi layer (copper-plated).

Claims (3)

【特許請求の範囲】[Claims] (1)熱伝導性が良く、かつ線膨脹係数の小さいCFR
P積層板を用い、該CFRP積層板の表面をアルミナ砂
を用いサンドブラスト処理を行い、かつ該アルミナ砂を
CFRP積層板上に残存させ、該CFRP積層板上に接
着剤を介して金属薄層を形成するようにしたことを特徴
とする混成集積回路用基板の製造方法。
(1) CFR with good thermal conductivity and small coefficient of linear expansion
Using a P laminate, sandblast the surface of the CFRP laminate using alumina sand, leave the alumina sand on the CFRP laminate, and apply a thin metal layer onto the CFRP laminate using an adhesive. 1. A method of manufacturing a hybrid integrated circuit board, characterized in that:
(2)前記接着剤として50μm以下のエポキシ接着剤
を用いるようにしたことを特徴とする特許請求の範囲第
1項記載の混成集積回路用基板の製造方法。
(2) The method for manufacturing a hybrid integrated circuit board according to claim 1, wherein an epoxy adhesive with a thickness of 50 μm or less is used as the adhesive.
(3)前記CFRP積層板上に前記エポキシ接着剤を介
した前記金属薄層を設け、加熱加圧するようにしたこと
を特徴とする特許請求の範囲第2項記載の混成集積回路
用基板の製造方法。
(3) Manufacturing a substrate for a hybrid integrated circuit according to claim 2, characterized in that the metal thin layer is provided on the CFRP laminate via the epoxy adhesive and heated and pressurized. Method.
JP25370385A 1985-11-14 1985-11-14 Manufacture of substrate for hybrid integrated circuit Pending JPS62114245A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25370385A JPS62114245A (en) 1985-11-14 1985-11-14 Manufacture of substrate for hybrid integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25370385A JPS62114245A (en) 1985-11-14 1985-11-14 Manufacture of substrate for hybrid integrated circuit

Publications (1)

Publication Number Publication Date
JPS62114245A true JPS62114245A (en) 1987-05-26

Family

ID=17254974

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25370385A Pending JPS62114245A (en) 1985-11-14 1985-11-14 Manufacture of substrate for hybrid integrated circuit

Country Status (1)

Country Link
JP (1) JPS62114245A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09246752A (en) * 1996-03-06 1997-09-19 Nec Corp Package structure of electronic equipment
US10674609B2 (en) 2014-03-31 2020-06-02 Mitsubishi Gas Chemical Company, Inc. Entry sheet for drilling

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09246752A (en) * 1996-03-06 1997-09-19 Nec Corp Package structure of electronic equipment
US10674609B2 (en) 2014-03-31 2020-06-02 Mitsubishi Gas Chemical Company, Inc. Entry sheet for drilling

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