JPS62102106U - - Google Patents

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Publication number
JPS62102106U
JPS62102106U JP19301385U JP19301385U JPS62102106U JP S62102106 U JPS62102106 U JP S62102106U JP 19301385 U JP19301385 U JP 19301385U JP 19301385 U JP19301385 U JP 19301385U JP S62102106 U JPS62102106 U JP S62102106U
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JP
Japan
Prior art keywords
measured
stylus
wedge
roughness meter
width
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19301385U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0435761Y2 (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19301385U priority Critical patent/JPH0435761Y2/ja
Publication of JPS62102106U publication Critical patent/JPS62102106U/ja
Application granted granted Critical
Publication of JPH0435761Y2 publication Critical patent/JPH0435761Y2/ja
Expired legal-status Critical Current

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Landscapes

  • A Measuring Device Byusing Mechanical Method (AREA)
JP19301385U 1985-12-17 1985-12-17 Expired JPH0435761Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19301385U JPH0435761Y2 (enrdf_load_stackoverflow) 1985-12-17 1985-12-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19301385U JPH0435761Y2 (enrdf_load_stackoverflow) 1985-12-17 1985-12-17

Publications (2)

Publication Number Publication Date
JPS62102106U true JPS62102106U (enrdf_load_stackoverflow) 1987-06-29
JPH0435761Y2 JPH0435761Y2 (enrdf_load_stackoverflow) 1992-08-25

Family

ID=31148635

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19301385U Expired JPH0435761Y2 (enrdf_load_stackoverflow) 1985-12-17 1985-12-17

Country Status (1)

Country Link
JP (1) JPH0435761Y2 (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0450701A (ja) * 1990-06-19 1992-02-19 Ngk Insulators Ltd ハニカムの表面粗度測定法及びそれに用いる表面粗度測定用測定子
JP2004177192A (ja) * 2002-11-26 2004-06-24 Dainippon Printing Co Ltd 欠陥高さ検査装置及び欠陥高さ検査方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0450701A (ja) * 1990-06-19 1992-02-19 Ngk Insulators Ltd ハニカムの表面粗度測定法及びそれに用いる表面粗度測定用測定子
JP2004177192A (ja) * 2002-11-26 2004-06-24 Dainippon Printing Co Ltd 欠陥高さ検査装置及び欠陥高さ検査方法

Also Published As

Publication number Publication date
JPH0435761Y2 (enrdf_load_stackoverflow) 1992-08-25

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