JPS62102106U - - Google Patents
Info
- Publication number
- JPS62102106U JPS62102106U JP19301385U JP19301385U JPS62102106U JP S62102106 U JPS62102106 U JP S62102106U JP 19301385 U JP19301385 U JP 19301385U JP 19301385 U JP19301385 U JP 19301385U JP S62102106 U JPS62102106 U JP S62102106U
- Authority
- JP
- Japan
- Prior art keywords
- measured
- stylus
- wedge
- roughness meter
- width
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003746 surface roughness Effects 0.000 claims description 2
- 241001422033 Thestylus Species 0.000 claims 1
Landscapes
- A Measuring Device Byusing Mechanical Method (AREA)
Description
第1図は本考案に用いるナイフウエツジ型触針
の一例を示す拡大図、第2図は本考案の表面粗さ
計の一例を示す側面図、第3図は薄膜状物の表面
状を検査するために張り付けるに適した治具を示
す表面図と断面図である。
1……触針、2……ナイフウエツジ。
Figure 1 is an enlarged view showing an example of a knife wedge type stylus used in the present invention, Figure 2 is a side view showing an example of a surface roughness meter of the present invention, and Figure 3 is for inspecting the surface condition of a thin film-like object. FIG. 4 is a surface view and a cross-sectional view showing a jig suitable for pasting. 1... Stylus, 2... Knife wedge.
Claims (1)
測定する平面粗さ計において、触針として、横幅
が0.05〜2mm、真直度が±0.5μm以内の
ナイフウエツジ型触針を、被測定面に垂直度±0
.5μmで接触させ、かつ被測定面上で該ウエツ
ジの幅方向と直角方向に移動可能に装着したこと
を特徴とする平面粗さ計。 In a surface roughness meter that measures surface irregularities by sliding a stylus over the surface to be measured, a knife-wedge type stylus with a width of 0.05 to 2 mm and a straightness of within ±0.5 μm is used as the stylus. Perpendicularity to the surface to be measured ±0
.. A plane roughness meter, characterized in that the wedge is brought into contact at a distance of 5 μm and is movably mounted on the surface to be measured in a direction perpendicular to the width direction of the wedge.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19301385U JPH0435761Y2 (en) | 1985-12-17 | 1985-12-17 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19301385U JPH0435761Y2 (en) | 1985-12-17 | 1985-12-17 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62102106U true JPS62102106U (en) | 1987-06-29 |
JPH0435761Y2 JPH0435761Y2 (en) | 1992-08-25 |
Family
ID=31148635
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19301385U Expired JPH0435761Y2 (en) | 1985-12-17 | 1985-12-17 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0435761Y2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0450701A (en) * | 1990-06-19 | 1992-02-19 | Ngk Insulators Ltd | Surface roughness measuring method for honeycomb and measuring prove used for same |
JP2004177192A (en) * | 2002-11-26 | 2004-06-24 | Dainippon Printing Co Ltd | Inspection device for defective height and inspection method for defective height |
-
1985
- 1985-12-17 JP JP19301385U patent/JPH0435761Y2/ja not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0450701A (en) * | 1990-06-19 | 1992-02-19 | Ngk Insulators Ltd | Surface roughness measuring method for honeycomb and measuring prove used for same |
JP2004177192A (en) * | 2002-11-26 | 2004-06-24 | Dainippon Printing Co Ltd | Inspection device for defective height and inspection method for defective height |
Also Published As
Publication number | Publication date |
---|---|
JPH0435761Y2 (en) | 1992-08-25 |
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