JPS6184505U - - Google Patents

Info

Publication number
JPS6184505U
JPS6184505U JP16824384U JP16824384U JPS6184505U JP S6184505 U JPS6184505 U JP S6184505U JP 16824384 U JP16824384 U JP 16824384U JP 16824384 U JP16824384 U JP 16824384U JP S6184505 U JPS6184505 U JP S6184505U
Authority
JP
Japan
Prior art keywords
wavelength
light source
measuring device
interference laser
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16824384U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16824384U priority Critical patent/JPS6184505U/ja
Publication of JPS6184505U publication Critical patent/JPS6184505U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Instruments For Measurement Of Length By Optical Means (AREA)

Description

【図面の簡単な説明】
第1図Aは本考案の一実施例の構成を示す図、
第1図Bは第1図Aに示す一実施例の作用を説明
するための図、第2図A,B〜第4図A,Bはそ
れぞれ従来例を説明するための図である。 1…2波長光源、2…スキヤニング反射鏡、1
0…単一波長光源、11,12…半透明鏡、13
…光強度検出器、14…クロツク形成回路。

Claims (1)

    【実用新案登録請求の範囲】
  1. 少なくとも2波長光源、スキヤニング反射鏡、
    半透明鏡、光強度検出器、2乗回路、フイルタ回
    路および演算処理回路を有する2波長干渉レーザ
    測定装置に、合成波を得るためのスキヤニング機
    構の動きを別個の単一波長光源によつてモニタす
    る装置を付加してなることを特徴とする2波長干
    渉レーザ測長装置。
JP16824384U 1984-11-06 1984-11-06 Pending JPS6184505U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16824384U JPS6184505U (ja) 1984-11-06 1984-11-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16824384U JPS6184505U (ja) 1984-11-06 1984-11-06

Publications (1)

Publication Number Publication Date
JPS6184505U true JPS6184505U (ja) 1986-06-04

Family

ID=30726020

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16824384U Pending JPS6184505U (ja) 1984-11-06 1984-11-06

Country Status (1)

Country Link
JP (1) JPS6184505U (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008099788A1 (ja) * 2007-02-13 2008-08-21 Naoyuki Koyama 測距方法及びレーザ測距装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5940133A (ja) * 1982-08-30 1984-03-05 Shimadzu Corp フ−リエ変換分光光度計

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5940133A (ja) * 1982-08-30 1984-03-05 Shimadzu Corp フ−リエ変換分光光度計

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008099788A1 (ja) * 2007-02-13 2008-08-21 Naoyuki Koyama 測距方法及びレーザ測距装置

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