JPS6184505A - 位置検出装置 - Google Patents

位置検出装置

Info

Publication number
JPS6184505A
JPS6184505A JP59206414A JP20641484A JPS6184505A JP S6184505 A JPS6184505 A JP S6184505A JP 59206414 A JP59206414 A JP 59206414A JP 20641484 A JP20641484 A JP 20641484A JP S6184505 A JPS6184505 A JP S6184505A
Authority
JP
Japan
Prior art keywords
optical system
lens
light
optical path
length
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59206414A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0453241B2 (enrdf_load_stackoverflow
Inventor
Minokichi Ban
箕吉 伴
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP59206414A priority Critical patent/JPS6184505A/ja
Publication of JPS6184505A publication Critical patent/JPS6184505A/ja
Publication of JPH0453241B2 publication Critical patent/JPH0453241B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP59206414A 1984-10-03 1984-10-03 位置検出装置 Granted JPS6184505A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59206414A JPS6184505A (ja) 1984-10-03 1984-10-03 位置検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59206414A JPS6184505A (ja) 1984-10-03 1984-10-03 位置検出装置

Publications (2)

Publication Number Publication Date
JPS6184505A true JPS6184505A (ja) 1986-04-30
JPH0453241B2 JPH0453241B2 (enrdf_load_stackoverflow) 1992-08-26

Family

ID=16522970

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59206414A Granted JPS6184505A (ja) 1984-10-03 1984-10-03 位置検出装置

Country Status (1)

Country Link
JP (1) JPS6184505A (enrdf_load_stackoverflow)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5183549A (enrdf_load_stackoverflow) * 1974-12-04 1976-07-22 Krautkraemer Gmbh
US4336997A (en) * 1979-03-06 1982-06-29 Erwin Sick Gmbh Optik-Electronik Change of distance measuring apparatus
JPS59114404A (ja) * 1982-12-22 1984-07-02 Hitachi Ltd 磁気ヘツドの形状および取付姿勢測定方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5183549A (enrdf_load_stackoverflow) * 1974-12-04 1976-07-22 Krautkraemer Gmbh
US4336997A (en) * 1979-03-06 1982-06-29 Erwin Sick Gmbh Optik-Electronik Change of distance measuring apparatus
JPS59114404A (ja) * 1982-12-22 1984-07-02 Hitachi Ltd 磁気ヘツドの形状および取付姿勢測定方法

Also Published As

Publication number Publication date
JPH0453241B2 (enrdf_load_stackoverflow) 1992-08-26

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term