JPH0453241B2 - - Google Patents
Info
- Publication number
- JPH0453241B2 JPH0453241B2 JP59206414A JP20641484A JPH0453241B2 JP H0453241 B2 JPH0453241 B2 JP H0453241B2 JP 59206414 A JP59206414 A JP 59206414A JP 20641484 A JP20641484 A JP 20641484A JP H0453241 B2 JPH0453241 B2 JP H0453241B2
- Authority
- JP
- Japan
- Prior art keywords
- optical system
- lens
- light beam
- light
- parallel light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/45—Multiple detectors for detecting interferometer signals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59206414A JPS6184505A (ja) | 1984-10-03 | 1984-10-03 | 位置検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59206414A JPS6184505A (ja) | 1984-10-03 | 1984-10-03 | 位置検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6184505A JPS6184505A (ja) | 1986-04-30 |
| JPH0453241B2 true JPH0453241B2 (enrdf_load_stackoverflow) | 1992-08-26 |
Family
ID=16522970
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59206414A Granted JPS6184505A (ja) | 1984-10-03 | 1984-10-03 | 位置検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6184505A (enrdf_load_stackoverflow) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2457253C2 (de) * | 1974-12-04 | 1982-09-02 | Krautkrämer, GmbH, 5000 Köln | Optisches interferometrisches Verfahren und Vorrichtung zur berührungslosen Messung der durch Ultraschallwellen verursachten Oberflächenauslenkung eines Prüflings |
| DE2908757C2 (de) * | 1979-03-06 | 1986-10-16 | Baumgartner, Viktor, 8028 Taufkirchen | Abstandsänderungs-Meßanordnung |
| JPS59114404A (ja) * | 1982-12-22 | 1984-07-02 | Hitachi Ltd | 磁気ヘツドの形状および取付姿勢測定方法 |
-
1984
- 1984-10-03 JP JP59206414A patent/JPS6184505A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6184505A (ja) | 1986-04-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107843213B (zh) | 共焦自准直中心偏和曲率半径测量方法与装置 | |
| CN104568389B (zh) | 双边错位差动共焦元件参数测量方法 | |
| US4732483A (en) | Interferometric surface profiler | |
| CN102519368A (zh) | 法向位移和角度传感光学测头及测量方法 | |
| CN102679894B (zh) | 反射式差动共焦透镜中心厚度测量方法 | |
| CN101226344A (zh) | 测量光学系统参数的测量装置及其测量方法 | |
| CN102679895A (zh) | 反射式共焦透镜中心厚度测量方法 | |
| CN109186477B (zh) | 后置分光瞳激光差动共焦透镜中心厚度测量方法与装置 | |
| US7435941B2 (en) | Methods for measuring optical characteristics by differential diffractive scanning | |
| GB2355310A (en) | White light interferometer | |
| CN109990732B (zh) | 横向相减差动共焦曲率半径测量方法 | |
| JP2000241128A (ja) | 面間隔測定方法および装置 | |
| JP5704150B2 (ja) | 白色干渉装置及び白色干渉装置の位置及び変位測定方法 | |
| JPS5979104A (ja) | 光学装置 | |
| TWI431240B (zh) | 三維量測系統 | |
| Xu et al. | Development and verification of a high-precision laser measurement system for straightness and parallelism measurement | |
| JPS63193003A (ja) | 凹部深さ・膜厚測定装置 | |
| CN105806237B (zh) | 反射式激光共焦曲率半径测量方法与装置 | |
| US7898671B2 (en) | Interferometer having a mirror system for measuring a measured object | |
| CN103673927A (zh) | 反射腔式差动共焦超大曲率半径测量方法 | |
| JPH0453241B2 (enrdf_load_stackoverflow) | ||
| JPS6184506A (ja) | 光路長測定装置 | |
| Fukatsu et al. | Development of an optical stylus displacement sensor for surface profiling instruments | |
| JPH08334606A (ja) | レンズ | |
| CN109883340B (zh) | 横向相减差动共焦透镜中心厚度测量方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |