JPS6179172A - 環境試験装置 - Google Patents

環境試験装置

Info

Publication number
JPS6179172A
JPS6179172A JP20116984A JP20116984A JPS6179172A JP S6179172 A JPS6179172 A JP S6179172A JP 20116984 A JP20116984 A JP 20116984A JP 20116984 A JP20116984 A JP 20116984A JP S6179172 A JPS6179172 A JP S6179172A
Authority
JP
Japan
Prior art keywords
test chamber
environmental test
environmental
test object
rotary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP20116984A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0158465B2 (https=
Inventor
Hiroaki Kobayashi
博昭 小林
Masayuki Wakui
正幸 涌井
Masahito Kusaka
日下　正仁
Kazuto Sugawara
一人 菅原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DENSHI GIKEN KK
Orion Machinery Co Ltd
Original Assignee
DENSHI GIKEN KK
Orion Machinery Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DENSHI GIKEN KK, Orion Machinery Co Ltd filed Critical DENSHI GIKEN KK
Priority to JP20116984A priority Critical patent/JPS6179172A/ja
Publication of JPS6179172A publication Critical patent/JPS6179172A/ja
Publication of JPH0158465B2 publication Critical patent/JPH0158465B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP20116984A 1984-09-26 1984-09-26 環境試験装置 Granted JPS6179172A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20116984A JPS6179172A (ja) 1984-09-26 1984-09-26 環境試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20116984A JPS6179172A (ja) 1984-09-26 1984-09-26 環境試験装置

Publications (2)

Publication Number Publication Date
JPS6179172A true JPS6179172A (ja) 1986-04-22
JPH0158465B2 JPH0158465B2 (https=) 1989-12-12

Family

ID=16436506

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20116984A Granted JPS6179172A (ja) 1984-09-26 1984-09-26 環境試験装置

Country Status (1)

Country Link
JP (1) JPS6179172A (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996026428A1 (en) * 1995-02-21 1996-08-29 Qualmark Corporation Apparatus for thermal and vibrational stress screening
JP2010534842A (ja) * 2007-10-05 2010-11-11 ムルティテスト・エレクトロニッシェ・ジステーメ・ゲーエムベーハー 電子部品の温度を調節できる回転ユニットを有する電子部品、特にｉｃの取扱装置
JP2010540944A (ja) * 2007-10-05 2010-12-24 ムルティテスト・エレクトロニッシェ・ジステーメ・ゲーエムベーハー 循環軌道に沿って案内される複数の回転運搬台を有する電子部品、特にｉｃ用の取扱装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5151355A (en) * 1974-10-30 1976-05-06 Hitachi Ltd Buhinno koonkensasochi
JPS54136959U (https=) * 1978-03-17 1979-09-22

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5151355A (en) * 1974-10-30 1976-05-06 Hitachi Ltd Buhinno koonkensasochi
JPS54136959U (https=) * 1978-03-17 1979-09-22

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996026428A1 (en) * 1995-02-21 1996-08-29 Qualmark Corporation Apparatus for thermal and vibrational stress screening
JP2010534842A (ja) * 2007-10-05 2010-11-11 ムルティテスト・エレクトロニッシェ・ジステーメ・ゲーエムベーハー 電子部品の温度を調節できる回転ユニットを有する電子部品、特にｉｃの取扱装置
JP2010540944A (ja) * 2007-10-05 2010-12-24 ムルティテスト・エレクトロニッシェ・ジステーメ・ゲーエムベーハー 循環軌道に沿って案内される複数の回転運搬台を有する電子部品、特にｉｃ用の取扱装置

Also Published As

Publication number Publication date
JPH0158465B2 (https=) 1989-12-12

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