JPH0158465B2 - - Google Patents
Info
- Publication number
- JPH0158465B2 JPH0158465B2 JP59201169A JP20116984A JPH0158465B2 JP H0158465 B2 JPH0158465 B2 JP H0158465B2 JP 59201169 A JP59201169 A JP 59201169A JP 20116984 A JP20116984 A JP 20116984A JP H0158465 B2 JPH0158465 B2 JP H0158465B2
- Authority
- JP
- Japan
- Prior art keywords
- test chamber
- environmental test
- rotary
- environmental
- test object
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20116984A JPS6179172A (ja) | 1984-09-26 | 1984-09-26 | 環境試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20116984A JPS6179172A (ja) | 1984-09-26 | 1984-09-26 | 環境試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6179172A JPS6179172A (ja) | 1986-04-22 |
| JPH0158465B2 true JPH0158465B2 (https=) | 1989-12-12 |
Family
ID=16436506
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20116984A Granted JPS6179172A (ja) | 1984-09-26 | 1984-09-26 | 環境試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6179172A (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1996026428A1 (en) * | 1995-02-21 | 1996-08-29 | Qualmark Corporation | Apparatus for thermal and vibrational stress screening |
| DE102007047596B4 (de) * | 2007-10-05 | 2013-02-07 | Multitest Elektronische Systeme Gmbh | Handhabungsvorrichtung für elektronische Bauelemente, insbesondere ICs, mit einer Mehrzahl von auf einer Umlaufbahn geführten Umlaufwagen |
| DE102007047680B4 (de) * | 2007-10-05 | 2009-11-26 | Multitest Elektronische Systeme Gmbh | Handhabungsvorrichtung für elektronische Bauelemente, insbesondere IC's, mit temperierbaren Umlaufeinheiten |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5151355A (en) * | 1974-10-30 | 1976-05-06 | Hitachi Ltd | Buhinno koonkensasochi |
| JPS54136959U (https=) * | 1978-03-17 | 1979-09-22 |
-
1984
- 1984-09-26 JP JP20116984A patent/JPS6179172A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6179172A (ja) | 1986-04-22 |
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