JPS6169120A - Boat for liquid growing - Google Patents
Boat for liquid growingInfo
- Publication number
- JPS6169120A JPS6169120A JP59190906A JP19090684A JPS6169120A JP S6169120 A JPS6169120 A JP S6169120A JP 59190906 A JP59190906 A JP 59190906A JP 19090684 A JP19090684 A JP 19090684A JP S6169120 A JPS6169120 A JP S6169120A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- slider
- crystal
- growing
- boat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
- H01L21/02625—Liquid deposition using melted materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
- H01L21/02628—Liquid deposition using solutions
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、通信用発光ダイオード等の化合物半導体のエ
ピタキシャル成長に使用するスライド式液相成長用ボー
トに関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a sliding liquid phase growth boat used for epitaxial growth of compound semiconductors such as light emitting diodes for communications.
従来、通信用発光ダイオードの液相成長には、第3図に
示すようなスライド式カーボンボードを用いていた。す
なわち、第3図で示した装置は、浴槽部10と、クエー
ハスライド板20(以下、スライダーと称する)と、ガ
イド30とから成シ、ガイド30に挿入された浴槽1°
0の下側を、スライダー20のスライドによってウェー
ハ保持部20LK保持され九ウェーハが各溶液の底部に
運ばれて多層成長が行なわれる。一般に、成長用結晶は
スライダー20の結晶保持部201に載置するが、′第
2回置に示すように面発光型通信用発光ダイオードのウ
ィンド層40は、厚みが30〜70〔μ・m〕であシ、
基板結晶ウェーハ60の厚みの数分のLK及び、さらに
、クエーハ60の端部での工、ジグ誼−ス層401は、
成長層厚の数倍から10倍にも達する。そのためスライ
ダー20の上面と、結晶表面までの距離(スキ間)を大
!くしなければ、溶質核や工、ヂグロースのためにスラ
イドが防げられる。ところが、前記スキ間を大きく取シ
過ぎると各溶液が、前記スキ間を介して持ち込まれ、成
長境界面および続く成長層の組成比、キャリア濃度の制
御性と再現性が低下する。Conventionally, a sliding carbon board as shown in FIG. 3 has been used for liquid phase growth of communication light emitting diodes. That is, the apparatus shown in FIG. 3 is composed of a bathtub section 10, a Quaha slide plate 20 (hereinafter referred to as a slider), and a guide 30, and the bathtub 1° inserted into the guide 30.
The lower side of the 9 wafer is held by the wafer holding portion 20LK by the slide of the slider 20, and the 9 wafer is carried to the bottom of each solution to perform multilayer growth. Generally, the crystal for growth is placed on the crystal holding part 201 of the slider 20, but as shown in the second position, the window layer 40 of the surface-emitting communication light emitting diode has a thickness of 30 to 70 μm. ] Adashi,
LK of several thicknesses of the substrate crystal wafer 60 and the jig layer 401 formed at the edge of the wafer 60 are as follows:
The thickness ranges from several times to 10 times the thickness of the grown layer. Therefore, increase the distance (gap) between the top surface of the slider 20 and the crystal surface! If you do not do this, sliding can be prevented due to solute nuclei, degrowth, and degrowth. However, if the gap is made too large, each solution will be brought in through the gap, and the controllability and reproducibility of the composition ratio and carrier concentration of the growth interface and the subsequent growth layer will deteriorate.
溶液の残j5による持ち込まれに対しては、洗浄溶液(
ウォッシュメルト)を使用して、組成比の制御をある程
度行うことが可能であるが、本発明者の検討によれば、
約300〔μ・m3以上のスキ間では、ウォッシュメル
ト効果の再現性が乏しい事が明らかであるから、スキ間
は50〜200〔μ・m〕に抑えなければならない。上
記理由によシ、通信用発光ダイオードのエピタキシャル
成長の際ICは、あらかじめウェーハ端部の面取りを行
ない実用に供していた。For cleaning solution (
Although it is possible to control the composition ratio to some extent by using wash melt), according to the study of the present inventor,
It is clear that the reproducibility of the wash melt effect is poor at a gap of about 300 [μ·m3 or more], so the gap must be suppressed to 50 to 200 [μ·m]. For the above reasons, when epitaxially growing light emitting diodes for communication, the edges of the IC wafers are chamfered in advance for practical use.
しかし、クエーハ端部の面取〕は、その作業工程中にウ
ェーハ表面に欠陥を導入せしめる危険性が高く、素子の
信頼度上問題であシ、さらに洗浄工程等の作業工数も必
要であシ、液相エピタ中シ1 .2□。、、あよ7
.よ工、。However, chamfering the edges of the wafer has a high risk of introducing defects to the wafer surface during the process, which poses a problem in terms of device reliability, and requires additional work such as cleaning processes. , during liquid phase epitaxy 1. 2□. ,,Ayo7
.. Yoko,.
本発明の目的は、各成長層の組成比の制御性を維持し、
ウェーハ端部の面取)を不要として、生産性の向上をは
かることができる液相成長用ボートを提供するととにあ
る。The purpose of the present invention is to maintain controllability of the composition ratio of each growth layer,
It is an object of the present invention to provide a boat for liquid phase growth that can improve productivity by eliminating the need for chamfering of wafer edges.
本発明は、スライダーの結晶保持部のスライド方向に直
角の方向の外稜を好ましくは巾0.2〜2.0(mm)
削シ落して、成長用溶液をウェーハ端部側面にも接触せ
しめることを特徴とする。In the present invention, the outer edge of the crystal holding portion of the slider in the direction perpendicular to the sliding direction preferably has a width of 0.2 to 2.0 (mm).
It is characterized in that it is scraped off so that the growth solution also comes into contact with the side surface of the end of the wafer.
上記ボートを用いることによって、溶質の析出が端部側
面でも生じ、端部での成長層厚方向への厚み分を減少せ
しめることができる。このため、スキ間をより減少せし
めることが可能となシ各層の組成比の制御性が、一段と
高まシ、さらに、端部の面取シをしない基板ウェーハを
使用することができるため、素子の信頼性が向上し処理
工数が減少し、エピタキシャル成長の生産性が向上した
。By using the boat described above, solute precipitation also occurs on the side surfaces of the ends, and the thickness of the grown layer at the ends in the thickness direction can be reduced. For this reason, it is possible to further reduce the gap, and the controllability of the composition ratio of each layer is further improved.Furthermore, it is possible to use a substrate wafer without chamfering the edges, so it is possible to improve the controllability of the composition ratio of each layer. The reliability of the process has been improved, the number of processing steps has been reduced, and the productivity of epitaxial growth has been improved.
以下、本発明を図面を参照して述べる。 The present invention will be described below with reference to the drawings.
第り図は本発明の一実施例であシ、スライダー20の結
晶保持部201の外稜が削シ落とされている。巾0.2
〜2.0(mm)K削るのが好ましい。Figure 2 shows an embodiment of the present invention, in which the outer edge of the crystal holding portion 201 of the slider 20 is shaved off. Width 0.2
It is preferable to shave by ~2.0 (mm)K.
ここに、端部面取シをしていない基板クエーハが設置さ
れ1.スキ間が150Cμm〕になる様にする。Here, a substrate wafer without chamfered edges is installed.1. The gap should be 150Cμm].
次に、第3図と同じように、浴槽10をスライダ20に
載置し、ガイド30の一方の側から挿入する。しかる後
に浴槽LOK各成長用ソースをチャージして850〔℃
〕で保持した後に0.2〔C/Min〕で除冷し、通信
用発光ダイオードの第1層ウィンド層40を約50〔μ
・m〕成長せしめる。上記結晶保持部201に設置され
た基板ウェーハの端部に於いては、第2図の)に示すよ
うに、ウェーハ60の成長層方向には約70〜L30〔
μ・m〕成長し、側面には厚さ50〜【OO〔μ・m〕
成長する。スキ間が150〔μ・石〕であるため、スラ
イダー20のスライドを防げることなく、かつ持ち込ま
れ量をウォッシュメルトによって洗浄して、続く第2層
成長溶液の位置に前記基板クエーノ・を位置せしめるこ
とができる。順次必要な層を連続的にエピタキシャル成
長を行ない、各層の組成比の制御を再現性よく実現し、
かつ工、デクロースによるスライド停止等の工程上の事
故も皆無となシ良質の通信用発光ダイオードの成長結晶
が得られた。Next, as in FIG. 3, the bathtub 10 is placed on the slider 20 and inserted into the guide 30 from one side. After that, charge the bathtub LOK with each growth source and heat it to 850°C.
] and then slowly cooled at 0.2 [C/Min] to form the first window layer 40 of the communication light emitting diode to about 50 [μ
・M] Let it grow. At the end of the substrate wafer placed in the crystal holding section 201, as shown in ) in FIG.
μ・m], and the sides have a thickness of 50 to [OO[μ・m]
grow up. Since the gap is 150 [μ・stone], the sliding of the slider 20 is not prevented, and the amount brought in is washed away with wash melt, and the substrate Quaeno is positioned at the position of the subsequent second layer growth solution. be able to. By epitaxially growing the necessary layers one after another, we can control the composition ratio of each layer with good reproducibility.
Moreover, a high-quality grown crystal of a light-emitting diode for communication was obtained without any process accidents such as slide stoppage due to decrose.
以上のとおシ、本発明のボートによれば半導体ウェーハ
を再取りすることなく再現性よく成長層が得られる。As described above, according to the boat of the present invention, a grown layer can be obtained with good reproducibility without having to take the semiconductor wafer again.
第り図は、本発明の一実施例を示す斜視図、第2図(A
l 、 (aは夫々従来および本発明の一実施例による
エビウェーハの断面図、第3図は、従来例を示す外観図
である。
10・・・・・・浴槽、20・・・・・・基板ウェーハ
スライド板(スライダー)、30・・・・・・ガイド、
20L・・団・結晶保持部、40・・・・・・面発光型
、通信用発光ダイオードのウィンド層、50・・・・・
・成長用溶液。Figure 2 is a perspective view showing one embodiment of the present invention, and Figure 2 (A
l, (a is a sectional view of shrimp wafers according to a conventional example and an embodiment of the present invention, respectively, and FIG. 3 is an external view showing a conventional example. 10... bathtub, 20...・Substrate wafer slide plate (slider), 30... Guide,
20L...Group/crystal holding part, 40...Wind layer of surface emitting type, communication light emitting diode, 50...
・Growth solution.
Claims (1)
するガイド部を有するスライド式液相エピタキシャル成
長用ボートにおいて、前記ウェーハスライド板に設けら
れた結晶保持部の外稜を削り落して、成長用溶液が基板
ウェーハの端部側面にも接触するようにしたことを特徴
とする液相成長用ボート。In a slide-type liquid phase epitaxial growth boat having a bathtub section, a wafer slide plate, and a guide section for storing and holding both, the outer edge of the crystal holding section provided on the wafer slide plate is scraped off, and the growth solution is applied to the substrate. A boat for liquid phase growth, characterized in that it also comes into contact with the side surface of the end of a wafer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59190906A JPS6169120A (en) | 1984-09-12 | 1984-09-12 | Boat for liquid growing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59190906A JPS6169120A (en) | 1984-09-12 | 1984-09-12 | Boat for liquid growing |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6169120A true JPS6169120A (en) | 1986-04-09 |
Family
ID=16265680
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59190906A Pending JPS6169120A (en) | 1984-09-12 | 1984-09-12 | Boat for liquid growing |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6169120A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100407461C (en) * | 2005-11-28 | 2008-07-30 | 晶元光电股份有限公司 | Method for producing luminous element with high-illuminating effect |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4945683A (en) * | 1972-09-01 | 1974-05-01 | ||
JPS5219191A (en) * | 1975-08-06 | 1977-02-14 | Sakai Chem Ind Co Ltd | Catalyst and process for removing nox |
JPS5643634A (en) * | 1979-09-18 | 1981-04-22 | Fujitsu Ltd | Negative type resist material |
JPS5732620A (en) * | 1980-08-05 | 1982-02-22 | Fujitsu Ltd | Method for liquid-phase epitaxial growth and growing boat |
-
1984
- 1984-09-12 JP JP59190906A patent/JPS6169120A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4945683A (en) * | 1972-09-01 | 1974-05-01 | ||
JPS5219191A (en) * | 1975-08-06 | 1977-02-14 | Sakai Chem Ind Co Ltd | Catalyst and process for removing nox |
JPS5643634A (en) * | 1979-09-18 | 1981-04-22 | Fujitsu Ltd | Negative type resist material |
JPS5732620A (en) * | 1980-08-05 | 1982-02-22 | Fujitsu Ltd | Method for liquid-phase epitaxial growth and growing boat |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100407461C (en) * | 2005-11-28 | 2008-07-30 | 晶元光电股份有限公司 | Method for producing luminous element with high-illuminating effect |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE102016124650B4 (en) | SEMICONDUCTOR WAFERS AND METHODS | |
CA1268846C (en) | Semiconductor laser with mesa structure | |
JPS6169120A (en) | Boat for liquid growing | |
Rode et al. | Growth of AlGaAs-GaAs heterostructures from step-cooled solutions | |
JPS58110491A (en) | Liquid phase epitaxial growth method | |
JPS63164309A (en) | Liquid growth method | |
Nishitani et al. | An improved LPE growth method for GaAs-Ga1-xAlxAs double heterostructures | |
Tamari et al. | LPE growth of Pb1-xSnxTe layers on metal-etched substrates | |
JPH01214017A (en) | Method and apparatus for molecular beam epitaxial growth | |
JPH0445238Y2 (en) | ||
KR100304547B1 (en) | Boat structure for epitaxial growth | |
JPS5931972B2 (en) | Liquid phase epitaxial growth method | |
JPS62216991A (en) | Sliding type liquid growth method | |
JPH02264489A (en) | Manufacture of buried type semiconductor device | |
JPS6169119A (en) | Boat for liquid-phase epitaxial growth | |
KR950009247Y1 (en) | Boat for epitaxial layer fabrication of semiconductor device | |
JPS59205715A (en) | Slide board liquid phase epitaxial device | |
JPS5935424A (en) | Manufacture of semiconductor device | |
US4594126A (en) | Growth of thin epitaxial films on moving substrates from flowing solutions | |
JPS5816524A (en) | Liquid phase epitaxial growth | |
JPS61220321A (en) | Selective vapor growth method | |
JPH051237B2 (en) | ||
JPS58175825A (en) | Growth method for semiconductor crystal | |
JPS6071595A (en) | Liquid-phase epitaxial growth device | |
JPH01126299A (en) | Liquid phase epitaxy device |