JPS616278A - Plasma cvd device - Google Patents
Plasma cvd deviceInfo
- Publication number
- JPS616278A JPS616278A JP12520184A JP12520184A JPS616278A JP S616278 A JPS616278 A JP S616278A JP 12520184 A JP12520184 A JP 12520184A JP 12520184 A JP12520184 A JP 12520184A JP S616278 A JPS616278 A JP S616278A
- Authority
- JP
- Japan
- Prior art keywords
- drums
- electrode
- drum
- raw material
- electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/24—Deposition of silicon only
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
[技術分野1
本発明は、プラズマCVD技術を用いてドラム等の円筒
状基体の表面にアモルファス−シリコン等の膜を蒸着し
て、例えば、電子写真用感光体ドラムを連続的に生産す
ることができるプラズマCVD装置に関し、特にその原
料ガスを適切に処理してドラム表面にアモルファス・シ
リコン膜を均等に蒸着することができるプラズマCVD
装置に関するものである。Detailed Description of the Invention [Technical Field 1] The present invention relates to the production of electrophotographic photosensitive drums, for example, by depositing a film of amorphous silicon or the like on the surface of a cylindrical substrate such as a drum using plasma CVD technology. Regarding a plasma CVD device that can continuously produce, in particular, a plasma CVD device that can appropriately process the raw material gas and uniformly deposit an amorphous silicon film on the drum surface.
It is related to the device.
[従来技術1
この種の装置は、プラズマCVD装置の電極配置方式か
ら分類すれば、従来の容量結合型プラズマCVD装置と
同様の構造を有するが、この構造を主に電子写真用感光
体ドラム作製用のプラズマCVD装置に適用すると、カ
ソード電極とアノード電極(ドラム)とが同心円状に配
置されているため、ドラム収納個数が制約され、装置構
造が複雑になる。[Prior art 1] This type of device has a structure similar to a conventional capacitively coupled plasma CVD device if classified based on the electrode arrangement method of the plasma CVD device, but this structure is mainly used for manufacturing photosensitive drums for electrophotography. When applied to a commercial plasma CVD apparatus, the cathode electrode and the anode electrode (drum) are arranged concentrically, which limits the number of drums that can be accommodated and complicates the apparatus structure.
そこで以上のような問題を考慮して、主としてアモルフ
ァス拳シリコン感光体材料を用いる電子写真用感光体ド
ラムの量産装置な得べく、L述の従来例のごとき複雑な
装置構造を大幅に簡素化し、ドラムの収納個数を増やし
、かつ電極配置方法、及び形状を改善することにより、
従来の装置では困難であった電子写真用ドラム等の量産
、及び高速成膜を有利に可能ならしめた装置が提案され
た。Therefore, in consideration of the above-mentioned problems, in order to create a mass production device for electrophotographic photoreceptor drums that mainly uses amorphous silicon photoreceptor material, the complicated device structure of the conventional example described in L was significantly simplified. By increasing the number of drums that can be stored and improving the electrode arrangement method and shape,
An apparatus has been proposed that advantageously enables mass production of electrophotographic drums and the like and high-speed film formation, which has been difficult with conventional apparatuses.
第1図はこのようなプラズマCVD装置を示し、図中1
5は表面にアモルファス・シリコン膜を形成するように
アルミニウム製の基板をドラム状に形成した円筒状基体
としてのドラムである。FIG. 1 shows such a plasma CVD apparatus, and in the figure 1
Reference numeral 5 denotes a drum as a cylindrical base body, which is an aluminum substrate formed into a drum shape so as to form an amorphous silicon film on its surface.
1はドラムを加熱するための加熱室、2は加熱室lに続
けて設けられ、ドラム+5の表面にプラズマCVD 法
によりアモルファス・シリコン膜を形成するための反応
室、および3は反応室2に続けて設けられ、膜形成後の
ドラムを冷却するための冷却室である。これらの室1.
2および3は気密構造を有している。6は複数のドラム
15を軸中心に回転させると共に、これらの中心軸 が
互いに同一平面上になるように、かつ各軸が平行になる
ように直立して保持し、さらにドラム回転搬送機構を備
えた保持枠である。1 is a heating chamber for heating the drum, 2 is a reaction chamber provided following heating chamber 1 and for forming an amorphous silicon film on the surface of drum +5 by plasma CVD method, and 3 is a reaction chamber in reaction chamber 2. A cooling chamber is provided next to the drum for cooling the drum after film formation. These chambers1.
2 and 3 have an airtight structure. 6 rotates a plurality of drums 15 around their axes and holds them upright so that their central axes are on the same plane and parallel to each other, and further includes a drum rotation conveyance mechanism. It is a holding frame.
4は加熱室l内に各室1.2および3の連続右向に沿う
ように配置された一対のヒーターである。Reference numeral 4 denotes a pair of heaters arranged in the heating chamber 1 so as to be continuous with the chambers 1, 2 and 3 to the right.
この一対のヒーター4は、互いに平行になるように直立
して配置され、かつその間に配列方向がヒーター4に平
行になるように配置されたドラム15を加熱する。5は
各室の一側壁に設けられ、各室を真空に保つためのフィ
ルター及びバッフルを備えた排気系である。7はカソー
ド電極としての一対の平板状電極であって、互いに平行
になるように直立して反応室2内に配置されている。こ
の一対の電極7は原料ガス供給のため二重構造となし、
その間に配列方向が電極7と平行になるように配置され
たドラム15に向ってガスを噴出する多数の孔を内側全
面にわたって有し、さらにヒータにより加熱される。8
は平板状電極7の外側に接続された、同電極7の二重構
造内に原料ガスを供給するための原料ガス供給パイプ、
8は電極7にパイプ8を介して高周波パワーを供給する
ための電源、lOは保持枠6に保持されたドラム15を
7ノード電極とするためのアースである。The pair of heaters 4 are arranged upright so as to be parallel to each other, and heat a drum 15 arranged between them so that the arrangement direction is parallel to the heaters 4. Reference numeral 5 denotes an exhaust system provided on one side wall of each chamber and equipped with a filter and baffle for keeping each chamber in a vacuum. A pair of flat electrodes 7 serve as cathode electrodes, and are arranged upright in the reaction chamber 2 so as to be parallel to each other. This pair of electrodes 7 has a double structure for supplying raw material gas,
The drum 15 has a large number of holes over its entire inner surface that ejects gas toward the drum 15, which is arranged so that its arrangement direction is parallel to the electrodes 7, and is further heated by a heater. 8
is a raw material gas supply pipe connected to the outside of the flat electrode 7 for supplying raw material gas into the double structure of the electrode 7;
8 is a power source for supplying high frequency power to the electrode 7 via the pipe 8, and IO is a ground for making the drum 15 held by the holding frame 6 into a 7-node electrode.
11は一対の冷却板であって、互いに平行になるように
直立して冷却室3内に配置されている。一対の冷却板1
1はその間にある膜形成の終ったドラム15を冷却する
ために内部に水等の冷媒流路を有する。 12は冷却板
II内に供給する水等の冷媒、 13は各室1.2およ
び3を隔離し、かつドラム15が保持枠6とともに移動
するときに面状態になるように制御されるゲート・バル
ブ、 14は加熱室l及び冷却室3の排気系5に設けら
れ各室1および3を大気に戻すためのり−ク―バルブで
ある。A pair of cooling plates 11 are arranged upright in the cooling chamber 3 so as to be parallel to each other. A pair of cooling plates 1
1 has a refrigerant flow path for water or the like inside to cool the drum 15 between which the film formation has been completed. 12 is a refrigerant such as water to be supplied into the cooling plate II; 13 is a gate that isolates each chamber 1, 2 and 3 and is controlled so that the drum 15 is in a flat state when it moves together with the holding frame 6; A valve 14 is a refrigerant valve provided in the exhaust system 5 of the heating chamber 1 and the cooling chamber 3 to return each chamber 1 and 3 to the atmosphere.
保持枠6に固定されたドラム15は、第1図中左端のゲ
ート・バルブ13内を通って、加熱室1に入り、排気系
5により真空にされた後、加熱室1内において回転しな
がらヒーター4により加熱される。加熱されたドラム1
5は両室1および2間のゲート−バルブ13内を通って
排気系5により真空に保たれた反応室2に保持枠8とと
もに入る。反応室2に入ったドラム15はアース10に
接続されて、高周波電源8に接続されたカソード電極と
しての一対の電極7に対する7ノード電極を形成する。The drum 15 fixed to the holding frame 6 enters the heating chamber 1 through the gate valve 13 at the left end in FIG. It is heated by a heater 4. heated drum 1
5 passes through the gate-valve 13 between the chambers 1 and 2 and enters the reaction chamber 2, which is kept in vacuum by the exhaust system 5, together with the holding frame 8. The drum 15 that has entered the reaction chamber 2 is connected to earth 10 and forms a 7-node electrode for a pair of electrodes 7 as cathode electrodes connected to a high frequency power source 8 .
電極7と電場を形成し、ヒーターにより加熱されたドラ
ム15の表面には、原料ガス供給パイプ8から送られる
シラン等の原料ガスがプラズマ中で分解することによっ
てアモルファス・シリコン膜が形成される。膜形成の終
ったドラム15は反応室2と冷却室3との間のゲートφ
バルブ13内を通って、排気系5により真空に保たれた
冷却室3に入り、冷却板11を介して冷媒12と熱交換
して冷却され、リーク会バルブ14により大気に戻され
た冷却室3から第1図中右端のゲートψバルブ13内を
通って冷却室s外に出され蒸着工程を終了する。An amorphous silicon film is formed on the surface of the drum 15, which forms an electric field with the electrode 7 and is heated by a heater, by decomposing a source gas such as silane sent from the source gas supply pipe 8 in the plasma. The drum 15 after film formation is placed at the gate φ between the reaction chamber 2 and the cooling chamber 3.
The cooling chamber passes through the valve 13 and enters the cooling chamber 3 kept in a vacuum by the exhaust system 5, is cooled by exchanging heat with the refrigerant 12 via the cooling plate 11, and is returned to the atmosphere by the leak valve 14. 3, passes through the gate ψ valve 13 at the right end in FIG. 1, and is taken out of the cooling chamber s to complete the vapor deposition process.
しかしながら以上のような構成のプラズマCVD装置に
おいては次のような欠点がある。すなわち、第2図は反
応室2の断面を示し、図中矢印で示すように原料ガスは
、平板状電極7の内側に全面にわたって形成されたガス
噴出用の孔7Aからドラム15に向って噴出する0図中
右側の平板状電極7から噴出した原料ガスは、ドラム1
5の主として右側の半周部分に接触し、そして、左側の
平板状電極7の周辺を通って排気系5に排気さる。However, the plasma CVD apparatus having the above configuration has the following drawbacks. That is, FIG. 2 shows a cross section of the reaction chamber 2, and as shown by the arrow in the figure, the raw material gas is ejected toward the drum 15 from the gas ejection holes 7A formed over the entire surface inside the flat electrode 7. The raw material gas ejected from the flat electrode 7 on the right side of the figure is transferred to the drum 1.
5, and is exhausted to the exhaust system 5 through the periphery of the flat electrode 7 on the left side.
一方、図中左側の平板状7電極から噴出した原料ガスは
ドラム15の主として左側の半周部分に接触して左側の
平板状電極7の周辺を通って排気系5に排気される。On the other hand, the raw material gas ejected from the flat plate-shaped electrode 7 on the left side of the figure comes into contact with mainly the left half circumference of the drum 15, passes around the left side flat plate-shaped electrode 7, and is exhausted to the exhaust system 5.
このように反応室2内においては、第2図に示すように
ドラム15の左側における軸方向の中間部分近傍の原料
ガスおよび左側の平板状電極7の内側の−1−下両端部
分から噴出した原料ガスなどがよどみやすい、その結果
、ドラム15の周囲において、原料ガスの密度は不均一
になりやすく、そのため、ドラム15の表面に得られた
アモルファス・シリコンの膜厚および膜質は不均一にな
りやすい。In this way, in the reaction chamber 2, as shown in FIG. The raw material gas tends to stagnate, and as a result, the density of the raw material gas tends to become uneven around the drum 15, and as a result, the thickness and quality of the amorphous silicon film obtained on the surface of the drum 15 become uneven. Cheap.
[目的1
本発明の目的は以−Lのような問題を解消し、適切な原
料ガスの流れを形成して、膜厚および膜質の均一なドラ
ム等の円筒状基体が得られるプラズマCVD装置を提供
することにある。[Objective 1] The object of the present invention is to solve the following problems and to provide a plasma CVD apparatus that can form an appropriate flow of raw material gas and obtain a cylindrical substrate such as a drum with uniform film thickness and film quality. It is about providing.
[実施例]
第3図は本発明の一実施例にかかるプラズマCVD装置
の要部の平面図、第4図は同装置の要部の断面図である
6本発明にかかるプラズマCVD装置においては、反応
室内の電極および原料ガス供給排気のための構造を除い
て第1図に示したプラズマCVD装置と同様な構成であ
るので、以下、反応室について主に説明する。[Example] FIG. 3 is a plan view of the main parts of a plasma CVD apparatus according to an embodiment of the present invention, and FIG. 4 is a sectional view of the main parts of the same apparatus.6 In the plasma CVD apparatus according to the present invention, The structure is similar to that of the plasma CVD apparatus shown in FIG. 1 except for the electrodes in the reaction chamber and the structure for supplying and exhausting raw material gas, so the reaction chamber will mainly be described below.
すなわち第3図および第4図に示すように、本発明にか
かるプラズマCVD装置における反応室21内には、内
側が平坦な一対の平板状電極22および23が、従来の
平板状電極7と同様の位置に、互いに平行になるように
直立して配置されている。この一方の平板状電極22は
、従来の電極7と同様に、原料ガス供給のための二重構
造とし、内側全面にわたってガス噴出用の多数の孔24
を有する。That is, as shown in FIGS. 3 and 4, in the reaction chamber 21 of the plasma CVD apparatus according to the present invention, a pair of flat electrodes 22 and 23 with flat insides are provided, similar to the conventional flat electrode 7. are placed upright and parallel to each other. One of the flat electrodes 22, like the conventional electrode 7, has a double structure for supplying raw material gas, and has numerous holes 24 for gas ejection over the entire inner surface.
has.
また、他の一方の平板状電極23は、原料ガス排気のた
めの二重構造とし、内側全面にわたってガス吸込用の多
数の孔25を有する。The other flat electrode 23 has a double structure for exhausting raw material gas, and has a large number of holes 25 for gas suction over the entire inside surface.
孔24および25の位置3間隔、孔径および個数を適当
に設定することによって、後述するように反応室21内
における原料ガスの密度をドラム15の軸方向に均一に
することができる。By appropriately setting the distance between the positions of the holes 24 and 25, the hole diameter, and the number of holes, the density of the raw material gas in the reaction chamber 21 can be made uniform in the axial direction of the drum 15, as will be described later.
−・方の平板状電極22の外側には、その二重構造内に
原ネ4ガスを供給するための原料ガス供給パイプ26を
接続し、他方の平板状電極23の外側には、その二重構
造内に孔25を介して原料ガスを吸込み、これを反応室
21外に排気するための原料ガス排気パイプ27を接続
する0両電極22および23を、パイプ23および27
を介して高周波電極9に接続し、これらをカソード電極
とする。A raw material gas supply pipe 26 for supplying raw gas 4 into the double structure is connected to the outside of the flat electrode 22 on the - side, and a raw material gas supply pipe 26 for supplying raw gas 4 into the double structure is connected to the outside of the flat electrode 23 on the other side. The electrodes 22 and 23 are connected to the pipes 23 and 27 to connect the raw material gas exhaust pipe 27 for sucking the raw material gas into the heavy structure through the hole 25 and exhausting it outside the reaction chamber 21.
are connected to the high-frequency electrode 9 through the electrode, and these are used as cathode electrodes.
両電極22および23の外側にはヒーター4が取付けら
れている。A heater 4 is attached to the outside of both electrodes 22 and 23.
原料ガス供給パイプ26は、図示しない原料ガス供給源
に接続されており、原料ガス排気パイプ27は図示しな
い排気装置に接続されている。The raw material gas supply pipe 26 is connected to a raw material gas supply source (not shown), and the raw material gas exhaust pipe 27 is connected to an exhaust device (not shown).
ドラム+5はアースされて、7ノード電極となっている
。Drum +5 is grounded, making it a 7-node electrode.
以上のような構成による本発明プラズマCVD装置の作
用を次に説明する。第3図および第4図に矢印で示すよ
うに、一方の電極22の内側の孔24から反応室21内
にドラム■5に向って噴出した原料ガスは、一対の平板
状電極22および23の間の空間をドラム15の軸中心
方向と直角に流れてドラム15の周囲を通過し、ついで
他方の電極23の内側の孔25に吸い込まれて同電極2
3の二重構造および排気パイプ27を介して反応室21
外に排気される。このように原料ガスは電極22の孔2
4から噴出して、ドラム15の表面へのアモルファス・
シリコン膜形成に寄与し、電極23の孔25に吸込まれ
るまで2 ドラム15の軸心と直角な方向そったよどみ
ないスムーズな流れを形成する。The operation of the plasma CVD apparatus of the present invention having the above configuration will be explained next. As shown by the arrows in FIGS. 3 and 4, the raw material gas ejected from the inner hole 24 of one electrode 22 into the reaction chamber 21 toward the drum 5 flows through the pair of flat electrodes 22 and 23. It flows through the space between the drums at right angles to the axial center direction of the drum 15, passes around the drum 15, and is then sucked into the hole 25 inside the other electrode 23.
3 and the reaction chamber 21 via the exhaust pipe 27.
Exhausted outside. In this way, the raw material gas flows through the holes 2 of the electrode 22.
4 and onto the surface of the drum 15.
It contributes to the formation of a silicon film and forms a smooth flow without stagnation along the direction perpendicular to the axis of the drum 15 until it is sucked into the hole 25 of the electrode 23.
その結果、ドラム15の周囲のガス密度が、とくにその
−L下方向のガス密度が均一になり、ドラム15の表面
には膜厚および膜質が均一なアモルファス・シリコン膜
が形成される。As a result, the gas density around the drum 15, especially in the downward direction -L, becomes uniform, and an amorphous silicon film with uniform thickness and quality is formed on the surface of the drum 15.
なお、原料ガスの噴出用の孔24および同ガスの吸い込
み用の孔25の各々の位置9間隔および個数を適当に設
定することによって、ドラム15の配列方向におけるガ
ス密度をも適切に制御することができる。したがってド
ラム15の配列方向における原料ガスの分解効率も効率
的に制御することができる。Note that the gas density in the arrangement direction of the drums 15 can also be appropriately controlled by appropriately setting the spacing and number of the holes 24 for blowing out raw material gas and the holes 25 for suctioning the same gas. I can do it. Therefore, the decomposition efficiency of the raw material gas in the arrangement direction of the drums 15 can also be efficiently controlled.
加熱室1および冷却室3におけるドラム15の処理は従
来と同様である。The processing of the drum 15 in the heating chamber 1 and the cooling chamber 3 is the same as in the conventional case.
また、上記実施例では、一対の電極22および23は共
に高周波電源8に接続してカソード電極としたが、これ
らのいずれか一方をカソード電極とし、他方を高周波電
源8に接続せずにアースして、アノード電極としてもよ
い(ドラム15はいずれの場合もアースする)。Furthermore, in the above embodiment, the pair of electrodes 22 and 23 were both connected to the high frequency power source 8 to serve as the cathode electrode, but it is also possible to use one of these electrodes as the cathode electrode and the other to be grounded without being connected to the high frequency power source 8. Alternatively, it may be used as an anode electrode (the drum 15 is grounded in either case).
【効果1
以1―説明したように本発明によれば、膜厚および膜質
が均一であり、電気的特性に優れたアモルファスやシリ
コン等の膜を表面に有する円筒状基体を効率的に得るこ
とができる。また本発明によれ゛ば、円筒状基体の配列
方向におけるガス密度を適切に制御することができる。[Effect 1] As explained above, according to the present invention, it is possible to efficiently obtain a cylindrical substrate having a film of amorphous, silicon, etc. on the surface, which has uniform film thickness and film quality, and has excellent electrical properties. I can do it. Further, according to the present invention, the gas density in the arrangement direction of the cylindrical substrates can be appropriately controlled.
第1図は電子写真感光体ドラム製造用の従来のプラズマ
CVD装置の概略平面図、
第2図は同装置における反応室の縦断面図、第3図は電
子写真感光体ドラム製造用の本発明にかかるプラズマC
VD装置の一実施例を示す平面図。
第4図は同装置における反応室の縦断面図である。
15・・・ドラム、
21・・・反応室、
22.23・・・平板状電極、
24・・・原料ガスの噴射用の孔、
25・・・原ネ4ガス吸込み用の孔、
26・・・原料ガス供給パイプ。FIG. 1 is a schematic plan view of a conventional plasma CVD apparatus for manufacturing electrophotographic photoreceptor drums, FIG. 2 is a longitudinal sectional view of a reaction chamber in the same apparatus, and FIG. 3 is a diagram of the present invention for manufacturing electrophotographic photoreceptor drums. plasma C applied to
FIG. 1 is a plan view showing an embodiment of a VD device. FIG. 4 is a longitudinal sectional view of the reaction chamber in the same apparatus. 15... Drum, 21... Reaction chamber, 22. 23... Flat electrode, 24... Hole for injection of raw material gas, 25... Hole for suction of raw gas 4, 26. ... Raw material gas supply pipe.
Claims (1)
側に原料ガスの噴出部を形成すると共に他方の内側に原
料ガスの吸込部を形成した一対の平行平板電極と、各中
心軸が前記電極と平行な同一平面上に位置し、かつ互い
に平行になるように複数の円筒状基体を前記一対の平行
平板電極の間に配置するための基体保持手段とを具えた
ことを特徴とするプラズマCVD装置。A pair of parallel plate electrodes arranged parallel to each other and having a raw material gas ejection part formed inside one and a raw material gas suction part formed inside the other; and a substrate holding means for arranging a plurality of cylindrical substrates between the pair of parallel plate electrodes so as to be located on the same plane parallel to and parallel to each other. Device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12520184A JPS616278A (en) | 1984-06-20 | 1984-06-20 | Plasma cvd device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12520184A JPS616278A (en) | 1984-06-20 | 1984-06-20 | Plasma cvd device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS616278A true JPS616278A (en) | 1986-01-11 |
Family
ID=14904405
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12520184A Pending JPS616278A (en) | 1984-06-20 | 1984-06-20 | Plasma cvd device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS616278A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5990628A (en) * | 1982-11-16 | 1984-05-25 | Seiko Epson Corp | Plasma chemical vapor deposition device |
-
1984
- 1984-06-20 JP JP12520184A patent/JPS616278A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5990628A (en) * | 1982-11-16 | 1984-05-25 | Seiko Epson Corp | Plasma chemical vapor deposition device |
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