JPS6161457U - - Google Patents
Info
- Publication number
- JPS6161457U JPS6161457U JP14653584U JP14653584U JPS6161457U JP S6161457 U JPS6161457 U JP S6161457U JP 14653584 U JP14653584 U JP 14653584U JP 14653584 U JP14653584 U JP 14653584U JP S6161457 U JPS6161457 U JP S6161457U
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- data
- signal
- primary crystal
- cooling curve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000002076 thermal analysis method Methods 0.000 claims description 3
- 238000001816 cooling Methods 0.000 claims 7
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims 6
- 229910052799 carbon Inorganic materials 0.000 claims 6
- 239000013078 crystal Substances 0.000 claims 6
- 230000005496 eutectics Effects 0.000 claims 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 3
- 238000007405 data analysis Methods 0.000 claims 3
- 229910052710 silicon Inorganic materials 0.000 claims 3
- 239000010703 silicon Substances 0.000 claims 3
- 229910001018 Cast iron Inorganic materials 0.000 claims 2
- 238000001514 detection method Methods 0.000 claims 2
- 238000005259 measurement Methods 0.000 claims 2
- 239000002184 metal Substances 0.000 claims 2
- 229910052751 metal Inorganic materials 0.000 claims 2
- 238000009529 body temperature measurement Methods 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Description
第１図は本考案装置の概念を示したブロツクダ
イアグラムである。第２図は本考案の具体的な１
実施例に係る熱分析装置の構成を示したブロツク
ダイアグラムである。第３図，第４図は同実施例
装置において使用されたコンピユータの処理を示
すフローチヤートである。第５図は出力画面を示
した出力図である。
FIG. 1 is a block diagram showing the concept of the device of the present invention. Figure 2 shows a concrete example of this invention.
1 is a block diagram showing the configuration of a thermal analysis device according to an example. FIGS. 3 and 4 are flowcharts showing the processing of the computer used in the apparatus of this embodiment. FIG. 5 is an output diagram showing an output screen.
Claims (1)
測定する測定装置と、 前記測温装置からの信号を入力して、データを
解析し、出力装置に信号を出力するデータ解析装
置と、 該データ解析装置からの信号を入力し、その信
号によつて、表示を行なう出力装置とから成る装
置であつて、 前記データ解析装置は、前記測温装置から入力
した時系列温度データをリアルタイムで、溶湯の
冷却曲線の表示データとして前記出力装置に出力
する冷却曲線表示部と、前記冷却曲線の温度停滞
点を初晶温度、共晶温度として検出する初晶共晶
温度検出部と、該初晶温度検出部によつて求めら
れた前記初晶温度、共晶温度とから炭素含有率、
ケイ素含有率、炭素当量を求める演算部と、 前記初晶温度、共晶温度、炭素含有率、ケイ素
含有率、炭素当量の表示データを、前記出力装置
へ前記冷却曲線の測定修了後に、出力するデータ
表示部とから成り、 前記出力装置は、前記冷却曲線及び前記初晶温
度、共晶温度、炭素含有率、ケイ素含有率、炭素
当量を同一表示面上に表示する装置であることを
特徴とする鋳鉄溶湯の熱分析装置。 (2) 前記データ表示部は、検出された初晶温度
、共晶温度に相当する冷却曲線上の測定データに
マークを付す信号を出力することを特徴とする実
用新案登録請求の範囲第１項記載の鋳鉄溶湯の熱
分析装置。[Claims for Utility Model Registration] (1) A measuring device that measures the temperature of the molten metal in time series during the cooling process; a signal from the temperature measuring device is input, the data is analyzed, and the signal is sent to an output device; A device comprising a data analysis device that outputs data, and an output device that receives a signal from the data analysis device and performs display based on the signal, wherein the data analysis device receives the signal input from the temperature measurement device. A cooling curve display unit that outputs time-series temperature data in real time as display data of a cooling curve of the molten metal to the output device, and a primary eutectic that detects temperature stagnation points of the cooling curve as primary crystal temperature and eutectic temperature. From the temperature detection unit and the primary crystal temperature and eutectic temperature determined by the primary crystal temperature detection unit, carbon content,
a calculation unit that calculates silicon content and carbon equivalent; and outputs display data of the primary crystal temperature, eutectic temperature, carbon content, silicon content, and carbon equivalent to the output device after the measurement of the cooling curve is completed. and a data display section, and the output device is a device that displays the cooling curve, the primary crystal temperature, the eutectic temperature, the carbon content, the silicon content, and the carbon equivalent on the same display surface. A thermal analysis device for molten cast iron. (2) Utility model registration claim 1, wherein the data display unit outputs a signal that marks measurement data on the cooling curve corresponding to the detected primary crystal temperature and eutectic temperature. Thermal analysis device for molten cast iron described above.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984146535U JPH0435805Y2 (en) | 1984-09-27 | 1984-09-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984146535U JPH0435805Y2 (en) | 1984-09-27 | 1984-09-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6161457U true JPS6161457U (en) | 1986-04-25 |
| JPH0435805Y2 JPH0435805Y2 (en) | 1992-08-25 |
Family
ID=30704769
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1984146535U Expired JPH0435805Y2 (en) | 1984-09-27 | 1984-09-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0435805Y2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102423222B1 (en) * | 2020-11-27 | 2022-07-21 | 한국생산기술연구원 | Analysis apparatus for Molten Material |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51985A (en) * | 1974-06-21 | 1976-01-07 | Seiichi Okuhara | Yokaishiteirumonoga gyokosurutokino ondohenkaokirokusurusochi |
| JPS5325274A (en) * | 1976-08-19 | 1978-03-08 | Hitachi Zosen Corp | Multiple-effect evaporator |
| JPS53102096A (en) * | 1977-02-18 | 1978-09-06 | Chino Works Ltd | Automatic measuring device for carbon and silicon in melt |
-
1984
- 1984-09-27 JP JP1984146535U patent/JPH0435805Y2/ja not_active Expired
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51985A (en) * | 1974-06-21 | 1976-01-07 | Seiichi Okuhara | Yokaishiteirumonoga gyokosurutokino ondohenkaokirokusurusochi |
| JPS5325274A (en) * | 1976-08-19 | 1978-03-08 | Hitachi Zosen Corp | Multiple-effect evaporator |
| JPS53102096A (en) * | 1977-02-18 | 1978-09-06 | Chino Works Ltd | Automatic measuring device for carbon and silicon in melt |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0435805Y2 (en) | 1992-08-25 |
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