JPS6159344U - - Google Patents
Info
- Publication number
- JPS6159344U JPS6159344U JP14355384U JP14355384U JPS6159344U JP S6159344 U JPS6159344 U JP S6159344U JP 14355384 U JP14355384 U JP 14355384U JP 14355384 U JP14355384 U JP 14355384U JP S6159344 U JPS6159344 U JP S6159344U
- Authority
- JP
- Japan
- Prior art keywords
- unit
- transfer unit
- transfer
- integrated circuits
- branch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004080 punching Methods 0.000 claims description 6
- 239000011295 pitch Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Description
図面は本考案の集積回路検査装置の一実施例を
示していて、第１図は全体構成を示す説明図、第
２図は移送ユニツトの構成を示す斜視図、第３図
はローデイングユニツトの構成を示す斜視図、第
４図は計測ユニツトの構成を示す斜視図、第５図
は第４図−線にそう拡大断面図、第６図は打
ち抜きユニツト、分岐移送ユニツト、マーキング
ユニツトおよび集積回路アンローデイングユニツ
トの詳細を示す斜視図、第７図は除去ユニツトの
斜視図である。
１１…移送ユニツト、１２…ローデイングユニ
ツト、１３…アンローデイングユニツト、１４…
計測ユニツト、１５，１６…打ち抜きユニツト、
１７，１８…分岐移送ユニツト、１９，２０…マ
ーキングユニツト、２１，２２…第二アンローデ
イングユニツト、２３…除去ユニツト。
The drawings show an embodiment of the integrated circuit testing apparatus of the present invention, in which Fig. 1 is an explanatory diagram showing the overall structure, Fig. 2 is a perspective view showing the structure of the transfer unit, and Fig. 3 is an illustration of the loading unit. FIG. 4 is a perspective view showing the configuration of the measurement unit, FIG. 5 is an enlarged sectional view taken along the line in FIG. 4, and FIG. 6 is a punching unit, branch transfer unit, marking unit, and integrated circuit. FIG. 7 is a perspective view showing details of the unloading unit, and FIG. 7 is a perspective view of the removal unit. 11...transfer unit, 12...loading unit, 13...unloading unit, 14...
Measuring unit, 15, 16... punching unit,
17, 18... Branch transfer unit, 19, 20... Marking unit, 21, 22... Second unloading unit, 23... Removal unit.
Claims (1)
配列ピツチで間欠移送させる移送ユニツトと、移
送ユニツトにフラツトフレームをひとつずつ供給
するために移送ユニツトの一端におかれたローデ
イングユニツトと、移送ユニツトから送り出され
たフラツトフレームをひとつずつ移送ユニツトか
らひろい上げるために移送ユニツトの他端におか
れたアンローデイングユニツトと、フラツトフレ
ーム上の集積回路をひとつずつ検査し、複数のグ
レードのどれかに属するかの判別をなすために移
送ユニツトにそつて配置された測定ユニツトと、
リードフレーム上の集積回路をリードフレームか
ら打ち抜くために、測定ユニツトとアンローデイ
ングユニツトとの間に位置して移送ユニツトにそ
つて配置された、測定ユニツトにより測定される
グレードに対応する数の打ち抜きユニツトと、各
打ち抜きユニツトを分岐点として移送ユニツトか
ら延び、打ち抜きユニツトで打ち抜かれた集積回
路を間欠移送させる分岐移送ユニツトと、各打ち
抜きユニツトで打ち抜かれた集積回路に製品番号
のようなマーキングをなすために、分岐移送ユニ
ツトの各々にそつて配置されたマーキングユニツ
トと、マーキングされた集積回路を分岐移送ユニ
ツトの各々からとり出すために、分岐移送ユニツ
トの端部に配置された第二のアンローデイングユ
ニツトとからなり、第二のアンローデイングユニ
ツトがフラツトフレームから打ち抜かれた集積回
路を一列に内部空間に収容できる、両端を開放さ
れた中空のマガジンを含み、第二のアンローデイ
ングユニツトがこのマガジンを多数収容する機構
およびマガジンをひとつずつ分岐移送ユニツトに
おける集積回路の移送ライン上に位置させる機構
からなること、を特徴としている集積回路検査装
置。 a transfer unit for intermittently transferring a flat frame between array pitches of integrated circuits suspended thereon; a loading unit placed at one end of the transfer unit for supplying the flat frames one by one to the transfer unit; The unloading unit placed at the other end of the transfer unit picks up the flat frames sent out one by one from the transfer unit, and inspects the integrated circuits on the flat frames one by one to determine whether they are of multiple grades. a measuring unit placed along the transfer unit to determine whether the
In order to punch out the integrated circuits on the lead frame from the lead frame, a number of punching units corresponding to the grade to be measured by the measuring unit are located between the measuring unit and the unloading unit and arranged along the transfer unit. a branch transfer unit extending from the transfer unit with each punching unit as a branch point and for intermittently transferring the integrated circuits punched by the punching unit; and a branch transfer unit for marking the integrated circuits punched by each punching unit, such as a product number. a marking unit disposed along each of the branch transfer units; and a second unloading unit disposed at the end of the branch transfer units for removing the marked integrated circuit from each of the branch transfer units. The second unloading unit includes a hollow magazine with open ends capable of accommodating integrated circuits punched from a flat frame in a row in the internal space; An integrated circuit testing device characterized by comprising a mechanism for accommodating a large number of magazines, and a mechanism for positioning the magazines one by one on the integrated circuit transfer line in a branch transfer unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14355384U JPS6159344U (en) | 1984-09-25 | 1984-09-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14355384U JPS6159344U (en) | 1984-09-25 | 1984-09-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6159344U true JPS6159344U (en) | 1986-04-21 |
Family
ID=30701844
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14355384U Pending JPS6159344U (en) | 1984-09-25 | 1984-09-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6159344U (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5344376U (en) * | 1976-09-20 | 1978-04-15 | ||
| JPS5533014A (en) * | 1978-08-29 | 1980-03-08 | Towa Electric | Method of and device for automatically sorting and picking up electric part |
| JPS5623476B2 (en) * | 1975-04-21 | 1981-05-30 |
-
1984
- 1984-09-25 JP JP14355384U patent/JPS6159344U/ja active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5623476B2 (en) * | 1975-04-21 | 1981-05-30 | ||
| JPS5344376U (en) * | 1976-09-20 | 1978-04-15 | ||
| JPS5533014A (en) * | 1978-08-29 | 1980-03-08 | Towa Electric | Method of and device for automatically sorting and picking up electric part |
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