JPS6148380U - - Google Patents

Info

Publication number
JPS6148380U
JPS6148380U JP13475884U JP13475884U JPS6148380U JP S6148380 U JPS6148380 U JP S6148380U JP 13475884 U JP13475884 U JP 13475884U JP 13475884 U JP13475884 U JP 13475884U JP S6148380 U JPS6148380 U JP S6148380U
Authority
JP
Japan
Prior art keywords
lsi
socket
terminal
changeover switch
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13475884U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13475884U priority Critical patent/JPS6148380U/ja
Publication of JPS6148380U publication Critical patent/JPS6148380U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP13475884U 1984-09-04 1984-09-04 Pending JPS6148380U (uk)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13475884U JPS6148380U (uk) 1984-09-04 1984-09-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13475884U JPS6148380U (uk) 1984-09-04 1984-09-04

Publications (1)

Publication Number Publication Date
JPS6148380U true JPS6148380U (uk) 1986-04-01

Family

ID=30693263

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13475884U Pending JPS6148380U (uk) 1984-09-04 1984-09-04

Country Status (1)

Country Link
JP (1) JPS6148380U (uk)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6384131A (ja) * 1986-09-29 1988-04-14 Matsushita Electronics Corp 半導体装置用検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6384131A (ja) * 1986-09-29 1988-04-14 Matsushita Electronics Corp 半導体装置用検査装置

Similar Documents

Publication Publication Date Title
MY112140A (en) Jig for measuring the characteristics of a semiconductor, manufacturing method for the same, and usage of the same
JPS6148380U (uk)
JPS60192441U (ja) 集積回路試験装置
JPS627086U (uk)
JPS613473U (ja) 低抵抗測定用接触子
JPS60131876U (ja) 短絡スイツチつき四端子抵抗測定コ−ド
JPS6283979U (uk)
JPH0625778B2 (ja) コンタクト式マルチプロ−ブ
JPS6280333U (uk)
JPS6027374U (ja) 集積回路測定器
JPS61189278U (uk)
JPS5923674U (ja) Ｉｃ試験装置
JPS6013480U (ja) エ−ジング試験装置
JPS59154677U (ja) 半導体装置の試験装置
JPS61149884U (uk)
JPS58143404U (ja) 配電盤用試験端子
JPS603480U (ja) リレ−マトリツクス回路試験装置
JPS6146481U (ja) 自動耐圧絶縁試験装置
JPS62104165U (uk)
JPS59166179U (ja) プリント回路板検査装置
JPS6325381U (uk)
JPS61112281U (uk)
JPS61107467U (uk)
JPS6244273U (uk)
JPS60161873U (ja) 多分岐用切替アダプタ