JPS6144926U - crystal oscillator for monitor - Google Patents

crystal oscillator for monitor

Info

Publication number
JPS6144926U
JPS6144926U JP13005284U JP13005284U JPS6144926U JP S6144926 U JPS6144926 U JP S6144926U JP 13005284 U JP13005284 U JP 13005284U JP 13005284 U JP13005284 U JP 13005284U JP S6144926 U JPS6144926 U JP S6144926U
Authority
JP
Japan
Prior art keywords
crystal oscillator
particles
monitor
mass
plate surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13005284U
Other languages
Japanese (ja)
Other versions
JPH0342036Y2 (en
Inventor
亜紀雄 千葉
幹雄 中島
Original Assignee
日本電波工業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電波工業株式会社 filed Critical 日本電波工業株式会社
Priority to JP13005284U priority Critical patent/JPS6144926U/en
Publication of JPS6144926U publication Critical patent/JPS6144926U/en
Application granted granted Critical
Publication of JPH0342036Y2 publication Critical patent/JPH0342036Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Physical Vapour Deposition (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例に用いるモニター用水晶振動
子の一例を示す側断面図、第2図は電極の蒸着装置の一
例を示す概略構成図、第3図aおよび第3図bは蒸着源
に対して平行に配置した場合の蒸着質比を説明する図、
第4図は蒸着時のモニター用水晶振動子の周波数変化と
通電電流の変化を示す図、第5図は第1図のD−D線矢
示断面図、第6図は第1図に示す振動子の底面図、第7
図は第1図に示すモニター用水晶振動子を用いた装置に
おけるモニター用水晶振動子の周波数および通電電流の
変化を示す図である。 1・・・・・・容器、3・・・・・・水晶片、4・・・
・・・モニター用水晶振動子、5・・・・・・制御装置
、6・・・・・・蒸着源、12・・・・・・軟性物質。
FIG. 1 is a side sectional view showing an example of a monitoring crystal resonator used in an embodiment of the present invention, FIG. 2 is a schematic configuration diagram showing an example of an electrode vapor deposition apparatus, and FIGS. 3a and 3b. is a diagram explaining the deposition quality ratio when placed parallel to the deposition source,
Figure 4 is a diagram showing changes in the frequency of the monitoring crystal oscillator and changes in the applied current during vapor deposition, Figure 5 is a sectional view taken along the line D-D in Figure 1, and Figure 6 is shown in Figure 1. Bottom view of the vibrator, No. 7
The figure is a diagram showing changes in the frequency and current of the monitoring crystal oscillator in a device using the monitoring crystal oscillator shown in FIG. 1...Container, 3...Crystal piece, 4...
... Monitoring crystal oscillator, 5 ... Control device, 6 ... Vapor deposition source, 12 ... Soft substance.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 蒸着源より発生した粒子を被蒸着体と水晶振動子の板面
に形成された電極に付着させ、前記水晶振動子の電極に
付着した粒子の質量によって変化′する振動周波数の変
化量から前記粒子が前記蒸着体に付着[7て形成される
薄膜の量を検出するモニタ用水晶振動子において、前記
粒子の質量により連続的に変化する前記水晶振動子の振
動周波数に対して発生する不要振動を抑制するために前
記水晶振動子の少なくとも一側の板面を軟性物質を介し
て保持することを特徴とするモニタ用水晶振動子。
Particles generated from an evaporation source are attached to electrodes formed on the plate surface of the evaporation target and a crystal oscillator, and the particles are determined from the amount of change in the vibration frequency that changes depending on the mass of the particles attached to the electrodes of the quartz crystal oscillator. In a monitoring crystal oscillator that detects the amount of a thin film formed by adhering to the vapor deposited body [7], unnecessary vibrations that occur with respect to the vibration frequency of the crystal oscillator that continuously changes depending on the mass of the particles are suppressed. A crystal resonator for a monitor, characterized in that at least one plate surface of the crystal resonator is held through a soft material in order to suppress the vibration.
JP13005284U 1984-08-28 1984-08-28 crystal oscillator for monitor Granted JPS6144926U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13005284U JPS6144926U (en) 1984-08-28 1984-08-28 crystal oscillator for monitor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13005284U JPS6144926U (en) 1984-08-28 1984-08-28 crystal oscillator for monitor

Publications (2)

Publication Number Publication Date
JPS6144926U true JPS6144926U (en) 1986-03-25
JPH0342036Y2 JPH0342036Y2 (en) 1991-09-03

Family

ID=30688661

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13005284U Granted JPS6144926U (en) 1984-08-28 1984-08-28 crystal oscillator for monitor

Country Status (1)

Country Link
JP (1) JPS6144926U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012142733A (en) * 2010-12-28 2012-07-26 Nippon Dempa Kogyo Co Ltd Piezoelectric vibrator, film thickness sensor, etching amount sensor and film thickness detection method and etching amount detection method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5488790A (en) * 1977-12-26 1979-07-14 Seiko Instr & Electronics Ltd Resonant frequency adjusting method for crystal oscillator
JPS58117714A (en) * 1982-01-06 1983-07-13 Hitachi Ltd Construction of crystal plate head

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5488790A (en) * 1977-12-26 1979-07-14 Seiko Instr & Electronics Ltd Resonant frequency adjusting method for crystal oscillator
JPS58117714A (en) * 1982-01-06 1983-07-13 Hitachi Ltd Construction of crystal plate head

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012142733A (en) * 2010-12-28 2012-07-26 Nippon Dempa Kogyo Co Ltd Piezoelectric vibrator, film thickness sensor, etching amount sensor and film thickness detection method and etching amount detection method

Also Published As

Publication number Publication date
JPH0342036Y2 (en) 1991-09-03

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