JPS6141949A - 螢光ｘ線測定装置 - Google Patents

螢光ｘ線測定装置

Info

Publication number
JPS6141949A
JPS6141949A JP16468284A JP16468284A JPS6141949A JP S6141949 A JPS6141949 A JP S6141949A JP 16468284 A JP16468284 A JP 16468284A JP 16468284 A JP16468284 A JP 16468284A JP S6141949 A JPS6141949 A JP S6141949A
Authority
JP
Japan
Prior art keywords
hole
measurement
port
fluorescent
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16468284A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0380255B2 (enrdf_load_stackoverflow
Inventor
Yoshihiko Usui
臼井　義彦
Tomoyuki Haga
知行 羽賀
Koichi Kumakura
熊倉　孝一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP16468284A priority Critical patent/JPS6141949A/ja
Publication of JPS6141949A publication Critical patent/JPS6141949A/ja
Publication of JPH0380255B2 publication Critical patent/JPH0380255B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00—Energy generation of nuclear origin
    • Y02E30/10—Nuclear fusion reactors

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP16468284A 1984-08-04 1984-08-04 螢光ｘ線測定装置 Granted JPS6141949A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16468284A JPS6141949A (ja) 1984-08-04 1984-08-04 螢光ｘ線測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16468284A JPS6141949A (ja) 1984-08-04 1984-08-04 螢光ｘ線測定装置

Publications (2)

Publication Number Publication Date
JPS6141949A true JPS6141949A (ja) 1986-02-28
JPH0380255B2 JPH0380255B2 (enrdf_load_stackoverflow) 1991-12-24

Family

ID=15797847

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16468284A Granted JPS6141949A (ja) 1984-08-04 1984-08-04 螢光ｘ線測定装置

Country Status (1)

Country Link
JP (1) JPS6141949A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230009805A (ko) * 2021-07-09 2023-01-17 (주)현대공업 시트용 암 레스트

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3928014B2 (ja) * 2004-01-23 2007-06-13 理学電機工業株式会社 蛍光ｘ線分析装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50138890A (enrdf_load_stackoverflow) * 1974-03-22 1975-11-06

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50138890A (enrdf_load_stackoverflow) * 1974-03-22 1975-11-06

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230009805A (ko) * 2021-07-09 2023-01-17 (주)현대공업 시트용 암 레스트

Also Published As

Publication number Publication date
JPH0380255B2 (enrdf_load_stackoverflow) 1991-12-24

Similar Documents

Publication Publication Date Title
US3972226A (en) Slit impact air sampler
JPS6141949A (ja) 螢光ｘ線測定装置
CN110471098A (zh) 基于碳量子点荧光生物传感器的氡辐射剂量检测方法
CN109297800B (zh) 一种激光剥蚀吹扫池
CN111624076A (zh) 一种总α和总β放射性测量制样方法和装置
ALLEN et al. X-ray Diffraction Determination of α-Quartz in Respirable and Total Dust Samples from Sand-Blasting Operations
JPH02189460A (ja) 金属粒子組成分析用装置
Collinson et al. A scintillation counter for the measurement of radon concentration in air
CN222034630U (zh) 一种磁悬液加工用浓度控制装置
CN217424831U (zh) 一种标准物质研究用取样分析装置
JPS6153584A (ja) 放射線検出装置
Zeitz et al. Zinc analysis in biological specimens by x-ray fluorescence
JP3823155B2 (ja) 雰囲気置換機能を備えたｘ線分析方法
D'Angelo et al. Standardless analysis of small amounts of mineral samples by SR‐XRF and conventional XRF analyses
CN219799159U (zh) 一种比表面积测定方法的试样称量及装料装置
CN220258354U (zh) 一种具有分层功能的中药材检验装置
CN218157915U (zh) 一种用于混泥土气体含量的检测装置
Bertin et al. Some Special Sample-Mounting Devices for the X-Ray Fluorescence Spectrometer
Belcher et al. A directional scintillation counter for clinical measurements
Baurmash et al. A new exposure chamber for inhalation studies
FR2482312A1 (fr) Cellule de mesure a tambour pour la determination de rayonnement alpha
CN86209041U (zh) 可同时探测Ca.Fe.Si.Al.的特征谱线的薄窗多丝正比计数器
JPH01184489A (ja) 放射線測定装置
JPH07286977A (ja) Ｘ線分析装置およびｘ線分析方法
JPH0755731A (ja) 全反射蛍光ｘ線分析の測定方法及びその装置