JPS6140029A - 自動マスク・ウェーハ目合せ焼付方法 - Google Patents
自動マスク・ウェーハ目合せ焼付方法Info
- Publication number
- JPS6140029A JPS6140029A JP16268984A JP16268984A JPS6140029A JP S6140029 A JPS6140029 A JP S6140029A JP 16268984 A JP16268984 A JP 16268984A JP 16268984 A JP16268984 A JP 16268984A JP S6140029 A JPS6140029 A JP S6140029A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- mask
- cassette
- point
- parallel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 235000012431 wafers Nutrition 0.000 claims abstract description 149
- 238000001514 detection method Methods 0.000 claims abstract description 22
- 238000000034 method Methods 0.000 abstract description 7
- 238000003780 insertion Methods 0.000 abstract description 2
- 230000037431 insertion Effects 0.000 abstract description 2
- 230000001105 regulatory effect Effects 0.000 abstract 1
- 230000007246 mechanism Effects 0.000 description 10
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 6
- 229910052753 mercury Inorganic materials 0.000 description 6
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 5
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000001179 sorption measurement Methods 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
- G03F7/7075—Handling workpieces outside exposure position, e.g. SMIF box
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16268984A JPS6140029A (ja) | 1984-07-31 | 1984-07-31 | 自動マスク・ウェーハ目合せ焼付方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16268984A JPS6140029A (ja) | 1984-07-31 | 1984-07-31 | 自動マスク・ウェーハ目合せ焼付方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6140029A true JPS6140029A (ja) | 1986-02-26 |
JPH0141250B2 JPH0141250B2 (enrdf_load_stackoverflow) | 1989-09-04 |
Family
ID=15759424
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16268984A Granted JPS6140029A (ja) | 1984-07-31 | 1984-07-31 | 自動マスク・ウェーハ目合せ焼付方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6140029A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61177726A (ja) * | 1985-02-01 | 1986-08-09 | Hitachi Ltd | 半導体用露光装置 |
JPS62273727A (ja) * | 1986-04-15 | 1987-11-27 | ハンプシヤ− インスツルメンツ,インコ−ポレ−テツド | X線リソグラフイ装置及び処理方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50152670A (enrdf_load_stackoverflow) * | 1974-05-28 | 1975-12-08 | ||
JPS5147026A (ja) * | 1974-08-21 | 1976-04-22 | Ciba Geigy | Biizukeijonoganryososeibutsunoseizoho |
-
1984
- 1984-07-31 JP JP16268984A patent/JPS6140029A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50152670A (enrdf_load_stackoverflow) * | 1974-05-28 | 1975-12-08 | ||
JPS5147026A (ja) * | 1974-08-21 | 1976-04-22 | Ciba Geigy | Biizukeijonoganryososeibutsunoseizoho |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61177726A (ja) * | 1985-02-01 | 1986-08-09 | Hitachi Ltd | 半導体用露光装置 |
JPS62273727A (ja) * | 1986-04-15 | 1987-11-27 | ハンプシヤ− インスツルメンツ,インコ−ポレ−テツド | X線リソグラフイ装置及び処理方法 |
Also Published As
Publication number | Publication date |
---|---|
JPH0141250B2 (enrdf_load_stackoverflow) | 1989-09-04 |
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