JPS6136221B2 - - Google Patents
Info
- Publication number
- JPS6136221B2 JPS6136221B2 JP4274079A JP4274079A JPS6136221B2 JP S6136221 B2 JPS6136221 B2 JP S6136221B2 JP 4274079 A JP4274079 A JP 4274079A JP 4274079 A JP4274079 A JP 4274079A JP S6136221 B2 JPS6136221 B2 JP S6136221B2
- Authority
- JP
- Japan
- Prior art keywords
- dry plate
- lid
- mask
- cleaning device
- nozzle assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000004140 cleaning Methods 0.000 claims description 17
- 238000004519 manufacturing process Methods 0.000 claims description 15
- 239000000428 dust Substances 0.000 description 10
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 229910001873 dinitrogen Inorganic materials 0.000 description 4
- 238000007664 blowing Methods 0.000 description 3
- 238000009423 ventilation Methods 0.000 description 3
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Drying Of Semiconductors (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Description
【発明の詳細な説明】 本発明はマスク清浄装置の構造に関す。[Detailed description of the invention] The present invention relates to the structure of a mask cleaning device.
半導体集積回路装置等に微細な素子パターン、
配線パターン等を形成させる際に使用するフオト
マスクの製造に於いて、マスクパターンを形成さ
せようとする乾板あるいはフオトレジスト塗布し
たブランク板(以下ブランク板と称す)上へのご
みの附着はフオトマスクの製造歩留りや製造品質
を低下させる原因となる。 Fine element patterns for semiconductor integrated circuit devices, etc.
In the production of photomasks used to form wiring patterns, etc., the adhesion of dust on the dry plate or blank plate coated with photoresist (hereinafter referred to as the blank plate) on which the mask pattern is to be formed is a problem in the production of the photomask. This causes a decrease in yield and manufacturing quality.
従来フオトマスクの製造に於いて前記乾板ある
いはブランク板上に附着したごみを除去する方法
としては、イオナイザーを具備したエアーガンか
ら噴射させたオゾンを含んだ窒素ガスのジエツト
で、乾板あるいはブランク板面をはじから順次吹
きはらつて行く方法であつた。 Conventionally, in the production of photomasks, the method of removing dust adhering to the dry plate or blank plate is to remove the dust from the dry plate or blank plate using a jet of nitrogen gas containing ozone, which is injected from an air gun equipped with an ionizer. It was a method of blowing away one by one from the beginning.
然し該従来方法は吹きはらいの際に窒素ガスの
ジエツトが乾板あるいはブランク板周辺部のごみ
をまき上げ、このごみが吹きはらいを終つた面に
再び沈着するという現象があり、乾板あるいはブ
ランク板面を完全に清浄化することが困難であつ
た。 However, in this conventional method, there is a phenomenon in which the nitrogen gas jet stirs up dust around the dry plate or blank plate during blowing away, and this dust is deposited again on the surface where it has been blown away. It was difficult to completely clean it.
本発明は上記問題点に鑑み、パターンの形成を
行おうとする乾板或るいはブランク板をマスク製
造装置にセツトした状態で、乾板或るいはブラン
ク板周辺を排気しながらごみの吹きはらいを行い
乾板あるいはブランク板面の完全な清浄化を行う
装置を提供する。 In view of the above-mentioned problems, the present invention has been developed by setting a dry plate or blank plate on which a pattern is to be formed in a mask manufacturing apparatus, and blowing away dust while evacuating the area around the dry plate or blank plate. Alternatively, an apparatus for completely cleaning the blank board surface is provided.
即ち本発明のマスク清浄装置は下面開口部周縁
にパツキンを具備し、該パツキンを介してマスク
製造装置の乾板ホルダー部上に気密に載置し得る
ごとき蓋状の構造体を有し、該構造体の内部に、
イオナイザーを具備する複数個のノズルを有し且
つ前記開口面に対し水平方向に回転し得るごとき
構造のノズル集合体を配設し該ノズル集合体周辺
の蓋状構造体内壁に複数個の排気口を配設してな
ることを特徴とする。 That is, the mask cleaning device of the present invention includes a gasket around the lower opening, and has a lid-like structure that can be airtightly placed on the dry plate holder of the mask manufacturing device via the gasket. inside the body,
A nozzle assembly having a plurality of nozzles equipped with an ionizer and capable of rotating horizontally with respect to the opening surface is provided, and a plurality of exhaust ports are provided on the inner wall of the lid-like structure around the nozzle assembly. It is characterized by being arranged with.
以下本発明による装置の構造及び本発明の装置
を使用する際のマスク製造方法の一実施例を図示
断面図により詳細に説明する。 DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the structure of an apparatus according to the present invention and a method of manufacturing a mask using the apparatus of the present invention will be described in detail below with reference to illustrated cross-sectional views.
図はフオトマスクの製造に於いてパターン形成
を行おうとする乾板1を乾板ホルダー2上に固定
させ、該乾板ホルダー2上に本発明による蓋状構
造を有するマスク清浄装置をかぶせた状態を示す
ものである。 The figure shows a state in which a dry plate 1 on which a pattern is to be formed in the production of a photomask is fixed on a dry plate holder 2, and a mask cleaning device having a lid-like structure according to the present invention is placed over the dry plate holder 2. be.
本発明のマスク清浄装置は図に示すように、装
置下面開口部3の周縁部にパツキン4が配設され
上部にハンドル5を有する蓋状構造体6の中央部
に配設されたノズルに対する送気及び吸気が可能
な管状の回転軸7の先端に、蓋状構造体6の開口
面、いいかえるとマスク製造装置の乾板ホルダー
2の上面に対し水平で両端が封じられた硬質塩化
ビニール等のプラスチツクからなるノズル集合体
8が設けられ、該ノズル集合体8には前記開口面
に対して直角方向に通気の軸が形成された複数個
のイオナイザー9を有するノズル10が配列され
ており、該ノズル集合体8周辺の蓋状構造体6の
内側壁には複数個の排気口11が設けられた構造
となつている。 As shown in the figure, the mask cleaning device of the present invention has a gasket 4 disposed around the periphery of an opening 3 on the lower surface of the device, and a nozzle disposed in the center of a lid-like structure 6 having a handle 5 on the top. At the tip of the tubular rotating shaft 7 that allows air and intake, there is a plastic material such as hard vinyl chloride that is horizontal to the opening surface of the lid-like structure 6, or in other words, to the top surface of the dry plate holder 2 of the mask manufacturing device, and that is sealed at both ends. A nozzle assembly 8 is provided, in which nozzles 10 having a plurality of ionizers 9 each having a ventilation axis formed in a direction perpendicular to the opening surface are arranged. A plurality of exhaust ports 11 are provided on the inner wall of the lid-like structure 6 around the aggregate 8.
然してフオトマスクの製造に際して本発明の装
置を使用して、例えばパターンを形成させようと
する乾板を清浄化するには、図に示すように先づ
マスク製造装置の乾板ホルダー2上に感光面を上
にして乾板1を真空固定し、該乾板1を蔽うよう
にマスク清浄装置を開口部3を下にして乾板ホル
ダー2上に載置し、該清浄装置の有するパツキン
4により乾板ホルダー2と密着させる。 However, in order to clean a dry plate on which a pattern is to be formed, for example, using the apparatus of the present invention when manufacturing a photomask, first place the photosensitive surface on the dry plate holder 2 of the mask manufacturing apparatus as shown in the figure. The dry plate 1 is fixed under vacuum, and the mask cleaning device is placed on the dry plate holder 2 with the opening 3 facing down so as to cover the dry plate 1, and the mask cleaning device is brought into close contact with the dry plate holder 2 by the gasket 4 of the cleaning device. .
比の際マスク清浄装置の有するノズル10の先
端と乾板1の上面との距離は1〜5mmの範囲に設
定する。 During the comparison, the distance between the tip of the nozzle 10 of the mask cleaning device and the top surface of the dry plate 1 is set in the range of 1 to 5 mm.
次に乾板ホルダー2とマスク清浄装置の蓋状構
造体6の内壁面で形成される空間を、蓋状構造体
6の内側壁に設けた複数個の排気口11により減
圧排気を行う。 Next, the space formed by the dry plate holder 2 and the inner wall surface of the lid-like structure 6 of the mask cleaning device is evacuated under reduced pressure through a plurality of exhaust ports 11 provided on the inner wall of the lid-like structure 6.
次に前記減圧排気を行つている状態で、蓋状構
造体6内部の前記ノズル集合体8を3〜10rpmの
ゆるやかな速度で一定方向に回転させながら、ノ
ズル10からイオナイザー9によりオゾンを混入
させた窒素ガスを1.4〜5Kg/cm2の圧力で乾板1上
に直角に吹きつけ乾板1上に附着しているごみを
吹きとばし、前記蓋状構造体6内壁の排気口11
から装置外部に排出させる。 Next, while the depressurized exhaust is being performed, ozone is mixed in from the nozzle 10 by the ionizer 9 while rotating the nozzle assembly 8 inside the lid-like structure 6 in a constant direction at a gentle speed of 3 to 10 rpm. Nitrogen gas is blown at right angles onto the dry plate 1 at a pressure of 1.4 to 5 kg/cm 2 to blow off the dust adhering to the dry plate 1, and the exhaust port 11 on the inner wall of the lid-like structure 6 is
from the outside of the device.
次にノズル集合体8の回転を続けながら、回転
軸7を経てノズル集合体8の内部を真空に排気し
ノズル10から吸気を行い乾板1上に密着したご
みを浮き上がらせる。 Next, while continuing to rotate the nozzle assembly 8, the inside of the nozzle assembly 8 is evacuated through the rotation shaft 7, and air is sucked in from the nozzle 10 to lift the dust stuck on the dry plate 1.
以上のような窒素の吹き付けと吸気を交互に約
10秒程度づつ数回繰り返し乾板1の清浄化を行う
が、この際蓋状構造体6内壁の排気口11からの
排気量の調節が清浄化を完全にするための重要な
ポイントである。 Alternately blow and inhale nitrogen as described above.
The dry plate 1 is cleaned several times for about 10 seconds each, and at this time, adjusting the amount of exhaust air from the exhaust port 11 on the inner wall of the lid-like structure 6 is an important point for complete cleaning.
上記の操作が完了したならば、マスク清浄装置
への窒素ガスの送気及び排気を停止し、該装置を
乾板ホルダー上から取り除き直ちに乾板への露光
を行う。 When the above operations are completed, the supply and exhaust of nitrogen gas to the mask cleaning device is stopped, and the device is removed from the dry plate holder and the dry plate is immediately exposed.
上記実施例では本発明の装置を使用してマスク
用乾板面の清浄化を行う場合について説明した
が、本発明の装置は乾板に限らずレジストを塗布
したブランク板及びマスター用フオトマスクの清
浄化にも使用し得ることは勿論であり、又投影型
或るいは密着型の何ずれのマスク製造装置につい
ても適用することが可能である。 In the above embodiment, the case where the device of the present invention is used to clean the surface of a dry plate for a mask has been explained, but the device of the present invention can be used not only for cleaning a dry plate but also for cleaning a blank plate coated with resist and a master photomask. Of course, the present invention can also be used with any projection-type or contact-type mask manufacturing apparatus.
又上記実施例に於いてはノズルの通気の軸が蓋
状構造体の開口面に対して直角の場合について説
明したが、該通気軸の角度はごみの形状大きさに
より、最も効果的な角度に設定することが好まし
い。 In addition, in the above embodiment, the case where the ventilation axis of the nozzle is perpendicular to the opening surface of the lid-like structure has been described, but the angle of the ventilation axis may vary depending on the shape and size of the dust. It is preferable to set it to .
以上説明したように本発明の装置はパターンを
形成させようとする乾板或るいはブランク板を外
界から遮断した状態で、該乾板又はブランク板に
附着したごみの除去を行うので清浄化が完全にな
され、フオトマスクの製造歩留りや製造品質を大
幅に向上せしめる効果がある。 As explained above, the apparatus of the present invention removes dust attached to the dry plate or blank plate on which a pattern is to be formed while the dry plate or blank plate is isolated from the outside world, so that cleaning can be completed completely. This has the effect of greatly improving the manufacturing yield and manufacturing quality of photomasks.
図は本発明によるマスク清浄装置の一例の断面
図である。
図に於いて、1は乾板、2は乾板ホルダー、3
は開口部、4はパツキン、5はハンドル、6は蓋
状構造体、7は回転軸、8はノズル集合体、9は
イオナイザー、10はノズル、11は排気口。
The figure is a sectional view of an example of a mask cleaning device according to the present invention. In the figure, 1 is a dry plate, 2 is a dry plate holder, and 3 is a dry plate.
1 is an opening, 4 is a gasket, 5 is a handle, 6 is a lid-like structure, 7 is a rotating shaft, 8 is a nozzle assembly, 9 is an ionizer, 10 is a nozzle, and 11 is an exhaust port.
Claims (1)
キンを介してマスク製造装置の乾板ホルダー部上
に気密に載置し得るごとき蓋状の構造体を有し、
該構造体の内部に、イオナイザーを具備する複数
個のノズルを有し且つ前記開口面に対し水平方向
に回転し得るごとき構造のノズル集合体を設け、
該ノズル集合体周辺の蓋状構造体内壁に複数個の
排気口を配設してなることを特徴とするマスク清
浄装置。1. A lid-like structure is provided with a gasket on the periphery of the lower opening, and can be airtightly placed on the dry plate holder of the mask manufacturing device via the gasket;
A nozzle assembly having a plurality of nozzles equipped with an ionizer and having a structure capable of rotating in a horizontal direction with respect to the opening surface is provided inside the structure,
A mask cleaning device characterized in that a plurality of exhaust ports are arranged on the inner wall of the lid-like structure around the nozzle assembly.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4274079A JPS55134851A (en) | 1979-04-09 | 1979-04-09 | Mask purifier |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4274079A JPS55134851A (en) | 1979-04-09 | 1979-04-09 | Mask purifier |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55134851A JPS55134851A (en) | 1980-10-21 |
JPS6136221B2 true JPS6136221B2 (en) | 1986-08-16 |
Family
ID=12644412
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4274079A Granted JPS55134851A (en) | 1979-04-09 | 1979-04-09 | Mask purifier |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55134851A (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60231330A (en) * | 1984-04-28 | 1985-11-16 | Seiichiro Sogo | Semiconductor material processing apparatus |
JPS61170034A (en) * | 1985-01-23 | 1986-07-31 | Hitachi Ltd | Cleaning device |
JP4658776B2 (en) * | 2005-11-01 | 2011-03-23 | 株式会社リコー | Cleaning device |
-
1979
- 1979-04-09 JP JP4274079A patent/JPS55134851A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS55134851A (en) | 1980-10-21 |
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