JPS61294327A - Interference method and interferrometer for measuring surface shape of parabolic mirror - Google Patents
Interference method and interferrometer for measuring surface shape of parabolic mirrorInfo
- Publication number
- JPS61294327A JPS61294327A JP13569285A JP13569285A JPS61294327A JP S61294327 A JPS61294327 A JP S61294327A JP 13569285 A JP13569285 A JP 13569285A JP 13569285 A JP13569285 A JP 13569285A JP S61294327 A JPS61294327 A JP S61294327A
- Authority
- JP
- Japan
- Prior art keywords
- light
- parabolic mirror
- reflected
- surface shape
- parallel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02034—Interferometers characterised by particularly shaped beams or wavefronts
- G01B9/02038—Shaping the wavefront, e.g. generating a spherical wavefront
- G01B9/02039—Shaping the wavefront, e.g. generating a spherical wavefront by matching the wavefront with a particular object surface shape
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/005—Testing of reflective surfaces, e.g. mirrors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Description
【発明の詳細な説明】
(イ)発明の目的
[産業上の利用分野]
この発明は放物面鏡の表面形状を測定するための干渉計
に関するものである。Detailed Description of the Invention (a) Purpose of the Invention [Field of Industrial Application] This invention relates to an interferometer for measuring the surface shape of a parabolic mirror.
[従来の技術]
放物面鏡は、入射平行光を収差なく、入射光外の一点に
集光できたり、逆に一点からの発散球面波光を別の方向
に平行光として反射することのできる重要な光学素子の
一つであり、例えばレーザ核融合の集光用ミラーとして
は必須のものである。[Prior art] A parabolic mirror can condense incident parallel light to a point outside the incident light without aberration, and conversely can reflect diverging spherical wave light from one point as parallel light in another direction. It is one of the important optical elements, and is essential, for example, as a focusing mirror for laser fusion.
この放物面鏡の表面形状を検査するには、被検体である
放物面鏡に平行光を当てて焦点を結ばせたときの、その
点の大きさによって表面形状を検査しているが現状であ
る。この場合には、被検鏡面の表面形状精度が良いほど
、焦点での光点は小さくなる。しかしながらこの表面形
状の検査方法だと集光度を測定しているだけで、表面形
状は測定できない。In order to inspect the surface shape of this parabolic mirror, the surface shape is inspected by the size of the point when parallel light is focused on the parabolic mirror that is the object to be inspected. This is the current situation. In this case, the better the surface shape precision of the mirror surface to be inspected, the smaller the light spot at the focal point. However, this surface shape inspection method only measures the light convergence and cannot measure the surface shape.
また、従来一般に知られている放物面鏡の形状測定用干
渉計としては、第5図に示すように、レーザ光源51か
らのビームをコリメータレンズ52で平行光とした後、
ビームスプリッタ53で2分割し、分割した一方の光束
を標準となる平面154で反射させ、かつ、他方の光束
を被検体放物面ITMで反射させ、両反射光を干渉させ
、その干渉縞を観測レンズ55を通してスクリーン56
上で観測するものがある。しかるに、この干渉計では収
束レンズ57を非球面レンズで構成する必要があるので
、非球面レンズの精度が被検体放物面鏡TMの形状測定
精度に影響を及ぼすこととなり、実施が必ずしも容易で
はない。In addition, as shown in FIG. 5, as a conventionally known interferometer for measuring the shape of a parabolic mirror, a beam from a laser light source 51 is made into parallel light by a collimator lens 52, and then, as shown in FIG.
The beam splitter 53 splits the beam into two parts, one of the divided beams is reflected by the standard plane 154, and the other beam is reflected by the object paraboloid ITM to cause interference between the two reflected beams and create interference fringes. Screen 56 through observation lens 55
There is something to observe above. However, in this interferometer, the converging lens 57 needs to be composed of an aspherical lens, so the accuracy of the aspherical lens affects the accuracy of shape measurement of the object parabolic mirror TM, and implementation is not necessarily easy. do not have.
さらに、その他の検査方法として計算機ホログラムをつ
くる方法があるが、作製までの工程が複雑で、実用化、
までにはまだほど遠いというの゛が現状である。Furthermore, another inspection method is to create a computer-generated hologram, but the manufacturing process is complicated and it is difficult to put it into practical use.
The current situation is that we are still far from reaching that goal.
また、さらに他の検査方法として、放物面に最も近い球
面波をつくり、それと被検体放物面鏡からの反射光を干
渉させて、干渉縞の位置を測定してから、放物面の形状
を測定する方法もあるが、干渉縞の解析が相当に面倒で
ある。Another inspection method is to create a spherical wave closest to the paraboloid, make it interfere with the reflected light from the parabolic mirror of the object, measure the position of the interference fringes, and then measure the position of the interference fringes. There is also a method of measuring the shape, but analysis of interference fringes is quite troublesome.
[発明が解決しようとする問題点]
この発明は上記の如ぎ事情に鑑みてなされたものであっ
て放物面鏡の表面形状の測定を容易、確実、かつ安価に
測定することができる測定技術を提供することを目的と
している。[Problems to be Solved by the Invention] The present invention has been made in view of the above circumstances, and provides a measurement method that allows the surface shape of a parabolic mirror to be measured easily, reliably, and at low cost. The purpose is to provide technology.
(ロ)発明の構成
[問題を解決するための手段]
この目的に対応して、この発明の放物面鏡の表面形状測
定用干渉方法は、レーザ光源と、前記レーザ光源からの
光束を少なくとも2光束に分割するビームスプリッタと
を使用し、前記2光束のうちの一方の光束から被検体放
物面鏡を照明する照明光を生成させ、前記2光束のうち
の他方の光束から標準となる光を生成させ、前記照明光
を被検体放物面鏡で反射させ、前記反射した反射平行光
と前記標準となる光との干渉縞を観測することを特徴と
している。(B) Structure of the Invention [Means for Solving the Problem] Corresponding to this object, an interference method for measuring the surface shape of a parabolic mirror according to the present invention includes a laser light source and a light beam from the laser light source. A beam splitter that splits the beam into two beams is used to generate illumination light for illuminating the object parabolic mirror from one of the two beams, and to generate a standard illumination light from the other of the two beams. The method is characterized in that light is generated, the illumination light is reflected by an object parabolic mirror, and interference fringes between the reflected parallel light and the standard light are observed.
また、この発明の放物面鏡の表面形状測定用干渉計はレ
ーザ光源と、前記レーザ光源からの光束を少なくとも2
光束に分割するビームスプリッタと、前記2光束のうち
の一方の光束から発散球面波を生成させる発散球面波生
成光学系と、前記2光束のうちの他方の光束から平行光
を生成させる平行光生成光学系とを備え、前記生成され
た発散球面波を被検体放物面鏡で反射させ、前記反射し
た反射平行光と前記平行光との干渉縞を観測するように
構成したことを特徴としている。Further, the interferometer for measuring the surface shape of a parabolic mirror according to the present invention includes a laser light source and a light beam from the laser light source that is
a beam splitter that splits the beam into a beam; a divergent spherical wave generation optical system that generates a divergent spherical wave from one of the two beams; and a parallel light generator that generates parallel light from the other of the two beams. and an optical system, configured to reflect the generated divergent spherical wave on a subject parabolic mirror and observe interference fringes between the reflected parallel light and the parallel light. .
以下、この発明の詳細を一実施例を示す図面について説
明する。Hereinafter, details of the present invention will be explained with reference to the drawings showing one embodiment.
まず、この発明を放物面鏡のうち、軸外し放物面鏡の形
状測定に適用する場合について説明する。First, a case will be described in which the present invention is applied to shape measurement of an off-axis parabolic mirror among parabolic mirrors.
第1図において、1は干渉計である。干渉計1は例えば
アルゴンイオンレーザを発生させるレーザ光源3、光路
変更用ミラーBRI 、ビームスプリッタBS1、発散
球面波生成光学系4、平行光生成光学系5、平面11F
M、ビームスプリッタ(または半透1)882 、観測
レンズOL1スクリーンSを備えている。In FIG. 1, 1 is an interferometer. The interferometer 1 includes, for example, a laser light source 3 that generates an argon ion laser, an optical path changing mirror BRI, a beam splitter BS1, a diverging spherical wave generating optical system 4, a parallel light generating optical system 5, and a flat surface 11F.
M, a beam splitter (or semi-transparent 1) 882, and an observation lens OL1 screen S.
発散球面波生成光学系4は反射鏡BR2、顕微鏡対物レ
ンズMO1、ピンホールP1を備えている。The diverging spherical wave generating optical system 4 includes a reflecting mirror BR2, a microscope objective lens MO1, and a pinhole P1.
一方、平行光生成光学系5は反射鏡BR3、顕微鏡対物
レンズMO2、ピンホールP2及びコリメータレンズC
Lを備えている。On the other hand, the parallel light generating optical system 5 includes a reflecting mirror BR3, a microscope objective lens MO2, a pinhole P2, and a collimator lens C.
It is equipped with L.
[、作用]
この第1図に示す干渉計1において、被検体放物面鏡T
Mの表面形状を測定するには、レーザ光源3からのビー
ムをビームスプリッタBS1で分割し、一方の光束を発
散球面波生成光学系4に導いて発散球面波を生成さける
。発散球面波生成光学系4ではビームスプリッタBS1
で2光束に分割した一方の光束を反射鏡BR2で光路変
更したのち顕微鏡対物レンズMO1、ピンホールP1に
よって発散球面波とする。こうして生成した発散球面波
は軸外から被検体放物面鏡TMに入射し、被検体放物面
鏡TMで反射して反射平行光となり、ビームスプリッタ
BS2で反射して観測レンズOLに達する。一方、ビー
ムスプリッタ881で分割された他方の光束を平行光生
成光学系5に導いて平行光を生成させる。平行光生成光
学系5では、反射tt!BR3で反射してのち、顕微鏡
対物レンズMo2、ピンホールP2によって発散球面波
としたのちコリメータレンズCLで平行光を生成させる
。この平行光はビームスプリッタBS2で反射して平面
11FMに達し、平面鏡FMで反射して折返し、ビーム
スプリッタBS2を透過して観測レンズOLに達する。[, Effect] In the interferometer 1 shown in FIG. 1, the object parabolic mirror T
To measure the surface shape of M, a beam from the laser light source 3 is split by a beam splitter BS1, and one of the beams is guided to a divergent spherical wave generating optical system 4 to generate a divergent spherical wave. In the divergent spherical wave generation optical system 4, the beam splitter BS1
One of the two beams divided into two beams is changed in its optical path by a reflecting mirror BR2, and then converted into a diverging spherical wave by a microscope objective lens MO1 and a pinhole P1. The divergent spherical wave thus generated enters the object parabolic mirror TM from off-axis, is reflected by the object parabolic mirror TM, becomes a reflected parallel beam, is reflected by the beam splitter BS2, and reaches the observation lens OL. On the other hand, the other beam split by the beam splitter 881 is guided to the parallel light generation optical system 5 to generate parallel light. In the parallel light generating optical system 5, reflection tt! After being reflected by BR3, it is made into a divergent spherical wave by the microscope objective lens Mo2 and pinhole P2, and then parallel light is generated by the collimator lens CL. This parallel light is reflected by the beam splitter BS2, reaches the plane 11FM, is reflected by the plane mirror FM, is turned back, and passes through the beam splitter BS2, reaching the observation lens OL.
この平行光と先の被検体放物面鏡TMから反射した反射
平行光とは重なり合うが、被検体放物面鏡TMからの反
射光は被検体放物面鏡TMの鏡面の凹凸の影響を受【ノ
て標準となる平行光からずれているので、両軍行光とで
第3図に示すような干渉縞が生じる。This parallel light and the reflected parallel light reflected from the previous object parabolic mirror TM overlap, but the reflected light from the object parabolic mirror TM is affected by the unevenness of the mirror surface of the object parabolic mirror TM. Since it deviates from parallel light, which is the standard for reception, interference fringes as shown in FIG. 3 are generated between the two directions of light.
この干渉縞における干渉縞ピッチDとずれInd、被検
面の形状誤差Δhの間には、λを波長としてΔh =
(d /D)・(λ/2)
の関係があるから、第3図に示すように、干渉縞ピッチ
Dとずれmdから形状誤差Δhを求め、被検体放物面1
2TMの表面形状を測定することができる。The difference between the interference fringe pitch D, the deviation Ind, and the shape error Δh of the surface to be measured in this interference fringe is Δh =
Since there is a relationship of (d/D)・(λ/2), the shape error Δh is calculated from the interference fringe pitch D and the deviation md, as shown in FIG.
2TM surface topography can be measured.
[実施例]
第2図は、この発明を軸内放物面鏡の形状測定に適用す
る他の実施例を示すものである。[Embodiment] FIG. 2 shows another embodiment in which the present invention is applied to shape measurement of an in-axis parabolic mirror.
すなわら、第2図に示すように、被検体放物面鏡TMが
軸内放物面鏡である場合には、発散球面波生成光学系4
の出口側において、被検体放物鏡TMの軸内に半透鏡8
83を配設し、発散球面波生成光学系4からの発散光を
半透mBs3で光路変更させて被検体放物面鏡TMに軸
方向に入射し、その反射光を半透鏡BS3を透過させて
ビームスプリッタBS2に到達させる。That is, as shown in FIG. 2, when the subject parabolic mirror TM is an in-axis parabolic mirror, the diverging spherical wave generating optical system 4
A semi-transparent mirror 8 is disposed within the axis of the object parabolic mirror TM on the exit side of the specimen parabolic mirror TM.
83, the diverging light from the diverging spherical wave generating optical system 4 is changed in optical path by the semi-transparent mBs3, and is incident on the subject parabolic mirror TM in the axial direction, and the reflected light is transmitted through the semi-transparent mirror BS3. to reach the beam splitter BS2.
(ハ)発明の効果
このように、この発明の干渉方法及び干渉計によれば、
標準となる放物面鏡面を必要とせず、また、高精度の非
球面レンズを必要とせず、収差がきわめて小さい顕微鏡
対物レンズを使用し、製作が容易で、かつ安価にするこ
とができる。しがも、測定操作が煩雑となることはなく
、高M度の表面形状測定が可能になる。また、各種のF
ナンバーの放物面鏡の形状測定に対して、顕微鏡対物レ
ンズを交換し若しくはその位置を移動するだけで対応す
ることができ、測定対象物に対するフレキシビリティが
高い。(c) Effects of the invention As described above, according to the interference method and interferometer of this invention,
It does not require a standard parabolic mirror surface or a high-precision aspherical lens, uses a microscope objective lens with extremely small aberrations, and can be manufactured easily and inexpensively. However, the measurement operation does not become complicated, and it is possible to measure the surface shape with a high degree of M. In addition, various F
Measurement of the shape of a numbered parabolic mirror can be handled by simply replacing the microscope objective lens or moving its position, providing high flexibility with respect to the object to be measured.
第1図はこの発明の放物面鏡の表面形状測定用干渉計を
示す構成図、第2図はこの発明の他の放物面鏡の表面形
状測定用干渉計を示す構成図、第3図は干渉縞の例を示
す線図、及び第4図は従来の放物面鏡の表面形状測定用
干渉計を示づ構成図である。
1・・・干渉計 3・・・レーザ光源 4・・・発
散球面波生成光学系 5・・・平行光生成光学系BS
1 、BS2・・・ビームスプリッタ BRI・・・
光路変更用ミラー Mo1. Mo2・・・顕微鏡対
物レンズ PI 、P2・・・ピンホール CL・
・・コリメータレンズ Bf12 、[3R3・・・
反OA鏡MT・・・被検体放物面鏡面FIG. 1 is a block diagram showing an interferometer for measuring the surface shape of a parabolic mirror according to the present invention, FIG. 2 is a block diagram showing an interferometer for measuring the surface shape of a parabolic mirror according to another embodiment of the present invention, and FIG. The figure is a diagram showing an example of interference fringes, and FIG. 4 is a configuration diagram showing a conventional interferometer for measuring the surface shape of a parabolic mirror. 1... Interferometer 3... Laser light source 4... Divergent spherical wave generation optical system 5... Parallel light generation optical system BS
1, BS2...beam splitter BRI...
Optical path changing mirror Mo1. Mo2...Microscope objective lens PI, P2...Pinhole CL・
...Collimator lens Bf12, [3R3...
Anti-OA mirror MT...Object parabolic mirror surface
Claims (4)
くとも2光束に分割するビームスプリッタとを使用し、
前記2光束のうちの一方の光束から被検体放物面鏡を照
明する照明光を生成させ、前記2光束のうちの他方の光
束から標準となる光を生成させ、前記照明光を被検体放
物面鏡で反射させ、前記反射した反射平行光と前記標準
となる光との干渉縞を観測することを特徴とする放物面
鏡の表面形状測定用干渉方法(1) using a laser light source and a beam splitter that splits the light beam from the laser light source into at least two light beams,
Illumination light that illuminates the object parabolic mirror is generated from one of the two light beams, standard light is generated from the other of the two light beams, and the illumination light is used to illuminate the object parabolic mirror. An interference method for measuring the surface shape of a parabolic mirror, characterized by reflecting the reflected parallel light with an object mirror and observing interference fringes between the reflected parallel light and the standard light.
くとも2光束に分割するビームスプリッタと、前記2光
束のうちの一方の光束から発散球面波を生成させる発散
球面波生成光学系と、前記2光束のうちの他方の光束か
ら平行光を生成させる平行光生成光学系とを備え、前記
生成された発散球面波を被検体放物面鏡で反射させ、前
記反射した反射平行光と前記平行光との干渉縞を観測す
るように構成したことを特徴とする放物面鏡の表面形状
測定用干渉計(2) a laser light source, a beam splitter that splits the light beam from the laser light source into at least two light beams, and a divergent spherical wave generation optical system that generates a diverging spherical wave from one of the two light beams; a parallel light generation optical system that generates parallel light from the other of the light beams, the generated divergent spherical wave is reflected by the object parabolic mirror, and the reflected reflected parallel light and the parallel light are An interferometer for measuring the surface shape of a parabolic mirror, characterized in that it is configured to observe interference fringes with a parabolic mirror.
を特徴とする特許請求の範囲第2項記載の放物面鏡の表
面形状測定用干渉計(3) An interferometer for measuring the surface shape of a parabolic mirror according to claim 2, wherein the object parabolic mirror is an off-axis parabolic mirror.
特徴とする特許請求の範囲第2項記載の放物面鏡の表面
形状測定用干渉計(4) An interferometer for measuring the surface shape of a parabolic mirror according to claim 2, wherein the object parabolic mirror is an in-axis parabolic mirror.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13569285A JPS61294327A (en) | 1985-06-21 | 1985-06-21 | Interference method and interferrometer for measuring surface shape of parabolic mirror |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13569285A JPS61294327A (en) | 1985-06-21 | 1985-06-21 | Interference method and interferrometer for measuring surface shape of parabolic mirror |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61294327A true JPS61294327A (en) | 1986-12-25 |
JPH0552881B2 JPH0552881B2 (en) | 1993-08-06 |
Family
ID=15157680
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13569285A Granted JPS61294327A (en) | 1985-06-21 | 1985-06-21 | Interference method and interferrometer for measuring surface shape of parabolic mirror |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61294327A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06288735A (en) * | 1993-03-31 | 1994-10-18 | Agency Of Ind Science & Technol | Phase conjugate interferometer for parabolic mirror shape inspection measurement |
DE102022207359A1 (en) | 2022-07-19 | 2024-01-25 | Carl Zeiss Smt Gmbh | Device and method for determining a fit error in a concave mirror |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5958305A (en) * | 1982-09-29 | 1984-04-04 | Hitachi Ltd | Method and device for measuring surface shape |
-
1985
- 1985-06-21 JP JP13569285A patent/JPS61294327A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5958305A (en) * | 1982-09-29 | 1984-04-04 | Hitachi Ltd | Method and device for measuring surface shape |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06288735A (en) * | 1993-03-31 | 1994-10-18 | Agency Of Ind Science & Technol | Phase conjugate interferometer for parabolic mirror shape inspection measurement |
DE102022207359A1 (en) | 2022-07-19 | 2024-01-25 | Carl Zeiss Smt Gmbh | Device and method for determining a fit error in a concave mirror |
Also Published As
Publication number | Publication date |
---|---|
JPH0552881B2 (en) | 1993-08-06 |
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