JPS61292457A - Diagnosing method for electronic exchange - Google Patents

Abstract

PURPOSE:To reduce the diagnosing time by dividing diagnostic items into normal operation confirmation and abnormal operation confirmation at each exchange and each function of each exchange and combining properly the divided diagnosis item for diagnosis. CONSTITUTION:A peripheral input/output device IO of the test item 8 is tested by a step S1 at first. When it is decided that the peripheral input/output device IO is normal, the routine normality test or host exchanges CC, MM, CHC, that is, test items 1, 4 and 6 are not executed and the procedure proceeds the step S2. In steps S2-S5, remaining tests (test items 5, 3, 2) except the normality test (test items 1, 4, 6) of each exchange are conducted sequentially. A spare/ standby system SBY or a faulty system OUS is diagnosed in less step numbers than a conventional method by combining properly the test items 1-8 depending on the difference from the diagnosis.

Description

[Detailed Description of the Invention] [Summary] This is a diagnostic method for testing faulty system or backup/standby system electronic exchange equipment, which reduces diagnostic time by performing diagnosis by appropriately combining test items depending on the differences in diagnostic requirements. A diagnostic method designed to shorten the time.

[Industrial application field]

The present invention relates to a diagnostic method for testing faulty or backup/standby electronic exchanges.

[Conventional technology]

Generally, electronic exchanges have two systems, a working system and a backup/standby system, to deal with failures. Then, the backup/standby system or failure system electronic switch is activated by the active system or normal active system electronic switch, for example, every 24 hours or 48 hours.
Tests and diagnosis are conducted hourly to prevent potential failures.

It is desirable that the time required for this test/diagnosis be as short as possible.

FIG. 3 shows a functional block diagram for explaining the diagnosis target. In FIG. 3, AC'l' indicates an active system, and SBY indicates a backup/standby system electronic exchange.

Instead of the backup/standby system SBY, the failure system OUS may be the subject of diagnosis. Active system ACT, reserve/standby system SBY
Each has a plurality of devices including a central processing unit CC1, a main memory MM, a channel control device CHCl, and a peripheral output device 10. In the figure, the current system C
Only the central processing unit CC is shown in C, and illustration of other devices is omitted.

The test items for the backup/standby system SBY or failure system OUS include, for example, the following eight items.

1, CC normal operation normality test 2, CC special operation normality test 3, CC abnormal operation detection function test 4, MM normal function test 5, MM abnormality detection function test 6, CHC normal operation test 7, CHC abnormal operation detection function Test 8, ■0 Test According to the conventional diagnostic method, the above test items 1 to 8 are executed in order from 1, as shown in the flowchart of FIG. 4, for example. That is, first test items 1 to 3 test the central processing unit CC, then test items 4 and 5 test the main memory device MM, and test items 6 and 7 test the channel control device. The CHC was tested, and finally, in test item 8, the peripheral input/output device 10 was tested.

[Problems to be solved by the invention]

In the above-mentioned conventional method, since the test is performed in order starting from test item 1, there is a problem that the time required for testing and diagnosing the electronic exchange is too long. If the test diagnosis time is long, it will take a long time to recover from the failure, and if a failure occurs in the active system during this time, both the active and backup systems will go down, reducing the operating rate of the entire system. This causes the problem that reliability is reduced.

[Means for solving problems]

In order to solve the above-mentioned problems, the present invention provides a fault system or backup/standby electronic switching system equipped with a plurality of devices including a central processing unit, a main storage device, a channel control device, and peripheral input/output devices. A diagnostic method for testing a system, which divides test and diagnosis items into each unit of the device and, if necessary, into units for each function included in each device, and divides the test and diagnosis items into each unit of the device. Provided is a method for diagnosing an electronic exchange, which is characterized in that the test items are divided into normal operation confirmation items and abnormal operation confirmation items, and the diagnosis is performed by appropriately combining the test items depending on the difference in the requirements for diagnosis.

[For production]

By dividing the diagnostic items into each device, each function of each device, and confirming normal operation and abnormal operation of each device, and performing diagnosis by combining these divided diagnostic items as appropriate, all diagnostic items can be executed. This makes it possible to diagnose all devices even if the device is not used, reducing diagnosis time.

〔Example〕

FIG. 1 is a flowchart showing a method for diagnosing an electronic exchange according to an embodiment of the present invention. In FIG. 1, first, in step S1, the peripheral input/output device 10 of test item 8 is
The test will be carried out. Viewed from the central processing unit CC in the active system ACT, the central processing unit CC1 in the backup/standby system SBY, the main storage device MM, and the channel control device CHC are higher-level devices of the peripheral input/output device IO. Therefore, step S
If the IO is determined to be normal in step 1, the higher-level device CC,
MM, CHC normal operation normality test, test items 1, 4. and 6 are all considered to be normal even if they are not executed, and the process proceeds to step S2. Steps 82-S5
Next, we will perform normal operation normality tests for each device (test items 1, 4.
The remaining tests (test item 5.3.2) except for 6) will be conducted sequentially.

If it is determined in step S1 that the IO is abnormal, the process proceeds to step S6 and tests the normal operation of the channel control device CHC, which is the next higher-level device after 0.Test item 6)
If normal, go to step S2; if abnormal, go to step S
Proceed to step 7.

In step S7, the normal function of the main memory device MM, which is a host device of the CHC, is tested (test item 4). If normal, the process proceeds to step S3, and if abnormal, the process proceeds to step S8.

In step S8, the normal operation of the central processing unit CC, which is a host device of the MM, is tested (test item 1). If normal, the process proceeds to step S4, and if abnormal, the diagnosis is ended.

Since the probability that peripheral input/output device 20 is abnormal in step S1 is generally small, steps 86 to S8 are rarely executed. Therefore, most of the diagnosis is done in step 8.
All you need is 5 steps from 1 to S5.

FIG. 2 shows a conceptual diagram that facilitates understanding of the advantages of the method shown in FIG. In FIG. 2, if the normality of the peripheral input/output device IO is confirmed in test item 8, test items 1 and 4 are confirmed.
CC, MM in 6.

The normality of the CHC is considered to have been confirmed, and it is understood that only the remaining test items 7, 5.3.2 need to be executed.

In the above description of the embodiment, an example was shown in which the peripheral input/output device ■0, which is the lowest-level device, is tested first, but test item 1
By appropriately combining 8 to 8 depending on the difference in diagnostic requirements, backup/standby SB can be created with fewer steps than before.
, Y or a diagnosis of faulty OUS is clearly possible. For example, when detecting a faulty device from the faulty OUS, it can be detected quickly by executing test items 1 to 8 in order, and in the case of a test immediately before a periodic switchover where it can be expected that the device is normal in advance. , the diagnosis can be completed in a short time by executing the test items in the order of 8.7, 5, and 2.3.

Moreover, the test items are not limited to the above 1 to 8.

〔Effect of the invention〕

As is clear from the above description, according to the present invention, in a diagnostic method for testing a faulty electronic exchange or a standby/standby electronic exchange, diagnostic items for a plurality of devices in an electronic exchange can be set for each device and for each device. By dividing each function and each device into normal operation check and abnormal operation check, and performing diagnosis by appropriately combining these divided diagnostic items, it is possible to diagnose all devices by executing some of the diagnostic items. As a result, diagnosis time can be significantly shortened, resulting in shortened failure recovery time, improved system availability, and overall system reliability.

[Brief explanation of drawings]

Fig. 1 is a flowchart showing a method for diagnosing an electronic exchange according to an embodiment of the present invention; Fig. 2 is a conceptual diagram that facilitates understanding of the advantages of the method shown in Fig. 1; Fig. 3 explains the object of diagnosis. FIG. 4 is a flowchart showing an example of a conventional diagnostic method. CC...Central processing unit MM...Main memory C) (C...Channel control device ■0...Peripheral input/output device

Claims (1)

[Scope of Claims] 1. A diagnostic method for testing a faulty system or standby/standby system electronic exchange equipped with a plurality of devices including a central processing unit, a main storage device, a channel control device, and peripheral input/output devices. The test and diagnosis items are divided into units for each unit of the device and, if necessary, divided into units for each function included in each device, and the test and diagnosis items are divided into units for each unit of the device, and the test and diagnosis items are A method for diagnosing an electronic exchange, characterized in that the test items are divided into operation confirmation items and abnormal operation confirmation items, and the diagnosis is performed by appropriately combining the test items depending on the difference in the requirements for the diagnosis.