JPS61264173A - Production of sputtering target - Google Patents
Production of sputtering targetInfo
- Publication number
- JPS61264173A JPS61264173A JP60105234A JP10523485A JPS61264173A JP S61264173 A JPS61264173 A JP S61264173A JP 60105234 A JP60105234 A JP 60105234A JP 10523485 A JP10523485 A JP 10523485A JP S61264173 A JPS61264173 A JP S61264173A
- Authority
- JP
- Japan
- Prior art keywords
- powder
- sputtering target
- compact
- alkali metals
- vacuum furnace
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Ceramic Products (AREA)
- Physical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、特に半導体電極をスパッター法により形成す
る際に用いられる粉末焼結法により製造される、スパッ
ターターゲットの製造方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention particularly relates to a method for manufacturing a sputter target manufactured by a powder sintering method used when forming semiconductor electrodes by a sputtering method.
[従来の技術]
近年MOS型LSIのゲート電極に、比抵抗の小さいモ
リブデンやタングステンなどの高融点金属のシリサイド
(珪化物)が用いられるようになってきた。こうした高
融点金属のシリサイドの膜を形成するには、高融点金属
のシリサイド製のターゲットを用いたスパッタリング法
が用いられている。[Prior Art] In recent years, silicides of high-melting point metals such as molybdenum and tungsten, which have low specific resistance, have been used for gate electrodes of MOS type LSIs. To form such a film of high melting point metal silicide, a sputtering method using a target made of high melting point metal silicide is used.
高融点のシリサイド、特にモリブデンシリサイド製のタ
ーゲットは、一般にモリブデン粉末とシリコン粉末ある
いは溶解により製造されたモリブデンシリサイドインゴ
ットを粉砕した粉末を原料として、ホットプレス法ある
いは熱間静水圧プレス法などの粉末焼結法により製造さ
れる。Targets made of high melting point silicides, particularly molybdenum silicide, are generally made from powder obtained by pulverizing molybdenum powder and silicon powder, or molybdenum silicide ingots produced by melting, and are produced using powder sintering methods such as hot pressing or hot isostatic pressing. Manufactured by the binding method.
一方、ゲート電極に要求される特性として、比抵抗の小
さいこと以外に、しきい値電圧の安定であることが要求
される。しきい値電圧の変動の原因は、主にNaなどの
アルカリ金属のイオンがゲート酸化膜中で移動すること
に因ることが知られている。On the other hand, in addition to low specific resistance, the gate electrode is required to have a stable threshold voltage. It is known that the variation in threshold voltage is mainly caused by the movement of alkali metal ions such as Na in the gate oxide film.
このため、電極成膜用のターゲットにNaなとのアルカ
リ金属が含まれないことが要求される。Therefore, it is required that the target for electrode film formation does not contain alkali metals such as Na.
しかし、Naはターゲット原料に含有されていること以
外に、ターゲットの製造工程中に、例えば大気中の塵埃
1人体からの汗、あるいは研磨加工の研削油などから容
易に混入し、ターゲットを汚染する。However, in addition to being contained in the target raw material, Na is easily mixed into the target during the target manufacturing process, for example from dust in the atmosphere, sweat from the human body, or grinding oil from polishing processes, contaminating the target. .
[発明が解決しようとする問題点]
本発明は、Naなどのアルカリ金属の含有量の少ない、
粉末焼結法によるターゲットの製造方法を提供するもの
である。[Problems to be Solved by the Invention] The present invention solves the following problems:
The present invention provides a method for manufacturing a target using a powder sintering method.
[問題を解決するための手段]
本発明は、粉末冶金法により成形、仕上げ加工されたタ
ーゲットを、10−2Torr以下、好ましくは10−
3Torr以下の真空炉内で800℃以上、好ましくは
900℃以上の温度で加熱処理し、アルカリ金属を蒸発
除去する方法を提供するものである。[Means for solving the problem] The present invention provides a target molded and finished by a powder metallurgy method at a temperature of 10-2 Torr or less, preferably 10-
The present invention provides a method of evaporating and removing alkali metals by heat treatment at a temperature of 800° C. or higher, preferably 900° C. or higher in a vacuum furnace of 3 Torr or lower.
[実施例] 以下に実施例により本発明を説明する。[Example] The present invention will be explained below with reference to Examples.
純度99.98%のモリブデンのインゴットをM。M is a molybdenum ingot with a purity of 99.98%.
S12.りとなるように原料を配合し、プラズマアーク
炉にて溶解した。得られた合金を振動式粉砕機にて粉砕
した。この原料粉末を、内面にMOを溶射した軟鋼製の
円筒缶に詰め、真空脱気、封止し、熱間静水圧プレスに
より、圧力1,000kg/CI2 。S12. The raw materials were blended so as to be as follows and melted in a plasma arc furnace. The obtained alloy was pulverized using a vibrating pulverizer. This raw material powder was packed into a mild steel cylindrical can whose inner surface was sprayed with MO, vacuum degassed, sealed, and hot isostatically pressed at a pressure of 1,000 kg/CI2.
温度1180℃1時間3)−1rで成形・焼結し、直径
240mm 、厚み50IImのターゲットを得た。こ
のターゲットを、厚み10111111に放電切断機に
より切断し、さらに平面研削により、厚み6■の円板に
仕上げた。この円板から、厚み6mm 、幅10mm、
長さ20m−の試験片を採取した。試験片の1ケをクリ
ーンルーム内で折損せしめて自然破面を露出し、その中
央をrMAによりNaおよびKを分析した。分析の結果
は、標準試料対比で22.2および2.2であった。It was molded and sintered at a temperature of 1180° C. for 1 hour 3)-1r to obtain a target with a diameter of 240 mm and a thickness of 50 II m. This target was cut to a thickness of 10111111 mm using an electric discharge cutting machine, and then surface ground to form a disk having a thickness of 6 mm. From this disk, thickness 6mm, width 10mm,
A test piece with a length of 20 m was taken. One of the test pieces was broken in a clean room to expose the natural fracture surface, and the center was analyzed for Na and K by rMA. The results of the analysis were 22.2 and 2.2 compared to the standard sample.
次に、同時に採取した同形の試験片を、真空度が10’
Torrの電気炉内で、800. 900. 1,00
0および1,100℃で2.5時間清浄化熱処理を施し
、それぞれの試験片をクリーンルーム内で折損せしめて
自然破面を゛露出し、その中央をIMA分析を行った。Next, a test piece of the same shape taken at the same time was placed at a vacuum level of 10'.
Torr electric furnace, 800. 900. 1,00
A cleaning heat treatment was performed at 0 and 1,100° C. for 2.5 hours, and each test piece was broken in a clean room to expose the natural fracture surface, and IMA analysis was performed on the center of the specimen.
分析の結果を第1表に示す。800℃の熱処理でNaの
含有量は約半減し、900℃以上では20分の1以下に
低減出来る。Kについても減少効果は大きい。この効果
は、真空度の向上、熱処理時間の延長によりさらに含有
量を減少出来るが、真空度が10〜2Torrをこえる
。と減少効果は悪くなり、好ましくない。The results of the analysis are shown in Table 1. Heat treatment at 800°C reduces the Na content by about half, and at 900°C or higher it can be reduced to less than one-twentieth. The reduction effect on K is also large. This effect can be achieved by further reducing the content by increasing the degree of vacuum and extending the heat treatment time, but the degree of vacuum exceeds 10 to 2 Torr. and the reduction effect becomes worse, which is not desirable.
第1表
[発明の効果]
以上説明したように、本発明の製造方法によれば、原料
あるいは製造工程中に混入したNaなどのアルカリ金属
の含有量を低減することが出来る。Table 1 [Effects of the Invention] As explained above, according to the production method of the present invention, the content of alkali metals such as Na mixed into raw materials or during the production process can be reduced.
以上that's all
Claims (1)
た後、10^−^2Torr以下の真空炉内で800℃
以上の温度で熱処理することを特徴とする、スパッター
ターゲットの製造方法。After being molded using the powder sintering method and finished into the desired shape, it is heated to 800°C in a vacuum furnace at 10^-^2 Torr or less.
A method for producing a sputter target, characterized by heat treatment at a temperature above.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60105234A JPH0621350B2 (en) | 1985-05-17 | 1985-05-17 | Method for manufacturing sputter target |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60105234A JPH0621350B2 (en) | 1985-05-17 | 1985-05-17 | Method for manufacturing sputter target |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61264173A true JPS61264173A (en) | 1986-11-22 |
JPH0621350B2 JPH0621350B2 (en) | 1994-03-23 |
Family
ID=14401961
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60105234A Expired - Lifetime JPH0621350B2 (en) | 1985-05-17 | 1985-05-17 | Method for manufacturing sputter target |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0621350B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11317282A (en) * | 1998-02-20 | 1999-11-16 | Riken Corp | Molybdenum disilicide composite ceramic heating element and its manufacture |
JP2002038260A (en) * | 2000-07-26 | 2002-02-06 | Toshiba Corp | Sputtering target and manufacturing method |
JP2002038261A (en) * | 2000-07-26 | 2002-02-06 | Toshiba Corp | Sputtering target and manufacturing method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5351103A (en) * | 1976-10-19 | 1978-05-10 | Sprecher & Schuh Ag | Method and apparatus for removal of gas from metallic material |
JPS6066425A (en) * | 1983-09-22 | 1985-04-16 | Nippon Telegr & Teleph Corp <Ntt> | High-purity molybdenum target and high-purity molybdenum silicide target for lsi electrode and manufacture thereof |
-
1985
- 1985-05-17 JP JP60105234A patent/JPH0621350B2/en not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5351103A (en) * | 1976-10-19 | 1978-05-10 | Sprecher & Schuh Ag | Method and apparatus for removal of gas from metallic material |
JPS6066425A (en) * | 1983-09-22 | 1985-04-16 | Nippon Telegr & Teleph Corp <Ntt> | High-purity molybdenum target and high-purity molybdenum silicide target for lsi electrode and manufacture thereof |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11317282A (en) * | 1998-02-20 | 1999-11-16 | Riken Corp | Molybdenum disilicide composite ceramic heating element and its manufacture |
JP2002038260A (en) * | 2000-07-26 | 2002-02-06 | Toshiba Corp | Sputtering target and manufacturing method |
JP2002038261A (en) * | 2000-07-26 | 2002-02-06 | Toshiba Corp | Sputtering target and manufacturing method |
Also Published As
Publication number | Publication date |
---|---|
JPH0621350B2 (en) | 1994-03-23 |
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