JPS6126143A - Testing method of device - Google Patents

Abstract

PURPOSE:To generalize a monitor recorder and a device tester by inputting input information to a device to be tested, comparing its output information with that of the monitor recorder, and when both the information coincide with each other, deciding the information as normal one. CONSTITUTION:An S device T200 being a device to be tested is connected to the device tester 20, a test program is set in a test program part 201 and the S device T200 is initialized to start the tester 20. When information is inputted from the tester 20 to the S device T200 and the S device T200 operates in accordance with the input, information to be applied to a peripheral device is outputted from an output terminal, the tester 20 inputs the information and compares the input information with the output information of the test program part 201. When both the information coincide with each other, the S device T200 is decided as a normal one. In case of dissidence, the contents of the difference are outputted and error correcting work is started.

Description

DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an equipment testing method for testing mass production equipment included in a system using a testing machine.

(Prior art) In the conventional equipment testing method, a complete equipment testing machine is prepared for each product name of the equipment under test, a test program is prepared for each functional condition, and the equipment testing equipment is equipped with the equipment testing machine and this equipment testing machine is connected. The output from the device under test to which the test program has been input is compared with the standard cover pattern to determine whether the device under test is normal or abnormal. The test program created for this test is designed for each device under test based on the device σ In addition to being limited to the functional test of the section, a large amount of man-hours are required to complete the program.

On the other hand, in a small-scale device or a device in units of bars or cages, the output value obtained by applying a random pattern to a normal device under test with zero output is taken as the normal output value.

A test method is adopted in which a device testing machine applies the random pattern to the device under test and compares the output value obtained with the normal output value. This test does not apply the actual operating conditions of the device under test, so the test conditions cannot be completely satisfied.

(Problem to be Solved by the Invention) As described above, in the conventional device testing method, the test program installed in the device testing machine is designed and created using the design conditions of the device under test or a random pattern unrelated to the design conditions. Therefore, there was a problem in that the test quality deteriorated because it was limited to a part of the actual operating conditions of the device under test or was unrelated to the actual operating conditions.

(Means for Solving the Problems) The device testing method of the present invention connects a device testing machine to the input/output terminals of one initially set device under test to prepare for testing, while at the same time Connect the input/output terminals of a sample device with the same specifications and name as the device under test, and connect the monitor and recorder, initialize all the components of the stem, and then set the system up by providing predetermined external conditions. At this time, the monitor recording device monitors and records the state of each connection terminal of the sample device, and equips the device tester with this monitor record, inputs input information to the input terminal of the device under test, and outputs the information from the output terminal. The output information is compared and verified with the output terminal output information of the monitor record, and when they match, it is determined to be normal.

(Example) Next, one embodiment of the device testing method of the present invention will be described in detail with reference to all the drawings.

FIG. 1 is a functional block diagram showing an embodiment of test program creation in the device testing method of the present invention.

Is Figure 2 an example of partial details of the monitor recording in Figure 1?
FIG. 3 is a functional program showing an example of testing the recording element shown in FIG. 1 as a test program in the apparatus testing method of the present invention.

4 and 5 are flowcharts illustrating one embodiment of the principal method steps in FIGS. 1 and 3, respectively.

First, in FIG. 1, the paternity exchange system 10 is a completed system with A device 101. B device 102°C device 103
A normal S device (N) 100 is also provided as a sample device, and the S device (N) 100 is connected to each of the A devices 101 to C devices 103 by an information line to exchange input/output information.

Exchange system 1゜ is telephone set 1 connected to A device 101.
11, 112 calls will be charged. When an overload test is imposed on the switching system 10 as a system test, a large number of pseudo calls are fully applied to the switching system 10 in which the pseudo call generator 11 including the telephones 111 and 112 has been completed to confirm normal operation of the system. In the system in this normal state, the monitor recording device 12 connects the input/output terminals of the S device (to) 100 and monitors the input/output information values. The monitor recording device includes a monitor recording section 121 equipped with a recording element 13 for monitor recording. A write control unit 12 that records information from the input/output terminal of the S device (N) 100 onto the recording element 13
2. Control unit 123 that controls the operation of the monitor recording device 12
It is also possible to include at least one of the following, and to operate in conjunction with the pseudo call generator 11. The recording element 13 uses the write control section 122 to record the information value to the input terminal of the S device (N) 100 in the input terminal recording section, and the information value from the output terminal to the output terminal recording section.

In FIG. 2, A device 101. B
Device 102. An example of partial detailed recording of digital information values obtained from each input/output terminal of the C device 103 is shown.

In FIG. 3, the device testing machine 20 is an S device (T) 200.
Connect to the input/output terminals of S device (T) 200 is the first
This is a device under test using the S device (N) 100 shown in the figure as a sample device. The test program section 201 of the device testing machine 20 includes the monitor recording device 1 with the configuration shown in the diagram in FIG.
2, a recording element 13 recorded with information values as shown in FIG.
be equipped with. The device tester 20 also includes a read control section 200 that reads information values from the recording element 13. Test program 20
A collation unit 2031 receives the collation result from this collation unit 203, which collates the information value in the output terminal recording unit of the recording element 13 of No. 1 with the pressure information value from the output terminal of the S device (T) 200, which is the device under test. The readout control unit 20 also includes at least a control unit 204 that controls all operations of the device testing machine 20.
2 is the read input terminal recorded information value all S device (T) 200
At the same time as input to the input terminal of
) 200 inputs the pressure information value obtained as a result of obtaining the input information value, and compares it with the output terminal recorded information value of the previous 4 self-recording element 13. When they match, the control unit 204 determines that the pressure information value is normal.

Next, referring to the flowchart of FIG. 4 and FIG. 1, an embodiment of the main layer method procedure up to the creation of a test program to be installed in the equipment testing facility will be described.

First, prepare the exchange system 10 as a completed system, set the S device (N) 10 (l) as a sample device for the device under test, and connect the monitor recording device 12 to the input/output terminal of this device (operation step ①).

Each device of the exchange system 10 yen is initialized (m operation step ■), and then the pseudo call generator 11 is connected and various operating conditions of the exchange system 10 are set (operation step ■).

These operation steps ■ to ■ are usually in this order, but
This order can be different.

Following the last step from operation step (2) to (2), the pseudo call generator 11 activates the switching system 1 (l) and also activates the monitor recording device 12 (operation step (2). With this activation, the exchange system 10 starts operating. , each device in the system is included in the S device (N) 100 of the specimen device and operates (operation step ①), and the monitor recording device 12 also operates (operation step).

Step ■) and monitor and record all information values at the input/output terminal of the S device (N) 1000 (wJ production step ■).

When the operation of the pseudo call generator 11 stops, and therefore the operation of the switching system 10 and the monitor recording device 12 also stops (operation step ■), the recording element 13 installed in the monitor recording device 12 is taken out and the recorded information is related. Expert engineers will investigate and organize the results and create a test program (operation step ■).

Next, an embodiment of a method procedure for testing a device under test by equipping the device testing machine 20 with all the test programs will be described with reference to FIG. 3 as well as the flowchart of FIG.

The input/output terminals of the S device (T) 200 as the device under test are connected to the full device testing machine 20 (operation step 0), and the test program created by the above procedure is installed in the test program section 201 of the full device testing machine 20 (operation step 0). Step Q), and then the device under test (T) 200 (i-initialization (operation step 0)).

The order of the operation steps ① to 0 may be different, and the test program may use the recording element 13 recorded by the monitor recording device 12 as it is.

After the last step of operation steps 0 to 0, the device testing machine 20 is started (operation step, G(B)), and after the device test, the information from 20 is transferred to the S device (T) 2 of the device under test.
00 input terminal (operation step Co., Ltd.). According to this input, the S device ('I') of the device under test 20
0 is activated and outputs all information to be given to peripheral devices from the output terminal and performs operation step l1i9). This output information from the device under test is input to the device testing machine 20, which compares it with the output terminal information of the test program (operation step O). If the information matches, the eight devices (T) 200 of the device under test It is determined that it is normal (operation step @) and the test ends. Although not shown, if the comparison does not match, the entire discrepancy is output and the process moves on to the entertainment correction work.

In the above embodiment, a call from a telephone was explained as an external condition in a switching system, but in a general system, it is possible to monitor and record each operating condition and each component device and create a test program. Recording devices and device testing machines can be generalized. Therefore, it is possible to achieve economic efficiency by reducing design man-hours for test equipment and equipment investment.

(Effects of the Invention) As explained above, according to the device testing method of the present invention, a normal sample device of the device under test is actually operated in the system configuration, and information values at its input and output terminals are monitored and recorded. - The blade device testing machine inputs the recorded information for the input terminals into the device under test, operates according to this input, compares the output with the recorded information for the output terminals, and checks whether there is a complete match. By determining normality, mismatch, and all abnormalities, the monitor recording device and device testing machine can be made more versatile and tested.
In addition to the economical effects of reducing equipment design man-hours and equipment investment, test conditions based on actual operating conditions are imposed, making it possible to conduct meaningful operational tests, which has the same effect as improving test quality.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing an example of test program creation in the device testing method of the present invention, and FIG.
FIG. 3 is a block diagram showing an example of testing the recording element shown in FIG. 1 as a test block in the apparatus testing method of the present invention; FIG. Figure 5 is the first
4 is a flowchart illustrating one embodiment of the principal method steps in FIGS. and 3; FIG. 10... Switching system, 11... Pseudo call generator. 12...Monitor recording device, 13...Recording element (monitor recording), 20...Device testing machine, 100
...S device (N) (specimen device), 200...
...S device (T) (device under test). 1 person Benyo±, Hara ゛. Bud 2 Diagram 3 Diagram h Kaya 4 Diagram half sTgJ

Claims (1)

[Claims] While preparing for the test by connecting the device tester to the input/output terminal of one device under test that has been initially set, monitor and record data to the input/output terminal of a sample device that is included in the completed system and has the same specification product name as the device under test. When the device is connected and all the components of the system are initialized, and the system is operated by applying predetermined external conditions, the monitor and recorder monitors and records the state of each connection terminal of the sample device. , and when this monitor record is installed in the device, the input information is input to the input terminal of the device under test, and the output information from the output terminal is compared and matched with the output terminal output information of the monitor record, it is normal. A device testing method characterized by determining that.