JPS6016653B2 - Automatic testing method for information processing equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention provides a central processing unit, a main memory, a channel device,
The present invention relates to a test method for an information processing device that is composed of various peripheral devices and has a maintenance panel that has functions such as read/write of each register, read/write of the main memory, start/stop, and alternation switch.

Testing of information processing equipment is generally divided into the following two steps. The first step is a basic test before running the test program, that is, mounting check of various units, insulation test, power circuit check, logic voltage no load, load voltage measurement, adjustment of each adjustment point, maintenance panel and This includes operating each switch and self-checking the lamp display to confirm the functionality of the panel control circuit. The second step is a test to confirm the functionality of the entire information processing device by executing a test program. Second
The test program used in the step is created for multiple purposes, such as for debugging a prototype of an information processing device, for final function confirmation during mass production, and for on-site adjustment and maintenance after delivery to a customer. For this reason, the test program consists of a monitor section and a test module section so that test conditions such as test machine number, test capacity, type of input/output device, test mode, etc. can be freely set and executed. After loading the test module from the external storage device into the main storage device using the initial mode function of the processing device, it resides and loads the test module and executes it, or performs conversation processing with the operator to set test conditions, etc., or performs various functions for the test module. Performs processing for services. The test module also performs actual tests on the given test conditions under the control of the monitor. There are many test modules under the monitor. The conventional second step test work method is to read the test program stored in an external storage medium, such as a floppy disk or disk pack, from the external storage device that is the device under test, and then read the monitor or control program into the main storage device. The tester specifies the test module name on the console input/output device, such as a display device, typewriter device, etc.
Further, instructions such as necessary conditions such as machine number, capacity, test mode, etc. are given to the test module and the test module is executed. In the conventional test method, when executing a test program, manual operations are required to give instructions such as test module selection and test conditions while grasping the system configuration of the device under test one by one, and a large number of testing man-hours are required.

Another disadvantage is that the device under test must have a control function for reading a test program from an external storage device and a control function for console input/output equipment for operator conversation before test execution. The present invention is directed to the above-mentioned second
In view of the shortcomings of step test work, we aim to utilize test programs as much as possible, and reduce manual operations related to test program execution as much as possible to shorten test man-hours, prevent test omissions due to operational errors, and improve test quality. It is an object of the present invention to realize a testing method for an information processing device that can perform a complete test program even on a device under test for which the control functions of an external storage device and an input/output device are not guaranteed.

In the test method according to the present invention, in the first step, a test computer is connected via a maintenance control interface in place of the maintenance panel of the information processing device under test, which has undergone a functional test up to the panel control circuit.

In addition, an external storage device is prepared in the test computer, and the test conditions etc. are set in advance on the medium of the external storage device, and the data of the test program that does not require manual intervention is compatible with the system configuration of the information processing device under test. A table is stored that lists the test order etc. of the test program created. Next, under the control of the test computer, the test program data is stored in the main memory of the information processing device under test using a panel control circuit that has already been tested;
By starting, running, and monitoring the test progress, the central processing unit, main memory,
This method automatically performs the second step of testing each device such as a channel device and an input/output device. Next, embodiments of the present invention will be described with reference to the accompanying drawings.

In the accompanying drawings, A is an information processing device to be tested, which is composed of a maintenance panel 1 and a panel control circuit 2, which have been tested in the first step, and a group of devices to be tested 3 by executing a test program. The device under test group 3 includes a central processing unit 4, a main storage device 5, a channel device 6, and other input/output devices 7 to 10. B is a test device for the method according to the present invention, and a test computer 11 has a function that can control the panel control circuit 2 on the information processing side A, and also includes a console input/output device 12 and a magnetic disk device. A file memory device 13 such as the following is connected.
Prior to operation of the method according to the present invention, the following data is prepared on the medium of the file memory device 13. The test program with test conditions set first, that is, this button is 1
The test programs are classified according to test conditions such as machine number to be tested, capacity, test mode, etc., and each test program is treated as one independent test program data. In this way, all test programs are stored as test program data with numbers attached to each test condition.
Second, all the system configurations of the device under test group 3 are patterned into pattern numbers, and a test schedule table is prepared in which the test program number, alternation data, test execution cycle number, etc. are listed in the order in which tests are executed for each number. Create and store. Next, the test method during operation will be explained.

As already explained, the cape Louis connecting the maintenance panel 1 and the panel control circuit 2 of the information processing device A that has completed the first step test is removed, and the cape Louis connecting the maintenance panel 1 and the panel control circuit 2 is connected between the test computer 11 and the panel control circuit 2. Connect as shown.

Next, the operator operates the test computer 11, and under the control of the test computer 11, the operator inputs the following information to the console input/output device 12.
Enter the system pattern number described above. When the above operations are completed, the test computer 11 automatically executes the following processes 1 to 6. 1. Read the test schedule table corresponding to the system pattern number from the file memory device 13.

2 Determine the test program data number from the test schedule table, read the corresponding test program data from the file memory device 13, and send the discussed information to the information processing device via the panel interface under the control of the central processing device 4. Store in 5 on the A side.

3 Set the alternation via the panel interface, set the start address in the instruction counter register (not shown), then start and run the test program.

4 The test program reads the execution result stored in a predetermined register as an encoded code through the panel interface and judges the result. If the test program terminates normally, proceed to section 5. If it terminates with an error, proceed to section 6. Branch out.

5. Refer to the schedule table, and if the next test program data number exists, branch to item 2; if not, output a test completion message to the input/output device 12 and call the operator.

6. Read detailed error information created by the test program in a certain area of the main memory via the panel interface, output the information to the input/output device 12, and call the operator.

As mentioned above, by using the maintenance panel interface, there is no need to read the test program from the external storage device that is the device under test as in the conventional method, and various manual operations when executing the test program can be eliminated. There is no need to do anything outside of the operation until the execution of all test programs is completed, making it possible to significantly reduce testing man-hours.

In addition, quality can be improved without requiring a high level of skill on the part of test operators. In addition to this embodiment, a more comprehensive reliability test can be performed in synchronization with the execution of the test program by providing the test equipment with a control interface for voltage margin, temperature margin, clock margin, etc. for the information processing equipment. It is also possible to do this.

[Brief explanation of the drawing]

The attached figure is a block diagram showing an outline of an embodiment of an automatic test method according to the present invention. A: Information processing device, B: Testing device,
1...Maintenance panel, 2...Maintenance panel control circuit, 3...Device under test group, 4...
...Central processing unit, 5...Main storage device, 6...
...Channel counterfeit, 7...Console display device, 8...Flotspie disc diamond, 9.
... Disc pack device, 10 ... Typewriter device, 1 1 ... Test calculator, 12
...Console input/output device, 13...File memory device, I, mouth...Kefnore.

Claims (1)

[Claims] 1. In testing an information processing device that includes at least a functionally guaranteed maintenance panel and a panel control circuit that controls the panel, a maintenance panel control interface is provided to the panel control circuit in place of the maintenance panel. A test computer is connected via the test computer, and a test program for function confirmation is stored in the main memory of the information processing device to be tested under the control of the test computer, and the test program is executed, thereby checking the test progress. An automatic test method for information processing equipment, characterized in that the information processing equipment under test is tested by monitoring the information processing equipment.