JPS61247027A - Projection exposure equipment - Google Patents

Projection exposure equipment

Info

Publication number
JPS61247027A
JPS61247027A JP60087553A JP8755385A JPS61247027A JP S61247027 A JPS61247027 A JP S61247027A JP 60087553 A JP60087553 A JP 60087553A JP 8755385 A JP8755385 A JP 8755385A JP S61247027 A JPS61247027 A JP S61247027A
Authority
JP
Japan
Prior art keywords
holder
carriage
exposed
pad
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60087553A
Other languages
Japanese (ja)
Inventor
Koichi Matsushita
松下 光一
Junji Isohata
磯端 純二
Sekinori Yamamoto
山本 碩徳
Makoto Miyazaki
真 宮崎
Kunitaka Ozawa
小沢 邦貴
Hideki Yoshinari
吉成 秀樹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP60087553A priority Critical patent/JPS61247027A/en
Publication of JPS61247027A publication Critical patent/JPS61247027A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

PURPOSE:To prevent deterioration in relative positioning accuracy between a original sheet and a body to be exposed and in relative position accuracy between the patterns obtained by divided printing, by holding the bottom surface of the carriage transporting the original sheet and the body to be exposed in a body so as to slide freely in the direction of the transportation to the base stand loaded with the main body of exposure equipment. CONSTITUTION:The carriage (holder) 9 transports the original sheet 1 such as the mask, etc. and the body to be exposed 3 in a body. The bottom surface of the carriage (holder) 9 is so held that it can slide freely in the direction of the transportation to the base stand 13. For example, the air jet pad 15 is installed on the bottom surface of the holder 9, and the linear bearing is constituted to support the bottom surface of the holder 9 with the pad 15 and the guide rail 16 installed on the base stand 13. The pad 15 is supported through the spherical base 20a of the fixture 20, so as to equalize automatically to the upper surface of the guide rail 16 when the holder 9 travels in the direction of Y. Thus, the shape of the carriage is more stabilized and the more precise printing is available.

Description

【発明の詳細な説明】 [発明の分野] 本発明は、被露光体に原板上のパターン像、例えば半導
体回路を焼付ける露光装置に関し、特に大画面を分割焼
きする分割走査(ステップアンドスキャン)形として好
適な投影露光装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of the Invention] The present invention relates to an exposure apparatus that prints a pattern image on an original plate, such as a semiconductor circuit, onto an exposed object, and particularly relates to a step-and-scan method that prints a large screen in parts. The present invention relates to a projection exposure apparatus having a suitable shape.

[従来の技術の説明] ミラープロジェクション方式の半導体焼付装置において
は、マスクと塞板(またはウェハ)をキャリッジ上に乗
せこれを露光面上にスキャン移動させることにより画面
全体を露光している。
[Description of the Prior Art] In a mirror projection type semiconductor printing apparatus, a mask and a cover plate (or wafer) are placed on a carriage, and the entire screen is exposed by scanning and moving the carriage onto the exposure surface.

しかし、最近の傾向として、チップコストの低減を目的
としたウェハの大口径化や液晶TV用等の大型の液晶表
示板の製造のため、画面が大型化してくると、露光範囲
を大きくし、かつスギャン長を伸ばさなければならない
ことにより装置が大型化してくるという問題があった。
However, as recent trends have shown that screens have become larger due to larger diameter wafers to reduce chip costs and the manufacture of large liquid crystal display panels for LCD TVs, the exposure range has become larger. In addition, there is a problem in that the device becomes larger due to the need to increase the span length.

この対策として、画面を分割してスキャン焼きを複数回
に分けて行なうステップアンドスキャン焼方式が考えら
れている。そしてこのステップアンドスキャン焼きをよ
り高速かつ高精度に行なうために、キャリッジに基板ス
テージ(X、Y、θステージ)を搭載す、ることが考え
られている。
As a countermeasure to this problem, a step-and-scan printing method has been considered in which the screen is divided and scan printing is performed multiple times. In order to perform this step-and-scan printing at higher speed and with higher precision, it has been considered to mount a substrate stage (X, Y, θ stage) on the carriage.

ところで、この、基板ステージは例えば40kq程度と
比較的重く、一方、キャリッジは軽量化の要請から柔構
造となり勝ちである。従って、第4図に示すように、キ
ャリッジ9に基板ステージ4を搭載した場合、キャリッ
ジが点線で示すように変形してしまう。また、この変形
は基板ステージ4のステップ移動による重心位置の移動
に応じて変化する。このため、マスク1の位置決め基準
と基板3の位置決め基準との相対ずれが発生し、特にフ
ァーストマスク焼付工程等のようにマスクと基板をそれ
ぞれの絶対基準に合わせて露光する場合、分割焼きした
パターン同士の相対位置精度が低下してパターンが重な
り合ったり、間隔が離れ過ぎたり、パターン間に段差が
生じる等の不都合があった。
By the way, this substrate stage is relatively heavy, for example, about 40 kq, and on the other hand, the carriage tends to have a flexible structure due to the need for weight reduction. Therefore, when the substrate stage 4 is mounted on the carriage 9 as shown in FIG. 4, the carriage deforms as shown by the dotted line. Further, this deformation changes depending on the movement of the center of gravity position due to the step movement of the substrate stage 4. For this reason, a relative deviation occurs between the positioning reference of the mask 1 and the positioning reference of the substrate 3, and especially when exposing the mask and the substrate in accordance with their respective absolute standards, such as in the first mask printing process, the pattern printed in parts is There have been disadvantages such as the relative positional accuracy of the patterns being reduced and the patterns overlapping each other, being spaced too far apart, and creating steps between the patterns.

[発明の目的] 本発明は、前述の問題点に鑑み、キャリッジ自体の強度
並びに重量を増加することなく、その変形を減少させ、
もって、マスク等の原板と基板等の被露光体との相対位
置合わせ精度および被露光体との焼付パターン同士の相
対位置精度の低下を防止することを目的とする。
[Object of the Invention] In view of the above-mentioned problems, the present invention reduces the deformation of the carriage without increasing the strength and weight of the carriage itself, and
The object of the present invention is to prevent deterioration in the relative positioning accuracy between an original plate such as a mask and an exposed object such as a substrate, and the relative positional accuracy between printed patterns with respect to the exposed object.

[実施例の説明コ 以下、図面を用いて本発明の詳細な説明する。[Explanation code for the example] Hereinafter, the present invention will be explained in detail using the drawings.

なお、従来例と共通または対応する部分については同一
の符号で表わす。
Note that parts common or corresponding to those of the conventional example are represented by the same reference numerals.

第1図は、本発明の一実施例に係るステップアンドスキ
ャンタイプのミラープロジェクション露光装置の全体構
成図である。同図において、1は焼付パターンが形成さ
れているフォトマスク、2はマスク1を搭載してX、Y
、θ方向に移動可能なマスクステージである。3は液晶
表示板を製造するためにその表面に多数の画素とこれら
の画素のオン・オフを制御するためのスイッチングトラ
ンジスタが通常のフォトリソグラフィの手順で形成され
るガラス基板で、対角線の長さが14インチ程度の方形
である。4は基板3を保持してX、Y。
FIG. 1 is an overall configuration diagram of a step-and-scan type mirror projection exposure apparatus according to an embodiment of the present invention. In the figure, 1 is a photomask on which a printed pattern is formed, and 2 is a photomask with mask 1 mounted on it.
, a mask stage movable in the θ directions. 3 is a glass substrate on which a large number of pixels and switching transistors for controlling on/off of these pixels are formed by normal photolithography procedures in order to manufacture a liquid crystal display board, and the length of the diagonal line is is about 14 inches square. 4 holds the board 3 and moves X, Y.

θ方向に移動可能な基板ステージで、4つの位置へステ
ップ移動することにより基板3の4分割露光を可能にし
ている・。5は凹面鏡と凸面鏡の組み合せからなる周知
のミラー投影系で、マスクステージ2によって所定位置
にアライメントされたマスク1のパターン像を基板3上
へ等倍投影する。
The substrate stage is movable in the θ direction, and by stepping to four positions, it is possible to expose the substrate 3 in four parts. Reference numeral 5 denotes a well-known mirror projection system consisting of a combination of a concave mirror and a convex mirror, which projects the pattern image of the mask 1 aligned at a predetermined position by the mask stage 2 onto the substrate 3 at the same magnification.

6は不図示の光源からの特定の波長の光で露光位置にあ
るマスク1を照明する照明光学系で、マスク上のパター
ンを介して基板3上の感光層を露光することにより、マ
スク上のパターンを基板3に転写可能とするためのもの
である。なお、投影系5の光軸は照明系6の光軸と一致
させである。
Reference numeral 6 denotes an illumination optical system that illuminates the mask 1 at the exposure position with light of a specific wavelength from a light source (not shown), and by exposing the photosensitive layer on the substrate 3 through the pattern on the mask, This is to enable the pattern to be transferred onto the substrate 3. Note that the optical axis of the projection system 5 is made to coincide with the optical axis of the illumination system 6.

7はY方向(紙面に垂直な方向)に設けられた2つのガ
イドレール8に沿って移動可能なLAB(リニアエアベ
アリング)で、一方はX方向(紙面の左右方向)、Z方
向(紙面の上下方向)拘束タイプ、他方はZ方向拘束タ
イプである。9はマスクステージ2と基板ステージ4を
一定の関係で保持するホルダ(キャリッジ)で、LAB
7に支持されることによりマスクステージ2上のマスク
1と基板ステージ4上の基板3とを一体的に移送可能と
している。このホルダ9の一回の移動で基板3は各マス
ク1ごとに1/4づつ露光される。
7 is a LAB (linear air bearing) that can be moved along two guide rails 8 provided in the Y direction (perpendicular to the page), one of which is movable in the X direction (horizontal direction of the page) and the Z direction (direction perpendicular to the page). (vertical direction) restraint type, and the other is a Z direction restraint type. 9 is a holder (carriage) that holds the mask stage 2 and substrate stage 4 in a fixed relationship;
7, the mask 1 on the mask stage 2 and the substrate 3 on the substrate stage 4 can be integrally transferred. By one movement of the holder 9, the substrate 3 is exposed by 1/4 of each mask 1.

11はマスク搬送装置で、複数のマスク1がセットされ
ており、所望のマスクをマスクステージ2に搬送する。
Reference numeral 11 denotes a mask conveying device, on which a plurality of masks 1 are set, and conveys a desired mask to the mask stage 2.

12は投影系5のピント面と基板3の表面との間隔を検
出するためのギャップセンサで、例えばエアマイクロセ
ンサや、基板3がらの反射光で間隔を検出する光電タイ
プのセンサである。
Reference numeral 12 denotes a gap sensor for detecting the distance between the focal plane of the projection system 5 and the surface of the substrate 3, and is, for example, an air microsensor or a photoelectric type sensor that detects the distance using reflected light from the substrate 3.

13は投影系5、照明系6およびガイドレール8を一定
の関係で取付けるための基台である。
Reference numeral 13 denotes a base on which the projection system 5, illumination system 6, and guide rail 8 are mounted in a fixed relationship.

次に、15は本発明の特徴とするエア噴出バッドで、こ
のパッド15と基台13上に設けられたガイドレール1
6によってホルダ9の底面を指示するためのLABを構
成している。第2図に示す如く、パッド15は取付具2
0の球座20aを介して支持され、ホルダ、9がY方向
に移動する際、ガイドレール16の上面に自動的に倣う
(エコライズする)ようなされている。取付具20はビ
ス21によってホルダ9の底面に固定されている。22
はパッド15を球座22aの方向に付勢するためのスプ
リング、23はパッド15の噴出口15aに不図示のエ
ア供給源からのエアを伝達するためのバイブである。な
お、パッド15はエコライズ可能なものであれば、球座
タイプ以外のもの、例えば浮上タイプとしても良い。こ
のようにパッド15をエコライズ可能なものとすれば、
取付は精度の問題が少なくなるので、取付は作業が容易
となり好ましい。
Next, reference numeral 15 denotes an air jetting pad, which is a feature of the present invention, and a guide rail 1 provided on this pad 15 and the base 13.
6 constitutes a LAB for indicating the bottom surface of the holder 9. As shown in FIG. 2, the pad 15 is
When the holder 9 moves in the Y direction, it automatically follows (equalizes) the upper surface of the guide rail 16. The fixture 20 is fixed to the bottom surface of the holder 9 with screws 21. 22
23 is a spring for urging the pad 15 toward the spherical seat 22a, and 23 is a vibrator for transmitting air from an air supply source (not shown) to the ejection port 15a of the pad 15. Note that the pad 15 may be of a type other than a spherical seat type, for example, a floating type, as long as it can be equalized. If the pad 15 can be equalized in this way,
Mounting is preferred because it reduces the problem of accuracy, making the work easier.

また、ホルダ9の底面に設けるパッド15の個数−に特
に制限はないが、ホルダ9に載置される基板ステージ4
のステップ数を考慮して、例えば、第3図<a)(b)
に示すように、2個または4個とすることができる。第
3図(a)(b)において、01〜04は4ステツプ移
動を行なう基板ステージ4が、ステップ移動を行なった
際の各停止位置でのホルダ9に対する重心を示している
。第3図(a)は重心0+ 、03間の中央と重心02
104間の中央にそれぞれパッド15を設けた例を示し
、第3図(b)は各重心01〜04の位置にパッド15
を設けた例を示している。これらの例の如く、複数のパ
ッドをY方向に移動するホルダ9に設ける場合には、ス
テージ4による現在の重心に近いパッドの噴出圧を他の
パッドより高くすることが望ましい。また、パッドを一
つとする場合には、各重心01〜04の中央に設ければ
良い。
Further, although there is no particular restriction on the number of pads 15 provided on the bottom surface of the holder 9, the substrate stage 4 placed on the holder 9
For example, considering the number of steps in Fig. 3<a)(b)
As shown in the figure, the number can be two or four. In FIGS. 3(a) and 3(b), 01 to 04 indicate the center of gravity of the substrate stage 4 relative to the holder 9 at each stop position when the substrate stage 4 moves in four steps. Figure 3 (a) shows the center of gravity between 0+ and 03 and the center of gravity 02
Fig. 3(b) shows an example in which pads 15 are provided at the center of each of the centers of gravity 01 to 04.
An example is shown below. When a plurality of pads are provided on the holder 9 that moves in the Y direction as in these examples, it is desirable that the ejection pressure of the pads near the current center of gravity by the stage 4 be higher than that of the other pads. Moreover, when using one pad, it may be provided at the center of each center of gravity 01 to 04.

エア噴出パッド15の噴出圧はホルダ9の移動中一定と
しても良く、また、投影系5によって投影されたマスク
1のパターンと基板3間で生じる倍率誤差等を補正する
ためにLAB7のエア圧を制御してホルダ9の姿勢を変
化させる際に、LAB7と同期してエアのオン・オフま
たは強弱を制御するようにしても良い。
The ejection pressure of the air ejection pad 15 may be constant during the movement of the holder 9, and the air pressure of the LAB 7 may be adjusted to correct magnification errors that occur between the pattern of the mask 1 projected by the projection system 5 and the substrate 3. When controlling to change the attitude of the holder 9, the on/off or strength of the air may be controlled in synchronization with the LAB 7.

このように、エア噴出バッド15をホルダ9の底面に取
付け、ホルダ9を底面で支承することにより、ホルダ9
は重量物である基板ステージ4を搭載しても変形が防止
または低減される。
In this way, by attaching the air blowing pad 15 to the bottom surface of the holder 9 and supporting the holder 9 on the bottom surface, the holder 9
Even if the substrate stage 4, which is a heavy object, is mounted, deformation is prevented or reduced.

[発明の効果] 以上のように、本発明によると、マスク等の原板と基板
等の被露光体とを一体的に保持して移送するためのキャ
リッジの底面を支承するようにしているため、ステップ
アンドスキャンをより好適に行なうため等の目的でキャ
リッジに原板や被露光体搭載用のステー゛ジを載置した
場合であってもキャリッジの変形を低減ないし防止する
ことが可能となり、原板と被露光体との相対位置合わせ
精度および被露光体上分割焼付されたパターン同士の相
対位置精度の低下を防止することができる。
[Effects of the Invention] As described above, according to the present invention, since the bottom surface of the carriage for integrally holding and transporting an original plate such as a mask and an exposed object such as a substrate is supported, Even when an original plate or a stage for mounting an exposed object is mounted on the carriage for the purpose of performing step-and-scan more efficiently, deformation of the carriage can be reduced or prevented, and the original plate and It is possible to prevent a decrease in the relative positioning accuracy with the exposed object and the relative positional accuracy between the patterns that are divided and printed on the exposed object.

また、基板ステージを搭載しない従来例について本発明
を適用した場合であっても、キャリッジの形状がより安
定し、より高精度の焼付を行なうことが可能となる。
Further, even when the present invention is applied to a conventional example in which a substrate stage is not mounted, the shape of the carriage becomes more stable and printing can be performed with higher precision.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例に係るミラープロジェクショ
ン露光装置の要部断面図、 第2図は第1図の装置におけるエア噴出パッドを詳細に
示す断面図、 第3図(a)(b)は第1図の装置におけるホルダの上
面概略図、 第4図は従来のミラープロジェクション露光装置の要部
断面図である。 1:フォトマスク、2:マスクステージ、3:基板、4
:基板ステージ、5:ミラー投影系、9:ホルダ(キャ
リッジ)、13:基台、15:エア噴出パッド。 第1図 第2図 第3x
FIG. 1 is a sectional view of essential parts of a mirror projection exposure apparatus according to an embodiment of the present invention, FIG. 2 is a sectional view showing details of an air jet pad in the apparatus of FIG. 1, and FIGS. ) is a schematic top view of the holder in the apparatus shown in FIG. 1, and FIG. 4 is a sectional view of a main part of a conventional mirror projection exposure apparatus. 1: Photomask, 2: Mask stage, 3: Substrate, 4
: substrate stage, 5: mirror projection system, 9: holder (carriage), 13: base, 15: air jet pad. Figure 1 Figure 2 Figure 3x

Claims (1)

【特許請求の範囲】 1、原板と被露光体とを位置的に整合した後、これらの
原板と被露光体とを投影光学系に対して一体的に走査す
ることにより原板の像を被露光体上に転写する投影露光
装置において、上記原板と被露光体とを一体的に移送す
る部材の底面を、該露光装置本体を搭載している基台に
対して該移送方向に滑動自在な支承手段で支承したこと
を特徴とする投影露光装置。 2、前記支承手段が、前記基台上面に流体を噴出するこ
とにより形成される流体噴出パッドである特許請求の範
囲第1項記載の投影露光装置。
[Claims] 1. After positionally aligning the original plate and the object to be exposed, the original plate and the object to be exposed are scanned integrally with respect to a projection optical system, so that the image of the original plate is transferred to the exposed object. In a projection exposure apparatus that transfers images onto a body, a support that allows the bottom surface of a member that integrally transfers the original plate and the object to be exposed to slide in the transfer direction with respect to a base on which the exposure apparatus main body is mounted. A projection exposure apparatus characterized in that it is supported by means. 2. The projection exposure apparatus according to claim 1, wherein the support means is a fluid ejection pad formed by ejecting fluid onto the upper surface of the base.
JP60087553A 1985-04-25 1985-04-25 Projection exposure equipment Pending JPS61247027A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60087553A JPS61247027A (en) 1985-04-25 1985-04-25 Projection exposure equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60087553A JPS61247027A (en) 1985-04-25 1985-04-25 Projection exposure equipment

Publications (1)

Publication Number Publication Date
JPS61247027A true JPS61247027A (en) 1986-11-04

Family

ID=13918176

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60087553A Pending JPS61247027A (en) 1985-04-25 1985-04-25 Projection exposure equipment

Country Status (1)

Country Link
JP (1) JPS61247027A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008235889A (en) * 2007-03-20 2008-10-02 Asml Netherlands Bv Lithography apparatus including vibration insulating support device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008235889A (en) * 2007-03-20 2008-10-02 Asml Netherlands Bv Lithography apparatus including vibration insulating support device
JP4740970B2 (en) * 2007-03-20 2011-08-03 エーエスエムエル ネザーランズ ビー.ブイ. Lithographic apparatus including a vibration isolation support device
US8102505B2 (en) 2007-03-20 2012-01-24 Asml Netherlands B.V. Lithographic apparatus comprising a vibration isolation support device

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