JPS6122762B2 - - Google Patents
Info
- Publication number
- JPS6122762B2 JPS6122762B2 JP11832777A JP11832777A JPS6122762B2 JP S6122762 B2 JPS6122762 B2 JP S6122762B2 JP 11832777 A JP11832777 A JP 11832777A JP 11832777 A JP11832777 A JP 11832777A JP S6122762 B2 JPS6122762 B2 JP S6122762B2
- Authority
- JP
- Japan
- Prior art keywords
- measured
- light
- speckle pattern
- irradiation system
- roughness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003746 surface roughness Effects 0.000 claims description 25
- 230000001427 coherent effect Effects 0.000 claims description 12
- 238000005259 measurement Methods 0.000 claims description 12
- 230000000052 comparative effect Effects 0.000 claims description 11
- 238000007689 inspection Methods 0.000 claims description 9
- 238000003780 insertion Methods 0.000 claims description 4
- 230000037431 insertion Effects 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 description 24
- 235000019592 roughness Nutrition 0.000 description 15
- 239000011521 glass Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 238000009835 boiling Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11832777A JPS5451863A (en) | 1977-09-30 | 1977-09-30 | Surface roughness measuring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11832777A JPS5451863A (en) | 1977-09-30 | 1977-09-30 | Surface roughness measuring apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5451863A JPS5451863A (en) | 1979-04-24 |
JPS6122762B2 true JPS6122762B2 (en, 2012) | 1986-06-03 |
Family
ID=14733914
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11832777A Granted JPS5451863A (en) | 1977-09-30 | 1977-09-30 | Surface roughness measuring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5451863A (en, 2012) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0263381U (en, 2012) * | 1988-11-01 | 1990-05-11 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100394162C (zh) * | 2003-01-23 | 2008-06-11 | 友达光电股份有限公司 | 分析薄膜表面粗糙度的方法 |
-
1977
- 1977-09-30 JP JP11832777A patent/JPS5451863A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0263381U (en, 2012) * | 1988-11-01 | 1990-05-11 |
Also Published As
Publication number | Publication date |
---|---|
JPS5451863A (en) | 1979-04-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE19944354B4 (de) | Verfahren und Vorrichtung zur Vermessung von spiegelnden oder transparenten Prüflingen | |
US4373817A (en) | Computerized micromeasuring system and method therefor | |
US4160598A (en) | Apparatus for the determination of focused spot size and structure | |
JP3186799B2 (ja) | 立体形状測定装置 | |
JPH0153401B2 (en, 2012) | ||
US4959552A (en) | Microscope arranged for measuring microscopic structures | |
DE02773388T1 (de) | Messung komplexer oberflächenformen unter verwendung einer sphärischen wellenfront | |
KR20070116721A (ko) | 편심량 측정 방법 | |
US6552806B1 (en) | Automated minimization of optical path difference and reference mirror focus in white-light interference microscope objective | |
JPH0363009B2 (en, 2012) | ||
Baker | Microscope image comparator | |
DE4404276C1 (de) | Verfahren und Vorrichtung zum Messen der Grenzflächenspannung aus dem Tropfenprofil einer Probe | |
EP0128183B1 (en) | Inspection apparatus and method | |
US3619067A (en) | Method and apparatus for determining optical focal distance | |
CN109990982B (zh) | 反射式横向相减差动共焦焦距测量方法 | |
JPS6122762B2 (en, 2012) | ||
CN117608071A (zh) | 一种高精度双自聚焦装置、高精度显微成像系统和方法 | |
JPH077653B2 (ja) | 走査電子顕微鏡による観察装置 | |
CN110260783A (zh) | 一种干涉显微镜自动对焦装置及方法 | |
CN109990981B (zh) | 反射式双边错位差动共焦焦距测量方法 | |
CN117006969B (zh) | 光学测量系统 | |
SU1332204A1 (ru) | Способ измерени высоты шероховатости | |
JPS6212851B2 (en, 2012) | ||
JP3064329B2 (ja) | 屈折率分布測定方法及び屈折率分布測定装置 | |
JP2814260B2 (ja) | 屈折率分布の測定方法 |