JPS61222146A - Sheet for supporting semiconductor wafer - Google Patents

Sheet for supporting semiconductor wafer

Info

Publication number
JPS61222146A
JPS61222146A JP60024851A JP2485185A JPS61222146A JP S61222146 A JPS61222146 A JP S61222146A JP 60024851 A JP60024851 A JP 60024851A JP 2485185 A JP2485185 A JP 2485185A JP S61222146 A JPS61222146 A JP S61222146A
Authority
JP
Japan
Prior art keywords
semiconductor
sheet
semiconductor wafer
wafer
supporting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60024851A
Other languages
Japanese (ja)
Inventor
Seiji Ohashi
大橋 誠治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP60024851A priority Critical patent/JPS61222146A/en
Publication of JPS61222146A publication Critical patent/JPS61222146A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Dicing (AREA)

Abstract

PURPOSE:To prevent the deterioration in the characteristics of a semiconductor device by applying pressure sensitive adhesives onto one surface of a sheet base material while forming a large number of through-holes. CONSTITUTION:A sheet for supporting a semiconductor is positioned on a semiconductor-wafer cutter sucking base 5 with vacuum suction holes 4 while downward directing a sheet base material 1. A semiconductor wafer 6 is positioned on the sheet for supporting the semiconductor so that a surface reverse to the active layer side of the semiconductor wafer 6 and an adhesive layer 2 for the sheet for supporting the semiconductor are faced oppositely. The wafer 6 is bonded with the adhesive layer 2 through sheet through-holes 3 through vacuum suction from the suction holes 4 while the wafer 6 and the sheet for support are fixed to the sucking base 5 for a cutter through vacuum suction. Accordingly, the semiconductor wafer is bonded with the sheet for supporting the semiconductor wafer without applying force to an active layer in the semiconductor wafer, and the semiconductor wafer can be cut, thus preventing the deterioration of characteristics due to bonding.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は半導体ウェハの切断に用いる、ことができる半
導体ウェハ支持用シートに関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a semiconductor wafer support sheet that can be used for cutting semiconductor wafers.

従来の技術 半導体装置の製造に際しては、多数個の半導体装置が作
り込まれた半導体ウェハを前記半導体装置ごとに切断し
て多数個のチップを得るために前記半導体ウェハを半導
体ウェハ支持用シートにはり付け、次に前記半導体ウェ
ハをダイジグする方法がとられる。
BACKGROUND ART When manufacturing semiconductor devices, a semiconductor wafer on which a large number of semiconductor devices are fabricated is cut into individual semiconductor devices, and the semiconductor wafer is glued onto a semiconductor wafer support sheet in order to obtain a large number of chips. A method is used in which the semiconductor wafer is attached and then die-jigged.

第2図は半導体ウェハをはり付ける従来の半導体ウェハ
支持用シートの断面図である。
FIG. 2 is a sectional view of a conventional semiconductor wafer support sheet to which a semiconductor wafer is attached.

シート基材1は樹脂などからなり、その上に半導体ウェ
ハを固定するだめの粘着剤2が塗布されている。
The sheet base material 1 is made of resin or the like, and an adhesive 2 for fixing the semiconductor wafer is applied thereon.

発明が解決しようとする問題点 しかしながら、上記のような構成では、半導体ウェハ支
持用シートを半導体ウェハの裏面に接着する際、半導体
装置が形成されている半導体ウヱハ表面側を何らかの方
法で支持または固定し、半導体ウェハ支持用シートの粘
着層が形成された面とは反対の面を、ヘラあるいはロー
ラなとでこする必要がある。
Problems to be Solved by the Invention However, in the above configuration, when bonding the semiconductor wafer support sheet to the back surface of the semiconductor wafer, the front surface side of the semiconductor wafer on which semiconductor devices are formed must be supported or fixed in some way. However, it is necessary to rub the surface of the semiconductor wafer support sheet opposite to the surface on which the adhesive layer is formed with a spatula or roller.

このとき半導体ウェハの表面に加えられた圧力のために
前記半導体ウェハに歪を生じて、リーク電流が増加する
など、半導体装置の特性が劣化したり、さらに半導体装
置が破壊される、などの問題が生ずる。
At this time, the pressure applied to the surface of the semiconductor wafer causes distortion in the semiconductor wafer, leading to problems such as increased leakage current, deterioration of the characteristics of the semiconductor device, and even destruction of the semiconductor device. occurs.

問題点を解決するための手段 上記問題点を解決するために、本発明の半導体ウニ″支
持用シートは1シート基材の一方の面に粘着剤が塗布さ
れるとともに、多数個の貫通孔が形成されて構成されて
いる。
Means for Solving the Problems In order to solve the above problems, the semiconductor sea urchin'' support sheet of the present invention has one sheet base material coated with an adhesive and a large number of through holes. formed and composed.

作  用 この構成によって、半導体ウェハ支持用シートの粘着層
の上に載置された半導体ウェハを、半導体支持用シート
の貫通孔より前記半導体支持用シートに真空吸引するこ
とにより半導体ウェハが固定でき、したがって、半導体
ウェハ表面の半導体装置の活性層に圧力を加えることな
く、半導体ウェハを半導体支持用シートに接着すること
ができる0 実施例 以下、本発明の一実施例について、図面を参照しながら
説明する。
Function: With this configuration, the semiconductor wafer placed on the adhesive layer of the semiconductor wafer support sheet can be fixed by vacuum suction to the semiconductor support sheet through the through hole of the semiconductor support sheet. Therefore, the semiconductor wafer can be bonded to the semiconductor support sheet without applying pressure to the active layer of the semiconductor device on the surface of the semiconductor wafer.Example Hereinafter, an example of the present invention will be described with reference to the drawings. do.

本発明の半導体支持用シートは、第1図に図示するよう
にシート基材1の一方の面に、粘着剤が塗布されて粘着
層2が形成され、さらに粘着層2とシート基材1を貫通
する孔3が多数個形成されている。
As shown in FIG. 1, the semiconductor support sheet of the present invention has an adhesive layer 2 formed by applying an adhesive to one side of a sheet base material 1, and further includes an adhesive layer 2 and a sheet base material 1. A large number of through holes 3 are formed.

この半導体ウェハ支持用シートへの半導体ウェハの接着
は次のようにして行なう。
The semiconductor wafer is bonded to the semiconductor wafer support sheet in the following manner.

まず、半導体支持用シートをシート基材1を下側にし、
真空吸引孔4を持つ半導体ウェハ切断装置吸着台6に置
く。
First, place the semiconductor support sheet with the sheet base material 1 facing downward,
A semiconductor wafer cutting device having a vacuum suction hole 4 is placed on a suction table 6 .

次に、半導体ウェハ6の活性層側と反対の面と、半導体
支持用シートの粘着層2とが向い合うように半導体ウェ
ハ6を半導体支持用シートに置く。
Next, the semiconductor wafer 6 is placed on the semiconductor support sheet so that the surface of the semiconductor wafer 6 opposite to the active layer side faces the adhesive layer 2 of the semiconductor support sheet.

真空吸引孔4より真空吸着を行なえばシート貫通孔3を
通して半導体ウェハ6が粘着層2に接着されると共に、
半導体ウニへ〇と半導体支持用シートが真空吸着により
、半導体切断装置の吸着台6に固定される。
By performing vacuum suction through the vacuum suction hole 4, the semiconductor wafer 6 is adhered to the adhesive layer 2 through the sheet through hole 3, and
The semiconductor support sheet and the semiconductor support sheet are fixed to the suction table 6 of the semiconductor cutting device by vacuum suction.

発明の効果 以上のように、本発明の半導体支持用シートを用いれば
、半導体ウェハ活性層に力を加えることなく、半導体ウ
ェハ支持用シートに半導体ウェハが接着され、半導体ウ
ェハを切断が行なえるために、接着による、特性の劣化
、半導体装置の破壊などがなくなる。
Effects of the Invention As described above, by using the semiconductor support sheet of the present invention, the semiconductor wafer can be bonded to the semiconductor wafer support sheet and the semiconductor wafer can be cut without applying force to the semiconductor wafer active layer. Furthermore, deterioration of characteristics and destruction of semiconductor devices due to adhesion are eliminated.

このシートは支持用シートとして、あらゆる用途に応用
され、その効果は絶大である。
This sheet can be used as a support sheet for a variety of purposes, and its effects are tremendous.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例における半導体支持用シート
の使用方法を示す図、第2図は従来の半導体支持用シー
トの断面図である。 1・・・・・・シート基材、2・・・・・・シート粘着
層、3・・・・・・シート貫通孔、4・・・・・・真空
吸引孔、6・・・・・・半導体ウェハ切断装置吸着台、
6・・・・・・半導体ウェハ。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名W&
1  図 第2図
FIG. 1 is a diagram showing a method of using a semiconductor support sheet according to an embodiment of the present invention, and FIG. 2 is a sectional view of a conventional semiconductor support sheet. 1...Sheet base material, 2...Sheet adhesive layer, 3...Sheet through hole, 4...Vacuum suction hole, 6......・Semiconductor wafer cutting equipment suction table,
6... Semiconductor wafer. Name of agent: Patent attorney Toshio Nakao and one other person W&
1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 板状体の一方の面に粘着剤が塗布されるとともに、前記
粘着剤および板状体を貫通する貫通孔が多数個設けられ
ていることを特徴とする半導体ウェハ支持用シート。
1. A sheet for supporting a semiconductor wafer, characterized in that an adhesive is coated on one surface of a plate-like body, and a large number of through holes passing through the adhesive and the plate-like body are provided.
JP60024851A 1985-02-12 1985-02-12 Sheet for supporting semiconductor wafer Pending JPS61222146A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60024851A JPS61222146A (en) 1985-02-12 1985-02-12 Sheet for supporting semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60024851A JPS61222146A (en) 1985-02-12 1985-02-12 Sheet for supporting semiconductor wafer

Publications (1)

Publication Number Publication Date
JPS61222146A true JPS61222146A (en) 1986-10-02

Family

ID=12149714

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60024851A Pending JPS61222146A (en) 1985-02-12 1985-02-12 Sheet for supporting semiconductor wafer

Country Status (1)

Country Link
JP (1) JPS61222146A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5683947A (en) * 1994-08-13 1997-11-04 Robert Bosch Gmbh Method for producing a component according to the anodic bonding method and component
JP2001085449A (en) * 1999-09-10 2001-03-30 Disco Abrasive Syst Ltd Csp substrate holding member and table for csp substrate for placing the same thereon
WO2003041153A1 (en) * 2001-11-07 2003-05-15 Schlumberger Systèmes Method of fixing a sealing object to a base object
JP2007059802A (en) * 2005-08-26 2007-03-08 Disco Abrasive Syst Ltd Machining method of wafer, and pressure-sensitive adhesive tape used for the same
JP2007059829A (en) * 2005-08-26 2007-03-08 Disco Abrasive Syst Ltd Machining method of wafer, and pressure-sensitive adhesive tape used for the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5599741A (en) * 1979-01-26 1980-07-30 Hitachi Ltd Affixing method of article onto adhesive tape

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5599741A (en) * 1979-01-26 1980-07-30 Hitachi Ltd Affixing method of article onto adhesive tape

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5683947A (en) * 1994-08-13 1997-11-04 Robert Bosch Gmbh Method for producing a component according to the anodic bonding method and component
JP2001085449A (en) * 1999-09-10 2001-03-30 Disco Abrasive Syst Ltd Csp substrate holding member and table for csp substrate for placing the same thereon
WO2003041153A1 (en) * 2001-11-07 2003-05-15 Schlumberger Systèmes Method of fixing a sealing object to a base object
CN100409421C (en) * 2001-11-07 2008-08-06 雅斯拓股份有限公司 Method of fixing a sealing object to a base object
JP2007059802A (en) * 2005-08-26 2007-03-08 Disco Abrasive Syst Ltd Machining method of wafer, and pressure-sensitive adhesive tape used for the same
JP2007059829A (en) * 2005-08-26 2007-03-08 Disco Abrasive Syst Ltd Machining method of wafer, and pressure-sensitive adhesive tape used for the same

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