JPS6120803A - 膜厚測定方法 - Google Patents

膜厚測定方法

Info

Publication number
JPS6120803A
JPS6120803A JP59142573A JP14257384A JPS6120803A JP S6120803 A JPS6120803 A JP S6120803A JP 59142573 A JP59142573 A JP 59142573A JP 14257384 A JP14257384 A JP 14257384A JP S6120803 A JPS6120803 A JP S6120803A
Authority
JP
Japan
Prior art keywords
film thickness
film
ultrasonic
substrate
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59142573A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0432962B2 (enExample
Inventor
Yusuke Tsukahara
祐輔 塚原
Eiji Takeuchi
栄治 竹内
Eisaku Hayashi
栄作 林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toppan Inc
Original Assignee
Toppan Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toppan Printing Co Ltd filed Critical Toppan Printing Co Ltd
Priority to JP59142573A priority Critical patent/JPS6120803A/ja
Priority to US06/751,299 priority patent/US4625556A/en
Publication of JPS6120803A publication Critical patent/JPS6120803A/ja
Publication of JPH0432962B2 publication Critical patent/JPH0432962B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
    • G01B17/025—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP59142573A 1984-07-10 1984-07-10 膜厚測定方法 Granted JPS6120803A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP59142573A JPS6120803A (ja) 1984-07-10 1984-07-10 膜厚測定方法
US06/751,299 US4625556A (en) 1984-07-10 1985-07-02 Method of layer thickness measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59142573A JPS6120803A (ja) 1984-07-10 1984-07-10 膜厚測定方法

Publications (2)

Publication Number Publication Date
JPS6120803A true JPS6120803A (ja) 1986-01-29
JPH0432962B2 JPH0432962B2 (enExample) 1992-06-01

Family

ID=15318462

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59142573A Granted JPS6120803A (ja) 1984-07-10 1984-07-10 膜厚測定方法

Country Status (2)

Country Link
US (1) US4625556A (enExample)
JP (1) JPS6120803A (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0187205U (enExample) * 1987-12-02 1989-06-08
JPH0241109U (enExample) * 1988-09-12 1990-03-22
JPH02296104A (ja) * 1989-05-11 1990-12-06 Toppan Printing Co Ltd 膜厚測定装置
JP2008174916A (ja) * 2007-01-16 2008-07-31 Toyo Exterior Co Ltd 床面開口スライド開閉装置
JP2010243176A (ja) * 2009-04-01 2010-10-28 Kanto Auto Works Ltd 膜厚測定方法及び測定装置
CN114577153A (zh) * 2022-03-22 2022-06-03 西安交通大学 一种推力滑动轴承润滑油膜厚度在线超声测量方法及系统
WO2023190658A1 (ja) * 2022-04-01 2023-10-05 日東電工株式会社 積層体、放熱基板および積層体の製造方法

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2629586B1 (fr) * 1988-03-30 1992-01-03 Cezus Co Europ Zirconium Procede de controle ultrasonore de l'epaisseur de placage d'un tube metallique, dispositif correspondant et application a des tubes en alliage de zr plaque
GB2232487B (en) * 1989-06-09 1993-08-04 Shimizu Construction Co Ltd Ultrasonic measuring apparatus including a high-damping probe
JP2541012B2 (ja) * 1990-11-28 1996-10-09 凸版印刷株式会社 超音波スペクトラム顕微鏡
US5663502A (en) * 1994-10-18 1997-09-02 Hitachi, Ltd. Method and apparatus for measuring thickness of layer using acoustic waves
JPH08245792A (ja) * 1995-03-10 1996-09-24 Mitsubishi Electric Corp シリコーンラダーポリマー、シリコーンラダープレポリマーおよびそれらの製造方法
US6128081A (en) * 1996-11-22 2000-10-03 Perceptron, Inc. Method and system for measuring a physical parameter of at least one layer of a multilayer article without damaging the article and sensor head for use therein
US6769307B1 (en) 1997-11-21 2004-08-03 Perceptron, Inc. Method and system for processing measurement signals to obtain a value for a physical parameter
EP1007942B1 (en) * 1996-11-22 2006-10-18 Perceptron, Inc. Physical parameter measuring apparatus and method thereof
US5996415A (en) * 1997-04-30 1999-12-07 Sensys Instruments Corporation Apparatus and method for characterizing semiconductor wafers during processing
US5974886A (en) * 1997-09-15 1999-11-02 General Electric Company Method and apparatus for thickness determination in multilayer articles
EP0905478A3 (de) * 1997-09-30 2000-05-10 Siemens Aktiengesellschaft Verfahren zur Wanddickenmessung
US6250161B1 (en) 1997-10-03 2001-06-26 Board Of Trustees Of The Leland Stanford Junior University Ultrasonic photoresist process monitor and method
US6026688A (en) * 1997-10-03 2000-02-22 The Board Of Trustees Of The Leland Stanford Junior University Ultrasonic photoresist process monitor and method
USH2112H1 (en) * 2001-11-08 2004-12-07 The United States Of America As Represented By The Secretary Of The Navy Method for measuring coating thickness using ultrasonic spectral tracking
US20150000405A1 (en) * 2013-06-27 2015-01-01 Honeywell International Inc. Non-destructive evaluation methods for determining a thickness of a coating layer on a turbine engine component
CN109974639B (zh) * 2019-04-28 2020-05-12 中国科学院声学研究所 一种基于后退波的固体板厚度测量装置及其方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2349139A1 (fr) * 1975-11-20 1977-11-18 Centre Techn Ind Mecanique Procede et dispositif d'examen non destructif par ultrasons
US4274288A (en) * 1979-07-23 1981-06-23 Rockwell International Corporation Method for measuring the depth of surface flaws

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0187205U (enExample) * 1987-12-02 1989-06-08
JPH0241109U (enExample) * 1988-09-12 1990-03-22
JPH02296104A (ja) * 1989-05-11 1990-12-06 Toppan Printing Co Ltd 膜厚測定装置
JP2008174916A (ja) * 2007-01-16 2008-07-31 Toyo Exterior Co Ltd 床面開口スライド開閉装置
JP2010243176A (ja) * 2009-04-01 2010-10-28 Kanto Auto Works Ltd 膜厚測定方法及び測定装置
CN114577153A (zh) * 2022-03-22 2022-06-03 西安交通大学 一种推力滑动轴承润滑油膜厚度在线超声测量方法及系统
CN114577153B (zh) * 2022-03-22 2023-03-03 西安交通大学 一种推力滑动轴承润滑油膜厚度在线超声测量方法及系统
WO2023190658A1 (ja) * 2022-04-01 2023-10-05 日東電工株式会社 積層体、放熱基板および積層体の製造方法

Also Published As

Publication number Publication date
US4625556A (en) 1986-12-02
JPH0432962B2 (enExample) 1992-06-01

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees