JPS61199681U - - Google Patents
Info
- Publication number
- JPS61199681U JPS61199681U JP8414785U JP8414785U JPS61199681U JP S61199681 U JPS61199681 U JP S61199681U JP 8414785 U JP8414785 U JP 8414785U JP 8414785 U JP8414785 U JP 8414785U JP S61199681 U JPS61199681 U JP S61199681U
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- contact portions
- inspection device
- electrical contact
- pressing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 3
- 239000000758 substrate Substances 0.000 claims 1
- 239000004593 Epoxy Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8414785U JPS61199681U (US07652168-20100126-C00068.png) | 1985-06-03 | 1985-06-03 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8414785U JPS61199681U (US07652168-20100126-C00068.png) | 1985-06-03 | 1985-06-03 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61199681U true JPS61199681U (US07652168-20100126-C00068.png) | 1986-12-13 |
Family
ID=30633402
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8414785U Pending JPS61199681U (US07652168-20100126-C00068.png) | 1985-06-03 | 1985-06-03 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61199681U (US07652168-20100126-C00068.png) |
-
1985
- 1985-06-03 JP JP8414785U patent/JPS61199681U/ja active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS61199681U (US07652168-20100126-C00068.png) | ||
JPS5839574U (ja) | プリント基板検査用治具 | |
JPH0798331A (ja) | フラットパッケージlsi用プローブカバー | |
JPS61153365U (US07652168-20100126-C00068.png) | ||
JPS59115360U (ja) | 回路基板検査用電極構造 | |
JPS6262271U (US07652168-20100126-C00068.png) | ||
JPS58160362U (ja) | 半導体装置の特性試験治具 | |
JPS5837171U (ja) | 混成厚膜印刷基板 | |
JPS62158826U (US07652168-20100126-C00068.png) | ||
JPS6082333U (ja) | 入力装置 | |
JPH02160391A (ja) | フレーム付半導体装置の試験用ソケット | |
JPS5991771U (ja) | 基板回路の検査用端子のア−ス構造 | |
JPH0238744U (US07652168-20100126-C00068.png) | ||
JPS62122344U (US07652168-20100126-C00068.png) | ||
JPS5878678U (ja) | プリント基板装置 | |
JPS6343430U (US07652168-20100126-C00068.png) | ||
JPH02162671A (ja) | Icパッケージ変換用ソケット | |
JPS6213099U (US07652168-20100126-C00068.png) | ||
JPS62163764U (US07652168-20100126-C00068.png) | ||
JPS61174767U (US07652168-20100126-C00068.png) | ||
JPH0193570U (US07652168-20100126-C00068.png) | ||
JPS58127649U (ja) | 半導体装置 | |
JPS60163381U (ja) | 高周波測定回路 | |
JPS5920172U (ja) | ユニバ−サルフイクスチヤ− | |
JPS592137U (ja) | 半導体装置 |