JPS61197577U - - Google Patents
Info
- Publication number
- JPS61197577U JPS61197577U JP8246385U JP8246385U JPS61197577U JP S61197577 U JPS61197577 U JP S61197577U JP 8246385 U JP8246385 U JP 8246385U JP 8246385 U JP8246385 U JP 8246385U JP S61197577 U JPS61197577 U JP S61197577U
- Authority
- JP
- Japan
- Prior art keywords
- wire
- power supply
- inspection device
- conductive tube
- guide body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims 3
- 238000005259 measurement Methods 0.000 claims 2
- 238000003780 insertion Methods 0.000 claims 1
- 230000037431 insertion Effects 0.000 claims 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985082463U JPH0515109Y2 (de) | 1985-05-31 | 1985-05-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985082463U JPH0515109Y2 (de) | 1985-05-31 | 1985-05-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61197577U true JPS61197577U (de) | 1986-12-10 |
| JPH0515109Y2 JPH0515109Y2 (de) | 1993-04-21 |
Family
ID=30630202
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985082463U Expired - Lifetime JPH0515109Y2 (de) | 1985-05-31 | 1985-05-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0515109Y2 (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008292327A (ja) * | 2007-05-25 | 2008-12-04 | Hioki Ee Corp | プローブユニットおよび回路基板検査装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS587835A (ja) * | 1981-06-30 | 1983-01-17 | インタ−ナシヨナル・ビジネス・マシ−ンズ・コ−ポレ−シヨン | プロ−ブ・アツセンブリ− |
| JPS6011170A (ja) * | 1983-06-30 | 1985-01-21 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | 座屈はりテスト・プロ−ブ組立体 |
-
1985
- 1985-05-31 JP JP1985082463U patent/JPH0515109Y2/ja not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS587835A (ja) * | 1981-06-30 | 1983-01-17 | インタ−ナシヨナル・ビジネス・マシ−ンズ・コ−ポレ−シヨン | プロ−ブ・アツセンブリ− |
| JPS6011170A (ja) * | 1983-06-30 | 1985-01-21 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | 座屈はりテスト・プロ−ブ組立体 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008292327A (ja) * | 2007-05-25 | 2008-12-04 | Hioki Ee Corp | プローブユニットおよび回路基板検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0515109Y2 (de) | 1993-04-21 |