JPS61178493A - Liquid-phase epitaxial method - Google Patents
Liquid-phase epitaxial methodInfo
- Publication number
- JPS61178493A JPS61178493A JP2023385A JP2023385A JPS61178493A JP S61178493 A JPS61178493 A JP S61178493A JP 2023385 A JP2023385 A JP 2023385A JP 2023385 A JP2023385 A JP 2023385A JP S61178493 A JPS61178493 A JP S61178493A
- Authority
- JP
- Japan
- Prior art keywords
- melt
- holder
- wafer
- film
- support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B19/00—Liquid-phase epitaxial-layer growth
- C30B19/06—Reaction chambers; Boats for supporting the melt; Substrate holders
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、液状メルト残査を液相エピタキシャル膜(L
P E)形成基板から素早く除去し、LPE膜の特性
分布を改良する新規方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention provides a method for converting liquid melt residue into a liquid phase epitaxial film (L
PE) A novel method for rapid removal from forming substrates and improved property distribution of LPE films.
例えば、磁気バブルメモリ装・置においてその素子は、
GGG等の基板にガーネット等にてなるLPE膜を被着
し、その上に磁性材料にてなる磁気バブル転送路や導電
材料にてなる磁気バブルの発生器、検出器、複写器等が
パターン形成されている。For example, in a magnetic bubble memory device/device, the element is
An LPE film made of garnet or the like is deposited on a substrate such as GGG, and a pattern is formed on it of a magnetic bubble transfer path made of a magnetic material and a magnetic bubble generator, detector, copying device, etc. made of a conductive material. has been done.
そして前記素子は、1枚のウェーハから複数個が取得で
きる大きさであり、高い生産性を確保するため、素子基
板に分割するに先立って実施可能な工程は、ウェーハの
状態でバッチ処理されるが、。The devices are of a size that allows multiple devices to be obtained from one wafer, and in order to ensure high productivity, processes that can be performed prior to dividing into device substrates are performed in batches in the wafer state. but,.
前記LPE膜の形成はその1つである。Formation of the LPE film is one of them.
第2図は液相エピタキシャル方法の従来技術を説明する
ため装置の主要構成を模式的に示す側面図である。FIG. 2 is a side view schematically showing the main structure of an apparatus for explaining the conventional technique of liquid phase epitaxial method.
第2図において、1は炉心管、2は炉心管1を取り巻く
ヒータ、3は坩堝、4は坩堝3内のメルト、5はメルト
4の発生する有毒ガスを除去するガス(Ng)6の流通
路、7はウェーハ(GGG基板)、8は複数枚のウェー
ハ7を適宜の傾斜角度に保持するホルダ、9はホルダ8
を支持する支持棒、10は支持棒9を支持し上下動する
アーム、11はメルト残査である。In Fig. 2, 1 is a core tube, 2 is a heater surrounding the core tube 1, 3 is a crucible, 4 is the melt in the crucible 3, and 5 is a flow of gas (Ng) 6 for removing toxic gas generated by the melt 4. 7 is a wafer (GGG substrate); 8 is a holder for holding a plurality of wafers 7 at an appropriate inclination angle; 9 is a holder 8
10 is an arm that supports the support rod 9 and moves up and down, and 11 is a melt residue.
かかる装置において、ウェーハ7をメルト4中に浸漬し
、その表面にLPE膜を形成させてから引き上げた直後
には、各ウェーハ7の全体にメルト残香(第1図参照)
が付着している。そして暫時そのまま類l内に保持する
と、そのほぼ半量は自然に流れ落ちるも第2図に示す如
く、メルト残香11が残る。In such an apparatus, immediately after wafers 7 are immersed in the melt 4 to form an LPE film on their surfaces and then pulled up, the entire wafer 7 is left with a melt residual smell (see FIG. 1).
is attached. If the amount is kept within the range 1 for a while, approximately half of the amount will naturally run off, but a residual melt scent 11 will remain as shown in FIG.
そこで、メルト残香11を除去するため従来装置は、ホ
ルダ8を回転させその遠心力を利用し、残香11が飛び
敗るようにしていた。Therefore, in order to remove the melt residual aroma 11, the conventional apparatus rotates the holder 8 and utilizes the centrifugal force thereof, so that the residual aroma 11 is blown away.
しかし、メルト4に対する十分な耐性を有する金属線(
例えば白金−金の合金線)にてなるホルダ8の前記回転
速度は300rpm程度が限度であり、且つホルダ8の
機械的強度が低いため徐々に加速する必要がある。However, metal wires with sufficient resistance to melt 4 (
The rotational speed of the holder 8 made of, for example, a platinum-gold alloy wire, is limited to about 300 rpm, and since the mechanical strength of the holder 8 is low, it is necessary to gradually accelerate the rotation speed.
そのため、残香11の被着部分でLPE膜が成長し、残
香11の被着してない部分よりも厚くなると共に、残香
11の移動跡が形成されLPE膜の均一性が損なわれて
いた。As a result, the LPE film grows in the area to which the residual fragrance 11 is applied, becoming thicker than the area to which the residual fragrance 11 is not applied, and traces of movement of the residual fragrance 11 are formed, impairing the uniformity of the LPE film.
即ち、例えばウェーハ7がGGGでLPE膜がガーネッ
ト膜であり、該ガーネット膜の上にパーマロイにてなる
磁気バブル転送路、アルミニニウム等の金属にてなる磁
気バブル発生器等をパターン形成してなる磁気バブルメ
モリ素子を作成しようとするとき、ガーネット膜の厚さ
に影響される磁気バブルの消減磁界分布が悪くなり、初
期の特性の得られないことがあった。That is, for example, the wafer 7 is GGG and the LPE film is a garnet film, and a magnetic bubble transfer path made of permalloy, a magnetic bubble generator made of metal such as aluminum, etc. are patterned on the garnet film. When attempting to create a magnetic bubble memory element, the distribution of the demagnetizing field of the magnetic bubble, which is affected by the thickness of the garnet film, deteriorates, and initial characteristics may not be obtained.
そこで、前記ガーネット膜の不良個所は除去しなければ
ならないが、その良否は前記転送路や発生器等を形成し
た後でなければ不明であり、そのような不良個所の除去
が強く要望されていた。Therefore, the defective parts of the garnet film must be removed, but the quality of the film cannot be known until after the transfer path, generator, etc. are formed, and there is a strong desire to remove such defective parts. .
上記問題点の解決を目的として本発明は、液相エピタキ
シャル膜の形成される基板を傾斜させ支持するホルダに
設けた吸引路を介し、前記膜形成後の前記基板に付着す
る液状のメルトを吸引除去することを特徴とした液相エ
ピタキシャル方法である。In order to solve the above problems, the present invention suctions the liquid melt adhering to the substrate after the film is formed through a suction path provided in a holder that tilts and supports the substrate on which the liquid phase epitaxial film is formed. This is a liquid phase epitaxial method characterized by removing.
上記手段によれば、ホルダを徐々に加速して回
、転させ、且つ不十分な回転速度でメルト残香11を飛
び散らして除去する従来方法よりも、迅速にメルト残香
11が吸引除去されるため、メルト残香11が被着する
部分の膜成長、および残香移動跡が残らず、LPE膜の
均質化が可能になる。According to the above means, the holder is gradually accelerated and rotated.
Since the melt residual aroma 11 is removed by suction more quickly than the conventional method of scattering and removing the melt residual aroma 11 by rotating the rotor at an insufficient rotation speed, the melt residual aroma 11 is removed by film growth on the part to which it adheres, and No traces of residual fragrance transfer remain, making it possible to homogenize the LPE film.
以下に、図面を用いて本発明の詳細な説明する。 The present invention will be described in detail below using the drawings.
第1図は本発明の一実施例に係わる基板ホルダの構成と
該ホルダに取付けられウェーハおよび該ウェーハのメル
ト残香を示す側断面図である。FIG. 1 is a side cross-sectional view showing the configuration of a substrate holder, a wafer attached to the holder, and a melt residue on the wafer according to an embodiment of the present invention.
第2図と共通部分に同一符号を使用した第1図において
、18はホルダ8に相当するウェーハホルダ、19はホ
ルダ18の上端部を下端部に接続した支持管体、20は
管体19の上端部に一端を接続した吸気パイプ、21は
管体19の中管部をアーム10に固着する金具であり、
吸気パイプ20の他端は図示しない吸引装置に接続され
ている。In FIG. 1, in which the same reference numerals are used for parts common to those in FIG. An intake pipe with one end connected to the upper end, 21 is a metal fitting that fixes the middle pipe part of the pipe body 19 to the arm 10,
The other end of the intake pipe 20 is connected to a suction device (not shown).
メルトに対する耐性を具えたホルダ18は、パイプを加
工した支柱22と、適当な傾斜角度で支柱22に固着さ
れた複数個の環状体23と、ウェーハ7を固定するため
各環状体23に一端が固着された複数個(3〜4個)の
爪24にてなるが、支柱22は下部端を閉成し、各環状
体23を固着した部分の上下に貫通穴25が明けである
。The holder 18, which is resistant to melting, includes a support 22 made of a pipe, a plurality of annular bodies 23 fixed to the support 22 at appropriate inclination angles, and one end of each annular body 23 for fixing the wafer 7. The support 22 is made up of a plurality of (3 to 4) fixed claws 24, and the lower end of the support 22 is closed, and through holes 25 are opened above and below the portion to which each annular body 23 is fixed.
かかるホルダ18は、爪24の先端を曲げて各環状体2
3の上にウェーハ7を固定しかのち、各ウェーハ7をメ
ルト4に浸漬してその表面にLPB膜を被着形成させる
。Such a holder 18 is attached to each annular body 2 by bending the tip of the claw 24.
After fixing the wafers 7 on the melt 4, each wafer 7 is immersed in the melt 4 to form an LPB film on its surface.
次いで、ホルダ18をメルト4から引き上げると同時に
前記吸引装置を稼動させる。Next, the holder 18 is pulled up from the melt 4 and at the same time the suction device is activated.
すると、前記引き上げの瞬間には第1図に示す如く、ウ
ェーハ7の全体に付着し支柱22の半ばを埋めていたメ
ルト残香26は一部が流れ落ちると共に、他の一部はホ
ルダ18の上部および管体19に吸い上げられ、ウェー
ハ7から迅速に除去されることになる。Then, at the moment of lifting, as shown in FIG. 1, a part of the melt residue 26 that had adhered to the entire wafer 7 and filled the middle of the support column 22 has flowed down, and the other part has fallen onto the upper part of the holder 18 and the other part. It will be sucked up into the tube 19 and quickly removed from the wafer 7.
なお、上記実施例において吸い上げられたメルトは固化
し、ホルダ18の繰り返し使用で支柱22を介する吸引
が不能になるが、その固化メルトは加熱硝酸液に浸漬し
て溶去される。Incidentally, in the above embodiment, the sucked up melt solidifies and becomes impossible to suction through the support column 22 by repeated use of the holder 18, but the solidified melt is immersed in a heated nitric acid solution and dissolved away.
また、本発明にてメルト残香26を除去したのち、回転
の遠心力を利用した除去方法を適用し、さらに低欠陥化
されたLPE膜の得られることを付記する。It is also noted that after the melt residual scent 26 is removed in the present invention, a removal method that utilizes the centrifugal force of rotation is applied to obtain an LPE film with even fewer defects.
以上説明した如(本発明によれば、メルト残香がその引
き上げ直後に実施できるため、該残香によるLPE膜の
不均一が微少化し高品質化された効果は、高性能化され
た磁気バブルメモリ素子の作成等に適用し極めて顕著で
ある。As explained above (according to the present invention, since the melt residual aroma can be removed immediately after the melt is pulled up, the non-uniformity of the LPE film due to the residual aroma can be miniaturized and the quality improved). It is extremely important to apply this method to the creation of .
第1図は本発明の一実施例に係わる基板ホルダの構成と
該ホルダに取付けられウェーハおよび該ウェーハのメル
ト残香を示す側断面図、
第2図は液相エピタキシャル方法の従来技術を説明する
ため装置の主要構成を模式的に示す側面図、
である。
図中において、
7はウェーハ、
8.18はウェーハホルダ、
11 、26はメルト残香、
を示す。
%1 月
↑
第2 図FIG. 1 is a side cross-sectional view showing the configuration of a substrate holder according to an embodiment of the present invention, a wafer attached to the holder, and a melt residue on the wafer, and FIG. 2 is for explaining a conventional technique of a liquid phase epitaxial method. FIG. 2 is a side view schematically showing the main configuration of the device. In the figure, 7 is a wafer, 8.18 is a wafer holder, and 11 and 26 are melt residual scents. %1 Month↑ Figure 2
Claims (1)
するホルダに設けた吸引路を介し、前記膜形成後の前記
基板に付着する液状のメルトを吸引除去することを特徴
とした液相エピタキシャル方法。A liquid phase epitaxial method characterized in that liquid melt adhering to the substrate after the film is formed is removed by suction through a suction path provided in a holder that tilts and supports the substrate on which the liquid phase epitaxial film is formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2023385A JPS61178493A (en) | 1985-02-05 | 1985-02-05 | Liquid-phase epitaxial method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2023385A JPS61178493A (en) | 1985-02-05 | 1985-02-05 | Liquid-phase epitaxial method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61178493A true JPS61178493A (en) | 1986-08-11 |
Family
ID=12021461
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023385A Pending JPS61178493A (en) | 1985-02-05 | 1985-02-05 | Liquid-phase epitaxial method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61178493A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100192839A1 (en) * | 2007-09-28 | 2010-08-05 | Panasonic Corporation | Process for producing group iii element nitride crystal and apparatus for producing group iii element nitride crystal |
-
1985
- 1985-02-05 JP JP2023385A patent/JPS61178493A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100192839A1 (en) * | 2007-09-28 | 2010-08-05 | Panasonic Corporation | Process for producing group iii element nitride crystal and apparatus for producing group iii element nitride crystal |
US9281438B2 (en) * | 2007-09-28 | 2016-03-08 | Ricoh Company, Ltd. | Process for producing group III element nitride crystal and apparatus for producing group III element nitride crystal |
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