JPS61174748A - Socket for semiconductor - Google Patents

Socket for semiconductor

Info

Publication number
JPS61174748A
JPS61174748A JP60016286A JP1628685A JPS61174748A JP S61174748 A JPS61174748 A JP S61174748A JP 60016286 A JP60016286 A JP 60016286A JP 1628685 A JP1628685 A JP 1628685A JP S61174748 A JPS61174748 A JP S61174748A
Authority
JP
Japan
Prior art keywords
socket
semiconductor device
terminal
pin
recessed part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60016286A
Other languages
Japanese (ja)
Inventor
Masahiro Yamaguchi
雅博 山口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Toshiba Electronic Device Solutions Corp
Original Assignee
Toshiba Corp
Toshiba Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toshiba Microelectronics Corp filed Critical Toshiba Corp
Priority to JP60016286A priority Critical patent/JPS61174748A/en
Publication of JPS61174748A publication Critical patent/JPS61174748A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02Contact members
    • H01R13/22Contacts for co-operating by abutting
    • H01R13/24Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0441Details
    • G01R1/0466Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/62Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement
    • H01R13/629Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances
    • H01R13/631Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances for engagement only
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • G01R1/06738Geometry aspects related to tip portion

Abstract

PURPOSE:To facilitate the insertion of the outer terminal into a socket, by providing a recessed part in the head part of a socket pin, and providing a spring mechanism, by which the recessed part and the outer terminal of a semiconductor device are contacted. CONSTITUTION:A plurality of socket pins 7 are provided in a main body 1 of a socket. The inside of a tubular member 71 of each pin 7 is hollow. A pillar shaped member 72 is inserted in said inside part. A recessed part 74 is provided in the head part of the member 72. A spring 75 is provided in the inside of the member 71. An outer terminal 3 is contacted to a member 73 at the recessed part 74. At this time, even if the central axis of the terminal 3 is misaligned from the central axis of the pin 7, the terminal 3 is moved along the surface of the recessed part 74 during the downward moving process of the terminal 3. Therefore, the position is corrected so that the central lines are aligned. by the pressure of the spring 75, the electrical contact between the terminal 3 and the member 73 is kept excellently.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本幾明は半導体装置用ソケット、特にピングリッドアレ
イパッケージを形成する半導体装置をテストする場合に
用いる半導体装置用ソケットに関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a socket for a semiconductor device, and particularly to a socket for a semiconductor device used when testing a semiconductor device forming a pin grid array package.

〔発明の技術的背景〕[Technical background of the invention]

近年LSIの高集積化、多機能化によりLSIパッケー
ジの外部端子数が増加する傾向にあり、これら外部端子
の多いLSIパッケージには、通常ビングリッドアレイ
パッケージが用いられている。このようなピングリッド
アレイパッケージを形成する半導体装置を試験評価する
ために従来用いられているソケットを第2図に示す。ソ
ケット本体1には、ピングリッドアレイパッケージ2の
外部端子3を受は入れるためのソケット孔4が設けられ
ている。すべての外部端子3がこのソケット孔4に挿入
されるように、ピングリッドアレイパッケージ2をソケ
ット本体1の上に載置し、レバー5を動かすと、各ソケ
ット孔4内で外部端子3がソケット端子6と電気的に接
続されようになる。ソケット端子6は配線用基板と電気
的に接続されているため、結局外部端子3が配線用基板
と電気的に接続され、かつビングリッドアレイパッケー
ジ2はソケット本体2の上に支持固定されることになる
In recent years, the number of external terminals in LSI packages has tended to increase due to higher integration and multifunctionality of LSIs, and bin grid array packages are usually used for LSI packages with many external terminals. FIG. 2 shows a socket conventionally used for testing and evaluating a semiconductor device forming such a pin grid array package. The socket body 1 is provided with a socket hole 4 for receiving an external terminal 3 of a pin grid array package 2. When the pin grid array package 2 is placed on the socket body 1 and the lever 5 is moved so that all the external terminals 3 are inserted into the socket holes 4, the external terminals 3 are inserted into the socket holes 4. It becomes electrically connected to the terminal 6. Since the socket terminal 6 is electrically connected to the wiring board, the external terminal 3 is eventually electrically connected to the wiring board, and the bin grid array package 2 is supported and fixed on the socket body 2. become.

(背景技術の問題点〕 前述のように従来のソケットでは、ビングリッドアレイ
パッケージ2の外部端子3のすべてをソケット孔4に挿
入しなければならない。ところがビングリッドアレイパ
ッケージ2から垂直に伸びている外部端子については問
題はないが、曲がりを生じている外部端子はうまくソケ
ット孔に挿入できない。従ってづ゛べての外部端子をう
まくソケット孔に挿入するために、従来は手作業で挿入
位置の微調整を行なっていた。外部端子の数が多くなる
程、この作業には時間がかかり、この挿入のための労力
が大きな欠点となっていた。また、挿入作業を自動化す
ることができないという弊害も生じていた。
(Problems with Background Art) As mentioned above, in the conventional socket, all of the external terminals 3 of the bin grid array package 2 must be inserted into the socket holes 4. However, the external terminals 3 of the bin grid array package 2 must be inserted perpendicularly from the bin grid array package 2. There is no problem with the external terminals, but bent external terminals cannot be inserted properly into the socket holes.Therefore, in order to properly insert each external terminal into the socket hole, conventionally it was necessary to manually adjust the insertion position. The more external terminals there are, the more time it takes to do this, and the labor involved in inserting them is a major drawback.Also, the disadvantage is that the insertion process cannot be automated. was also occurring.

〔発明の目的〕[Purpose of the invention]

そこで本発明はビングリッドアレイパッケージを形成す
る半導体装置の外部端子の挿入が容易な半導体装置用ソ
ケットを提供することを目的とする。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide a socket for a semiconductor device into which external terminals of a semiconductor device forming a bin grid array package can be easily inserted.

〔発明の概要〕[Summary of the invention]

本発明の特徴は、ビングリッドアレイパッケージを形成
する半導体装置用ソケットにおいて、配線用基板に接続
するための筒状部材と、半導体装置の外部端子と電気的
に接触する凹状部をもった 、接触部材と、この接触部
材に固定され筒状部材の内部に長手方向に摺動自在に支
持される柱状部材と、外部端子と凹状部とを接触させる
方向に柱状部材に圧力を及ぼすばね部材と、を有する複
数のソケットピンをソケット本体に設け、半導体装置の
外部端子の挿入を容易にした点にある。
The present invention is characterized in that a socket for a semiconductor device forming a bin grid array package includes a cylindrical member for connecting to a wiring board, and a concave portion for electrically contacting an external terminal of the semiconductor device. a member, a columnar member fixed to the contact member and slidably supported in the longitudinal direction inside the cylindrical member, a spring member that applies pressure to the columnar member in a direction to bring the external terminal and the recess into contact; The socket body is provided with a plurality of socket pins having a diameter of 1.5 mm, thereby facilitating insertion of external terminals of a semiconductor device.

(発明の実施例〕 以下本発明を第1図に示す実施例に基づいて説明する。(Embodiments of the invention) The present invention will be explained below based on the embodiment shown in FIG.

第1図(a)に示すように、ソケット本体1には複数の
ソケットピン7が設けられている。
As shown in FIG. 1(a), the socket body 1 is provided with a plurality of socket pins 7. As shown in FIG.

ビングリッドアレイ2の外部端子3はこのソケットピン
7の頭頂部に載せられ、電気的接触が確保されるととも
に、ピングリッドアレイ2がソケッ1へ本体1によって
支持されることになる。第1図(b)にソケットピン7
を中心軸を通る面で切断した断面図を示す。筒状部材7
1は、内部が空洞となっており、この内部に柱状部材7
2が嵌挿されている。従ってこの柱状部材72は、筒状
部材71の内部で長手方向に摺動自在となる。柱状部材
72の上部には接触部材73が取付けられている。この
接触部材73の頭頂部には凹状部74が設けられている
。この凹状部74は円錐状にするのが好ましい。筒状部
材71の内部にはばね75が設けられており、柱状部材
72および接触部材73に対して図の上方に圧力を与え
ている。
The external terminals 3 of the bin grid array 2 are placed on the tops of the socket pins 7 to ensure electrical contact, and the pin grid array 2 is supported by the main body 1 to the socket 1. Figure 1(b) shows socket pin 7.
A sectional view taken along a plane passing through the central axis is shown. Cylindrical member 7
1 has a hollow interior, and a columnar member 7 is installed inside the cavity.
2 is inserted. Therefore, this columnar member 72 becomes slidable in the longitudinal direction inside the cylindrical member 71. A contact member 73 is attached to the top of the columnar member 72. A concave portion 74 is provided at the top of the contact member 73 . This concave portion 74 is preferably conical. A spring 75 is provided inside the cylindrical member 71 and applies pressure upward in the figure to the columnar member 72 and the contact member 73.

外部端子3は凹状部74から接触部材73に接触する。The external terminal 3 contacts the contact member 73 through the recessed portion 74 .

この際、外部端子3の中心軸とソケットピン7の中心軸
とがずれていたとしても、外部端子3は下方に移動する
過程で凹状部740表面に沿って動くため、中心軸が一
致するように自動的に矯正される。しかもばね75の圧
力により、外部端子3と接触部材73との電気的接触は
常に良好に保たれる。また、接触部材73と筒状部材7
1との間の電気的接触は柱状部材72とはね75を介し
て良好に保たれる。従って柱状部材72が配線用基板に
接続されると、外部端子3は配線用基板と電気的に接続
されることになる。
At this time, even if the central axis of the external terminal 3 and the central axis of the socket pin 7 are misaligned, the external terminal 3 moves along the surface of the concave portion 740 in the process of moving downward, so that the central axes are aligned. automatically corrected. Moreover, due to the pressure of the spring 75, good electrical contact between the external terminal 3 and the contact member 73 is always maintained. In addition, the contact member 73 and the cylindrical member 7
1 is maintained well through the columnar member 72 and the spring 75. Therefore, when the columnar member 72 is connected to the wiring board, the external terminal 3 is electrically connected to the wiring board.

このようにソケットへの外部端子3の挿入は、ビングリ
ッドアレイパッケージ2をソケット本体1の上に大まか
な位置合わせをして載せるだけでよい。先端部に曲がり
を生じている外部端子は前述のように自動的に矯正され
るので、すべての外部端子はソケットピンと良好な電気
的接触を保つようになる。従来のように手作業によって
微妙な位置合わせをする必要もないため、挿入作業を自
動化することも可能である。
In this way, the external terminals 3 can be inserted into the socket by simply placing the bin grid array package 2 on the socket body 1 with rough alignment. External terminals with bent tips are automatically straightened as described above, so that all external terminals maintain good electrical contact with the socket pins. It is also possible to automate the insertion work, since there is no need for delicate manual alignment as in the past.

〔発明の効果〕 以上のとおり本発明によれば、半導体装置用ソケットに
おいて、ソケットピンの頭頂部に凹状部を設け、更にこ
の凹状部と半導体装置の外部端子とを接触させるための
ばね機構を設けるようにしたため、半導体装置の外部端
子を容易にソケットに挿入することができるようになる
[Effects of the Invention] As described above, according to the present invention, in a socket for a semiconductor device, a concave portion is provided at the top of the socket pin, and a spring mechanism is further provided for bringing the concave portion into contact with an external terminal of the semiconductor device. Since the external terminals of the semiconductor device are provided, the external terminals of the semiconductor device can be easily inserted into the socket.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)は本発明に係る半導体装置用ソケットの一
実施例の説明図、第1図(b)は第1図(a)に示すソ
ケットのソケットピンの断面図、第2図は従来の半導体
装置用ソケットの一例を示す斜視図である。 1・・・ソケット本体、2・・−ビングリッドアレイパ
ッケージ、3・・・外部端子、4・・・ソケット孔、5
・・・レバー、6・・・ソケット端子、7・・・ソケッ
トピン、71・・・筒状部材、72・・・柱状部材、7
3・・・接触部材、74・・・凹状部、75・・・ばね
。 出願人代理人  猪  股    清 第2図
FIG. 1(a) is an explanatory diagram of an embodiment of a socket for a semiconductor device according to the present invention, FIG. 1(b) is a sectional view of a socket pin of the socket shown in FIG. 1(a), and FIG. FIG. 2 is a perspective view showing an example of a conventional socket for a semiconductor device. DESCRIPTION OF SYMBOLS 1...Socket body, 2...-bin grid array package, 3...External terminal, 4...Socket hole, 5
... lever, 6 ... socket terminal, 7 ... socket pin, 71 ... cylindrical member, 72 ... columnar member, 7
3... Contact member, 74... Concave portion, 75... Spring. Applicant's agent Kiyoshi Inomata Figure 2

Claims (1)

【特許請求の範囲】 1、ピングリッドアレイパッケージを形成する半導体装
置を配線用基板に電気的接続を保ちつつ支持固定する半
導体装置用ソケットであつて、前記配線用基板に接続す
るための筒状部材と、前記半導体装置の外部端子と電気
的に接触する凹状部をもった接触部材と、前記接触部材
に固定され前記筒状部材の内部に長手方向に摺動自在に
支持される柱状部材と、前記外部端子と前記凹状部とを
接触させる方向に前記柱状部材に圧力を及ぼすばね部材
と、を有する複数のソケットピンをソケット本体に備え
ることを特徴とする半導体装置用ソケット。 2、凹状部が円錐状をしていることを特徴とする特許請
求の範囲第1項記載の半導体装置用ソケット。
[Scope of Claims] 1. A semiconductor device socket for supporting and fixing a semiconductor device forming a pin grid array package while maintaining electrical connection to a wiring board, the socket having a cylindrical shape for connection to the wiring board. a contact member having a concave portion that electrically contacts an external terminal of the semiconductor device; and a columnar member fixed to the contact member and slidably supported in the longitudinal direction inside the cylindrical member. 1. A socket for a semiconductor device, characterized in that a socket main body includes a plurality of socket pins having: a spring member that applies pressure to the columnar member in a direction that brings the external terminal and the recess into contact with each other. 2. The socket for a semiconductor device according to claim 1, wherein the recessed portion has a conical shape.
JP60016286A 1985-01-30 1985-01-30 Socket for semiconductor Pending JPS61174748A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60016286A JPS61174748A (en) 1985-01-30 1985-01-30 Socket for semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60016286A JPS61174748A (en) 1985-01-30 1985-01-30 Socket for semiconductor

Publications (1)

Publication Number Publication Date
JPS61174748A true JPS61174748A (en) 1986-08-06

Family

ID=11912302

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60016286A Pending JPS61174748A (en) 1985-01-30 1985-01-30 Socket for semiconductor

Country Status (1)

Country Link
JP (1) JPS61174748A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2648289A1 (en) * 2012-04-02 2013-10-09 Tyco Electronics Nederland B.V. Contact element, clamping element, base and arrangement for holding and contacting an LED

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2648289A1 (en) * 2012-04-02 2013-10-09 Tyco Electronics Nederland B.V. Contact element, clamping element, base and arrangement for holding and contacting an LED
WO2013149845A1 (en) * 2012-04-02 2013-10-10 Tyco Electronics Nederland Bv Contact element, clamping element, base and arrangement for holding and contacting an led
US9651202B2 (en) 2012-04-02 2017-05-16 Te Connectivity Nederland Bv Contact element, clamping element, base and arrangement for holding and contacting an LED

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