JPS6117281B2 - - Google Patents

Info

Publication number
JPS6117281B2
JPS6117281B2 JP3816378A JP3816378A JPS6117281B2 JP S6117281 B2 JPS6117281 B2 JP S6117281B2 JP 3816378 A JP3816378 A JP 3816378A JP 3816378 A JP3816378 A JP 3816378A JP S6117281 B2 JPS6117281 B2 JP S6117281B2
Authority
JP
Japan
Prior art keywords
light
glossy surface
circularly polarized
glossy
polarized light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP3816378A
Other languages
English (en)
Japanese (ja)
Other versions
JPS54130976A (en
Inventor
Kazutada Koshikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP3816378A priority Critical patent/JPS54130976A/ja
Publication of JPS54130976A publication Critical patent/JPS54130976A/ja
Publication of JPS6117281B2 publication Critical patent/JPS6117281B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP3816378A 1978-04-03 1978-04-03 Direction detection of bright side Granted JPS54130976A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3816378A JPS54130976A (en) 1978-04-03 1978-04-03 Direction detection of bright side

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3816378A JPS54130976A (en) 1978-04-03 1978-04-03 Direction detection of bright side

Publications (2)

Publication Number Publication Date
JPS54130976A JPS54130976A (en) 1979-10-11
JPS6117281B2 true JPS6117281B2 (ko) 1986-05-07

Family

ID=12517726

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3816378A Granted JPS54130976A (en) 1978-04-03 1978-04-03 Direction detection of bright side

Country Status (1)

Country Link
JP (1) JPS54130976A (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010021148A1 (ja) * 2008-08-20 2010-02-25 国立大学法人東北大学 形状・傾斜検知及び/又は計測光学装置及び方法並びにその関連装置
JP2011106920A (ja) * 2009-11-16 2011-06-02 Tohoku Univ 回転・傾斜計測装置および方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6300954B1 (en) 1997-09-12 2001-10-09 Meiryo Tekunika Kabushiki Kaisha Methods and apparatus for detecting liquid crystal display parameters using stokes parameters
EP2071280B1 (en) * 2007-08-07 2015-09-30 Panasonic Intellectual Property Management Co., Ltd. Normal information generating device and normal information generating method
JP5681555B2 (ja) * 2011-04-27 2015-03-11 パナソニックIpマネジメント株式会社 光沢品の外観検査装置、プログラム

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010021148A1 (ja) * 2008-08-20 2010-02-25 国立大学法人東北大学 形状・傾斜検知及び/又は計測光学装置及び方法並びにその関連装置
JP5751470B2 (ja) * 2008-08-20 2015-07-22 国立大学法人東北大学 形状・傾斜検知及び/又は計測光学装置及び方法並びにその関連装置
JP2011106920A (ja) * 2009-11-16 2011-06-02 Tohoku Univ 回転・傾斜計測装置および方法

Also Published As

Publication number Publication date
JPS54130976A (en) 1979-10-11

Similar Documents

Publication Publication Date Title
US10502556B2 (en) Systems and methods for 3D surface measurements
Saito et al. Measurement of surface orientations of transparent objects using polarization in highlight
EP0877914B1 (en) Scanning phase measuring method and system for an object at a vision station
JP3481631B2 (ja) 能動型照明及びデフォーカスに起因する画像中の相対的なぼけを用いる物体の3次元形状を決定する装置及び方法
US9752869B2 (en) Systems and methods for performing machine vision using diffuse structured light
JP3747471B2 (ja) 偏光方位検出型2次元受光タイミング検出装置およびそれを用いた表面形状計測装置
JP7228690B2 (ja) 対向配置チャネルを有する三次元センサ
JPH03183904A (ja) 物体の形状の検知
US5963326A (en) Ellipsometer
US11573428B2 (en) Imaging method and apparatus using circularly polarized light
CN109470173A (zh) 一种双通道同时相移干涉显微系统
Wang et al. Rapid 3D measurement of high dynamic range surface based on multi-polarization fringe projection
Wolff Surface orientation from two camera stereo with polarizers
JPS6117281B2 (ko)
Li et al. Versatile four-axis gonioreflectometer for bidirectional reflectance distribution function measurements on anisotropic material surfaces
CN108507492A (zh) 一种平曲面透射元件表面的高精度大动态范围测量方法及测量系统
JPH05306915A (ja) 形状測定方法およびその装置
Xiang et al. Spatial phase-shifting profilometry by use of polarization for measuring 3D shapes of metal objects
US5383025A (en) Optical surface flatness measurement apparatus
Morel et al. Calibration of catadioptric sensors by polarization imaging
JP2015081894A (ja) 表面形状測定装置及び表面形状測定方法
Morel et al. Polarization imaging for 3D inspection of highly reflective metallic objects
Kawate et al. New scatterometer for spatial distribution measurements of light scattering from materials
Faber et al. Can deflectometry work in presence of parasitic reflections?
US20230168482A1 (en) Phase-shifting diffraction phase interferometry