JPS61168589A - Crucible for producing compound semiconductor - Google Patents
Crucible for producing compound semiconductorInfo
- Publication number
- JPS61168589A JPS61168589A JP839285A JP839285A JPS61168589A JP S61168589 A JPS61168589 A JP S61168589A JP 839285 A JP839285 A JP 839285A JP 839285 A JP839285 A JP 839285A JP S61168589 A JPS61168589 A JP S61168589A
- Authority
- JP
- Japan
- Prior art keywords
- crucible
- cvd method
- pbn
- plasma cvd
- single crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、GaAs 、 GaP 、 工nP
などの凰−V族化合物半導体及び0dTe lどのu−
vi族化合物半導体もしくは単結晶の製造装置特に製造
用るつぼに関するものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to GaAs, GaP, and nP
凰-V group compound semiconductors such as
The present invention relates to an apparatus for producing Group VI compound semiconductors or single crystals, particularly a crucible for production.
m−v族化合物半導体、n−vi族化合物半導体では、
GaAsにおけるA8.0aTe におけるCaのよ
うに、その構成元素の一方の解離圧が高い場合が多い。For m-v group compound semiconductors and n-vi group compound semiconductors,
In many cases, one of the constituent elements has a high dissociation pressure, such as Ca in A8.0aTe in GaAs.
そのため、その合成や単結晶育成にはB、 o3 が
液体封止剤として用いられ、高解離圧元素の揮散を防い
でいる。また、その時のるつぼとしてはPBlするつほ
が一般に用いられている。これは、カーボンにCVD法
によりnm (窒化ホウ素)をコーティングし、カーボ
ンから取シはずしたものであり、原料融液を汚染しない
という利点がある。Therefore, B and O3 are used as liquid sealants in their synthesis and single crystal growth to prevent volatilization of high dissociation pressure elements. In addition, a PB1 crucible is generally used as a crucible at that time. This is made by coating carbon with nm (boron nitride) using the CVD method and removing it from the carbon, which has the advantage of not contaminating the raw material melt.
しかしながら従来一般に用いられているPBNるつぼは
、結晶育成後冷却するとB!03 とゆ着し、nto
s を取り出す時と一緒にはく離してしま、うために
劣化が早く、寿命が短いという問題があつ九。また、単
結晶育成中にもはく離が起こシ、その破片が原料融液表
面に浮遊し、その影響で育成中の単結晶に双晶が発生す
るという重大な問題があった。However, the conventionally commonly used PBN crucible has a B! 03 and nto
Another problem is that when the s is taken out, it peels off, causing rapid deterioration and a short lifespan. In addition, delamination occurs during single crystal growth, and its fragments float on the surface of the raw material melt, resulting in the serious problem of generation of twin crystals in the single crystal being grown.
本発明の目的は、このような欠点を有するPllBるつ
ほにかえて、よシ安定でB、OS とゆ着せずまた合
成もしくは結晶育成中にもはく離のない新規な化合物半
導体の製造用るつぼを提供することにある。The object of the present invention is to provide a new crucible for producing compound semiconductors that is more stable, does not cause B, OS, and does not peel off during synthesis or crystal growth, in place of the PllB crucible that has such drawbacks. Our goal is to provide the following.
すなわち、本発明はPBNるつぼ表面に、プラズマCV
D法によシ非晶質BNをコーティングしてなる化合物半
導体の製造用るつぼである。That is, the present invention applies plasma CV to the surface of the PBN crucible.
This is a crucible for manufacturing compound semiconductors coated with amorphous BN by method D.
以下図面を参照して本発明のるつぼを詳細に説明する。The crucible of the present invention will be explained in detail below with reference to the drawings.
第1図は本発明の実施態様例を示す図であって、1がプ
ラズマCVD法によfiBNをコーティングしたPBN
るつぼ(以下BNココ−PBNるつぼという)である。FIG. 1 is a diagram showing an embodiment of the present invention, in which 1 is a PBN coated with fiBN by plasma CVD method.
It is a crucible (hereinafter referred to as BN Coco-PBN crucible).
他の部分は通常のLICO法単結晶製造装置と同様であ
って、2は原料融液、3は液体封止剤I3zom %
4はヒーター、5はf−’r7バ、6はシード、7は
育成中の単結晶を示す。The other parts are the same as the normal LICO method single crystal production equipment, 2 is the raw material melt, 3 is the liquid sealant I3zom %
4 is a heater, 5 is an f-'r7 bar, 6 is a seed, and 7 is a single crystal being grown.
本発明装置においてPBNるつぼへのBHのコーティン
グは原料としてNHs、 BCls を用いてプラズ
マCVD法によシコーティングする。In the apparatus of the present invention, the PBN crucible is coated with BH by plasma CVD using NHs and BCls as raw materials.
PBNとBNは組成は同じであるが、製造方法が前者は
CVD法によシ後者はプラズマcvp法によるため、生
成する温度が異な6 (cvn法:2000℃;プラス
−r OV D法:100G℃以下)、生成する結晶構
造が異なる。すなわち、FBIは六方晶系の結晶構造を
持つが、積層状に生成するためはく離しやすいが、プラ
ズマCVD法によりコーティングされ九BNはアモルフ
ァス状で、1枚の膜となるため安定である。BNコーテ
ィングの厚さは一般に、e−ct)μmで特に10μm
前後が好ましい。Although PBN and BN have the same composition, the production methods for the former are CVD and the latter are plasma CVP, so the production temperatures are different6 (CVN method: 2000°C; plus-r OV D method: 100G). ℃ or below), the resulting crystal structure is different. That is, FBI has a hexagonal crystal structure, but since it is formed in a layered manner, it is easily peeled off, but 9BN, which is coated by plasma CVD, is amorphous and forms a single film, so it is stable. The thickness of the BN coating is generally 10 μm in e-ct) μm.
Preferably before and after.
したがってBNコートされたFBIるつぼは液体封止剤
とのゆ着も起らず、又、育成中のはく離やそれによる双
晶発生の問題もない。Therefore, the BN-coated FBI crucible does not cause any sticking with the liquid sealant, and there is no problem of delamination during growth or generation of twins due to this.
具体的な化合物半導体の合成方法及び単結晶の製造方法
は例えば次の如くである。A specific method for synthesizing a compound semiconductor and a method for manufacturing a single crystal are as follows, for example.
■合成方法:合成する化合物半導体の原料結晶をBNコ
コ−FBNるづぼ1に入れ、液体封止剤B、0. 3を
入れ、ヒーター4で加熱融解する。チャンバ5中は窒素
、アルゴンなどの不活性気体で10〜50気圧に加圧し
、高解離圧元素の揮散を防ぐ。その後徐々に冷却するこ
とによシ、多結晶化合物半導体を合成することができる
。■Synthesis method: Put the raw material crystal of the compound semiconductor to be synthesized into BN Coco-FBN pot 1, add liquid sealant B, 0. 3 and heat and melt with heater 4. The inside of the chamber 5 is pressurized to 10 to 50 atmospheres with an inert gas such as nitrogen or argon to prevent volatilization of high dissociation pressure elements. Thereafter, by gradually cooling it, a polycrystalline compound semiconductor can be synthesized.
■単結晶製造方法:化合物半導体の多結晶原料2及び液
体封止剤B、0. 5をBNココ−PB)るつぼ1に入
れ、ヒーター4で加熱融解するー。■Single crystal production method: Compound semiconductor polycrystalline raw material 2 and liquid encapsulant B, 0. 5 into BN Coco-PB) crucible 1 and heat and melt with heater 4.
チャンバ5中は、窒素、アルゴンなどの不活性気体で1
0〜50気圧に加圧し、高解離圧元素の揮散を防ぐ。通
常のIIZC法単結晶育成法に従ってシード6によシ単
結晶7を育成する。The chamber 5 is filled with an inert gas such as nitrogen or argon.
Pressure is applied to 0 to 50 atmospheres to prevent volatilization of high dissociation pressure elements. A single crystal 7 is grown from the seed 6 according to the usual IIZC single crystal growth method.
■、■の場合とも、BMコート’PBliるつぼはB、
osに対して安定で、単結晶育成中にはく離した破片
により単結晶が双晶化することもなく、また、合成後や
単結晶育成後にB! Os を取シ出す時、表面がはく
離することもない。そのためるつぼの劣化が少なく、長
期間に渡って使用することができる。In both cases of ■ and ■, the BM coat 'PBli crucible is B,
It is stable against OS, does not cause twinning of the single crystal due to fragments exfoliated during single crystal growth, and B! When taking out the Os, the surface does not peel off. Therefore, there is little deterioration of the crucible and it can be used for a long period of time.
工nP単結晶を本発明装置を用いて製造した。 An engineered nP single crystal was produced using the apparatus of the present invention.
したPBNるつぼを使用して、B、Osを液封剤として
単結晶を育成した。チャンバ内は、Pの揮散を防ぐため
に窒素ガスによシラ0気圧に加圧した。通常のLICO
法により単結晶を育成したが、育成中にもFBHのはく
離はなく、双晶のない単結晶を育成することができた。A single crystal was grown using a PBN crucible containing B and Os as liquid sealants. The inside of the chamber was pressurized to 0 atmospheres with nitrogen gas to prevent evaporation of P. Normal LICO
Although a single crystal was grown by this method, there was no peeling of FBH during the growth, and a twin-free single crystal could be grown.
また、冷却後、該るつぼからB、 os を取り出す
時にも該るつぼとのゆ着はな(、FBIがはく離するこ
となく容易にB、 Ox を取シ出すことができた。Furthermore, when B, os was taken out from the crucible after cooling, there was no sticking to the crucible (the FBI was able to easily take out B, os without peeling it off).
このBNコートしたFBIるつぼは繰シ返し使用寿命が
長く、従来の1MコートしないPBlするつぼの約2倍
の寿命をもつ。This BN-coated FBI crucible has a long repeated use life, about twice as long as a conventional PBl crucible without 1M coating.
以上説明したように、本発明のプラズマCVD法による
非晶質BMをコートしたFBIるつぼを化合物半導体の
合成、単結晶製造に使用することによシ、液封剤B、
O,に対して安定となシ、単結晶育成中に双晶の発生を
抑えることができる。また、るつぼの劣化も少ないため
、長期間に渡って使用できる丸め、経済的にも有利であ
るといった利点がある。As explained above, by using the FBI crucible coated with amorphous BM by the plasma CVD method of the present invention for compound semiconductor synthesis and single crystal production, liquid sealant B,
Since it is stable against O, it is possible to suppress the generation of twins during single crystal growth. In addition, since the crucible is less likely to deteriorate, it has the advantage of being able to be rounded over a long period of time and being economically advantageous.
第1図は本発明のるつぼの一実施態様の説明図である。 FIG. 1 is an explanatory diagram of one embodiment of the crucible of the present invention.
Claims (1)
Nをコーティングしてなる化合物半導体の製造用るつぼ
。Amorphous B was deposited on the surface of the PBN crucible using the plasma CVD method.
A crucible for manufacturing compound semiconductors coated with N.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP839285A JPS61168589A (en) | 1985-01-22 | 1985-01-22 | Crucible for producing compound semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP839285A JPS61168589A (en) | 1985-01-22 | 1985-01-22 | Crucible for producing compound semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61168589A true JPS61168589A (en) | 1986-07-30 |
Family
ID=11691922
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP839285A Pending JPS61168589A (en) | 1985-01-22 | 1985-01-22 | Crucible for producing compound semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61168589A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022064735A1 (en) * | 2020-09-25 | 2022-03-31 | 国立大学法人茨城大学 | Mg2Si SINGLE CRYSTAL, Mg2Si SINGLE CRYSTAL SUBSTRATE, INFRARED RAY-RECEIVING ELEMENT, AND METHOD FOR MANUFACTURING Mg2Si SINGLE CRYSTAL |
-
1985
- 1985-01-22 JP JP839285A patent/JPS61168589A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022064735A1 (en) * | 2020-09-25 | 2022-03-31 | 国立大学法人茨城大学 | Mg2Si SINGLE CRYSTAL, Mg2Si SINGLE CRYSTAL SUBSTRATE, INFRARED RAY-RECEIVING ELEMENT, AND METHOD FOR MANUFACTURING Mg2Si SINGLE CRYSTAL |
US20220341057A1 (en) * | 2020-09-25 | 2022-10-27 | Ibaraki University | Mg2Si SINGLE CRYSTAL, Mg2Si SINGLE CRYSTAL SUBSTRATE, INFRARED LIGHT RECEIVING ELEMENT AND METHOD FOR PRODUCING Mg2Si SINGLE CRYSTAL |
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