JPS61161774U

JPS61161774U -

Info

Publication number: JPS61161774U
Application number: JP4702285U
Authority: JP
Priority date: 1985-03-29
Filing date: 1985-03-29
Publication date: 1986-10-07
Anticipated expiration: 2000-03-29
Also published as: JPH06779Y2

Description

[Brief explanation of the drawing]

第１図は本考案の一実施例にかかる基板試験用
治具の側面図、第２図はその矢視図、第３図は一
実施例のプローブ構造説明図、第４図はカバーボ
ツクス外形図、第５図は従来の基板試験用治具の
側面図、第６図はその矢視図である。１……基板、２……試験板、３……貫通小穴、
４……プローブ、５……気密室、６……気密性部
材、６Ａ……しや閉部材、７……プローブ取付板
、８Ａ，８Ｂ，８Ｃ，８Ｄ……支柱、９……台板
、１０……排気口。 Fig. 1 is a side view of a board testing jig according to an embodiment of the present invention, Fig. 2 is a view in the direction of arrows, Fig. 3 is an explanatory diagram of the probe structure of one embodiment, and Fig. 4 is an outline of the cover box. 5 is a side view of a conventional board testing jig, and FIG. 6 is a view in the direction of arrows. 1... Board, 2... Test plate, 3... Small through hole,
4... Probe, 5... Airtight chamber, 6... Airtight member, 6A... Seat closing member, 7... Probe mounting plate, 8A, 8B, 8C, 8D... Support column, 9... Base plate, 10...Exhaust port.

補正昭６０．５．８図面の簡単な説明を次のように補正する。明細書中、第１１頁第３行目の記載「第６図は
その矢視図である。」を「第６図は第５図の―
矢視図、第７図は他の実施例の側面図、第８図
は第７図のＺ１―Ｚ１矢視図である。」と補正し
ます。Amendment May 8, 1980 The brief description of the drawing is amended as follows. In the specification, the statement on page 11, line 3, ``Figure 6 is a view in the direction of the arrows.'' is replaced with ``Figure 6 is a view of Figure 5.''
7 is a side view of another embodiment, and FIG. 8 is a view taken along the line Z1--Z1 in FIG. 7. ” and correct it.

Claims

[Scope of Claim for Utility Model Registration] (1) Testing for electrically testing a board by setting a board with electrical components such as ICs, resistors, capacitors, etc., or a board without electrical components mounted in a predetermined position. The jig includes a test plate having an elastic airtight member formed in an arbitrary closed shape on the opposite side to which the substrate is set, and an airtight chamber formed between the test plate by being in close contact with the airtight member. and a probe mounting plate on which a probe is attached that contacts the test point of the board and transmits and receives electrical signals to and from the board when the volume of the airtight room is reduced when the air in the airtight room is exhausted. Jig for board testing. (2) The board testing jig as set forth in claim 1 of the utility model registration claim, characterized in that the probe is configured such that the probe portion that contacts the test point of the board changes its length in response to external force. Ingredients.