JPS61158311A - Universal polarization microscope - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

DETAILED DESCRIPTION OF THE INVENTION OBJECTS OF THE INVENTION Industrial Field of Application The present invention relates to a universal projection microscope with a polarization optical and interferometric imaging system, by means of which the optical quantities specific to a material can be determined. Concerning what can be detected and measured. Such microscopes can be used to study crystalline materials or a variety of materials that have a very close orientation of their molecules (eg, biofilms, polymeric materials, etc.).

Conventional techniques Microscopically characterize various solid bodies by measuring various optical quantities specific to that material, such as refractive index, birefringence, transmittance, reflectance, and optical properties, number of optical axes. Find qualitative characteristics such as

For a complete description of the properties of such materials, it is necessary to make use of polarization microscopy, interference microscopy, microscopic photometry, and photometric methods.

The known prefabricated wi-microS construction system makes it possible to selectively utilize these methods by using special add-on units that are attached via the connections of the microscope.

Thus, the polarizing microscope described in East German Economic Patent No. 65 323 provides an excellent conoscopic and orthoscopic view of the object to be examined by visual inspection with ergonomically well constructed binocular eyepieces. A separate interferometric device according to East German Economic Patent No. 53 890 is used for the measurement of the 6 refractive indices that allow observation. A disadvantage of this mode of operation is that the lens barrel with the interference device must be replaced by a polarizing lens barrel. Yet another additional replacement is required when the microscope 1# mirror photometer must be installed. A further disadvantage of such a building block system is that the images produced do not always lie in the same plane. This provides different viewing heights and viewing angles for the viewing tube. In addition,
Different imaging positions and different magnifications in side and height can be accommodated. This is limited by storing unused components at the work site and potentially contaminating external optics.

Austrian Patent No. 314222 describes a further development of the building blocks method.

This device keeps the height of the structure and the height of the viewing position constant and guarantees the exchange between each measurement method without changing its stability, with the necessary The rectangular parallelepiped-shaped fitting body to which various optical elements are attached is replaced. However, in this case too, with regard to maintaining the necessary adjustment accuracy, and with regard to the fact that interferometers are particularly susceptible to misalignment and mechanical damage, and are sensitive to dust,
A disadvantage is that various component groups, which have to be stored separately, have to be replaced.

The problem that the invention seeks to solve The aim of the invention is to obviate the above-mentioned disadvantages.

The present invention maintains the height and angle of the viewing position constant, and enables quick element exchange between a number of microscopy techniques, especially various technical means for phase analysis, and each of the necessary components. The aim is to create a microscope in which the group is extremely well protected against various environmental influences.

The present invention provides an inclined viewing barrel, connections for devices for WI microphotography and photometer, and an eyepiece aperture surface of an eyepiece barrel that can be connected to a WI microscope. The present invention relates to a universal polarizing microscope with optical elements, by means of which an intermediate image plane optically conjugate to the microscope is created.

The problem to be solved by the present invention is that all the optical components necessary for at least two or more different microscopy techniques can be inserted into the optical path in the microscope in a quick and simple manner, and The object is to form an optical path within the mum so that at least one or more intermediate images that can be processed to place marks, apertures, etc. of the object are generated.

[Structure of the invention]

Means for Solving the Problems According to the invention, the above-mentioned problems are solved in that the lens barrel connected to the microscope is constructed as a self-closed component group in which the optical connection to the microscope is between the part and the connection part for the eyepiece tube, the imaging rays coming from the objective can selectively follow different paths via switchable or insertable deflection elements. The solution is that the light rays can be guided along two partial light paths and that the light rays are physically influenced in different ways within these light paths. In this case, the second partial beam path is coupled to the first beam path in such a way that both partial beam paths have a common imaging plane which is present in front of the eyepiece tube or in front of the photometer device. . The intermediate image that occurs in this imaging plane has an equal position in side and height for both partial beam paths and the same imaging dimensions of the object and is then simultaneously detected by a separate optical system in its eyepiece. guided to the lens barrel and photometer device.

DESCRIPTION OF THE PREFERRED EMBODIMENTS The invention will now be explained in more detail with reference to the accompanying diagrammatic drawings, in which: FIG.

The attached figure shows a microscope barrel according to the invention in a sectional view. The housing 1 contains all imaging and deflection components and is fixedly or detachably connected to a microscope (not shown) via a mechanical connection 25. Along the imaging beam path 21 coming from the objective of this microscope, a compensator 14 and an analyzer 15 can be coupled out and a tube-lens system 16 is fixedly arranged. Following this, releasable deflection elements 17 and 20 are provided. If these are removed from the imaging optical path 26, the imaging optical path runs in the first imaging optical loop and the decoupable turning members 2 and 3
, passes through the field lens 4a, and passes through the turning member 12.
The one-part system 18a-18c passes through the lens system 18 for image position sliding and reaches a binocular or monocular eyepiece tube (not shown), which can be connected at a connection 19. Can be decoupled.

The subsystem 18b is then fixedly arranged within this optical path. When the deflecting members 17 and 18 are inserted into the optical path 26, the light beam passes through the deflecting member 17 in the second imaging light loop through the field lens 1], the lens system 10. The deflection element 9 is connected through the known Matsuhatsu Ender interferometer 8 and the tube-lens system 27 to the deflection element 20 and through this again to the first imaging light loop. Above the deflection element 2 there is a connection 3 for a microphotographic device (not shown). A photometer device I 13 with a photoreceiver 7 is mounted behind the objective 5 at the connection 6 . The subsystem 18a, in which the deflection element 21 is replaceable with the deflection elements 2 and 4 and the field lens 4a together with the field lens 21a, is connected to the deflection element 4 and moved away from its optical path, and the subsystem 18c is the deflection element 21 and inserted into its optical path.

According to the invention, the turning member 21 and the field lens 2
1g can be inserted into the optical path by means of a connecting member (not shown) which is also provided inside the housing 1. They are shown externally in the figure for ease of viewing. When the deflection elements 17 and 20 are inserted into the optical path, the tube lens system 16 forms an intermediate image Q, l of the object of the microscope into the mirror surface of the deflection element 4. The deflecting member 4 is constructed as a mirrored prism with a width at least twice its beam width, and it is possible to arbitrarily bring the missing parts of the central part with different diameters to the center of the image. It is now possible to slide sideways. These parts serve as a field diaphragm for the subsequently arranged photometer device 13. The light that has passed through these is guided onto a photoreceiver 7 by an objective lens 5. The field lens 4a combined with the deflection member 4 serves to appropriately shift the exit pupil of the objective.

Turning members 2, 4. Field lens 4a and partial system 1
If 8a is replaced by deflection element 21, field lens 21a and subsystem 18c, an intermediate image Op' is produced between deflection element 21 and field lens 21a through a larger channel in the glass inside deflection element 21. This allows one to freely incorporate a measuring plate or a crosshair (not shown) and an iris diaphragm for fading out small object details for conoscopic measurements.

Via the deflecting member 12 and the lens system 18 for moving the image position, the image of the object is finally formed in the aperture plane of the eyepiece at Op''.

For the description and measurement of the polarization optical properties, an analyzer 15 and a compensator 14 of different construction are inserted in the m-tube into the remote focusing imaging beam path of the microscope before the tube-lens system 16. . When neither the deflection member 2 nor the deflection member 21 is present in this optical path, the coupling portion 3 is
An image OP' of the object is created above the object, which can be photographed in this position by means of the microscope element 1c device.

In order to measure various optical quantities in the interferometer beam path, deflection elements 17 and 20 coupled to each other are inserted into this beam path, so that the imaging beam bundle is additionally divided into a second
passes through the imaging light loop.

The intermediate image created on the image plane 0' in front of the field lens 11 by the lens barrel lens system 16 passes through the interferometer 8 by the field lens 11 and the lens system 10, and is transferred to the deflecting member 4 again by the lens barrel lens system 27. image is formed on the mirror surface of An object intermediate image 0 ++ now occurs in the same image plane as that which has passed through the polarization beam path, which has the same position in height and side as Op' and has the same imaging dimensions.

The further course of the rays is the same as for the first imaging light loop, so that an object image O''' is produced in the eyepiece diaphragm plane.

[Brief explanation of the drawing]

The attached figure diagrammatically shows, in cross-section, the structure of a universal microscope according to the invention. 1... Housing 2.4, 9.12.17, zo-21... Turning member 3
．． 6. IL 25...Connection part 4a, 1121a...Field lens 7...Photoreceiver 8...Matsuhatsu Ender interferometer 13...! Photometer device 14...compensator 15...analyzer 16,
27... Lens barrel lens system 18... Lens system for moving the imaging position 18a, 18b, 18C... Partial system 26... Imaging optical path Q p l, 0''... Intermediate image OP''・...eyepiece aperture surface 0'...image

Claims (4)

[Claims] (1) Optically with respect to the inclined viewing tube, the connections for microphotograph and photometer devices, and the eyepiece aperture surface of the eyepiece tube that can be connected to the microscope. In a universal polarizing microscope with optical components by which a conjugate intermediate image plane is created in the microscope, the optical system is formed inside a lens barrel that can be connected to the microscope as a closed structural unit. An image beam path extends along the first beam path between an optical connection to the microscope and an optical connection to the tilted viewing tube via beam turning and imaging optical components. and the presence of said intermediate image plane in said first optical path, additional means for physically influencing said imaging beam and for imaging and beam deflection. a first diverting member insertable into the first optical path for diverting the imaging optical path into a second optical path having respective optical components; a second turning member is insertable into the first and second optical paths so as to be inserted into the first optical path again; decoupling the second optical path from the first optical path; or the re-insertion into the first optical path takes place before said intermediate image plane, and an image is created in this intermediate image plane via each of said partial optical paths, which is transmitted to the first optical path of the subsequent arrangement. Universal polarizing microscope, characterized in that it is imaged through the system onto the eyepiece diaphragm plane and simultaneously onto the photoreceiver via a second optical system. (2) A universal polarizing microscope according to claim 1, in which a deflecting element with several photometer apertures is provided in the intermediate image plane. (3) The deflection element with the photometer diaphragm and the deflection element arranged in front of it in the first beam path can be replaced by one deflection element with two beam deflections, and the two beam deflections An imaging optical system is provided in the optical path in conjunction with a turning member having a deflection member, which images an intermediate image that is displaced due to the exchange in the same plane as an intermediate image that is not displaced. A universal polarizing microscope according to claim 1. (4) Claims 1 to 3, wherein the image of the object is formed vertically within the eyepiece aperture plane through both partial optical paths so that the left and right sides coincide and with equal imaging dimensions.
A universal polarizing microscope according to any of the sections.