JPS61156733A - Apparatus for fixing plate-like object in vacuum - Google Patents

Apparatus for fixing plate-like object in vacuum

Info

Publication number
JPS61156733A
JPS61156733A JP28073484A JP28073484A JPS61156733A JP S61156733 A JPS61156733 A JP S61156733A JP 28073484 A JP28073484 A JP 28073484A JP 28073484 A JP28073484 A JP 28073484A JP S61156733 A JPS61156733 A JP S61156733A
Authority
JP
Japan
Prior art keywords
wafer
plate
spring
fixing
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28073484A
Other languages
Japanese (ja)
Inventor
Yoshio Watanabe
義雄 渡辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP28073484A priority Critical patent/JPS61156733A/en
Publication of JPS61156733A publication Critical patent/JPS61156733A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electron Beam Exposure (AREA)

Abstract

PURPOSE:To correct a plate planately by fixing the circle of a plate with a plurality of devices arranged in a plane, outwardly applying a tension to a specific device with a spring in the radial direction of the plate. CONSTITUTION:A reference base 16 is provided oppositly of a reference plate 13 for placing a wafer12 and a device 15 for fixing the wafer with a spring 14, the wafer is nipped and held by a reference plate 17 and a spring 18, and a tension is applied radially of the wafer by a spring 20. when pulled by the spring 20, the reference plate 17 slides on the upper surface of the base 16 along a guard 21. The tension may be on the order of 1kg with a single clamp. With this structure, a large-sized wafer can be placed planarly in vacuum without twisting or warping, thereby enabling high-precision exposure.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、真空中における試料固定装置に係わり、特に
半導体装置の製造工程における電子ビーム露光装置等で
半導体ウェハを固定する際に、静電チャック方式ではそ
の電界の影響のために電子ビームの軌跡が変動して正確
な描画が不可能になるため、電界がな(且つウェハの歪
や捩のないウェハの固定装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a sample fixing device in vacuum, and in particular, when fixing a semiconductor wafer with an electron beam exposure device or the like in the manufacturing process of semiconductor devices, electrostatic In the chuck method, the locus of the electron beam fluctuates due to the influence of the electric field, making accurate drawing impossible. Therefore, this method relates to a wafer fixing device that does not have an electric field (and does not distort or twist the wafer).

〔従来の技術〕[Conventional technology]

近時、半導体ウェハの高密度化、高集積度化が進み、パ
ターニングの方法として電子ビーム露光や、X線露光が
実用化され、従って、バターニングされる半導体ウェハ
の固定方法として、真空中で半導体ウェハを平坦に配置
し且つ捩の無い状態で露光することが必要になっており
、特に半導体ウェハが大型化するにつれて真空中におけ
る半導体ウェハの固定方法が重要になって来る。
In recent years, semiconductor wafers have become denser and more highly integrated, and electron beam exposure and X-ray exposure have become practical as patterning methods. It has become necessary to expose semiconductor wafers in a flat and untwisted state, and as semiconductor wafers become larger in size, methods for fixing semiconductor wafers in vacuum become more important.

従来、真空中におけろウェハの固定方法は、静電チャッ
ク方式か、又は機械的に固定する方法がある。
Conventionally, wafers have been fixed in a vacuum using an electrostatic chuck method or a mechanical method.

第4図は、従来の機械的固定装置の断面図であるが、ウ
ェハ固定台1があリウェハ2のオリエンテッドフラット
(OF)部に当接する位置出しピン3があって、ウェハ
はこの位置出しビン3と押さえ金具4によってウェハの
表面が固定され、一方、ウェハ固定台lは下部にあるス
プリング5によって上方向にバネ効果で押上られている
FIG. 4 is a sectional view of a conventional mechanical fixing device, in which the wafer fixing table 1 has a positioning pin 3 that comes into contact with the oriented flat (OF) portion of the wafer 2, and the wafer is The surface of the wafer is fixed by the bottle 3 and the presser metal fitting 4, while the wafer fixing table 1 is pushed upward by a spring 5 at the bottom.

通常、電子ビーム露光等で必要とされるウェハの平坦度
と捩については、反りの限度はウェハの露光単位あたり
で10μm程度、捩の高さの限度は10μmが限度であ
るとされるが、従来の機械的固定装置では、ウェハの反
りと捩が共に30μ11〜40μm程度である。
Normally, regarding the flatness and twist of a wafer required for electron beam exposure, etc., the limit for warpage is said to be about 10 μm per exposure unit of the wafer, and the limit for the height of twist is 10 μm. In conventional mechanical fixing devices, both the warpage and twist of the wafer are about 30 μm to 40 μm.

このように反りや捩の大きいウェハでは、露光の際に焦
点深度を大きくする必要がある等の不利があり、又パタ
ーンの歪みや、パターンの繋ぎ合わせが複雑になって、
精度の高い露光が出来ないという欠点があった。
Wafers with large warps and twists have disadvantages such as the need to increase the depth of focus during exposure, and also cause pattern distortion and complicated pattern connection.
The drawback was that highly accurate exposure was not possible.

又電磁石を用いて磁力によるチャック方式で固定する方
法もあるが、電子ビーム露光の場合には、この電磁石で
形成される電磁界が電子ビームの電界に影響し、その為
に電子ビームの軌道が変化するため使用することは不可
能である。
There is also a method of fixing using a magnetic chuck method using an electromagnet, but in the case of electron beam exposure, the electromagnetic field formed by this electromagnet affects the electric field of the electron beam, which causes the trajectory of the electron beam to change. It is impossible to use because it changes.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上記構成の真空中での板状体固定装置においては、単に
固定装置に機械的に圧力を加えて固定するだけなので、
大型のウェハでは平坦度や捩が発生することが問題点で
あり、そのため半導体ウェハに正確なパタニングが出来
ないという不具合を生ずる。
In the device for fixing a plate-shaped object in a vacuum with the above configuration, it is simply fixed by applying mechanical pressure to the fixing device.
A problem with large wafers is the occurrence of flatness and distortion, which results in the inability to accurately pattern the semiconductor wafer.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は上記問題点を解消した真空中での板状体固定装
置を提供するもので、その手段は、真空中で載置される
板状体の周辺の複数位置が固定台上の複数のクランプ装
置によって平面状に固定され、上記複数のクランプ装置
のいずれかに該板状体を半径方向に張力を加えるスプリ
ングが設けられて、該板状体を平坦化するようにした真
空中での板状体固定装置によって達成できる。
The present invention provides a device for fixing a plate-like object in a vacuum that solves the above-mentioned problems. The plate-shaped body is fixed in a flat shape by a clamping device, and one of the plurality of clamping devices is provided with a spring that applies tension to the plate-shaped body in a radial direction to flatten the plate-shaped body in a vacuum. This can be achieved by a plate fixation device.

〔作用〕[Effect]

本発明は、半導体ウェハの如き板状体を真空中で固定す
る際に、半導体ウェハ面に反りや捩が発生しないように
、板状体の円周部を平面状に配置された複数のクランプ
装置で固定し、そのクランプ装置の内特定のクランプ装
置にはスプリング等で板状体の半径方向の外方向に張力
を加えて、板状体を反りや捩がない平面にするようにし
たものである。
The present invention provides a plurality of clamps arranged in a planar manner around the circumference of a plate-shaped body to prevent warping or twisting of the semiconductor wafer surface when fixing a plate-shaped body such as a semiconductor wafer in a vacuum. It is fixed with a device, and certain clamp devices of the clamp device apply tension outward in the radial direction of the plate-shaped body using a spring or the like to make the plate-shaped body flat without warping or twisting. It is.

〔実施例〕〔Example〕

第1図は本発明の実施例である真空中での板状体の固定
装置を説明する断面図である。
FIG. 1 is a cross-sectional view illustrating a device for fixing a plate-shaped body in a vacuum according to an embodiment of the present invention.

基板配置台11があり、板状体として半導体ウェハ12
を配置するための基準板13と、スプリング14によっ
てウェハを固定する挿挟装置15がある。
There is a substrate placement table 11, on which a semiconductor wafer 12 is placed as a plate-like body.
There are a reference plate 13 for arranging the wafer, and a clamping device 15 for fixing the wafer using a spring 14.

ウェハ面の挿挟装置15に対向して、反対方向には基準
面になる基準台16があり、基準板17とウェハを挿挟
するスプリング18を備えたクランプ装置19があり、
この挿挟されたウェハを半径方向に張力を加えるための
引張用スプリング20が設けられている。
Opposed to the wafer surface clamping device 15, there is a reference stand 16 serving as a reference surface in the opposite direction, and a clamp device 19 equipped with a reference plate 17 and a spring 18 for clamping the wafer.
A tension spring 20 is provided to apply tension to the inserted wafer in the radial direction.

図において、矢印はスプリング又はクランプ装置の移動
方向を示している。
In the figures, arrows indicate the direction of movement of the spring or clamping device.

第2図は、ウェハの表面側からの平面図であり、ウェハ
12の周辺に配置された基準板13に対し、張力が加え
られる基準板17の相対位置を示しているが、これらの
配置は、ウェハを平坦に配置するのが目的であるから4
個以上の基準板を適宜配置することが出来る。
FIG. 2 is a plan view from the front side of the wafer, and shows the relative position of the reference plate 17 to which tension is applied with respect to the reference plate 13 placed around the wafer 12. , since the purpose is to arrange the wafer flatly, 4
It is possible to appropriately arrange more than one reference plate.

第3図は、第1図のX−X部分での断面図を示している
が、基準板17がスプリング20によって引張られた場
合に、ガード21に沿って基準台16の表面を引張方向
にスライド出来るように構成され、常にウェハに張力を
与えるようになっている。
FIG. 3 shows a cross-sectional view taken along the line X-X in FIG. It is configured to be able to slide, and is designed to constantly apply tension to the wafer.

通常ウェハの厚みが0.5a■であるから挿挟の間隙は
、この程度に設針すればよく、引張力も単体のクランプ
部で1kg程度であればよい。
Since the thickness of the wafer is normally 0.5 mm, the interposition gap may be set to this extent, and the tensile force for a single clamp portion may be approximately 1 kg.

本発明による板状体固定装置によりウェハの反りや捩が
10μ−以下になり、高精度のパターニングが可能にな
った。
The plate-shaped object fixing device according to the present invention reduces the warpage and twist of the wafer to 10 μm or less, making it possible to perform highly accurate patterning.

〔発明の効果〕〔Effect of the invention〕

以上、詳細に説明したように、本発明の真空中において
大型の半導体ウェハを捩や反りがない平坦な平面で載置
することが可能になり、従って高精度の電子ビーム露光
等も実現し得るという効果大なるものがある。
As explained above in detail, the present invention makes it possible to place a large semiconductor wafer in a vacuum on a flat plane without twisting or warping, and therefore enables high-precision electron beam exposure, etc. There is a great effect.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例である真空中での板状体の固定
装置を説明する断面図、 第2図は、本発明のウェハと基準板との相対配1図、 第3図は、本発明の基準台の断面図、 第4図は、従来の機械的固定装置の断面図である。 図において、 11は基板配置台、   12はウェハ、13は基準板
、      14はスプリング、15は挿挟装置、 
   16は基準台、17は基準板、      18
はスプリング、19はクランプ装置、  20は引張用
スプリング21はガード、 をそれぞれ示す。 第1図 第2図    第3図
FIG. 1 is a cross-sectional view illustrating a device for fixing a plate-shaped body in a vacuum according to an embodiment of the present invention, FIG. 2 is a diagram showing the relative arrangement of a wafer and a reference plate of the present invention, and FIG. FIG. 4 is a sectional view of a conventional mechanical fixing device. In the figure, 11 is a substrate placement table, 12 is a wafer, 13 is a reference plate, 14 is a spring, 15 is an inserting device,
16 is a reference stand, 17 is a reference plate, 18
19 is a spring, 19 is a clamp device, and 20 is a tension spring 21, which is a guard. Figure 1 Figure 2 Figure 3

Claims (1)

【特許請求の範囲】[Claims]  真空中で載置される板状体の周辺の複数位置が固定台
上の複数のクランプ装置によって平面状に固定され、上
記複数のクランプ装置のいずれかに該板状体を半径方向
に張力を加えるスプリングが設けられて、該板状体を平
坦化するようにしたことを特徴とする真空中での板状体
固定装置。
A plurality of positions around the plate-shaped body placed in a vacuum are fixed in a plane by a plurality of clamp devices on a fixing table, and tension is applied to the plate-shaped body in the radial direction by one of the plurality of clamp devices. 1. An apparatus for fixing a plate-like object in a vacuum, characterized in that an additional spring is provided to flatten the plate-like object.
JP28073484A 1984-12-27 1984-12-27 Apparatus for fixing plate-like object in vacuum Pending JPS61156733A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28073484A JPS61156733A (en) 1984-12-27 1984-12-27 Apparatus for fixing plate-like object in vacuum

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28073484A JPS61156733A (en) 1984-12-27 1984-12-27 Apparatus for fixing plate-like object in vacuum

Publications (1)

Publication Number Publication Date
JPS61156733A true JPS61156733A (en) 1986-07-16

Family

ID=17629203

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28073484A Pending JPS61156733A (en) 1984-12-27 1984-12-27 Apparatus for fixing plate-like object in vacuum

Country Status (1)

Country Link
JP (1) JPS61156733A (en)

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