JPS61147979U - - Google Patents

Info

Publication number
JPS61147979U
JPS61147979U JP3210385U JP3210385U JPS61147979U JP S61147979 U JPS61147979 U JP S61147979U JP 3210385 U JP3210385 U JP 3210385U JP 3210385 U JP3210385 U JP 3210385U JP S61147979 U JPS61147979 U JP S61147979U
Authority
JP
Japan
Prior art keywords
life test
semiconductor
measurement
section
semiconductor elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3210385U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3210385U priority Critical patent/JPS61147979U/ja
Publication of JPS61147979U publication Critical patent/JPS61147979U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3210385U 1985-03-05 1985-03-05 Pending JPS61147979U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3210385U JPS61147979U (enrdf_load_stackoverflow) 1985-03-05 1985-03-05

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3210385U JPS61147979U (enrdf_load_stackoverflow) 1985-03-05 1985-03-05

Publications (1)

Publication Number Publication Date
JPS61147979U true JPS61147979U (enrdf_load_stackoverflow) 1986-09-12

Family

ID=30533307

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3210385U Pending JPS61147979U (enrdf_load_stackoverflow) 1985-03-05 1985-03-05

Country Status (1)

Country Link
JP (1) JPS61147979U (enrdf_load_stackoverflow)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53142259A (en) * 1977-05-18 1978-12-11 Toshiba Corp Threshold condition testing system
JPS56157875A (en) * 1980-05-08 1981-12-05 Fujitsu Ltd Testing jig for semiconductor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53142259A (en) * 1977-05-18 1978-12-11 Toshiba Corp Threshold condition testing system
JPS56157875A (en) * 1980-05-08 1981-12-05 Fujitsu Ltd Testing jig for semiconductor

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